Nova Patents
NO970112L

Testing of memory content

Abstract

PCT No. PCT/GB95/01642 Sec. 371 Date Jan. 13, 1997 Sec. 102(e) Date Jan. 13, 1997 PCT Filed Jul. 12, 1995 PCT Pub. No. WO96/02917 PCT Pub. Date Feb. 1, 1996A method of testing a memory associated with a microprocessor, particularly for use in smart cards. The method involves comparing the output from the memory (2) passed along a read path (10) with predetermined data signals generated externally and passed via a port (7) along a read path (9). Comparison is carried out in a comparison device (3) which may, for example, be the microprocessor, suitably programmed. The output form the comparison device (3) is a simple pass/fail verification signal applied to a port (5). The stored data held in memory (2) may be permanently held data such as in a ROM, or (where the memory is alterable) may be specially written to the memory for the purpose of the text.

NO970112L, drawing sheet 1
Sheet 1 of 1

Term

No projected expiry on record.

  1. Priority
  2. Filed and published
  3. Today

8 paragraphs, as filed

(22) Entering day (24) Running day (41) Alm. avail.

<td> 970112 10.01.97</td><td>(86) Int. Entry day and social security number</td><td>12.07.95, PCT / GB95 / 01642</td>

<td> 12.07.95</td><td>(85) Continuation Day</td><td> 10.01.97</td>

<td> 10.01.97</td><td>(30) Priority</td><td>14.07.94, GB, 9414266</td>

(71) Seeking (72) Inventor (74) Proxy

National Westminister Bank plc, 41 Lothbury, London EC2P 2BP, England, GB Edward Patrick Keyes, Ottawa, ON, CA Oslo Patent Office AS, 0306 OSLO (54) Designation

Inventory Testing (57) Summary Procedure for testing a memory associated with a microprocessor, especially for smart card use. The method comprises comparing output from the memory (2) and passed along a read path (10), with predetermined data signals generated externally and passed through a port (7) along a read path (9). The comparison is performed in a comparison device (3) which may be, for example, a microprocessor with appropriate programming. The output of the comparator (3) constitutes a single correct / incorrect verification signal applied to a port (5). The stored data contained in the memory (2) may be permanently stored data, such as e.g. in a ROM, or (when the memory can be changed) can be read specifically to the memory for the purpose of the test.

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