Nova Patents
US6490641B2

Addressable shadow port circuit

Summary by NHIP

Addressable Shadow Port Circuit

The circuit couples a primary IEEE 1149.1 port to a secondary port using control logic that selectively interconnects test data and mode select leads. This logic responds to control signals distinct from normal IEEE 1149.1 signals to route primary inputs to secondary outputs without adding physical signals or altering bus throughput.

Claim Score by NHIP

Read claim 1, the broadest

Abstract

A protocol and associated circuitry operable for efficiently extending serial bus capability in system environments is disclosed. The protocol is designed to coexist and be fully compatible with existing serial bus approaches, and in particular an example of application of the invention to a backplane system utilizing the 1149.1 IEEE standard serial bus is detailed. The circuitry and protocol required to couple any one of the boards on the backplane to the serial bus master without modifying the existing serial bus protocol, without adding additional signals, and without affecting the throughput rate of the serial bus is described. The invention advantageously allows the serial bus master to select, communicate with, and deselect backplane boards so that high level test functions may be simultaneously executed and monitored. Additional preferred embodiments are also disclosed.

US6490641B2, drawing sheet 1
Sheet 1 of 22

Term

Term ended

Expired 19 February 2019, 7.6 years ago.

  1. Priority
  2. Filed
  3. Granted
  4. Expired
  5. Today

2 claims: 1 independent, 1 dependent

  1. 1
    Broadest claimClaim Score 20, narrow(NHIP)An addressable shadow port circuit comprising:A. a primary port having a primary test data input lead, a primary test mode select lead, a primary test clock lead and a primary test data output lead, the primary test data input lead and the primary test mode select lead carrying normal signals defined under the IEEE 1149.1 standard;B. a secondary port having a secondary test data output lead, a secondary test mode select lead, a secondary test clock lead coupled to the primary test clock lead and a secondary test data input lead;C. control logic connected to the primary port and to the secondary port, the control logic including control circuits coupled to the primary test data input lead and the primary test mode select lead, the control circuits being unresponsive to the normal signals carried on the primary test data input lead and the primary test mode select lead to interconnect the primary port and secondary port, the control circuits being responsive to control signals that are carried on the primary test data input lead and the primary test mode select lead, the control signals being other than and in addition to the normal signals carried on the primary test data input lead and the primary test mode select lead, responsive to the control signals the control circuits selectively control: i. connection of test data input signals on the primary test data input lead to the secondary test data output lead, ii. connection of test mode select signals on the primary test mode select lead to the secondary test mode select lead, and iii. connection of test data output signals on the secondary test data input lead to the primary test data output lead.