EP3910285C0

Scatterometry measurement of asymmetric structures

Abstract

This record has no abstract on file.

Term

4 yearsto projected expiry

Projected expiry 22 September 2030, counted from filing; an application has no term until it is granted.

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13 members in 4 offices

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Members13

Family members, oldest first
DocumentOfficeKind
US2011080585A1United States of AmericaA1
WO2011043930A1World Intellectual Property Organization (WIPO)A1
TW201140026ATaiwan Province of ChinaA
EP2486378A1European Patent Office (EPO)A1
US8525993B2United States of AmericaB2
TWI427284BTaiwan Province of ChinaB
EP2486378A4European Patent Office (EPO)A4
EP2486378B1European Patent Office (EPO)B1
EP3910285A1European Patent Office (EPO)A1
EP3910285A4European Patent Office (EPO)A4
EP3910285B1European Patent Office (EPO)B1
EP3910285C0This recordEuropean Patent Office (EPO)C0
EP4650733A2European Patent Office (EPO)A2