Chip packages including through-silicon via dice with vertically inegrated phased-array antennas and low-frequency and power delivery substrates
Claim Score by NHIP
Abstract
An apparatus includes a die with through-silicon vias and radio frequency integrated circuit capabilities and it is vertically integrated with a phased-array antenna substrate. The through-silicon via and a radio frequency integrated circuit is coupled to a plurality of antenna elements disposed on the phased-array antenna substrate where each of the plurality of antenna elements is coupled to the through-silicon vias and radio frequency integrated circuit through a plurality of through-silicon vias. A process of assembling the through-silicon vias and radio frequency integrated circuit to the phased-array antenna substrate includes testing the apparatus.

Term
5.6 yearsto projected expiry
Projected expiry 21 April 2032, counted from filing; an application has no term until it is granted.
- Priority and filed
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32 claims: 4 independent, 28 dependent
- 1Broadest claimClaim Score 85, broad(NHIP)An apparatus, comprising:a die including a through-silicon via and a radio frequency integrated circuit (TSV RFIC die);and a phased-array antenna (PAA) substrate vertically integrated with the TSV RFIC, wherein the PAA substrate includes a plurality of antenna elements, each of which is coupled to the TSV RFIC through a plurality of TSVs.
- 19An apparatus, comprising:a die including a through-silicon via and a radio frequency integrated circuit (TSV RFIC die) including an active surface and a backside surface;and a phased-array antenna (PAA) substrate vertically integrated with the TSV RFIC, wherein the PAA substrate includes a plurality of antenna elements, each of which is coupled to the TSV RFIC through electrical bumps on the active surface.
- 21A process of forming a vertically integrated apparatus comprising:assembling a through-silicon via radio-frequency integrated circuit die (TSV RFIC) to a phased-array antenna (PAA) substrate, wherein the PAA substrate includes a plurality of antenna elements, and wherein assembling includes coupling each antenna element to a TSV in the TSV RFIC.
- 29A computer system comprising:a die including a through-silicon via and a radio frequency integrated circuit (TSV RFIC die);a phased-array antenna (PAA) substrate vertically integrated with the TSV RFIC, wherein the PAA substrate includes a plurality of antenna elements, each of which is coupled to the TSV RFIC through a plurality of TSVs;a first-level interconnect substrate onto which the TSV RFIC is mounted;and a foundation substrate that supports the first-level interconnect substrate.
Independent claims4
97 paragraphs in 2 sections, as filed
0001Disclosed embodiments relate to packaged radio-frequency integrated circuits and methods of forming them.
BRIEF DESCRIPTION OF THE DRAWINGS
0002In order to understand the manner in which embodiments are obtained, a more particular description of various embodiments briefly described above will be rendered by reference to the appended drawings. These drawings depict embodiments that are not necessarily drawn to scale and are not to be considered to be limiting in scope. Some embodiments will be described and explained with additional specificity and detail through the use of the accompanying drawings in which:
0003<figref idref="DRAWINGS">FIG. 1</figref> is top plan of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus according to an example embodiment;
0004<figref idref="DRAWINGS">FIG. 2</figref> is a perspective elevation of a phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package according to an embodiment;
0005<figref idref="DRAWINGS">FIG. 3</figref> is a cross-section elevation of the phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package depicted in <figref idref="DRAWINGS">FIG. 2</figref> and taken along the cross-section line <b>2</b>-<b>2</b> according to an embodiment
0006<figref idref="DRAWINGS">FIG. 4</figref> is a detail cross-section elevation of the phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package depicted in <figref idref="DRAWINGS">FIG. 3</figref> according to an embodiment;
0007<figref idref="DRAWINGS">FIG. 5</figref><i>a </i>is a cross-section elevation of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package according to an example embodiment;
0008<figref idref="DRAWINGS">FIG. 5</figref><i>b </i>is a cross-section elevation of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package according to an example embodiment;
0009<figref idref="DRAWINGS">FIG. 6</figref> is a detail cross-section elevation of a top, low-loss phased-array antenna package substrate according to an example embodiment;
0010<figref idref="DRAWINGS">FIG. 7</figref> is a cross-section elevation of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package according to an example embodiment;
0011<figref idref="DRAWINGS">FIG. 8</figref> is a cross-section elevation of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package according to an example embodiment;
0012<figref idref="DRAWINGS">FIG. 9</figref> is a cross-section elevation of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a secondary low-cost package according to an example embodiment;
0013<figref idref="DRAWINGS">FIG. 10</figref> is a cross-section elevation of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus that includes a through-silicon via RFIC chip and a TSV processor chip that is mounted on a secondary low-cost package according to an example embodiment;
0014<figref idref="DRAWINGS">FIG. 11</figref> is an exploded, wire-frame perspective of a phased-array antenna radio-frequency integrated-circuit chip apparatus that includes a through-silicon via RFIC chip that is mounted on a secondary low-cost package with an embedded passive device according to an example embodiment;
0015<figref idref="DRAWINGS">FIG. 12</figref> is a process and method flow diagram according to an example embodiment; and
0016<figref idref="DRAWINGS">FIG. 13</figref> is a schematic of a computer system according to an embodiment.
DETAILED DESCRIPTION
0017Processes are disclosed where through-silicon-via radio-frequency integrated circuit (TSV RFIC) dice are assembled to phased-array antenna substrates.
0018Reference will now be made to the drawings wherein like structures may be provided with like suffix reference designations. In order to show the structures of various embodiments more clearly, the drawings included herein are diagrammatic representations of integrated circuit structures. Thus, the actual appearance of the fabricated integrated circuit structures, for example in a photomicrograph, may appear different while still incorporating the claimed structures of the illustrated embodiments. Moreover, the drawings may only show the structures useful to understand the illustrated embodiments. Additional structures known in the art may not have been included to maintain the clarity of the drawings.
0019<figref idref="DRAWINGS">FIG. 1</figref> is top plan of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>100</b> according to an example embodiment. A phased-array antenna (PAA) substrate <b>110</b> is depicted in simplified form with a 4×4 array of planar antenna elements <b>111</b>, <b>112</b>, <b>113</b>, <b>114</b>, <b>115</b>, <b>116</b>, <b>117</b>, <b>118</b>, <b>119</b>, <b>120</b>, <b>121</b>, <b>123</b>, <b>124</b>, <b>125</b>, and <b>126</b>. The PAA elements are deployed in rows of 4-4-4-4. In this embodiment, eight of the PAA elements are receiver elements and 8 PAA elements are transmitter elements. In an embodiment, the number of PAA elements is in a range from 4 to 64. In an embodiment, the number of PAA elements is 36 in a 6×6 array in which 18 PAA elements are receiver elements and 18 PAA elements are transmitter elements. In an embodiment, the number of PAA elements is 64 in a 8×8 array in which 32 PAA elements are receiver elements and 32 PAA elements are transmitter elements. In an embodiment, the 64 elements are split into many arrays. For example, four 4×4 arrays are configured, each from which two antenna elements are configured for Receive and two are configured for Transmit. In an embodiment, a 32-element phased-array antenna is split into many arrays. For example, two 4×4 arrays are configured, each from which two antenna elements are configured for Receive and two are configured for Transmit.
0020A through-silicon via (TSV) die <b>128</b> is depicted in phantom lines below the PAA substrate <b>110</b> and the TSV die <b>128</b> is vertically integrated (Z-direction) with the PAA substrate <b>110</b>. In an embodiment, the TSV die <b>128</b> includes active and passive circuitry in semiconductive material. For example, the TSV die <b>128</b> is part of a processor manufactured by Intel Corporation of Santa Clara, Calif. In an embodiment, the TSV die <b>128</b> contains a system-on-chip (SoC) <b>128</b> such as a dual-processor microelectronic device. In an embodiment, the TSV die <b>128</b> includes a digital processor and radio-frequency integrated circuit (DP-RFIC) hybrid device <b>128</b>. In an embodiment, the TSV die <b>128</b> includes an SoC <b>128</b> that includes a DP and a graphics (DP-GIC) hybrid.
0021In an embodiment, the TSV die <b>128</b> is a radio-frequency integrated circuit (RFIC) TSV die <b>128</b>. It can be seen that the TSV RFIC die <b>128</b> has a footprint that is smaller than that of the PAA substrate <b>110</b> and that the PAA substrate <b>110</b> is symmetrically disposed above the TSV RFIC die <b>128</b>. As depicted, a quadrilateral symmetry is seen between the PAA substrate <b>110</b> and the TSV RFIC die <b>128</b>. “Quadrilateral symmetry” may be understood to be that starting at the X-Y center of the apparatus <b>100</b>, a PAA element that is encountered may be balanced by encountering an analogous PAA element when moving in the opposite direction along the same line taken. Although the planar antenna elements are depicted in a quadrilateral symmetry, they may be deployed in other configurations such as in radial symmetry. The planar antenna elements may also be deployed such as in rows of 3-5-5-3, which is a 16-element array that is not a perfect geometrical square although 16 is a perfect numerical square. The planar antenna elements may also be deployed such as in rows of 4-6-6-6-6-4, which is a 32-element array that is not a perfect square.
0022By being able to dispose the TSV RFIC die <b>128</b> directly below the PAA substrate <b>110</b>, it is useful to achieve more uniform impedances, signal attenuations and phase delay therebetween. Uniform impedances may mean that the apparatus <b>100</b> may operate such that no significant differences in line impedance may be observed when comparing operation of any two antenna elements on the PAA substrate in a given application. Additionally by being able to dispose the TSV RFIC die <b>128</b> directly below the PAA substrate <b>110</b>, a useful smaller apparatus is achieved that facilitates miniaturization of packaging.
0023<figref idref="DRAWINGS">FIG. 2</figref> is a perspective elevation of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>200</b> mounted on a secondary low-cost package <b>230</b> (also referred to as a board <b>230</b>) according to an embodiment. In an embodiment, the board <b>230</b> is a direct chip-attach (DCA) board <b>230</b>. Where a secondary low-cost package <b>230</b> is used, the removal of RF/mm-wave signals allows a wider pitch to low frequency signals on the board <b>230</b>. This makes it possible to attach die first-level interconnects such as controlled-collapse chip connection (C4) bumps directly to the board <b>230</b>.
0024The apparatus <b>200</b> is depicted in partial wire frame in order to illustrate positioning of a TSV RIFC die <b>228</b> disposed below (Z-direction) a PAA substrate <b>210</b>. A 4×4 PAA configuration of planar antennas is disposed on the PAA substrate <b>210</b>, one of which is indicated with reference numeral <b>211</b>.
0025The TSV RFIC die <b>228</b> is illustrated with 16 through-silicon vias that are in groups of four, four or which are indicated with reference numeral <b>232</b>. Each one of the 16 TSVs <b>232</b> is coupled to a corresponding planar antenna element such as the planar antenna element <b>211</b>. Additional TSVs not shown in <figref idref="DRAWINGS">FIG. 2</figref> may be used to provide proper electrical ground reference to the 16 signal TSVs <b>232</b>. The TSV RFIC die <b>228</b> is flip-chip mounted to a direct chip-attach (DCA) board <b>230</b> by a plurality of electrical bumps <b>234</b>, one of which is indicated with reference numeral <b>234</b>. The electrical bumps <b>234</b> are first-level interconnect bumps such as C4 bumps that are attached to the active side of a die. As illustrated, the electrical bumps are configured in a 12×12 array, but other bump counts may be used where needed. Additional dummy bumps, one of which is indicated with reference numeral <b>236</b> are deployed between the PAA substrate <b>210</b> and the secondary low-cost package <b>230</b>. The dummy bumps <b>236</b> bridge the gap between the PAA substrate <b>210</b> and the secondary low-cost package <b>230</b> and add mechanical and thermal-stress stability to the apparatus <b>200</b> and the secondary low-cost package <b>230</b>. In an embodiment, electrical grounding capabilities are achieved through the dummy bumps <b>236</b> for at least the PAA substrate <b>210</b> and the TSV RFIC <b>228</b>.
0026<figref idref="DRAWINGS">FIG. 3</figref> is a cross-section elevation of the phased-array antenna radio-frequency integrated-circuit chip apparatus <b>300</b> mounted on a direct-chip-attach board <b>230</b> depicted in <figref idref="DRAWINGS">FIG. 2</figref> and taken along the cross-section line <b>3</b>-<b>3</b> according to an embodiment. The apparatus <b>300</b> includes the PAA substrate <b>210</b> and the TSV RFIC <b>228</b>. Additionally, the secondary low-cost package <b>230</b> is coupled to the PAA substrate <b>210</b> by backside electrical bumps <b>238</b>. A plurality of TSVs can be seen in the TSV RFIC <b>228</b>, two of which are indicated with the reference numeral <b>232</b>. Other structures may be seen in <figref idref="DRAWINGS">FIG. 3</figref>. Where the TSV RFIC <b>228</b> is an active RF device with RF and millimeter wave signals being transmitted through TSVs to the phased-array antenna, lower frequency functions are separated from the PAA substrate <b>210</b> and contained in the secondary low-cost package <b>230</b>. This vertical integration system reduces signal congestion and facilitates a small form factor that is limited by dimensions of the PAA substrate <b>210</b>. In an embodiment, the PAA substrate <b>210</b> operates in the 60 GHz realm while the secondary low-cost package <b>230</b> operates at lower frequencies.
0027In an embodiment, a 60 GHz or millimeter-wave phased array or millimeter-wave including the planar antenna elements <b>211</b>, <b>212</b>, <b>213</b>, and <b>214</b> is assembled to a millimeter-wave (mm-wave) TSV RFIC <b>228</b> that requires a Gb/s datarate over a wireless link. In an embodiment, the wireless link is for a wireless display from a wireless transmission for uncompressed high-definition (HD) video.
0028<figref idref="DRAWINGS">FIG. 4</figref> is a cross-section elevation detail of the phased-array antenna radio-frequency integrated-circuit chip apparatus mounted on a direct-chip-attach board depicted in <figref idref="DRAWINGS">FIG. 3</figref> according to an embodiment. The apparatus <b>400</b> includes the PAA substrate <b>210</b> and the TSV RFIC <b>228</b>. The apparatus <b>400</b> is mounted on the secondary low-cost package <b>230</b>.
0029The PAA substrate <b>210</b> is illustrated with two occurrences of the planar antenna elements <b>212</b> and <b>213</b> that are exposed through an array mask <b>240</b>. In an embodiment, a metallic layer <b>242</b> is disposed in the PAA substrate <b>210</b> to enhance antenna bandwidth. Electrical contact between the TSV RFIC <b>228</b> and the antenna elements is accomplished through at least one trace <b>244</b> that is coupled to the TSVs <b>232</b> through backside bumps <b>238</b>. Electrical coupling of the antenna elements <b>212</b> and <b>213</b> through the PAA substrate <b>210</b> is accomplished either by inductive or direct coupling. In an embodiment, the PAA substrate <b>210</b> includes a first dielectric layer <b>252</b> and a second dielectric layer <b>254</b>. In an embodiment, the first dielectric layer <b>252</b> has a lower dielectric constant than the second dielectric layer <b>254</b>.
0030The TSV RFIC <b>228</b> includes an active-device layer <b>250</b> that exhibits an active surface <b>227</b>. The metallization is indicated with a top bond pad <b>251</b>. The active surface <b>227</b> is opposite a die backside surface <b>229</b>. The metallization layer <b>251</b> may also be referred to as the silicon backend <b>251</b>. In an embodiment, the metallization layer <b>251</b> has several layers of metallization such as metal-1 (M1) to M12 depending upon a given need for the TSV RFIC <b>228</b>. In any event the TSVs <b>232</b> originate in the metallization layer <b>251</b> and penetrate the TSV RVIC <b>228</b> to the backside surface <b>229</b> in order to allow the TSV RVIC <b>228</b> to communicate with the antenna elements of the PAA substrate <b>210</b>. The TSVs <b>232</b> make electrical contact to the backside bumps <b>238</b> and are therefore coupled to the antenna elements <b>212</b> and <b>213</b>.
0031The secondary low-cost package <b>230</b> is coupled to the TSV RFIC <b>228</b> by the electrical bumps <b>234</b> and to the PAA substrate <b>210</b> by the dummy bumps <b>236</b> (see <figref idref="DRAWINGS">FIG. 3</figref>). In an embodiment, the secondary low-cost package <b>230</b> is a first-level chip-attach substrate and a land surface <b>231</b> is provided as a second-level chip-attach surface. In an embodiment, the land surface <b>231</b> is a land-grid array surface <b>231</b>. In an embodiment, the land surface <b>231</b> is a pin-grid array surface <b>231</b>
0032<figref idref="DRAWINGS">FIG. 5</figref><i>a </i>is a cross-section elevation of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>500</b> mounted on a direct-chip-attach board according to an example embodiment. The apparatus <b>500</b> includes a PAA substrate <b>510</b> and a TSV RFIC <b>528</b>. The TSV RFIC <b>528</b> includes an active surface <b>527</b> and a backside surface <b>529</b> and an active-device layer <b>550</b>. Additionally, a secondary low-cost package <b>530</b> is coupled to the TSV RFIC <b>528</b> by backside electrical bumps <b>538</b> and to the PAA substrate <b>510</b> by the dummy bumps <b>536</b>. A plurality of TSVs can be seen in the TSV RFIC <b>528</b>, two of which are indicated with the reference numeral <b>532</b>.
0033Other structures may be seen in <figref idref="DRAWINGS">FIG. 5</figref>. The PAA substrate <b>510</b> is illustrated with four occurrences of planar antenna elements <b>511</b>, <b>512</b>, <b>513</b>, and <b>514</b> that are exposed through an array mask <b>540</b>. In an embodiment, a metallic layer <b>542</b> with apertures is disposed in the PAA substrate <b>510</b> as a ground plane to enhance antenna bandwidth. The ground plane <b>542</b> is coupled to the dummy bumps <b>536</b> through ground vias <b>543</b> in the PAA substrate <b>510</b>.
0034Electrical contact between the TSV RFIC <b>528</b> and the antenna elements is accomplished through at least one trace <b>544</b> that is coupled to the TSVs <b>532</b> through backside bumps <b>538</b>. Electrical coupling of the antenna elements <b>511</b>, <b>512</b>, <b>513</b>, and <b>514</b> through the PAA substrate <b>510</b> is accomplished by inductive coupling. In an embodiment, the PAA substrate <b>510</b> includes a first dielectric layer <b>552</b> and a second dielectric layer <b>554</b>. In an embodiment, the first dielectric layer <b>552</b> has a lower dielectric constant than the second dielectric layer <b>554</b>.
0035Where the TSV RFIC <b>528</b> is an active RF device with TSV signals being transmitted to the phased-array antenna elements, lower frequency functions are separated from the PAA substrate <b>510</b> and contained in the secondary low-cost package <b>530</b>. This integration system reduces signal congestion and facilitates a small form factor that is limited by dimensions of the PAA substrate <b>510</b>. In an embodiment, the PAA substrate <b>510</b> operates in the 60 GHz realm while the secondary low-cost package <b>530</b> operates at lower frequencies.
0036In an embodiment, a 60 GHz or millimeter-wave phased array including the planar antenna elements <b>511</b>, <b>512</b>, <b>513</b>, and <b>514</b> is assembled to a mm-wave TSV RFIC <b>528</b> that requires a Gb/s datarate over a wireless link. In an embodiment, the wireless link is for a wireless display from a wireless transmission for uncompressed HD video. During operation, all RF signals generated within the TSV RFIC <b>228</b> are directed through the several TSVs <b>532</b> and into the PAA substrate <b>510</b> such that the phased-array antenna elements may emit useful signals in a range from zero to 30 meters such as from 1 centimeter to 20 meters according to an embodiment.
0037<figref idref="DRAWINGS">FIG. 5</figref><i>b </i>is a cross-section elevation of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>501</b> mounted on a direct-chip-attach board according to an example embodiment. The apparatus <b>501</b> includes a PAA substrate <b>510</b> and a TSV RFIC <b>528</b>. The TSV RFIC <b>528</b> has been configured opposite to that depicted in <figref idref="DRAWINGS">FIG. 5</figref><i>a </i>such that the configuration of the die <b>528</b> consists of flipping the die <b>528</b> such that the PAA <b>510</b> communicates with the chip <b>528</b> through the C4 bumps <b>534</b> while the low frequency board <b>530</b> receives its signals through the TSVs <b>532</b>. The TSV RVIC <b>528</b> includes an active surface <b>527</b> and a backside surface <b>529</b> and an active-device layer <b>550</b>. Additionally, a secondary low-cost package <b>530</b> is coupled to the TSV RFIC <b>528</b> by backside electrical bumps <b>538</b> and to the PAA substrate <b>510</b> by the dummy bumps <b>536</b>. A plurality of TSVs can be seen in the TSV RFIC <b>528</b>, two of which are indicated with the reference numeral <b>532</b>.
0038Other structures may be seen in <figref idref="DRAWINGS">FIG. 5</figref><i>b</i>. The PAA substrate <b>510</b> is illustrated with four occurrences of planar antenna elements <b>511</b>, <b>512</b>, <b>513</b>, and <b>514</b> that are exposed through an array mask <b>540</b>. In an embodiment, a metallic layer <b>542</b> with apertures is disposed in the PAA substrate <b>510</b> as a ground plane to enhance antenna bandwidth. The ground plane <b>542</b> is coupled to the dummy bumps <b>536</b> through ground vias <b>543</b> in the PAA substrate <b>510</b>.
0039Electrical contact between the TSV RFIC <b>528</b> and the antenna elements is accomplished through at least one trace <b>544</b> that is coupled to the active-surface C4 bumps <b>534</b>. Electrical coupling of the antenna elements <b>511</b>, <b>512</b>, <b>513</b>, and <b>514</b> through the PAA substrate <b>510</b> is accomplished by inductive coupling. In an embodiment, the PAA substrate <b>510</b> includes a first dielectric layer <b>552</b> and a second dielectric layer <b>554</b>. In an embodiment, the first dielectric layer <b>552</b> has a lower dielectric constant than the second dielectric layer <b>554</b>.
0040Where the TSV RFIC <b>528</b> is an active RF device with TSV signals being transmitted to the phased-array antenna elements, lower frequency functions are separated from the PAA substrate <b>510</b> and contained in the secondary low-cost package <b>530</b>. This integration system reduces signal congestion and facilitates a small form factor that is limited by dimensions of the PAA substrate <b>510</b>. In an embodiment, the PAA substrate <b>510</b> operates in the 60 GHz realm while the secondary low-cost package <b>530</b> operates at lower frequencies.
0041In an embodiment, a 60 GHz or millimeter-wave phased array including the planar antenna elements <b>511</b>, <b>512</b>, <b>513</b>, and <b>514</b> is assembled to a mm-wave TSV RFIC <b>528</b> that requires a Gb/s datarate over a wireless link. In an embodiment, the wireless link is for a wireless display from a wireless transmission for uncompressed HD video. During operation, all RF signals generated within the TSV RFIC <b>228</b> are directed through the several TSVs <b>532</b> and into the PAA substrate <b>510</b> such that the phased-array antenna elements may emit useful signals in a range from zero to 30 meters such as from 1 centimeter to 20 meters according to an embodiment.
0042<figref idref="DRAWINGS">FIG. 6</figref> is a detail cross-section elevation of a top, low-loss phased-array antenna <b>600</b> according to an example embodiment. The antenna <b>600</b> is part of a PAA substrate <b>610</b>. The PAA substrate <b>610</b> is illustrated with one occurrence of a planar antenna element <b>611</b> that is exposed through an array mask <b>640</b> that may be about 20 micrometer (μm) in thickness. In an embodiment, a metallic layer <b>642</b> is disposed in the PAA substrate <b>610</b> to enhance antenna bandwidth. Electrical contact between a the TSV RFIC and the antenna element <b>611</b> is accomplished through at least one trace <b>644</b> that is to be coupled to TSVs through backside bumps that are disposed between a TSV RFIC and the PAA substrate <b>610</b>. The trace <b>644</b> is protected by a solder resist <b>641</b> that may have a thickness of about 20 μm. Electrical coupling of the antenna element <b>611</b> through the PAA substrate <b>610</b> is accomplished by inductive coupling where an emitter trace <b>645</b> emits EM waves onto the antenna element <b>611</b> though both a high-k dielectric <b>652</b> such as a glass material and a lower-k dielectric layer <b>654</b> that may also be a glass material. In an embodiment, the first dielectric layer <b>652</b> has an Er of about 5.5, a tan_delta of about 0.001, and a thickness of about 100 micrometer (μm) and the lower-k dielectric layer <b>654</b> has an Er from about 2.0 to 2.5, a tan_delta of about 0.001, and a thickness from about 250 μm to about 400 μm.
0043<figref idref="DRAWINGS">FIG. 7</figref> is a cross-section elevation of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>700</b> mounted on a direct-chip-attach board <b>730</b> according to an example embodiment. The apparatus <b>700</b> uses aperture feeding to PAA antenna elements. Signals travel through TSVs <b>732</b> and through a PAA substrate <b>710</b> by inductive coupling to the PAA antenna elements. The apparatus <b>700</b> includes a PAA substrate <b>710</b> and a TSV RFIC <b>728</b>. The TSV RFIC <b>728</b> includes an active surface <b>727</b> and a backside surface <b>729</b> and an active-device layer <b>750</b>. Additionally, a secondary low-cost package <b>730</b> is coupled to the TSV RFIC <b>728</b> by backside electrical bumps <b>738</b> and to the PAA substrate <b>710</b> by the dummy bumps <b>736</b>. A plurality of TSVs can be seen in the TSV RFIC <b>728</b>, two of which are indicated with the reference numeral <b>732</b>.
0044The PAA substrate <b>710</b> is illustrated with four occurrences of planar antenna elements <b>711</b>, <b>712</b>, <b>713</b>, and <b>714</b> that are exposed through an array mask <b>740</b>. The number of planar antenna elements may be any set forth in this disclosure and any configuration. In an embodiment, a metallic layer <b>742</b> with apertures is disposed in the PAA substrate <b>710</b> as a ground plane to enhance antenna bandwidth. The ground plane <b>742</b> is coupled to the dummy bumps <b>736</b> through ground vias <b>743</b> in the PAA substrate <b>710</b>.
0045Electrical contact between the TSV RFIC <b>728</b> and the antenna elements is accomplished through at least one trace <b>744</b> that is coupled to the TSVs <b>732</b> through backside bumps <b>738</b>. Electrical coupling of the antenna elements <b>711</b>, <b>712</b>, <b>713</b>, and <b>714</b> through the PAA substrate <b>710</b> is accomplished by aperture feeding of an inductive coupling. In an embodiment, the PAA substrate <b>710</b> includes a first dielectric layer <b>752</b> and a second dielectric layer <b>754</b>. In an embodiment, the first dielectric layer <b>7</b> is glass and has a lower dielectric constant than the second dielectric layer <b>754</b> which is also glass.
0046Where the TSV RFIC <b>728</b> is an active RF device with TSV signals being transmitted to the phased-array antenna elements, lower frequency functions are separated from the PAA substrate <b>710</b> and contained in the secondary low-cost package <b>730</b>. This integration system reduces signal congestion and facilitates a small form factor that is limited by dimensions of the PAA substrate <b>710</b>. In an embodiment, the PAA substrate <b>710</b> operates in the 60 GHz realm while the secondary low-cost package <b>730</b> operates at lower frequencies.
0047In an embodiment, a 60 GHz or millimeter-wave phased array including the planar antenna elements <b>711</b>, <b>712</b>, <b>713</b>, and <b>714</b> is assembled to a mm-wave TSV RFIC <b>728</b> that requires a Gb/s datarate over a wireless link. In an embodiment, the wireless link is for a wireless display from a wireless transmission for uncompressed HD video. During operation, all RF signals generated within the TSV RFIC <b>728</b> are directed through the several TSVs <b>738</b> and into the PAA substrate <b>710</b> such that the phased-array antenna elements may emit useful signals in a range from zero to 30 meters such from 1 centimeter to 20 meters as according to an embodiment.
0048<figref idref="DRAWINGS">FIG. 8</figref> is a cross-section elevation of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>800</b> mounted on a direct-chip-attach board <b>830</b> according to an example embodiment. The apparatus <b>800</b> uses conductive-via feeding to PAA antenna elements. Signals travel through TSVs <b>732</b> and through a PAA substrate <b>710</b> by conductive vias <b>843</b> to PAA antenna elements <b>811</b>, <b>812</b>, <b>813</b>, and <b>814</b>. The apparatus <b>800</b> includes a PAA substrate <b>810</b> and a TSV RFIC <b>828</b>. The TSV RVIC <b>828</b> includes an active surface <b>827</b> and a backside surface <b>829</b> and an active-device layer <b>850</b>. Additionally, a secondary low-cost package <b>830</b> is coupled to the TSV RFIC <b>828</b> by backside electrical bumps <b>838</b> and to the PAA substrate <b>810</b> by dummy bumps <b>836</b>. A plurality of TSVs can be seen in the TSV RFIC <b>828</b>, two of which are indicated with the reference numeral <b>832</b>.
0049The PAA substrate <b>810</b> is illustrated with four occurrences of the planar antenna elements <b>811</b>, <b>812</b>, <b>813</b>, and <b>814</b> that are exposed through an array mask <b>840</b>. The number of planar antenna elements may be any set forth in this disclosure and any configuration. A ground plane <b>844</b> is coupled to the dummy bumps <b>836</b>.
0050Electrical contact between the TSV RFIC <b>828</b> and the antenna elements is accomplished through backside bumps <b>838</b> that are in contact with or coupled to the conductive vias <b>843</b>. In an embodiment, the PAA substrate <b>810</b> includes a dielectric layer <b>854</b> that is glass.
0051Where the TSV RFIC <b>828</b> is an active RF device with TSV signals being transmitted to the phased-array antenna elements, lower frequency functions are separated from the PAA substrate <b>810</b> and contained in the secondary low-cost package <b>830</b>. This integration system reduces signal congestion and facilitates a small form factor that is limited by dimensions of the PAA substrate <b>810</b>. In an embodiment, the PAA substrate <b>810</b> operates in the 60 GHz realm while the secondary low-cost package <b>830</b> operates at lower frequencies.
0052In an embodiment, a 60 GHz or millimeter-wave phased array including the planar antenna elements <b>811</b>, <b>812</b>, <b>813</b>, and <b>814</b> is assembled to a mm-wave TSV RFIC <b>828</b> that requires a Gb/s datarate over a wireless link. In an embodiment, the wireless link is for a wireless display from a wireless transmission for uncompressed HD video. During operation, all RF signals generated within the TSV RFIC <b>828</b> are directed through the several TSVs <b>832</b> and into the PAA substrate <b>810</b> such that the phased-array antenna elements may emit useful signals in a range from zero to 30 meters such as from 1 centimeter to 20 meters according to an embodiment.
0053<figref idref="DRAWINGS">FIG. 9</figref> is a cross-section elevation of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>900</b> mounted on a direct-chip-attach board according to an example embodiment. The apparatus <b>900</b> uses conductive-via <b>943</b> feeding to PAA antenna elements and a TSV RFIC <b>928</b> is embedded in a bumpless, build-up layer (BBUL) structure <b>990</b>. Signals travel through TSVs <b>932</b> and through a PAA substrate <b>910</b> by conductive vias <b>943</b> to PAA antenna elements <b>911</b>, <b>912</b>, <b>913</b>, and <b>914</b>. The conductive vias <b>943</b> where they contact the TSVs <b>932</b> may be referred to as die backside contact vias <b>943</b>.
0054In an embodiment, signals are aperture fed such as illustrated for the PAA substrates <b>510</b> and <b>710</b>, but the PAA substrate is either assembled to a BBUL structure <b>990</b> or is integral with a BBUL structure <b>990</b>. In an example embodiment, the BBUL structure <b>990</b> is manufactured separately and later assembled to the PAA substrate <b>910</b>. In an example embodiment, the BBUL structure <b>990</b> is manufactured in a same process as that of the PAA substrate <b>910</b>.
0055The apparatus <b>900</b> includes a PAA substrate <b>910</b> and a TSV RFIC <b>928</b> that is embedded in—and integral to the BBUL structure <b>990</b>. Additionally, a secondary low-cost package <b>930</b> is coupled to the TSV RFIC <b>928</b> by BBUL die-side vias <b>938</b>. A plurality of TSVs can be seen in the TSV RFIC <b>928</b>, four of which are indicated with the reference numeral <b>932</b>.
0056The PAA substrate <b>910</b> is illustrated with four occurrences of the planar antenna elements <b>911</b>, <b>912</b>, <b>913</b>, and <b>914</b> that are exposed through an array mask <b>940</b>. The number of planar antenna elements may be any set forth in this disclosure and any configuration. A ground plane <b>942</b> may be coupled to both the PAA substrate <b>910</b> and to the TSV RFIC <b>928</b> as well as to the secondary low-cost package <b>930</b>. Electrical contact between the TSV RFIC <b>928</b> and the antenna elements is accomplished through BBUL die-side vias <b>938</b> that are in contact with or coupled to the backside conductive vias <b>943</b>. In an embodiment, the PAA substrate <b>910</b> includes a dielectric layer <b>954</b> that is glass.
0057Where the TSV RFIC <b>928</b> is an active RF device with TSV signals being transmitted to the phased-array antenna elements, lower frequency functions are separated from the PAA substrate <b>910</b> and contained in the secondary low-cost package <b>930</b>. This integration system reduces signal congestion and facilitates a small form factor that is limited by dimensions of the PAA substrate <b>910</b>. In an embodiment, the PAA substrate <b>910</b> operates in the 60 GHz realm while the secondary low-cost package <b>930</b> operates at lower frequencies.
0058In an embodiment, a 60 GHz or millimeter-wave phased array including the planar antenna elements <b>911</b>, <b>912</b>, <b>913</b>, and <b>914</b> is assembled to a mm-wave TSV RFIC <b>928</b> that requires a Gb/s datarate over a wireless link. In an embodiment, the wireless link is for a wireless display from a wireless transmission for uncompressed HD video. During operation, all RF signals generated within the TSV RFIC <b>928</b> are directed through the several TSVs <b>932</b> and into the PAA substrate <b>910</b> such that the phased-array antenna elements may emit useful signals in a range from zero to 30 meters such from 1 centimeter to 20 meters as according to an embodiment.
0059<figref idref="DRAWINGS">FIG. 10</figref> is a cross-section elevation of a vertically integrated phased-array antenna radio-frequency integrated-circuit chip apparatus <b>1000</b> that includes a through-silicon via RFIC chip <b>1028</b> and a TSV digital processor chip <b>1092</b> that is mounted on a direct-chip-attach board <b>1030</b> according to an example embodiment. The apparatus <b>1000</b> includes a PAA substrate <b>1010</b>, a TSV RFIC <b>1028</b> and a TSV digital processor (TSV DP) <b>1092</b>. As depicted, the TSV DP <b>1092</b> has a different form factor (depicted in the X-direction) than that of the TSV RFIC <b>1028</b>. This embodiment illustrates that the two TSV dice <b>1028</b> and <b>1092</b> may have different form factors when a given application of vertically integrated dice is useful in connection with vertical integration with a phased-array antenna substrate. In an embodiment, it may be understood that the form-factor difference is such that the TSV RFIC <b>1028</b> is larger than that of the TSV DP <b>1092</b>. In an embodiment, it may be understood that the form factors of the two dice are substantially the same.
0060In an embodiment, where the TSV RFIC <b>1028</b> may bear a majority (more than 50 percent) or a plurality (less than 50 percent, but the largest amount) of the burden for RF signal processing, the TSV DP <b>1092</b> may be a processor such as that manufactured by Intel Corporation of Santa Clara, Calif. In an embodiment, the TSV DP <b>1092</b> has dual-processor functions such as a dual core processor. In an embodiment, the TSV DP <b>1092</b> has dual-processor dissimilar functions such as a digital-sector and a graphics-sector processor such as the processor type code-named “Sandy Bridge” manufactured by Intel Corporation.
0061A secondary low-cost package <b>1030</b> is coupled to the TSV DP <b>1092</b> by electrical bumps <b>1024</b> and to the PAA substrate <b>1010</b> by dummy bumps <b>1036</b>. A plurality of TSVs can be seen in the TSV RFIC <b>1028</b>, one of which is indicated with the reference numeral <b>1032</b>. Similarly, a plurality of TSVs can be seen in the TSV DC <b>1092</b>, one of which is indicated with the reference numeral <b>1094</b> and the two dice <b>1028</b> and <b>1092</b> are coupled at the respective TSVs by an electrical bump <b>1033</b>.
0062In an embodiment, a metallic layer <b>1042</b> with apertures is disposed in the PAA substrate <b>1010</b> as a ground plane to enhance antenna bandwidth. The ground plane <b>1042</b> is coupled to the dummy bumps <b>1036</b> through ground vias <b>1043</b> in the PAA substrate <b>1010</b>. In an embodiment, the apparatus <b>1000</b> may use conductive-via feeding such as is illustrate in <figref idref="DRAWINGS">FIGS. 8 and 9</figref>.
0063The PAA substrate <b>1010</b> is illustrated with four occurrences of the planar antenna elements <b>1011</b>, <b>1012</b>, <b>1013</b>, and <b>1014</b> that are exposed through an array mask <b>1040</b>. The number of planar antenna elements may be any set forth in this disclosure and any configuration. Electrical contact between the TSV RFIC <b>1028</b> and the antenna elements is accomplished through backside bumps <b>1038</b>. In an embodiment, the PAA substrate <b>1010</b> includes a first dielectric layer <b>1052</b> and a second dielectric layer <b>1054</b>. In an embodiment, the first dielectric layer <b>1052</b> has a lower dielectric constant than the second dielectric layer <b>1054</b>.
0064Where the TSV RFIC <b>1028</b> is an active RF device with TSV signals being transmitted to the phased-array antenna elements PAA substrate <b>1010</b>, lower frequency functions are separated from the PAA substrate <b>1010</b> and contained in the secondary low-cost package <b>1030</b>. This integration system reduces signal congestion and facilitates vertical integration of two dice <b>1028</b> and <b>1092</b> below a PAA and a small form factor that is limited by dimensions of the PAA substrate <b>1030</b>. In an embodiment, the PAA substrate <b>1010</b> operates in the 60 GHz/mm-wave realm while the secondary low-cost package <b>1030</b> operates at lower frequencies.
0065In an embodiment, a 60 GHz or millimeter-wave phased array including the planar antenna elements <b>1011</b>, <b>1012</b>, <b>1013</b>, and <b>1014</b> is assembled to a mm-wave TSV RFIC <b>1028</b> that requires a Gb/s datarate over a wireless link. In an embodiment, the wireless link is for a wireless display from a wireless transmission for uncompressed HD video. During operation, all RF signals generated within the TSV RFIC <b>1028</b> are directed through the several TSVs <b>1032</b> and into the PAA substrate <b>1010</b> such that the phased-array antenna elements may emit useful signals in a range from zero to 30 meters such as from 1 centimeter to 20 meters according to an embodiment.
0066It may now be appreciated that vertically integrated dice including a TSV RFIC and a TSV DC may be assembled an integral to a BBUL structure, which in turn may be assembled to—or be integral to a PAA substrate. Further, an apparatus that includes a BBUL-integral TSV RFIC and TSV DC may be assembled to a secondary low-cost package.
0067<figref idref="DRAWINGS">FIG. 11</figref> is an exploded, wire-frame perspective of a phased-array antenna radio-frequency integrated-circuit chip apparatus <b>1100</b> that includes a through-silicon via RFIC chip <b>1128</b> that is mounted on a direct-chip-attach board <b>1130</b> with an embedded passive device <b>1194</b> according to an example embodiment. As depicted, the apparatus <b>1100</b> is configured with an TSV RFIC <b>1128</b> and a PAA substrate <b>1110</b>. The PAA substrate <b>1110</b> is depicted with 16 antenna elements <b>111</b> to <b>1126</b> in a 3-5-5-3 (X-direction) configuration.
0068The TSV RFIC <b>1128</b> is disposed on the secondary low-cost package <b>1130</b> and a passive device <b>1194</b>, in this illustration a folded inductor <b>1194</b>, is embedded in the secondary low-cost package <b>1130</b>. In an embodiment, the apparatus includes the PAA substrate <b>1110</b>, the TSV RFIC <b>1128</b>, and also a TSV DP <b>1192</b>. In an embodiment, only the PAA substrate <b>1110</b> and the TSV RFIC <b>1128</b> are present. The apparatus <b>1100</b> is depicted in simplified form that includes TSV DP metallization <b>1998</b> that supports the TSV DP <b>1192</b> and RFIC metallization <b>1150</b> that supports the TSV RFIC <b>1128</b>.
0069In an embodiment, the secondary low-cost package <b>1130</b> is a coreless substrate <b>1130</b> that includes at least one passive device embedded therein. Electrical communication between the DP-RFIC <b>1192</b> and the secondary low-cost package <b>1130</b> is carried out through electrical bumps according to any disclosed embodiment or otherwise according to known technique. As illustrated, the DP-RFIC <b>1192</b>, if present, is a flip-chip <b>1192</b> that is being mated to the secondary low-cost package <b>1130</b> by use of electrical bumps according to any disclosed embodiment or otherwise according to known technique. Other passive devices may be embedded in the secondary low-cost package according to any technique disclosed in PCT Patent Application No. PCT/US2010/061388, filed Dec. 20, 2010 by two of the named inventors in this instant disclosure, the disclosure of which is incorporated herein in its entirety by reference.
0070Any RF-quality capacitors may be deployed within the silicon of the TSV RFIC <b>1128</b> according to an embodiment. As a front-end module passive device, at least one RF-quality capacitor is deployed within the TSV RFIC <b>1128</b>, remains within the silicon of the TSV RFIC <b>1128</b> where it may be fabricated with a high-k dielectric material for a useful capacitance and a useful small size compared to that of inductors that may be deployed within the secondary low-cost package <b>1130</b>, between the TSV RFIC <b>1128</b> and the secondary low-cost package <b>1130</b>.
0071<figref idref="DRAWINGS">FIG. 12</figref> is a process and method flow diagram <b>1200</b> according to an example embodiment.
0072At <b>1210</b>, the process includes assembling an apparatus of a through-silicon via die and a phased-array antenna substrate. In a non-limiting example embodiment, the TSV RFIC <b>228</b>, depicted in <figref idref="DRAWINGS">FIG. 3</figref>, is assembled to a PAA substrate <b>210</b>.
0073At <b>1212</b>, a process embodiment includes embedding the TSV RFIC in a bumpless build-up layer substrate. In a non-limiting example embodiment, the BBUL substrate <b>990</b>, depicted in <figref idref="DRAWINGS">FIG. 9</figref>, is assembled to the PAA substrate <b>910</b>.
0074At <b>1214</b>, a process embodiment includes assembling or adding a through-silicon via digital processor to the apparatus. In a non-limiting example embodiment, the TSV DP <b>1092</b> is added to the TSV RFIC <b>1028</b> as depicted in <figref idref="DRAWINGS">FIG. 1000</figref>.
0075At <b>1216</b>, a process includes assembling the TSV RFIC to a PAA substrate such that electrical coupling is by aperture feeding between the TSV RFIC and the planar antenna elements of the PAA. In a non-limiting example embodiment, aperture feeding couples the PAA substrate <b>510</b>, depicted in <figref idref="DRAWINGS">FIG. 5</figref>, to the TSV RFIC <b>528</b>.
0076At <b>1218</b>, a process includes assembling the TSV RFIC to a PAA substrate such that electrical coupling is by conductive-via feeding between the TSV RFIC and the planar antenna elements of the PAA. In a non-limiting example embodiment, conductive-via feeding is used on the apparatus <b>800</b>, depicted in <figref idref="DRAWINGS">FIG. 8</figref>.
0077At <b>1220</b>, a method embodiment includes testing the apparatus. In a non-limiting example embodiment, the apparatus that consists essentially of the PAA substrate mated to the TSV RFIC is tested before assembling the apparatus to a secondary low-cost package. For example, a testing jig may have a similar electrical-contact footprint of that of the TSV RFIC such that testing may be done without a permanent secondary low-cost package affixed.
0078At <b>1230</b>, a process embodiment includes assembling the apparatus to a secondary low-cost package. In a non-limiting example embodiment, testing at <b>1220</b> is done after assembling the apparatus to the secondary low-cost package.
0079At <b>1232</b>, a process embodiment includes fabricating at least one passive device in or on the secondary low-cost package. In a non-limiting example embodiment, the folded inductor <b>1194</b> is fabricated into a coreless secondary low-cost package <b>1130</b> as depicted in <figref idref="DRAWINGS">FIG. 11</figref>. In an embodiment, a bump inductor is deployed between the secondary low-cost package and the TSV RFIC. In an embodiment, a stacked-via inductor is deployed between the TSV RFIC and at least partially in the secondary low-cost package <b>1130</b>.
0080At <b>1240</b>, a method embodiment includes assembling the apparatus to a computer system. In a non-limiting example embodiment, the computer system depicted in <figref idref="DRAWINGS">FIG. 13</figref> has functionalities of an antenna element such as any disclosed PAA and their art-recognized equivalents in connection with this disclosure.
0081At <b>1250</b>, a method embodiment includes operating a remote device through a TSV RFIC and PAA apparatus. In an embodiment, a remote device <b>1384</b> is operated by an apparatus embodiment by use of PAA elements <b>1382</b>.
0082<figref idref="DRAWINGS">FIG. 13</figref> is a schematic of a computer system according to an embodiment.
0083The computer system <b>1300</b> (also referred to as the electronic system <b>1300</b>) as depicted can embody an apparatus that includes a TSV RFIC mated to a PAA substrate according to any of the several disclosed embodiments and their equivalents as set forth in this disclosure. An apparatus that includes a TSV RFIC mated to a PAA substrate is assembled to a computer system. The computer system <b>1300</b> may be a mobile device such as a netbook computer. The computer system <b>1300</b> may be a mobile device such as a wireless smart phone. The computer system <b>1300</b> may be a desktop computer. The computer system <b>1300</b> may be a hand-held reader. The computer system <b>1300</b> may be integral to an automobile. The computer system <b>1300</b> may be integral to a television. The computer system <b>1300</b> may be integral to a dvd player. The computer system <b>1300</b> may be integral to a digital camcorder.
0084In an embodiment, the electronic system <b>1300</b> is a computer system that includes a system bus <b>1320</b> to electrically couple the various components of the electronic system <b>1300</b>. The system bus <b>1320</b> is a single bus or any combination of busses according to various embodiments. The electronic system <b>1300</b> includes a voltage source <b>1330</b> that provides power to the integrated circuit <b>1310</b>. In some embodiments, the voltage source <b>1330</b> supplies current to the integrated circuit <b>1310</b> through the system bus <b>1320</b>.
0085The integrated circuit <b>1310</b> is electrically coupled to the system bus <b>1320</b> and includes any circuit, or combination of circuits according to an embodiment. In an embodiment, the integrated circuit <b>1310</b> includes a processor <b>1312</b> that can be of any type of an apparatus that includes a TSV RFIC mated to a PAA substrate embodiment. As used herein, the processor <b>1312</b> may mean any type of circuit such as, but not limited to, a microprocessor, a microcontroller, a graphics processor, a digital signal processor, or another processor. In an embodiment, the processor <b>1312</b> is the BBUL embedded TSV RFIC die disclosed herein. In an embodiment, SRAM embodiments are found in memory caches of the processor. Other types of circuits that can be included in the integrated circuit <b>1310</b> are a custom circuit or an application-specific integrated circuit (ASIC), such as a communications circuit <b>1314</b> for use in wireless devices such as cellular telephones, smart phones, pagers, portable computers, two-way radios, and similar electronic systems. In an embodiment, the processor <b>1310</b> includes on-die memory <b>1316</b> such as static random-access memory (SRAM). In an embodiment, the processor <b>1310</b> includes embedded on-die memory <b>1316</b> such as embedded dynamic random-access memory (eDRAM).
0086In an embodiment, the integrated circuit <b>1310</b> is complemented with a subsequent integrated circuit <b>1311</b> such as a graphics processor or a radio-frequency integrated circuit or both as set forth in this disclosure. In an embodiment, the dual integrated circuit <b>1310</b> includes embedded on-die memory <b>1317</b> such as eDRAM. The dual integrated circuit <b>1311</b> includes an RFIC dual processor <b>1313</b> and a dual communications circuit <b>1315</b> and dual on-die memory <b>1317</b> such as SRAM. In an embodiment, the dual communications circuit <b>1315</b> is particularly configured for RF processing.
0087In an embodiment, at least one passive device <b>1380</b> is coupled to the subsequent integrated circuit <b>1311</b> such that the integrated circuit <b>1311</b> and the at least one passive device are part of the any apparatus embodiment that includes a TSV RFIC mated to a PAA substrate that includes the integrated circuit <b>1310</b> and the integrated circuit <b>1311</b>.
0088In an embodiment, the electronic system <b>1300</b> includes an antenna element <b>1382</b> such as any PAA embodiment set forth in this disclosure. By use of the antenna element <b>1382</b> such as any PAA embodiment set forth in this disclosure, a remote device <b>1384</b> such as a television, may be operated remotely through a wireless link by an apparatus embodiment. For example, an application on a smart telephone that operates through a TSV RFIC and PAA substrate broadcasts instructions through a wireless link to a television up to about 30 meters distant such as by Bluetooth® technology.
0089In an embodiment, the electronic system <b>1300</b> also includes an external memory <b>1340</b> that in turn may include one or more memory elements suitable to the particular application, such as a main memory <b>1342</b> in the form of RAM, one or more hard drives <b>1344</b>, and/or one or more drives that handle removable media <b>1346</b>, such as diskettes, compact disks (CDs), digital variable disks (DVDs), flash memory drives, and other removable media known in the art. The external memory <b>1340</b> may also be embedded memory <b>1348</b> such an apparatus that includes a TSV RFIC mated to a PAA substrate according to any disclosed embodiment.
0090In an embodiment, the electronic system <b>1300</b> also includes a display device <b>1350</b>, and an audio output <b>1360</b>. In an embodiment, the electronic system <b>1300</b> includes an input device such as a controller <b>1370</b> that may be a keyboard, mouse, touch pad, keypad, trackball, game controller, microphone, voice-recognition device, or any other input device that inputs information into the electronic system <b>1300</b>. In an embodiment, an input device <b>1370</b> includes a camera. In an embodiment, an input device <b>1370</b> includes a digital sound recorder. In an embodiment, an input device <b>1370</b> includes a camera and a digital sound recorder.
0091A foundation substrate <b>1390</b> may be part of the computing system <b>1300</b>. In an embodiment, the foundation substrate <b>1390</b> is a motherboard that supports an apparatus that includes a TSV RFIC mated to a PAA substrate. It may be understood that a secondary low-cost package may be part of the computer system <b>1300</b> as well as a motherboard onto which the secondary low-cost package is assembled. In an embodiment, the foundation substrate <b>1390</b> is a board which supports an apparatus that includes a TSV RFIC mated to a PAA substrate. In an embodiment, the foundation substrate <b>1390</b> incorporates at least one of the functionalities encompassed within the dashed line <b>1390</b> and is a substrate such as the user shell of a wireless communicator.
0092As shown herein, the integrated circuit <b>1310</b> can be implemented in a number of different embodiments, an apparatus that includes a TSV RFIC mated to a PAA substrate according to any of the several disclosed embodiments and their equivalents, an electronic system, a computer system, one or more methods of fabricating an integrated circuit, and one or more methods of fabricating and assembling an apparatus that includes a TSV RFIC mated to a PAA substrate according to any of the several disclosed embodiments as set forth herein in the various embodiments and their art-recognized equivalents. The elements, materials, geometries, dimensions, and sequence of operations can all be varied to suit particular I/O coupling requirements including a semiconductive substrate that is metalized with at least one self-formed, self-aligned barrier embodiments and their equivalents.
0093Although a die may refer to a processor chip, an RF chip, an RFIC chip, IPD chip, or a memory chip may be mentioned in the same sentence, but it should not be construed that they are equivalent structures. Reference throughout this disclosure to “one embodiment” or “an embodiment” means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. The appearance of the phrases “in one embodiment” or “in an embodiment” in various places throughout this disclosure are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
0094Terms such as “upper” and “lower” “above” and “below” may be understood by reference to the illustrated X-Z coordinates, and terms such as “adjacent” may be understood by reference to X-Y coordinates or to non-Z coordinates.
0095The Abstract is provided to comply with 37 C.F.R. §1.72(b) requiring an abstract that will allow the reader to quickly ascertain the nature and gist of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
0096In the foregoing Detailed Description, various features are grouped together in a single embodiment for the purpose of streamlining the disclosure. This method of disclosure is not to be interpreted as reflecting an intention that the claimed embodiments of the invention require more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive subject matter lies in less than all features of a single disclosed embodiment. Thus the following claims are hereby incorporated into the Detailed Description, with each claim standing on its own as a separate preferred embodiment.
0097It will be readily understood to those skilled in the art that various other changes in the details, material, and arrangements of the parts and method stages which have been described and illustrated in order to explain the nature of this invention may be made without departing from the principles and scope of the invention as expressed in the subjoined claims.
Contents2
10 sheets
Sheet 1 Sheet 2 Sheet 3 Sheet 4 Sheet 5 Sheet 6 Sheet 7 Sheet 8 Sheet 9 Sheet 10
Every citation, both waysCites: the store holds 3 of 4
| Document | Relation | Office | Cited during |
|---|---|---|---|
| EP3050098B1 | Cited by | European Patent Office (EPO) | Examiner |
| US9543276B2 | Cited by | United States of America | Applicant |
| CN103887186A | Cited by | China | Search report |
| US2019191597A1 | Cited by | United States of America | Search report |
| JP2016528735A | Cited by | Japan | Search report |
| US10157900B2 | Cited by | United States of America | Applicant |
| US2012280380A1 | Cited by | United States of America | Pre-grant |
| US10950561B2 | Cited by | United States of America | Applicant |
| US2018164365A1 | Cited by | United States of America | Search report |
| US10615133B2 | Cited by | United States of America | Search report |
| US2015108656A1 | Cited by | United States of America | Pre-grant |
| US10905037B2 | Cited by | United States of America | Search report |
| JP2016528735A | Cited by | Japan | Search report |
| US9419339B2 | Cited by | United States of America | Applicant |
| US2018164365A1 | Cited by | United States of America | Search report |
| US2015380343A1 | Cited by | United States of America | Pre-grant |
| US2017229769A1 | Cited by | United States of America | Search report |
| US2013050016A1 | Cited by | United States of America | Pre-grant |
| US10868366B2 | Cited by | United States of America | Applicant |
| US8901688B2 | Cited by | United States of America | Search report |
| US10594356B1 | Cited by | United States of America | Applicant |
| JP2016528735A | Cited by | Japan | Search report |
| US10411752B1 | Cited by | United States of America | Applicant |
| US10887439B2 | Cited by | United States of America | Search report |
| GB2510055A | Cited by | United Kingdom | Search report |
| US2016352023A1 | Cited by | United States of America | Pre-grant |
| GB2510055B | Cited by | United Kingdom | Search report |
| US10725090B2 | Cited by | United States of America | Search report |
| WO2015047330A1 | Cited by | World Intellectual Property Organization (WIPO) | Applicant |
| US9543373B2 | Cited by | United States of America | Search report |
| US10971825B2 | Cited by | United States of America | Search report |
| US10468763B2 | Cited by | United States of America | Search report |
| US10903548B2 | Cited by | United States of America | Applicant |
| US10840578B2 | Cited by | United States of America | Applicant |
| US10026666B2 | Cited by | United States of America | Search report |
| US2015108635A1 | Cited by | United States of America | Pre-grant |
| JP2016528735A | Cited by | Japan | Search report |
| CN110036533A | Cited by | China | Search report |
| US10103450B2 | Cited by | United States of America | Search report |
| US2011068433A1 | Cites | United States of America | Pre-grant |
| US2011148707A1 | Cites | United States of America | Pre-grant |
| US8149166B1 | Cites | United States of America | Pre-grant |
13 members in 6 offices
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| 201113101883 | United States of America | A | |
| US201113101883 | – | – | – |
Members13
| Document | Office | Kind | |
|---|---|---|---|
| US2012280860A1 | United States of America | A1 | |
| WO2012151003A2 | World Intellectual Property Organization (WIPO) | A2 | |
| TW201246502A | Taiwan Province of China | A | |
| WO2012151003A3 | World Intellectual Property Organization (WIPO) | A3 | |
| SG194737A1 | Singapore | A1 | |
| KR20140014259A | Republic of Korea | A | |
| CN103597593A | China | A | |
| US8816906B2 | United States of America | B2 | |
| US2014333480A1 | United States of America | A1 | |
| KR101561759B1 | Republic of Korea | B1 | |
| CN103597593B | China | B | |
| US9653805B2 | United States of America | B2 | |
| TWI619221B | Taiwan Province of China | B |
53 transactions on the USPTO file
Allowed after 2 non-final rejections.
- Non-final rejections
- 2
- Final rejections
- 0
- RCEs
- 0
- Appeals
- 0
Over time
Point at a mark for the transactionTransactions
| Event | Code | |
|---|---|---|
| Payment of Maintenance Fee, 4th Year, Large EntityM1551 | M1551 | |
| Recordation of Patent Grant MailedPGM/ | PGM/ | |
| Patent Issue Date Used in PTA CalculationAllowedPTAC | PTAC | |
| Email NotificationEML_NTR | EML_NTR | |
| Issue Notification MailedAllowedWPIR | WPIR | |
| Dispatch to FDCD1935 | D1935 | |
| Workflow - Drawings FinishedDRWF | DRWF | |
| Application Is Considered Ready for IssuePILS | PILS | |
| Email NotificationEML_NTR | EML_NTR | |
| Mail PUB other miscellaneous communication to applicantMM327-D | MM327-D | |
| PUB Other miscellaneous communication to applicantM327-D | M327-D | |
| Issue Fee Payment VerifiedN084 | N084 | |
| Issue Fee Payment ReceivedIFEE | IFEE | |
| Electronic ReviewELC_RVW | ELC_RVW | |
| Email NotificationEML_NTF | EML_NTF | |
| Mail Notice of AllowanceAllowedMN/=. | MN/=. | |
| Notice of Allowance Data Verification CompletedAllowedN/=. | N/=. | |
| Date Forwarded to ExaminerFWDX | FWDX | |
| Supplemental ResponseSA.. | SA.. | |
| Response after Non-Final ActionA... | A... | |
| Information Disclosure Statement consideredIDSC | IDSC | |
| Information Disclosure Statement (IDS) FiledM844 | M844 | |
| Information Disclosure Statement (IDS) FiledWIDS | WIDS | |
| Electronic ReviewELC_RVW | ELC_RVW | |
| Email NotificationEML_NTF | EML_NTF | |
| Mail Non-Final RejectionNon-final rejectionMCTNF | MCTNF | |
| Non-Final RejectionNon-final rejectionCTNF | CTNF | |
| Date Forwarded to ExaminerFWDX | FWDX | |
| Response after Non-Final ActionA... | A... | |
| Request for Extension of Time - GrantedXT/G | XT/G | |
| Information Disclosure Statement consideredIDSC | IDSC | |
| Reference capture on IDSRCAP | RCAP | |
| Information Disclosure Statement (IDS) FiledM844 | M844 | |
| Information Disclosure Statement (IDS) FiledWIDS | WIDS | |
| Mail Non-Final RejectionNon-final rejectionMCTNF | MCTNF | |
| Non-Final RejectionNon-final rejectionCTNF | CTNF | |
| PG-Pub Issue NotificationPG-ISSUE | PG-ISSUE | |
| Case Docketed to Examiner in GAUDOCK | DOCK | |
| Change in Power of Attorney (May Include Associate POA)PA.. | PA.. | |
| Correspondence Address ChangeC.AD | C.AD | |
| Case Docketed to Examiner in GAUDOCK | DOCK | |
| Transfer Inquiry to GAUTI1050 | TI1050 | |
| Transfer Inquiry to GAUTI1050 | TI1050 | |
| Transfer Inquiry to GAUTI1050 | TI1050 | |
| Transfer Inquiry to GAUTI1050 | TI1050 | |
| Application Dispatched from OIPEOIPE | OIPE | |
| Application Is Now CompleteCOMP | COMP | |
| Email NotificationEML_NTR | EML_NTR | |
| Filing ReceiptFLRCPT.O | FLRCPT.O | |
| Sent to Classification ContractorPGPC | PGPC | |
| Cleared by OIPE CSRL194 | L194 | |
| IFW Scan & PACR Auto Security ReviewSCAN | SCAN | |
| Initial Exam Team nnIEXX | IEXX |
5 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Maintenance fee paymentMAFP | MAFP | |
| Maintenance fee paymentMAFP | MAFP | |
| Information on status: patent grantGrantedPATENTED CASESTCF | STCF | |
| Fee payment procedurePAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITYFEPP | FEPP | |
| AssignmentAS | AS |
Numbers
- Publication
- 20120280860
- Publication, DOCDB
- 2012280860
- Publication, EPODOC
- US2012280860
- Application
- 13101883
- Application, DOCDB
- 201113101883
- Application, EPODOC
- US201113101883
Titles
- English
- CHIP PACKAGES INCLUDING THROUGH-SILICON VIA DICE WITH VERTICALLY INEGRATED PHASED-ARRAY ANTENNAS AND LOW-FREQUENCY AND POWER DELIVERY SUBSTRATES
Classification
- CPC, 21
- H01Q1/2283
- H01Q3/30
- H01Q9/0414
- H01Q21/065
- H01Q23/00
- H01L23/66
- H01L25/0657
- H01L25/16
- H01L25/18
- H01L2223/6677
- H01L2225/06517
- H01L2225/06513
- H01L2224/13025
- H01L2224/14181
- H01L2224/16145
- H01L2224/16225
- H01L2924/15321
- Y10T29/49018
- Y10T29/49004
- H01L2224/17181
- H01L2224/16235
- IPC, 3
- H01Q3 00
- H01P11 00
- H05K13 04
- USPC, 3
- 342368000
- 029593000
- 029601000