Exposure apparatus, method for producing device, and method for controlling exposure apparatus
36 claims: 11 independent, 25 dependent
- 1投影光学系と液体とを介して基板を露光する露光装置であって、 前記投影光学系の像面側に液体を供給する供給口と、 前記供給口から供給された液体を回収する回収口と、 前記回収口から回収された気体と液体とを分離する分離器と、 前記回収口から回収された液体の量を計測する流量計と、を備える露光装置。
- 2前記流量計は、前記分離器の下流に配置されている請求項1に記載の露光装置。
- 3投影光学系と液体とを介して基板を露光する露光装置であって、 前記投影光学系の像面側に液体を供給する供給口と、 前記供給口から供給された液体を回収する回収口と、 前記回収口から回収された気体と液体とを分離する分離器と、 前記分離器の下流に配置された流量計と、を備える露光装置。
- 4前記流量計は、前記回収口と真空系との間に配置されている請求項1~3のいずれか一項に記載の露光装置。
- 5前記基板の上方から前記回収口を介して液体を回収しながら、前記基板の表面の液浸領域を形成し、前記液浸領域を介して前記基板を露光する請求項1~4のいずれか一項に記載の露光装置。
- 6前記基板を保持する基板ステージをさらに備え、前記基板ステージに形成された流路を介して液体を回収する請求項1~5のいずれか一項に記載の露光装置。
- 7前記基板ステージの前記流路を介して回収された液体と気体とを分離する別の分離器をさらに備える請求項6に記載の露光装置。
- 8前記基板ステージの前記流路を介して回収された液体の量を計測する別の流量計をさらに備える請求項7に記載の露光装置。
- 9前記別の流量計は、前記別の分離器の下流に配置されている請求項8記載の露光装置。
- 10前記基板ステージの前記流路を介して回収された液体の量を計測する別の流量計をさらに備える請求項6に記載の露光装置。
- 11前記別の流量計は、前記基板ステージの前記流路と真空系との間に配置されている請求項8~10のいずれか一項に記載の露光装置。
- 12前記基板ステージの前記流路を介して回収される液体は、前記基板ステージの上面と前記基板ステージに保持された前記基板の表面との間のギャップから流入した液体を含む請求項6~11のいずれか一項記載の露光装置。
- 13前記基板ステージには、液体を回収する別の回収口が設けられ、 前記基板ステージの前記流路を介して回収される液体は、前記基板ステージに設けられた前記回収口からの液体を含む請求項6~11のいずれか一項記載の露光装置。
- 14前記基板ステージは、前記供給口と前記回収口の下方で、前記供給口と前記回収口に対して移動可能であり、 前記供給口から供給された液体の一部は、前記基板ステージの上方から前記回収口を介して回収され、 前記供給口から供給された液体の他の一部は、前記基板ステージに設けられた前記流路を介して回収される請求項6~13のいずれか一項に記載の露光装置。
- 15前記基板を保持する基板ステージをさらに備え、 前記基板ステージには、前記回収口が設けられている請求項1~5記載の露光装置。
- 16前記基板ステージは、前記供給口の下方で、前記供給口に対して移動可能であり、 前記供給口から供給された液体の一部は、前記基板ステージに設けられた前記回収口から回収される請求項15記載の露光装置。
- 17投影光学系と液体とを介して基板を露光する露光装置であって、 前記投影光学系の像面側に液体を供給する供給口と、 前記供給口から供給された液体を回収する回収口と、 前記基板を保持する基板ステージと、 前記基板ステージに形成された流路を介して回収された液体の量を計測する流量計と、 を備える露光装置。
- 18前記基板ステージの前記流路を介して回収された液体と気体とを分離する分離器をさらに備える請求項17に記載の露光装置。
- 19前記流量計は、前記分離器で分離された液体の量を計測する請求項18に記載の露光装置。
- 20前記基板ステージは、前記供給口と前記回収口の下方で、前記供給口と前記回収口に対して移動可能であり、 前記供給口からの液体供給と前記回収口からの気体回収を行いつつ、前記基板上の一部に液浸領域を形成し、 前記液浸領域の液体を介して前記基板を露光する請求項17~19のいずれか一項に記載の露光装置。
- 21投影光学系と液体とを介して基板を露光する露光装置であって、 前記投影光学系の像面側に液体を供給する供給口と、 前記供給口から供給された液体を回収する回収口と、 前記基板を保持する基板ステージと、 前記回収口に接続された流量計と、を備え、 前記回収口が、前記基板ステージに設けられている露光装置。
- 22前記基板ステージは、前記供給口の下方で、前記供給口に対して移動可能であり、 前記供給口から供給された液体の一部は、前記基板ステージに設けられた前記回収口から回収される請求項21記載の露光装置。
- 23前記供給口から供給される液体の量を計測する流量計をさらに備える請求項1~21のいずれか一項記載の露光装置。
- 24請求項1~23のいずれか一項に記載の露光装置を用いて基板を露光することを含むデバイス製造方法。
- 25投影光学系と液体とを介して基板を露光する露光方法であって、 前記投影光学系の像面側に供給口から液体を供給するとともに、前記供給口から供給された液体を回収口から回収することにより、前記基板の一部に液浸領域を形成することと、 前記液浸領域の液体を介して前記基板に露光光を照射することと、 前記回収口から回収された液体と気体とを分離することと、 前記分離された液体の量を計測することと、 を含む露光方法。
- 26前記基板を保持する基板ステージに形成された流路を介して液体を回収することをさらに含む請求項25に記載の露光方法。
- 27前記基板ステージの前記流路を介して回収された液体の量を計測することをさらに含む請求項26に記載の露光方法。
- 28投影光学系と液体とを介して基板を露光する露光方法であって、 前記投影光学系の像面側に供給口から液体を供給するとともに、前記供給口から供給された液体を回収口から回収することにより、前記基板の一部に液浸領域を形成することと、 前記液浸領域の液体を介して前記基板に露光光を照射することと、 前記基板が保持された基板ステージの流路を介して回収された液体の量を計測することと、 を含む露光方法。
- 29前記基板ステージの前記流路を介して回収された液体と気体とを分離することをさらに含む請求項27または28に記載の露光方法。
- 30前記基板ステージの前記流路を介して回収された液体の量の計測は、前記分離された液体の量の計測である請求項29記載の露光方法。
- 31前記基板ステージの前記流路を介して回収された液体と気体とを分離することをさらに含む請求項26に記載の露光方法。
- 32前記基板ステージの前記流路を介して回収される液体は、前記基板ステージの上面と前記基板ステージに保持された前記基板の表面との間のギャップから流入した液体を含む請求項26~31のいずれか一項に記載の露光方法。
- 33前記基板ステージは、前記供給口と前記回収口の下方で、前記供給口と前記回収口に対して移動可能であり、 前記供給口から供給された液体の他の一部は、前記基板ステージに設けられた前記流路を介して回収される請求項26~32のいずれか一項記載の露光方法。
- 34前記基板ステージの前記流路を介して回収される液体は、前記基板ステージに設けられた別の回収口からの液体を含む請求項26~33のいずれか一項記載の露光方法。
- 35前記供給口から供給される液体の量を計測することをさらに含む請求項25~34のいずれか一項に記載の露光方法。
- 36請求項25~35のいずれか一項に記載の露光方法を用いて基板を露光することを含むデバイス製造方法。
Independent claims36
156 paragraphs, as filed
0001The present invention relates to an exposure apparatus that exposes a substrate via a projection optical system and a liquid, a device manufacturing method using the exposure apparatus, and a control method of the exposure apparatus.
0002Semiconductor devices and liquid crystal display devices are manufactured by a so-called photolithography method in which a pattern formed on a mask is transferred onto a photosensitive substrate. The exposure apparatus used in this photolithography process has a mask stage that supports the mask and a substrate stage that supports the substrate, and the mask pattern is projected via the projection optical system while sequentially moving the mask stage and the substrate stage. It is transferred to the substrate. In recent years, it has been desired to further increase the resolution of the projection optical system in order to cope with the higher integration of device patterns. The resolution of the projection optical system increases as the exposure wavelength used becomes shorter and the numerical aperture of the projection optical system increases. Therefore, the exposure wavelength used in the exposure apparatus is shortened year by year, and the numerical aperture of the projection optical system is also increasing. Currently, the mainstream exposure wavelength is 248 nm for KrF excimer lasers, but 193 nm for shorter wavelength ArF excimer lasers is also being put into practical use. In addition, the depth of focus (DOF) is as important as the resolution when performing exposure. The resolution R and the depth of focus δ are expressed by the following equations, respectively.
0003R = k<sub>1</sub> Λ / NA ... (1) δ = ± k<sub>2</sub> Λ / NA<sup>2</sup> ... (2) Here, λ is the exposure wavelength, NA is the numerical aperture of the projection optical system, and k<sub>1</sub>, K<sub>2</sub>Is the process factor. From Eqs. (1) and (2), it can be seen that the depth of focus δ becomes narrower when the exposure wavelength λ is shortened and the numerical aperture NA is increased in order to increase the resolution R.
0004If the depth of focus δ is too narrow, it becomes difficult to match the surface of the substrate with the image plane of the projection optical system, and the focus margin during the exposure operation may be insufficient. Therefore, as a method of substantially shortening the exposure wavelength and widening the depth of focus, for example, the immersion method disclosed in Pamphlet No. 99/49504 of International Publication No. 99/49504 has been proposed. In this immersion method, the space between the lower surface of the projection optical system and the surface of the substrate is filled with a liquid such as water or an organic solvent to form an immersion region, and the wavelength of the exposure light in the liquid is 1 / n in the air. (N is the refractive index of the liquid, which is usually about 1.2 to 1.6) to improve the resolution and expand the depth of focus by about n times.
<p num="0005"><patcit num="1"><text>International Publication No. 99/49 504 Pamphlet</text></patcit></p>
<p num="0006"> By the way, in an immersion exposure apparatus, if a liquid for exposure leaks or infiltrates, the liquid may cause inconveniences such as failure of the apparatus / member, electric leakage or rust. In addition, this makes it impossible to perform the exposure process satisfactorily.</p><p num="0007"> The present invention has been made in view of such circumstances, and an object of the present invention is to provide an exposure apparatus and a device manufacturing method capable of performing good exposure processing even when the immersion method is used, and a method for controlling the exposure apparatus. To do. Another object of the present invention is to provide an exposure apparatus and a device manufacturing method capable of performing an exposure process satisfactorily by suppressing the influence of leakage or infiltration of an exposure liquid, and a control method of the exposure apparatus.</p>
<p num="0008"> In order to solve the above problems, the present invention employs the following configurations associated with FIGS. 1 to 24 shown in the embodiments. However, the parenthesized symbols attached to each element are merely examples of the elements, and do not limit each element.</p><p num="0009"> According to the first aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with exposure light (EL) via a liquid (1) to expose the substrate (P): With a projection optical system (PL) that projects a pattern image onto a substrate (P); It is equipped with a liquid supply mechanism (10) that supplies the liquid (1) between the projection optical system (PL) and the substrate (P); The liquid supply mechanism (10) is provided with an exposure apparatus (EX) that stops the supply of the liquid (1) when an abnormality is detected.</p><p num="0010"> According to the first aspect of the present invention, when an abnormality is detected, the supply of the liquid by the liquid supply mechanism is stopped, so that it is possible to prevent the liquid from leaking or invading, or to prevent the damage from spreading thereof. .. Therefore, it is possible to prevent the occurrence of inconveniences such as failure and rust of peripheral devices / members due to the liquid, and fluctuations in the environment in which the substrate is placed, or to reduce the influence of such inconveniences.</p><p num="0011"> According to the second aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with exposure light (EL) via a liquid (1) to expose the substrate (P): With a projection optical system (PL) that projects a pattern image onto a substrate (P) via a liquid (1); Equipped with electrical equipment (47, 48); In order to prevent electric leakage due to the adhesion of the liquid (1), an exposure apparatus (EX) for stopping the power supply to the electric equipment (47, 48) when an abnormality is detected is provided.</p><p num="0012"> According to the second aspect of the present invention, when an abnormality is detected, the power supply to the electric device is stopped to prevent the electric leakage due to the adhesion of the liquid, so that the peripheral device due to the electric leakage is prevented. It is possible to suppress the occurrence of inconveniences such as the influence on the electric power and the failure of the electric device itself, or to reduce the damage caused by it.</p><p num="0013"> According to the third aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with an exposure light (EL) through a liquid (1) to expose the substrate (P): With a projection optical system (PL) that projects a pattern image onto a substrate (P) via a liquid (1); Equipped with an intake port (42A, 66) distributed to the suction system (25); In order to prevent the inflow of the liquid (1), an exposure apparatus (EX) for stopping the intake from the intake port (42A, 66) when an abnormality is detected is provided.</p><p num="0014"> The exposure device includes various intake ports such as an intake port of an air bearing (gas bearing) for non-contact supporting the stage device with respect to a guide surface, a mask, and an intake port of a holder device for sucking and holding a substrate. However, if liquid flows into those intake ports, it causes a failure of the vacuum system (suction system) such as the vacuum pump that flows with those intake ports. According to the third aspect of the present invention, when an abnormality is detected, the intake air from the intake port is stopped, so that it is possible to prevent the inconvenience that the liquid flows into the vacuum system through the intake port. it can. In the first to third aspects of the present invention, the phrase "abnormality is detected" means that a situation that adversely affects the exposure of the substrate through the liquid, that is, the immersion exposure is detected. However, not only the abnormality related to the flow of liquid but also the abnormality related to the operation of the stage that holds and moves the substrate was detected, and the abnormality in the related equipment connected to the exposure apparatus was detected. It is a concept that also includes things. For example, it includes the case where an abnormal signal (alarm) is detected in a liquid manufacturing apparatus that manufactures a liquid to be supplied to the exposure apparatus as a related apparatus.</p><p num="0015"> According to the fourth aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with an exposure light (EL) through a liquid (1) to expose the substrate (P): With a projection optical system (PL) that projects a pattern image onto a substrate (P) via a liquid (1); With suction ports (21, 61, 66) distributed to the suction system (25, 70, 74); With a separator (22, 71, 75) that separates the liquid (1) and gas sucked from the suction port (21, 61, 66); An exposure apparatus (EX) is provided with a dryer (23, 72, 76) that dries the gas separated by the separator (22, 71, 75).</p><p num="0016"> For example, when a liquid is sucked from a liquid suction port (recovery port) of a liquid recovery mechanism using a vacuum system, if the recovered liquid component flows into the vacuum system (suction system), the vacuum system may be damaged. According to the fourth aspect of the present invention, the liquid and the gas sucked from the suction port are gas-liquid separated by a separator, and the gas separated by the separator is further dried by a dryer to obtain a vacuum system. The inconvenience of inflow of liquid components (including moist gas) can be prevented. Therefore, it is possible to maintain good liquid recovery operation by the liquid recovery mechanism for a long period of time while preventing the occurrence of inconveniences such as failure of the vacuum system (suction system), and the liquid due to the inability to recover the liquid by the liquid recovery mechanism. Leakage can be prevented.</p><p num="0017"> According to the fifth aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with exposure light (EL) via a liquid (1) to expose the substrate (P): A substrate stage (PST) that holds and moves a substrate (P) and has a first region (LA1) on it; A projection optical system (PL) that projects a pattern image onto a substrate (P) via a liquid (1), including a tip portion (2a) on the image plane side, and faces the first region (LA1). With projection optics (PL) having a second region (LA2) that holds the liquid (1) between it and at least a portion of the region (LA1); An exposure apparatus (EX) including a control device (CONT) that limits the movement of the substrate stage (PST) according to the positional relationship between the first region (LA1) and the second region (LA2) is provided.</p><p num="0018"> According to the fifth aspect of the present invention, in the case of the configuration in which the liquid is held between the first region and the second region, for example, there is no positional relationship in which the liquid cannot be held between the first region and the second region. By restricting the movement of the substrate stage in this way, inconveniences such as liquid leakage can be prevented.</p><p num="0019"> According to the sixth aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with exposure light (EL) via a liquid (1) to expose the substrate (P): With a projection optical system (PL) that projects a pattern image onto a substrate (P) via a liquid (1); With a movable board stage (PST) that holds the board (P); With a base member (41) that movably supports the board stage (PST); With the first detector (80C) installed on the board stage (PST) to detect the liquid (1); With the second detector (80D) provided on the base member (41) to detect the liquid (1); An exposure apparatus (EX) including a control apparatus (CONT) for controlling the operation of the exposure apparatus according to the detection results of the first detector (80C) and the second detector (80D) is provided.</p><p num="0020"> According to the sixth aspect of the present invention, the operation of the exposure apparatus is controlled according to the detection results of the first detector and the second detector provided at different positions from each other, so that the leaked liquid Appropriate measures can be taken according to the diffusion range. Therefore, it is possible to shorten the time required for the recovery work after the liquid leakage occurs, and it is possible to prevent a decrease in the operating rate of the exposure apparatus. For example, when the first detector provided on the substrate stage detects the presence of liquid, the control device determines that the diffusion range of the leaked liquid is a relatively narrow range, and supplies the liquid by, for example, the liquid supply mechanism. Take appropriate measures according to the range, such as stopping. By doing so, the time required for the return work can be minimized. On the other hand, when the second detector provided on the base member detects the presence of liquid, it is determined that the diffusion range of the leaked liquid is a relatively wide area, and the control device drives, for example, the substrate stage. Stop the power supply to the equipment and other electrical equipment. By doing so, even if the leaked liquid diffuses over a wide range, it is possible to prevent damage such as electric leakage or failure of the electric device.</p><p num="0021"> According to the seventh aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with exposure light (EL) via a liquid (1) to expose the substrate (P): With a projection optical system (PL) that projects a pattern image onto a substrate (P) via a liquid (1); With the liquid supply mechanism (10) that supplies the liquid (1) between the projection optical system (PL) and the substrate (P); With a movable board stage (PST) that holds the board (P); While the liquid supply mechanism (10) is supplying the liquid (1), the movement range of the substrate stage (PST) is limited to the first range (SR1), and the liquid supply mechanism (10) is the liquid (1). An exposure apparatus (CONT) equipped with a control device (CONT) that limits the movement range of the substrate stage (PST) to a second range (SR2) wider than the first range (SR1) while the supply of the substrate stage (PST) is stopped. EX) is provided.</p><p num="0022"> According to a seventh aspect of the present invention, while the liquid supply mechanism is supplying the liquid, the range of movement of the substrate stage is limited to, for example, a first range in which the liquid can be held on the substrate stage. , Inconvenience such as liquid leakage can be prevented. On the other hand, while the liquid supply mechanism is stopping the supply of liquid, the moving range of the substrate stage is set to the second range wider than the first range, so that the substrate stage can be moved to the substrate replacement position. A predetermined operation related to the stage can be smoothly performed.</p><p num="0023"> According to the eighth aspect of the present invention, it is an exposure apparatus that irradiates a substrate (P) with exposure light (EL) via a liquid (1) to expose the substrate (P): With the projection optical system that projects the pattern image on the substrate (P) and (PL); With the liquid supply mechanism (10) that supplies the liquid (1) to the image plane side of the projection optical system (PL); With a movable stage (PST) on the image plane side of the projection optical system (PL); Equipped with a control device (CONT) that controls the range of movement of the stage (PST); When the control device (CONT) holds the liquid (1) between the projection optical system (PL) and the stage (PST), the movement range of the stage (PST) is defined as the projection optical system (PL). An exposure device (EX) is provided that limits the movement range of the stage (PST) to a range narrower than the range of movement of the stage (PST) when the liquid (1) is not held between it and the stage (PST).</p><p num="0024"> According to the eighth aspect of the present invention, for example, during the exposure of the substrate on the stage, it is possible to keep the liquid well held between the projection optical system and the stage, and between the projection optical system and the stage. When the liquid is not held in the optical system, other operations such as substrate replacement can be smoothly performed.</p><p num="0025"> According to the ninth aspect of the present invention, there is provided a device manufacturing method characterized by using the exposure apparatus (EX) of the above aspect.</p><p num="0026"> According to the ninth aspect of the present invention, when an abnormality is detected, the driving of a predetermined device is stopped, so that inconveniences such as device failure can be prevented and the device can be manufactured in a good device environment. It can be performed.</p><p num="0027"> According to the tenth aspect of the present invention, it is a control method of an exposure apparatus (EX) that irradiates a substrate (P) with exposure light (EL) via a liquid (1) to expose the substrate (P). , The projection optical system (PL) that projects the pattern image on the substrate (P), the liquid supply mechanism (10) that supplies the liquid (1) to the image plane side of the projection optical system (PL), and the electric energy drive. A method of controlling an exposure device that is composed of components of an exposure device including a device that uses force (47, 48) and a device that has a function of sucking gas (42, PH) and is connected to an external related device: Supplying liquid (1) to the image plane side of the projection optical system (PL); Receiving an anomaly signal from at least one of the components and external related equipment; Based on the signal, limiting the operation of at least one of the liquid supply mechanism (10), the device using electric energy as the driving force (47, 48), and the device having the function of sucking gas (42, PH). A method of controlling an exposure apparatus (EX) including is provided.</p><p num="0028"> According to the tenth aspect of the present invention, when an abnormality occurs in the related device inside the exposure device or outside the exposure device and the abnormality is a signal indicating an abnormality that affects the exposure of the substrate or the like, the liquid is used. Leakage caused by limiting at least one type of operation of the supply mechanism (10), electrical energy driven equipment (47, 48) and gas suction function equipment (42, PH). It is possible to prevent electric leakage and suction of liquid by the suction device.</p>
<p num="0029"> According to the present invention, an abnormality in an internal device or an external related device of an exposure apparatus that affects immersion exposure is detected, and the influence on peripheral devices / members and exposure operation due to leakage or penetration of liquid for exposure is exerted. Since it can be suppressed or reduced, it is possible to maintain a good state of an expensive exposure apparatus and perform an accurate immersion exposure process. This makes it possible to manufacture a device having desired performance.</p>
0030<figref num="1">It is a schematic block diagram which shows 1st Embodiment of the exposure apparatus of this invention.</figref><figref num="2">It is a perspective view which shows the substrate stage.</figref><figref num="3">It is a schematic block diagram which shows the vicinity of the tip part of the projection optical system, the liquid supply mechanism, and the liquid recovery mechanism.</figref><figref num="4">It is a top view which shows the positional relationship between the projection area of a projection optical system, a liquid supply mechanism, and a liquid recovery mechanism.</figref><figref num="5">It is sectional drawing for demonstrating the recovery device provided in the substrate stage.</figref><figref num="6">It is a schematic diagram for demonstrating the detector provided with the optical fiber which concerns on 2nd Embodiment of the exposure apparatus of this invention.</figref><figref num="7">It is a schematic diagram for demonstrating the detector provided with the optical fiber which concerns on 2nd Embodiment of the exposure apparatus of this invention.</figref><figref num="8">It is a side view which shows the arrangement example of the detector provided with an optical fiber.</figref><figref num="9">It is a top view of FIG.</figref><figref num="10">It is a side view which shows the other arrangement example of the detector provided with an optical fiber.</figref><figref num="11">FIG. 5 is a plan view showing another embodiment of a detector including an optical fiber.</figref><figref num="12">It is a perspective view which shows the other arrangement example of the detector provided with an optical fiber.</figref><figref num="13">FIG. 5 is a plan view showing another embodiment of a detector including an optical fiber.</figref><figref num="14">It is a schematic diagram for demonstrating the detector provided with the prism which concerns on 3rd Embodiment of the exposure apparatus of this invention.</figref><figref num="15">It is a schematic diagram for demonstrating the detector provided with the prism which concerns on 3rd Embodiment of the exposure apparatus of this invention.</figref><figref num="16">It is a top view which shows the arrangement example of the detector provided with a prism.</figref><figref num="17">It is a figure which shows the other use example of the detector provided with a prism.</figref><figref num="18">It is a top view which shows the other arrangement example of the detector provided with a prism.</figref><figref num="19">It is a figure which shows the other embodiment of the detector provided with the optical fiber.</figref><figref num="20">It is a figure for demonstrating another embodiment of this invention.</figref><figref num="21">It is a figure for demonstrating another embodiment of this invention.</figref><figref num="22">It is a flowchart which shows an example of the manufacturing process of a semiconductor device.</figref><figref num="23">It is a block diagram which shows the connection relationship between the control device and the related device outside the exposure apparatus which the control apparatus controls based on the detection signal from the various detectors of the exposure apparatus of this invention, and the various devices inside the exposure apparatus.</figref><figref num="24">It is a flowchart which shows the control content of the control device of the exposure apparatus of this invention.</figref>
0031Hereinafter, embodiments of the exposure apparatus of the present invention will be described with reference to the drawings, but the present invention is not limited thereto.
0032<First Embodiment> FIG. 1 is a schematic configuration diagram showing a first embodiment of the exposure apparatus of the present invention. In FIG. 1, the exposure apparatus EX is an illumination optical system IL that illuminates the mask stage MST that supports the mask M, the substrate stage PST that supports the substrate P, and the mask M that is supported by the mask stage MST with the exposure light EL. And the projection optical system PL that projects and exposes the pattern image of the mask M illuminated by the exposure light EL onto the substrate P supported by the substrate stage PST, and the control device CONT that controls the operation of the entire exposure device EX. I have. An alarm device K that issues an alarm when an abnormality occurs in the exposure process is connected to the control device CONT. Further, the exposure apparatus EX includes a main column 3 that supports the mask stage MST and the projection optical system PL. The main column 3 is installed on a base plate 4 placed horizontally on the floor. The main column 3 is formed with an upper step portion 3A and a lower step portion 3B protruding inward. As shown in FIG. 23, the control device is connected to various components constituting the exposure device and related devices outside the exposure device, and the control contents of the control device will be described later.
0033The exposure apparatus EX of the present embodiment is an immersion exposure apparatus to which an immersion method is applied in order to substantially shorten the exposure wavelength to improve the resolution and substantially increase the depth of focus, and is on the substrate P. A liquid supply mechanism 10 for supplying the liquid 1 to the substrate P and a liquid recovery mechanism 20 for recovering the liquid 1 on the substrate P are provided. While at least the pattern image of the mask M is transferred onto the substrate P, the exposure apparatus EX receives the liquid 1 supplied from the liquid supply mechanism 10 onto a part of the substrate P including the projection region AR1 of the projection optical system PL. The immersion region AR2, which is larger than the projection region AR1 and smaller than the substrate P, is locally formed. Specifically, the exposure apparatus EX fills the liquid 1 between the optical element 2 at the tip (termination) of the projection optical system PL and the surface of the substrate P, and between the projection optical system PL and the substrate P. The substrate P is exposed by projecting a pattern image of the mask M onto the substrate P via the liquid 1 of the above and the projection optical system PL.
0034In the present embodiment, as the exposure apparatus EX, a scanning exposure apparatus (so-called so-called) that exposes the pattern formed on the mask M to the substrate P while synchronously moving the mask M and the substrate P in different directions (opposite directions) in the scanning direction. The case of using a scanning stepper) will be described as an example. In the following description, the direction that coincides with the optical axis AX of the projection optical system PL is the Z-axis direction, and the synchronous movement direction (scanning direction) between the mask M and the substrate P in the plane perpendicular to the Z-axis direction is the X-axis direction. The direction perpendicular to the Z-axis direction and the X-axis direction (non-scanning direction) is defined as the Y-axis direction. Further, the rotation (tilt) directions around the X-axis, Y-axis, and Z-axis are the θX, θY, and θZ directions, respectively. The "substrate" here includes a semiconductor wafer coated with a photoresist as a photosensitive material, and the "mask" includes a reticle on which a device pattern is reduced and projected onto the substrate.
0035The illumination optical system IL is supported by a support column 5 fixed to the upper part of the main column 3. The illumination optical system IL illuminates the mask M supported by the mask stage MST with the exposure light EL, and is an optical integrator and an optical integrator that equalize the illuminance of the exposure light source and the light beam emitted from the exposure light source. It has a condenser lens that collects the exposure light EL from the light source, a relay lens system, and a variable field aperture that sets the illumination area on the mask M by the exposure light EL in a slit shape. A predetermined illumination region on the mask M is illuminated by the illumination optical system IL with an exposure light EL having a uniform illuminance distribution. The exposure light EL emitted from the illumination optical system IL includes, for example, far-ultraviolet light (g-line, h-line, i-line) emitted from a mercury lamp and far-ultraviolet light (wavelength 248 nm) such as KrF excimer laser light (wavelength 248 nm). DUV light), vacuum ultraviolet light (VUV light) such as ArF excimer laser light (wavelength 193 nm) and F2 laser light (wavelength 157 nm) are used. In this embodiment, ArF excimer laser light is used.
0036In this embodiment, pure water is used as the liquid 1. Pure water is not limited to ArF excimer laser light, but also far-ultraviolet light (DUV light) such as ultraviolet emission lines (g-line, h-line, i-line) emitted from mercury lamps and KrF excimer laser light (wavelength 248 nm). Is also transparent.
0037The mask stage MST supports the mask M and has an opening 34A in the center thereof for passing the pattern image of the mask M. A mask surface plate 31 is supported on the upper stage portion 3A of the main column 3 via a vibration isolation unit 6. An opening 34B through which the pattern image of the mask M passes is also formed in the central portion of the mask surface plate 31. A plurality of gas bearings (air bearings) 32, which are non-contact bearings, are provided on the lower surface of the mask stage MST. The mask stage MST is non-contact supported by the air bearing 32 with respect to the upper surface (guide surface) 31A of the mask platen 31, and is perpendicular to the optical axis AX of the projection optical system PL by the mask stage drive mechanism such as a linear motor. It can move in two dimensions in a plane, that is, in an XY plane, and can rotate minutely in the θZ direction. On the mask stage MST, a moving mirror 35 that moves with respect to the projection optical system PL is provided together with the mask stage MST. A laser interferometer 36 is provided at a position facing the moving mirror 35. The position of the mask M on the mask stage MST in the two-dimensional direction and the rotation angle in the θZ direction (including the rotation angles in the θX and θY directions in some cases) are measured in real time by the laser interferometer 36, and the measurement result is measured by the control device. Output to CONT. The control device CONT controls the position of the mask M supported by the mask stage MST by driving the mask stage drive mechanism based on the measurement result of the laser interferometer 36.
0038The projection optical system PL projects and exposes the pattern of the mask M onto the substrate P at a predetermined projection magnification β, and is a plurality of optical elements including an optical element (lens) 2 provided at the tip on the substrate P side. These optical elements are supported by the lens barrel PK. In the present embodiment, the projection optical system PL is a reduced system having a projection magnification β of, for example, 1/4 or 1/5. The projection optical system PL may be either a 1x system or a magnifying system. A flange portion FLG is provided on the outer peripheral portion of the lens barrel PK. Further, the lens barrel surface plate 8 is supported on the lower stage portion 3B of the main column 3 via the vibration isolation unit 7. Then, the projection optical system PL is supported by the lens barrel surface plate 8 by engaging the flange portion FLG of the projection optical system PL with the lens barrel surface plate 8.
0039The optical element 2 at the tip of the projection optical system PL of the present embodiment is provided so as to be removable (replaceable) with respect to the lens barrel PK. The liquid 1 in the immersion region AR2 comes into contact with the optical element 2. The optical element 2 is made of fluorite. Since fluorite has a high affinity for water, the liquid 1 can be brought into close contact with almost the entire surface of the liquid contact surface 2a of the optical element 2. That is, in the present embodiment, since the liquid (water) 1 having a high affinity with the liquid contact surface 2a of the optical element 2 is supplied, the adhesion between the liquid contact surface 2a of the optical element 2 and the liquid 1 is provided. Is high, and the optical path between the optical element 2 and the substrate P can be reliably filled with the liquid 1. The optical element 2 may be quartz having a high affinity for water. Further, the liquid contact surface 2a of the optical element 2 may be subjected to a hydrophilic treatment (liquidation) treatment to further enhance the affinity with the liquid 1.
0040A plate member 2P is provided so as to surround the optical element 2. The surface (that is, the lower surface) of the plate member 2P facing the substrate P is a flat surface. The lower surface (liquid contact surface) 2a of the optical element 2 is also a flat surface, and the lower surface of the plate member 2P and the lower surface of the optical element 2 are substantially flush with each other. Thereby, the immersion region AR2 can be satisfactorily formed in a wide range. Further, the lower surface of the plate member 2P can be subjected to a surface treatment (liquidation treatment) as in the optical element 2.
0041The board stage (movable member) PST is provided so as to be movable by adsorbing and holding the board P via the board holder (board holding member) PH, and a gas bearing (air) which is a plurality of non-contact bearings is provided on the lower surface thereof. Bearing) 42 is provided. A substrate surface plate 41 is supported on the base plate 4 via a vibration isolation unit 9. The air bearing 42 sucks gas between the outlet 42B that blows gas (air) with respect to the upper surface (guide surface) 41A of the substrate platen 41 and the lower surface (bearing surface) of the substrate stage PST and the guide surface 41A. Equipped with an intake port 42A, a certain gap is maintained between the lower surface of the board stage PST and the guide surface 41A by balancing the repulsive force of the gas blown out from the outlet 42B and the suction force of the intake port 42A. .. That is, the substrate stage PST is non-contactly supported by the air bearing 42 with respect to the upper surface (guide surface) 41A of the substrate platen (base member) 41, and the projection optical system PL is supported by the substrate stage drive mechanism such as a linear motor. It can move two-dimensionally in the plane perpendicular to the optical axis AX, that is, in the XY plane, and can rotate minutely in the θZ direction. Further, the substrate holder PH is provided so as to be movable in the Z-axis direction, the θX direction, and the θY direction. The board stage drive mechanism is controlled by the control device CONT. That is, the substrate holder PH controls the focus position (Z position) and the tilt angle of the substrate P to align the surface of the substrate P with the image plane of the projection optical system PL by the autofocus method and the autoleveling method, and also the substrate. Position P in the X-axis direction and Y-axis direction.
0042On the substrate stage PST (board holder PH), a moving mirror 45 that moves with respect to the projection optical system PL is provided together with the substrate stage PST. A laser interferometer 46 is provided at a position facing the moving mirror 45. The two-dimensional position and rotation angle of the substrate P on the substrate stage PST are measured in real time by the laser interferometer 46, and the measurement result is output to the control device CONT. The control device CONT positions the substrate P supported by the substrate stage PST by driving the substrate stage drive mechanism including the linear motor based on the measurement result of the laser interferometer 46.
0043An auxiliary plate 43 is provided on the board stage PST (board holder PH) so as to surround the board P (see FIG. 2). The auxiliary plate 43 has a flat surface at substantially the same height as the surface of the substrate P held by the substrate holder PH. Even when the edge region of the substrate P is exposed, the liquid 1 can be held under the projection optical system PL by the auxiliary plate 43.
0044Further, on the outside of the auxiliary plate 43 of the substrate holder PH, a collection port (suction port) 61 of the collection device 60 for collecting the liquid 1 that has flowed out of the substrate P is provided. The collection port 61 is an annular groove formed so as to surround the auxiliary plate 43, and a liquid absorbing member 62 made of a sponge-like member, a porous body, or the like is arranged inside the annular groove portion.
0045FIG. 2 is a schematic perspective view showing a substrate stage PST and a substrate stage drive mechanism for driving the substrate stage PST. In FIG. 2, the substrate stage PST is movably supported in the X-axis direction by the X-guide stage 44. The substrate stage PST can be moved in the X-axis direction with a predetermined stroke by the X linear motor 47 while being guided by the X guide stage 44. The X linear motor 47 includes a stator 47A provided on the X guide stage 44 so as to extend in the X-axis direction, and a mover 47B provided corresponding to the stator 47A and fixed to the board stage PST. There is. Then, the substrate stage PST moves in the X-axis direction by driving the mover 47B with respect to the stator 47A. Here, the substrate stage PST is non-contactly supported by a magnetic guide composed of a magnet and an actuator that maintain a predetermined amount of gap in the Z-axis direction with respect to the X guide stage 44. The substrate stage PST is moved in the X-axis direction by the X linear motor 47 while being non-contact supported by the X guide stage 44.
0046A pair of Y linear motors 48 that can move the X guide stage 44 together with the substrate stage PST in the Y axis direction are provided at both ends of the X guide stage 44 in the longitudinal direction. Each of the Y linear motors 48 includes movers 48B provided at both ends in the longitudinal direction of the X guide stage 44, and stators 48A provided corresponding to the movers 48B. Then, when the mover 48B is driven with respect to the stator 48A, the X guide stage 44 moves in the Y-axis direction together with the board stage PST. Further, by adjusting the respective drives of the Y linear motor 48, the X guide stage 44 can rotate and move in the θZ direction as well. Therefore, the Y linear motor 48 makes it possible for the substrate stage PST to move in the Y-axis direction and the θZ direction almost integrally with the X guide stage 44.
0047Each side of the substrate surface plate 41 in the X-axis direction is formed in an L-shape when viewed from the front, and guide portions 49 for guiding the movement of the X guide stage 44 in the Y-axis direction are provided. The guide portion 49 is supported on the base plate 4 (Fig. 1). In the present embodiment, the stator 48A of the Y linear motor 48 is provided on the flat portion 49B of the guide portion 49. On the other hand, concave guided members 50 are provided at both ends of the lower surface of the X guide stage 44 in the longitudinal direction. The guide portion 49 is provided so as to engage with the guided portion 50 so that the upper surface (guide surface) 49A of the guide portion 49 and the inner surface of the guided member 50 face each other. A gas bearing (air bearing) 51, which is a non-contact bearing, is provided on the guide surface 49A of the guide portion 49, and the X guide stage 44 is non-contact supported with respect to the guide surface 49A.
0048A gas bearing (air bearing) 52, which is a non-contact bearing, is interposed between the stator 48A of the Y linear motor 48 and the flat portion 49B of the guide portion 49, and the stator 48A is guided by the air bearing 52. It is non-contactly supported with respect to the flat portion 49B of the portion 49. Therefore, according to the law of conservation of momentum, the stator 48A moves in the -Y direction (+ Y direction) according to the movement of the X guide stage 44 and the substrate stage PST in the + Y direction (-Y direction). The movement of the stator 48A cancels out the reaction force caused by the movement of the X guide stage 44 and the substrate stage PST, and can prevent the change in the position of the center of gravity. That is, the stator 48A has a function as a so-called counter mass.
0049FIG. 3 is an enlarged view showing the vicinity of the liquid supply mechanism 10, the liquid recovery mechanism 20, and the PL tip of the projection optical system. The liquid supply mechanism 10 supplies the liquid 1 between the projection optical system PL and the substrate P, and supplies the liquid 1 to the liquid supply unit 11 and the liquid supply unit 11 via the supply pipe 15. It is provided with a supply nozzle 14 that is connected and supplies the liquid 1 sent from the liquid supply unit 11 onto the substrate P. The supply nozzle 14 is arranged close to the surface of the substrate P. The liquid supply unit 11 includes a tank for accommodating the liquid 1, a pressure pump, and the like, and supplies the liquid 1 onto the substrate P via the supply pipe 15 and the supply nozzle 14. The liquid supply operation of the liquid supply unit 11 is controlled by the control device CONT, and the control device CONT can control the liquid supply amount per unit time on the substrate P by the liquid supply unit 11.
0050A flow meter 12 for measuring the amount of liquid 1 (the amount of liquid supplied per unit time) supplied from the liquid supply unit 11 onto the substrate P is provided in the middle of the supply pipe 15. The flow meter 12 constantly monitors the amount of liquid 1 supplied on the substrate P, and outputs the measurement result to the control device CONT. Further, a valve 13 for opening and closing the flow path of the supply pipe 15 is provided between the flow meter 12 and the supply nozzle 14 of the supply pipe 15. The opening / closing operation of the valve 13 is controlled by the control device CONT. The valve 13 in the present embodiment is a so-called normal-off method that mechanically blocks the flow path of the supply pipe 15 when the drive source (power supply) of the exposure device EX (control device CONT) is stopped due to, for example, a power failure or the like. (Normally closed method).
0051The liquid recovery mechanism 20 recovers the liquid 1 on the substrate P supplied by the liquid supply mechanism 10, and has a recovery nozzle (suction port) 21 arranged close to the surface of the substrate P and a recovery nozzle. The 21 is provided with a vacuum system (suction system) 25 connected via a recovery pipe 24. vacuum The system 25 includes a vacuum pump, and its operation is controlled by the control device CONT. When the vacuum system 25 is driven, the liquid 1 on the substrate P is recovered together with the surrounding gas (air) through the recovery nozzle 21. As the vacuum system 25, the vacuum system of the factory where the exposure apparatus EX is arranged may be used without providing the vacuum pump in the exposure apparatus.
0052A gas-liquid separator 22 that separates the liquid 1 and the gas sucked from the recovery nozzle 21 is provided in the middle of the recovery pipe 24. Here, as described above, the recovery nozzle 21 recovers the liquid 1 on the substrate P as well as the gas around it. The gas-liquid separator 22 separates the liquid 1 and the gas recovered from the recovery nozzle 21. As the gas-liquid separator 22, for example, the collected liquid and gas are circulated in a pipe member having a plurality of holes, and the liquid and the gas are separated by dropping the liquid through the holes by the action of gravity. It is possible to adopt a gravity separation type device, a centrifugal separation type device that separates the recovered liquid and gas by using centrifugal force, and the like. Then, the vacuum system 25 sucks the gas separated by the gas-liquid separator 22.
0053Of the recovery pipe 24, a dryer 23 for drying the gas separated by the gas-liquid separator 22 is provided between the vacuum system 25 and the gas-liquid separator 22. Even if the gas separated by the gas-liquid separator 22 contains a liquid component, the liquid component flows in by drying the gas with the dryer 23 and allowing the dried gas to flow into the vacuum system 25. It is possible to prevent the occurrence of inconveniences such as failure of the vacuum system 25 due to the above. The dryer 23 is, for example, a device of a type that removes a liquid component by cooling the gas (a gas in which a liquid component is mixed) supplied from the gas-liquid separator 22 below the dew point of the liquid, for example, a cooler. Alternatively, a device that removes liquid components by heating above the boiling point of the liquid, such as a heater, can be adopted.
0054On the other hand, the liquid 1 separated by the gas-liquid separator 22 is collected by the liquid recovery unit 28 via the second recovery pipe 26. The liquid recovery unit 28 includes a tank or the like for accommodating the recovered liquid 1. The liquid 1 collected in the liquid recovery unit 28 is, for example, discarded or cleaned and returned to the liquid supply unit 11 or the like for reuse. In addition, a flow meter 27 that measures the amount of recovered liquid 1 (the amount of liquid recovered per unit time) between the gas-liquid separator 22 and the liquid recovery unit 28 in the middle of the second recovery pipe 26. Is provided. The flow meter 27 constantly monitors the amount of liquid 1 recovered from the substrate P, and outputs the measurement result to the control device CONT. As described above, the recovery nozzle 21 recovers the liquid 1 on the substrate P as well as the gas around it, but the gas-liquid separator 22 separates the liquid 1 and the gas, and only the liquid component is transferred to the flow meter 27. By sending, the flow meter 27 can accurately measure the amount of the liquid 1 recovered from the substrate P.
0055Further, the exposure apparatus EX includes a focus detection system 56 that detects the position of the surface of the substrate P supported by the substrate stage PST. The focus detection system 56 includes a light projecting unit 56A that projects a detection light beam from diagonally above via the liquid 1 on the substrate P, and a light receiving unit 56B that receives the reflected light of the detection light beam reflected by the substrate P. I have. The light receiving result of the focus detection system 56 (light receiving unit 56B) is output to the control device CONT. The control device CONT can detect the position information of the surface of the substrate P in the Z-axis direction based on the detection result of the focus detection system 56. Further, by projecting a plurality of detection light fluxes from the light projecting unit 56A, it is possible to detect the inclination information of the substrate P in the θX and θY directions.
0056The focus detection system 56 can detect surface position information of an object arranged on the image plane side of the projection optical system PL, not limited to the substrate P. Further, the focus detection system 56 detects the surface position information of the object (board P) via the liquid 1, but the surface position of the object (board P) outside the immersion region AR2 without passing through the liquid 1. A focus detection system that detects information can also be adopted.
0057As shown in a partial cross-sectional view of FIG. 1, the liquid supply mechanism 10 and the liquid recovery mechanism 20 are separately supported by the lens barrel surface plate 8. As a result, the vibration generated by the liquid supply mechanism 10 and the liquid recovery mechanism 20 is not transmitted to the projection optical system PL via the lens barrel surface plate 8.
0058FIG. 4 is a plan view showing the positional relationship between the liquid supply mechanism 10 and the liquid recovery mechanism 20 and the projection region AR1 of the projection optical system PL. The projection area AR1 of the projection optical system PL has an elongated rectangular shape (slit shape) in the Y-axis direction, and three supply nozzles 14A to 14C are provided on the + X side so as to sandwich the projection area AR1 in the X-axis direction. Two recovery nozzles 21A and 21B are arranged on the -X side. The supply nozzles 14A to 14C are connected to the liquid supply unit 11 via the supply pipe 15, and the recovery nozzles 21A and 21B are connected to the vacuum system 25 via the recovery pipe 24. Further, the supply nozzles 14A'to 14C'and the recovery nozzles 21A'and 21B'are arranged at positions where the supply nozzles 14A to 14C and the recovery nozzles 21A and 21B are rotated by approximately 180 °. The supply nozzles 14A to 14C and the recovery nozzles 21A'and 21B'are alternately arranged in the Y-axis direction, and the supply nozzles 14A'to 14C' and the recovery nozzles 21A and 21B are alternately arranged in the Y-axis direction. 14A'~ 14C'are connected to the liquid supply unit 11 via the supply pipe 15', and the recovery nozzles 21A'and 21B' are connected to the vacuum system 25 via the recovery pipe 24'. A flow meter 12'and a valve 13'are provided in the middle of the supply pipe 15', as in the supply pipe 15. Further, a gas-liquid separator 22'and a dryer 23'are provided in the middle of the recovery pipe 24', as in the recovery pipe 24.
0059FIG. 5 is a diagram showing a recovery device 60 that recovers the liquid 1 that has flowed out of the substrate P. In FIG. 5, the recovery device 60 is arranged on the recovery port (suction port) 61 formed in an annular shape so as to surround the auxiliary plate 43 on the substrate holder PH, and the recovery port 61, and is arranged in a sponge-like member, porous ceramics, or the like. It is provided with a liquid absorbing member 62 made of the porous body of. The liquid absorbing member 62 is an annular member having a predetermined width, and can hold a predetermined amount of the liquid 1. A flow path 63 communicating with the recovery port 61 is formed inside the substrate holder PH, and the bottom of the liquid absorbing member 62 arranged at the recovery port 61 is in contact with the flow path 63. Further, a plurality of liquid recovery holes 64 are provided between the substrate P on the substrate holder PH and the auxiliary plate 43. These liquid recovery holes 64 are also connected to the flow path 63.
0060A plurality of protrusions 65 for supporting the back surface of the substrate P are provided on the upper surface of the substrate holder (board holding member) PH that holds the substrate P. Each of these protrusions 65 is provided with a suction hole 66 for sucking and holding the substrate P. Each of the suction holes 66 is connected to a conduit 67 formed inside the substrate holder PH.
0061The flow path 63 connected to each of the recovery port 61 and the liquid recovery hole 64 is connected to one end of a pipeline 68 provided outside the substrate holder PH. On the other hand, the other end of the pipeline 68 is connected to a vacuum system 70 including a vacuum pump. A gas-liquid separator 71 is provided in the middle of the pipeline 68, and a dryer 72 is provided between the gas-liquid separator 71 and the vacuum system 70. By driving the vacuum system 70, the liquid 1 is recovered from the recovery port 61 together with the surrounding gas. Further, even if the liquid 1 infiltrates between the substrate P and the auxiliary plate 43 and wraps around to the back surface side of the substrate P, the liquid is recovered together with the surrounding gas from the recovery port 64. The gas separated by the gas-liquid separator 71 and dried by the dryer 72 flows into the vacuum system 70. On the other hand, the liquid 1 separated by the gas-liquid separator 71 flows into the liquid recovery unit 73 provided with a tank or the like capable of accommodating the liquid 1. The liquid 1 collected in the liquid recovery unit 73 is, for example, discarded or cleaned and returned to the liquid supply unit 11 or the like for reuse.
0062Further, the conduit 67 connected to the suction hole 66 is connected to one end of the conduit 69 provided outside the substrate holder PH. On the other hand, the other end of the pipeline 69 is connected to a vacuum system 74 including a vacuum pump provided outside the substrate holder PH. By driving the vacuum system 74, the substrate P supported by the protrusion 65 is sucked and held in the suction hole 66. A gas-liquid separator 75 is provided in the middle of the pipeline 69, and a dryer 76 is provided between the gas-liquid separator 75 and the vacuum system 74. Further, the gas-liquid separator 75 is connected to a liquid recovery unit 73 including a tank or the like capable of accommodating the liquid 1.
0063Next, a procedure for exposing the pattern of the mask M to the substrate P using the above-mentioned exposure apparatus EX will be described with reference to FIG. 1 and the like.
0064After the mask M is loaded on the mask stage MST and the substrate P is loaded on the substrate stage PST, the control device CONT drives the liquid supply unit 11 of the liquid supply mechanism 10 to drive the supply pipe 15 and the supply nozzle 14. A predetermined amount of liquid 1 per unit time is supplied onto the substrate P via the substrate P. Further, the control device CONT drives the vacuum system 25 of the liquid recovery mechanism 20 with the supply of the liquid 1 by the liquid supply mechanism 10, and supplies a predetermined amount of the liquid 1 per unit time via the recovery nozzle 21 and the recovery pipe 24. to recover. As a result, the immersion region AR2 of the liquid 1 is formed between the optical element 2 at the tip of the projection optical system PL and the substrate P. Here, in order to form the immersion region AR2, the control device CONT sets the liquid supply mechanism 10 and the liquid so that the amount of liquid supplied to the substrate P and the amount of liquid recovered from the substrate P are substantially the same. Control each of the recovery mechanisms 20. Then, the control device CONT illuminates the mask M with the exposure light EL by the illumination optical system IL, and projects an image of the pattern of the mask M onto the substrate P via the projection optical system PL and the liquid 1.
0065At the time of scanning exposure, a part of the pattern image of the mask M is projected on the projection area AR1 and is synchronized with the movement of the mask M in the -X direction (or + X direction) at a velocity V with respect to the projection optical system PL. Then, the substrate P moves in the + X direction (or -X direction) via the substrate stage PST at a velocity β · V (β is the projection magnification). Then, after the exposure to one shot region is completed, the next shot region is moved to the scanning start position by the stepping of the substrate P, and thereafter, the exposure processing for each shot region is sequentially performed by the step-and-scan method. In the present embodiment, the liquid 1 is set to flow in the same direction as the moving direction of the substrate P in parallel with the moving direction of the substrate P. That is, when the substrate P is moved in the scanning direction (-X direction) indicated by the arrow Xa (see FIG. 4) for scanning exposure, the supply tube 15, supply nozzles 14A to 14C, recovery tube 24, and recovery nozzle are used. Using 21A and 21B, the liquid 1 is supplied and recovered by the liquid supply mechanism 10 and the liquid recovery mechanism 20. That is, when the substrate P moves in the -X direction, the liquid 1 is supplied from the supply nozzles 14 (14A to 14C) between the projection optical system PL and the substrate P, and the recovery nozzles 21 (21A, 21B) ), The liquid 1 on the substrate P is recovered together with the gas around it, and the liquid 1 flows in the -X direction so as to fill the space between the optical element 2 at the tip of the projection optical system PL and the substrate P. On the other hand, when the substrate P is moved in the scanning direction (+ X direction) indicated by the arrow Xb (see FIG. 4) for scanning exposure, the supply tube 15', the supply nozzles 14A'to 14C', and the recovery tube 24' , And the recovery nozzles 21A'and 21B'are used to supply and recover the liquid 1 by the liquid supply mechanism 10 and the liquid recovery mechanism 20. That is, when the substrate P moves in the + X direction, the liquid 1 is supplied from the supply nozzle 14'(14A' to 14C') between the projection optical system PL and the substrate P, and the recovery nozzle 21' From (21A', 21B'), the liquid 1 on the substrate P is recovered together with the surrounding gas, and the liquid 1 in the + X direction fills the space between the optical element 2 at the tip of the projection optical system PL and the substrate P. Flow To. In this case, for example, the liquid 1 supplied through the supply nozzle 14 flows so as to be drawn between the optical element 2 and the substrate P as the substrate P moves in the X direction, so that the liquid supply mechanism 10 Even if the supply energy of the (liquid supply unit 11) is small, the liquid 1 can be easily supplied between the optical element 2 and the substrate P. Then, by switching the direction in which the liquid 1 flows according to the scanning direction, the liquid is sandwiched between the optical element 2 and the substrate P when scanning the substrate P in either the + X direction or the -X direction. It can be filled with 1 and can be exposed at high resolution and wide depth of focus.
0066During the exposure process, the measurement result of the flow meter 12 provided in the liquid supply mechanism 10 and the measurement result of the flow meter 27 provided in the liquid recovery mechanism 20 are always output to the control device CONT. The control device CONT was collected from the measurement result of the flow meter 12, that is, the amount of liquid supplied on the substrate P by the liquid supply mechanism 10, and the measurement result of the flow meter 27, that is, the liquid recovery mechanism 20 from the substrate P. The amount of liquid is compared, and the valve 13 of the liquid supply mechanism 10 is controlled based on the result of the comparison. Specifically, the control device CONT obtains the difference between the amount of liquid supplied onto the substrate P (measurement result of the flowmeter 12) and the amount of liquid recovered from the substrate P (measurement result of the flowmeter 27). The valve 13 is controlled based on the determination of whether or not the obtained difference exceeds a preset allowable value (threshold value). Here, as described above, the control device CONT sets each of the liquid supply mechanism 10 and the liquid recovery mechanism 20 so that the amount of liquid supplied to the substrate P and the amount of liquid recovered from the substrate P are substantially the same. Since the control is performed, if each of the liquid supply operation by the liquid supply mechanism 10 and the liquid recovery operation by the liquid recovery mechanism 20 is normally performed, the above-determined difference becomes almost zero.
0067When the obtained difference is equal to or greater than the permissible value, that is, when the liquid recovery amount is extremely small compared to the liquid supply amount, the control device CONT recovers the liquid 1 sufficiently due to an abnormality in the recovery operation of the liquid recovery mechanism 20. Judge that it is not done. At this time, the control device CONT determines that an abnormality such as a failure has occurred in the vacuum system 25 of the liquid recovery mechanism 20, and prevents the liquid 1 from leaking due to the liquid recovery mechanism 20 not being able to recover the liquid 1 normally. In order to do so, the valve 13 of the liquid supply mechanism 10 is operated to shut off the flow path of the supply pipe 15, and the supply of the liquid 1 to the substrate P by the liquid supply mechanism 10 is stopped. In this way, the control device CONT compares the amount of liquid supplied from the liquid supply mechanism 10 onto the substrate P with the amount of liquid recovered by the liquid recovery mechanism 20, and the liquid recovery mechanism 20 is based on the comparison result. When an abnormality in the recovery operation is detected, the liquid 1 becomes excessively supplied, and when the abnormality is detected, the supply of the liquid 1 to the substrate P is stopped. This can prevent the leakage of the liquid 1 to the outside of the substrate P and the substrate stage PST (board holder PH), the infiltration of the liquid 1 into an undesired place, or the spread of damage due to such leakage or intrusion. it can.
0068Further, when the control device CONT detects an abnormality in the recovery operation of the liquid recovery mechanism 20, in order to prevent electric leakage due to leakage or adhesion of the infiltrated liquid 1, the control device CONT is attached to the electrical equipment constituting the exposure device EX. Stop the power supply. Here, examples of the electrical equipment include linear motors 47, 48, etc. for moving the substrate stage PST. Since these linear motors 47 and 48 are in positions where the liquid 1 leaked to the outside of the substrate stage PST easily adheres and infiltrates, the control device CONT stops the power supply to these linear motors 47 and 48 to liquid. It is possible to prevent electric leakage due to the adhesion of 1. Further, as the electric device, in addition to the linear motors 47 and 48, for example, a sensor (photomultiplier tube or the like) provided on the substrate stage PST and for receiving the exposure light EL for the substrate stage PST can be mentioned. Alternatively, examples of electrical equipment include various actuators such as a piezo element for adjusting the positions of the substrate holder PH in the Z-axis direction and the tilt direction. Further, when an abnormality is detected, it is possible to stop the power supply to all the electric devices constituting the exposure apparatus EX, and it is also possible to stop the power supply to some electric devices. .. Here, when the control device CONT detects an abnormality in the recovery operation of the liquid recovery mechanism 20, for example, a linear motor, a piezo element used in the vicinity of 0 to 150V, or a photomultiplier used in the vicinity of 300 to 900V. By stopping the power supply to electric devices (high-voltage devices) such as (sensors), it is possible to prevent the occurrence of electric leakage and suppress the influence of electric leakage on peripheral devices.
0069Further, when the control device CONT detects an abnormality in the recovery operation of the liquid recovery mechanism 20, for example, the control device CONT drives the air bearing 42 for moving the board stage PST with respect to the guide surface 41A of the board surface plate 41 in a non-contact manner. To stop. The air bearing 42 sucks gas between the outlet 42B that blows gas (air) with respect to the upper surface (guide surface) 41A of the substrate platen 41 and the lower surface (bearing surface) of the substrate stage PST and the guide surface 41A. Equipped with an intake port 42A, a certain gap is maintained between the lower surface of the board stage PST and the guide surface 41A by balancing the repulsive force of the gas blown out from the outlet 42B and the suction force of the intake port 42A. However, when the control device CONT detects an abnormality in the recovery operation of the liquid recovery mechanism 20, the leaked liquid 1 is prevented from flowing into (invading) the intake port 42A of the air bearing 42. In addition, the operation of the air bearing 42, especially the intake from the intake port 42A is stopped. As a result, it is possible to prevent the liquid 1 from flowing into the vacuum system connected to the intake port 42A, and it is possible to prevent the occurrence of inconveniences such as a failure of the vacuum system due to the inflow of the liquid 1.
0070Further, when a protrusion 65 or a suction hole 66 for holding the substrate P is provided on another member and the other member is sucked and held on the board holder PH, the control device CONT sucks and holds the other member. The intake air from the suction hole (intake port) may be stopped.
0071Further, the control device CONT drives the alarm device K when it detects an abnormality in the recovery operation of the liquid recovery mechanism 20. The alarm device K issues an alarm using a warning light, an alarm sound, a display, or the like, whereby, for example, the operator can know that the liquid 1 has leaked or infiltrated into the exposure device EX.
0072Further, when an abnormality in the recovery operation of the liquid recovery mechanism 20 is detected, the control device CONT increases the liquid recovery amount of the recovery device 60. Specifically, the driving amount (driving force) of the vacuum system 70 of the recovery device 60 is increased. Since the drive of the recovery device 60 (vacuum system 70) is a vibration source, it is preferable that the driving force of the recovery device 60 is reduced or stopped during the exposure process, but the recovery operation of the liquid recovery mechanism 20 is abnormal. When the possibility of leakage of liquid 1 occurs, the control device CONT increases the driving force of the recovery device 60 to increase the driving force of the recovery device 60 to the outside of the board stage PST (board holder PH) (at least outside the recovery port 61). ) Can be prevented from leaking the liquid 1 or the leakage can be prevented from spreading.
0073Further, while the shot region near the center of the substrate P is exposed, the liquid 1 supplied from the liquid supply mechanism 10 is recovered by the liquid recovery mechanism 20. On the other hand, as shown in FIG. 5, by exposing the edge region of the substrate P, when the immersion region AR2 is near the edge region of the substrate P, the auxiliary plate 43 betweens the projection optical system PL and the substrate P. However, a part of the fluid 1 may flow out to the outside of the auxiliary plate 43, and the flowing fluid 1 is collected from the collection port 61 in which the liquid absorbing member 62 is arranged. .. Here, the control device CONT starts the operation of the recovery device 60 at the same time as the drive of the liquid supply mechanism 10 and the liquid recovery mechanism 20 is started. Therefore, the liquid 1 recovered from the recovery port 61 is recovered together with the surrounding air through the flow path 63 and the pipeline 68 by the suction of the vacuum system 70. Further, the liquid 1 that has flowed into the gap between the substrate P and the auxiliary plate 43 is recovered through the liquid recovery hole 64 and the surrounding air through the flow path 63 and the pipeline 68. At this time, the gas-liquid separator 71 separates the liquid 1 and the gas recovered from the recovery port 61. The gas separated by the gas-liquid separator 71 flows into the vacuum system 70 after being dried by the dryer 72. This makes it possible to prevent the inconvenience of the liquid component flowing into the vacuum system 70. On the other hand, the liquid separated by the gas-liquid separator 71 is collected by the liquid recovery unit 73.
0074At this time, since a part of the liquid 1 supplied from the liquid supply mechanism 10 is recovered by the recovery device 60, the amount of liquid recovered by the liquid recovery mechanism 20 is reduced, and as a result, the flow rate of the liquid recovery mechanism 20 is reduced. The amount of liquid recovered measured by a total of 27 is reduced. In this case, although the liquid 1 has not leaked, the control device CONT compares the measurement results of the flow meter 12 of the liquid supply mechanism 10 and the flow meter 27 of the liquid recovery mechanism 20, and the liquid There is a possibility of making an erroneous judgment that an abnormality has occurred in the recovery operation of the recovery mechanism 20. Therefore, a flow meter for measuring the amount of collected liquid is provided between the gas-liquid separator 71 and the liquid recovery unit 73 of the recovery device 60, and the control device CONT measures the flow meter of the recovery device 60. The total liquid recovery amount is obtained based on the result and the measurement result of the flow meter 27 of the liquid recovery mechanism 20, and the obtained total liquid recovery amount is compared with the measurement result of the flow meter 12 of the liquid supply mechanism 10. Then, based on the comparison result, the control device CONT determines whether or not an abnormality has occurred in the liquid recovery operation of the liquid recovery mechanism 20, and based on the determined result, the liquid supply operation by the liquid supply mechanism 10 is performed. It is possible to take measures such as stopping, stopping the power supply, and stopping the intake operation from the intake port.
0075Further, when the measured value of the flow meter provided in the recovery device 60 becomes an excessively large value with respect to the preset allowable value, the control device CONT causes a large amount of liquid 1 to flow out to the outside of the substrate P. The liquid supply mechanism 10 may be stopped in order to prevent the liquid 1 from leaking to the outside of the substrate stage PST (board holder PH).
0076It is also conceivable that the liquid 1 that has flowed out of the substrate P invades through the gap between the substrate P and the auxiliary plate 43 and reaches the back surface side of the substrate P. Then, the liquid 1 that has entered the back surface side of the substrate P may flow into the suction hole (suction port) 66 for sucking and holding the substrate P. In this case, the suction hole 66 provided in the board holder PH for sucking and holding the board P is connected to the vacuum system 74 via the pipe line 67 and the pipe line 69, and the gas-liquid separator 75 is in the middle of the connection. , And a dryer 76 for drying the gas separated by the gas-liquid separator 75 is provided. Therefore, even if the liquid 1 flows into the suction hole 66, the liquid 1 that has flowed in from the suction hole 66 is recovered by the liquid recovery unit 73, and the inconvenience that the liquid component flows into the vacuum system 74 can be prevented.
0077If the liquid 1 infiltrates through the suction hole 66, there is a possibility that the holding of the substrate P may be defective. Therefore, a flow meter is installed between the pipeline 69 or the gas-liquid separator 75 and the liquid recovery unit 73. If the flow meter detects the ingress of liquid from the suction hole 66, it is judged as an abnormal situation, and the liquid supply operation is stopped, the power supply is stopped, and the intake air is taken from the intake port as described above. At least one of the outages can also be performed.
0078If the conduit 69 connected to the suction hole 66 is not provided with the gas-liquid separator 75, the suction hole (intake air) is detected when an abnormality in the recovery operation of the liquid recovery mechanism 20 or the recovery device 60 is detected. In order to prevent the inflow of the liquid 1 into the port) 66, the drive of the vacuum system 74 (suction system) may be stopped to stop the intake air from the suction hole 66.
0079As described above, when an abnormality such as leakage or infiltration of liquid 1 is detected, the supply of liquid 1 to the substrate P by the liquid supply mechanism 10 is stopped, so that leakage of liquid 1 is prevented. Alternatively, it is possible to prevent the spread of leakage and inundation. In addition, even if an abnormality such as liquid 1 leaking or infiltrating occurs, electric leakage occurs or electric leakage is caused by stopping the power supply to the linear motors 47 and 48 and other electric devices that make up the exposure apparatus EX. It is possible to prevent the spread of damage caused by. Further, by stopping the intake from each intake port that flows in the vacuum system such as the intake port 42A of the air bearing 42 and the suction hole 66 provided in the substrate holder PH for sucking and holding the substrate P, this intake is taken. It is possible to prevent the occurrence of inconvenience such as the liquid 1 flowing into the vacuum system connected to the mouth. Further, when collecting the liquid and the surrounding gas together with the liquid from the suction port such as the recovery nozzle 21, the recovery port 61, or the suction hole 66, the liquid and the gas sucked from the suction port are separated into gas and liquid by a gas-liquid separator. By further drying the gas separated by the gas-liquid separator with a dryer, the inconvenience of liquid components (wet gas, etc.) flowing into the vacuum system can be prevented, and the influence of the liquid on the vacuum system can be suppressed. Can be done. Further, in the present embodiment, the liquid is recovered from the suction port together with the gas around it, but the amount of the recovered liquid is accurately measured by separating the liquid and the gas recovered by the gas-liquid separator. be able to.
0080In the above-described embodiment, the failure of the vacuum system 25 (operation abnormality) has been described as an example of the abnormality of the recovery operation of the liquid recovery mechanism 20, but in addition to the failure of the vacuum system 25, for example, a gas-liquid separator There are also 22 malfunctions. That is, even if the liquid 1 on the substrate P can be recovered through the recovery nozzle 21, the gas-liquid separator 22 cannot sufficiently separate the liquid and the gas recovered from the recovery nozzle 21, and the flow meter 27 measures the liquid. It is conceivable that the amount of liquid will be less than the specified value. In this case, since the amount of liquid components flowing into the vacuum system 25 increases, the vacuum system 25 may fail. Therefore, the control device CONT stops the liquid supply operation of the liquid supply mechanism 10 and the liquid recovery mechanism 20 (vacuum). By stopping the liquid recovery operation of the system 25), it is possible to prevent the leakage of the liquid 1 and also prevent the failure of the vacuum system 25.
0081In the above-described embodiment, the control device CONT sets each of the liquid supply mechanism 10 and the liquid recovery mechanism 20 so that the liquid supply amount on the substrate P and the liquid recovery amount from the substrate P are substantially the same. I'm in control. Therefore, if each of the liquid supply operation by the liquid supply mechanism 10 and the liquid recovery operation by the liquid recovery mechanism 20 is normally performed, the above-determined difference is almost zero, and the above allowable value is correspondingly. It is preset to a small value. On the other hand, for example, when the liquid 1 to be used has high volatility, even in a situation where the liquid supply operation by the liquid supply mechanism 10 and the liquid recovery operation by the liquid recovery mechanism 20 are normally performed. It is considered that the liquid 1 volatilizes on the substrate P, and the value measured by the flow meter 27 of the liquid recovery mechanism 20 becomes smaller than the value measured by the flow meter 12 of the liquid supply mechanism 10. Therefore, the control device CONT sets the above allowable value in advance according to the environment in which the liquid 1 (volatile) to be used or the substrate P is placed, and compares the set allowable value with the obtained difference. Based on this, the valve 13 may be controlled.
0082Further, in the above-described embodiment, the liquid supply amount of the liquid supply mechanism 10 and the liquid recovery amount of the liquid recovery mechanism 20 are compared, and an abnormality in the flow state of the liquid 1 is observed. Each abnormality may be detected based only on the supply amount of the mechanism 10 or only on the recovery amount by the liquid recovery mechanism 20. Further, not only the flow rate of the liquid but also when a mechanical or electrical abnormality of the liquid supply mechanism 10 or the liquid recovery mechanism 20 is detected, the control device CONT stops the liquid supply operation by the liquid supply mechanism 10 and power. It is possible to take measures such as stopping the supply and stopping the intake operation from the intake port.
0083In the above-described embodiment, since the liquid 1 and the surrounding gas are recovered from the recovery nozzle 21, the liquid and gas recovered by using the gas-liquid separator 22 in order to measure the liquid recovery amount more accurately. Is separated, and the amount of separated liquid is measured by the flow meter 27. Therefore, the amount of liquid measured by the flow meter 27 may fluctuate depending on the gas-liquid separation capacity of the gas-liquid separator 22. Therefore, the control device CONT can also set the above allowable value according to the gas-liquid separator 22 (gas-liquid separation capacity) to be used.
0084In the above-described embodiment, when an abnormality in the liquid recovery operation of the liquid recovery mechanism 20 is detected, the liquid supply operation by the liquid supply mechanism 10 is stopped, the power supply to the electric device is stopped, and the air intake port is used. Although it has been described that all intake operations are stopped, at least one of them may be executed.
0085In the above-described embodiment, the liquid 1 and the surrounding gas are recovered from the recovery nozzle 21 of the liquid recovery mechanism 20, so that the amount of the liquid recovered by the flow meter 27 can be measured accurately. The liquid separator 22 is used to separate the liquid and the gas, but when the liquid recovery mechanism 20 is configured to recover only the liquid 1 from the recovery nozzle 21, the liquid and gas separator 22 is used to separate the liquid and the gas. The amount of liquid recovered can be determined by measuring the pressure of the recovered liquid without separating the liquid.
0086By the way, in the above-described embodiment, when an abnormality in the recovery operation of the liquid recovery mechanism 20 is detected, the liquid supply operation by the liquid supply mechanism 10 is stopped, the power supply to the electric device is stopped, or the intake port. It is configured to stop the intake operation from the liquid supply operation, but when an abnormality in the positional relationship between the substrate stage (movable member) PST that can move while holding the substrate P and the projection optical system PL is detected, the liquid supply operation is performed. At least one of a stop, a stop of power supply, and a stop of the intake operation from the intake port may be executed. Here, the abnormal positional relationship between the substrate stage PST and the projection optical system PL is a state in which the liquid 1 cannot be held under the projection optical system PL, and the positional relationship of at least one of the Z-axis direction and the XY direction. Including abnormalities. That is, even if the supply operation of the liquid supply mechanism 10 and the recovery operation of the liquid recovery mechanism 20 are normal, for example, an abnormality occurs in the operation of the substrate stage PST, and the substrate stage PST is relative to the desired position with respect to the projection optical system PL. When the liquid 1 is placed at a position deviated from the XY direction, the immersion region AR2 of the liquid 1 cannot be formed well between the projection optical system PL and the substrate P held by the substrate stage PST (under the projection optical system PL). (A state in which liquid 1 cannot be retained) occurs. In this case, the liquid 1 may leak to the outside of the substrate P and the outside of the substrate holder PH, or the moving mirror 45 of the substrate stage PST (board holder PH) may be flooded. Then, since the liquid recovery mechanism 20 cannot recover a predetermined amount of liquid 1, the flow meter 27 of the liquid recovery mechanism 20 outputs a measurement result of a value smaller than the predetermined value to the control device CONT. Based on the measurement results of the flow meter 27, the control device CONT can detect an abnormality in the position of the substrate stage PST that causes leakage of the liquid 1. Then, when the control device CONT detects the abnormality, the control device CONT executes the stop of the liquid supply operation, the stop of the power supply, the stop of the intake operation from the intake port, and the like.
0087Further, in the immersion region AR2, the distance between the projection optical system PL and the substrate P is set to a predetermined distance (about 0.1 mm to 1 mm) that allows the immersion region AR2 to be formed by the surface tension of the liquid 1. For example, when the position control of the substrate stage PST in the Z-axis direction is defective, the distance between the projection optical system PL and the substrate P on the substrate stage PST increases, and the projection optical system PL becomes larger. A situation may occur in which the liquid 1 cannot be held underneath. In this case as well, the liquid 1 leaks to the outside of the substrate P or the outside of the substrate stage PST (board holder PH), and the liquid recovery mechanism 20 cannot recover a predetermined amount of the liquid 1. Therefore, the flow meter of the liquid recovery mechanism 20 27 outputs the measurement result of a value smaller than the predetermined value to the control device CONT. Based on the measurement result of the flow meter 27, the control device CONT can detect an abnormality in the position of the substrate stage PST such that the liquid 1 leaks. Then, when the control device CONT detects the abnormality, the control device CONT executes the stop of the liquid supply operation, the stop of the power supply, the stop of the intake operation from the intake port, and the like.
0088In order to detect an abnormality in the positional relationship of the substrate stage PST with respect to the projection optical system PL, the position of the substrate stage PST in the XY direction is not used by the flow meter 27 of the liquid recovery mechanism 20, for example, by the interferometer 46. Can be detected, and an abnormality in the positional relationship can be detected based on the position detection result. The control device CONT compares the substrate stage position detection result by the interferometer 46 with the preset allowable value, and when the stage position detection result of the interferometer 46 exceeds the allowable value, the liquid 1 is supplied. May be executed such as stopping. In addition, the focus detection system 56 detects the position of the board stage PST in the Z-axis direction, and the stage position detection result by the focus detection system 56 is compared with the preset allowable value, and the detection result of the focus detection system 56 is obtained. When the permissible value is exceeded, the control device CONT may execute the stop of the supply operation of the liquid 1 and the like. In this way, the control device CONT detects an abnormality in the positional relationship between the projection optical system PL and the substrate stage PST based on the detection results of the substrate stage position detection device including the interferometer 46 and the focus detection system 56, and the abnormality is detected. When is detected, it is possible to stop the liquid supply operation, stop the power supply to the electric device, stop the intake operation from the intake port, and the like.
0089Further, when the interferometer 46 causes an error, the control device CONT may stop the liquid supply operation by the liquid supply mechanism 10. Here, the error of the interferometer 46 means that the position of the substrate stage PST cannot be measured for some reason, such as a failure of the interferometer 46 itself or a foreign object being placed on the optical path of the measurement light of the interferometer. Including state. When the interferometer 46 causes an error, the control device CONT cannot grasp the position of the board stage PST and at the same time cannot control the position of the board stage PST. In this case, an abnormality may occur in the positional relationship between the projection optical system PL and the substrate stage PST, and the liquid 1 may leak or flow out. Therefore, when the interferometer 46 causes an error, the inconvenience that the liquid 1 leaks can be prevented by stopping the liquid supply by the liquid supply mechanism 10. Similarly, when an error occurs in the measurement system (focus detection system 56 in this embodiment) for controlling the position of the substrate stage PST in the Z-axis direction, the positional relationship between the projection optical system PL and the substrate stage PST. The control device CONT can stop the liquid supply operation by the liquid supply mechanism 10 when the focus detection 56 causes an error because there is a risk that the liquid 1 may leak or flow out due to an abnormality in the optics.
0090Note that the abnormality in the positional relationship between the substrate stage PST (board holder PH) and the projection optical system PL in the Z-axis direction is not limited to the focus detection system 56, but a non-optical detection system such as a capacitance sensor should be used. It may be.
0091Further, the positional relationship between the image plane of the projection optical system PL and the surface of the substrate stage PST (board P) can be managed by using an interferometer. It is disclosed in, for example, USP6,020,964 that the positional relationship between the image plane of the projection optical system PL and the surface of the machine board stage PST (board P) is managed by using an interferometer, which is specified in this international application. Alternatively, to the extent permitted by the legislation of the selected country, those disclosures shall be incorporated as part of the text.
0092Further, in the above-described embodiment, the case where the abnormality occurs during the exposure operation has been described, but the same applies to the case where the abnormality occurs when the substrate P is not exposed.
0093Further, in the above-described embodiment, the liquid supply is stopped when an abnormality is detected during the liquid supply, but when the liquid supply is started, the projection optical system PL and the substrate stage PST are used. Even when an abnormality such as a positional relationship is detected, it is preferable to stop the supply start of the liquid.
0094<Second embodiment> Next, a second embodiment of the exposure apparatus EX of the present invention will be described. In the following description, the same or equivalent components as those in the above-described embodiment are designated by the same reference numerals, and the description thereof will be simplified or omitted. In the present embodiment, the leakage of the liquid 1 to the outside of the substrate P or the substrate stage PST (board holder PH) is optically detected by using a detector including an optical fiber, and the leakage or infiltration of the liquid 1 is detected. Occasionally, at least one of stopping the liquid supply operation by the liquid supply mechanism 10, stopping the power supply to the electrical equipment, and stopping the intake operation from the intake port is performed.
0095The detection principle of the detector that detects the leakage of the liquid 1 will be described with reference to FIGS. 6 and 7. In this embodiment, an optical fiber is used as a detector. FIG. 6 is a schematic configuration diagram showing a general optical fiber. In FIG. 6, the optical fiber 80'includes a core portion 81 that propagates light and a clad portion 82 that is provided around the core portion 81 and has a refractive index smaller than that of the core portion 81. In the optical fiber 80', light is confined and propagated in the core portion 81 having a higher refractive index than the clad portion 82.
0096FIG. 7 is a schematic configuration diagram showing the optical fiber 80 according to the present embodiment. In FIG. 7, the optical fiber 80 is an optical fiber (cladless fiber) having a core portion 81 for propagating light and having no clad portion provided around the core portion 81. The core portion 81 of the optical fiber 80 has a refractive index nc higher than the refractive index na of the surrounding gas (air in the present embodiment) and lower than the refractive index nw of the liquid (pure water in the present embodiment) 1. It has a refractive index (na <nc <nw). Therefore, when the periphery of the optical fiber 80 is filled with air, as long as the incident angle θ0 of light satisfies the total reflection condition sin θ0> na / nc, the light is directed to the core portion 81 having a refractive index nc higher than that of air. Confined and propagated. That is, the light incident from the incident end portion of the optical fiber 80 is emitted from the ejection end portion without significantly attenuating the amount of light. However, when liquid (pure water) 1 adheres to the surface of the optical fiber 80, nc <nw, so the total reflection condition sinθ0 = nw / nc must be satisfied at any angle of incidence where water adheres. Since total reflection does not occur at the interface between the liquid 1 and the optical fiber 80, light leaks to the outside from the liquid-attached portion of the optical fiber 80. Therefore, the amount of light incident from the incident end of the optical fiber 80 is reduced when emitted from the emission end. Therefore, by installing this optical fiber 80 at a predetermined position of the exposure device EX and measuring the amount of light at the injection end of the optical fiber 80, the control device CONT determines whether the liquid 1 has adhered to the optical fiber 80. That is, it is possible to detect whether or not the liquid 1 has leaked. Since the refractive index of air is about 1 and the refractive index of water is about 1.4 to 1.6, the core portion 81 is made of, for example, a material having a refractive index of about 1.2 (quartz, glass having a specific composition, etc.). Is preferable.
0097Further, the amount of the liquid 1 adhering to the optical fiber 80 can also be determined from the amount of attenuation of the light emitted from the injection end of the optical fiber 80. That is, the amount of light attenuation depends on the area of the portion where the liquid 1 is attached to the optical fiber, and when a small amount of liquid 1 is attached around the optical fiber 80, the amount of light attenuation at the injection end is small. , When a large amount of liquid 1 adheres, the amount of attenuation is large. Therefore, it is considered that the area of the portion to which the liquid 1 is attached depends on the amount of leakage of the liquid. Therefore, the amount of leakage of the liquid 1 can be obtained by measuring the amount of light at the injection end of the optical fiber 80. Furthermore, by comparing the measured value of the amount of light at the optical fiber ejection end with a plurality of preset threshold values (reference values) and emitting a specific signal when each threshold value is exceeded, each threshold value is emitted. The amount of leakage of liquid 1 can be detected step by step.
0098FIG. 8 is a side view showing a state in which the optical fiber 80 of the detector is arranged around the substrate stage PST (board holder PH), and FIG. 9 is a plan view. As shown in FIGS. 8 and 9, the optical fiber 80 is arranged so as to wind around the substrate stage PST (board holder PH). Then, a light projecting unit 83 capable of injecting light onto the optical fiber 80 is connected to the incident end of the optical fiber 80, and the light is propagated through the optical fiber 80 to the emission end of the optical fiber 80. A light receiving unit 84 capable of receiving light emitted from the unit is connected. The control device CONT is based on the amount of light when the light is incident on the optical fiber 80 from the light projecting unit 83 and the amount of light received by the light receiving unit 84, and the light at the injection end with respect to the incident end of the optical fiber 80. Based on the obtained result, it is determined whether or not the liquid 1 has adhered to the optical fiber 80, that is, whether or not the liquid 1 has leaked to the outside of the substrate stage PST (board holder PH). Then, when the control device CONT determines that the liquid 1 has leaked, the liquid supply mechanism 10 stops the liquid supply operation, stops the power supply to the electric device, stops the intake operation from the intake port, and the like. ..
0099The optical fiber 80 may be arranged on the upper surface of the substrate stage PST (board holder PH), particularly around the collection port 61, or the moving mirror 45 is checked for immersion (immersion). It may be placed at or around 45.
0100FIG. 10 shows an example in which the optical fiber 80 is arranged around the air bearing 42 provided on the lower surface of the substrate stage PST and around the substrate surface plate (base member) 41 that movably supports the substrate stage PST. It is a figure. Since the optical fiber 80 can be bent arbitrarily, it can be mounted by winding it around an arbitrary position where liquid 1 such as the substrate stage PST (board holder PH), the air bearing 42, and the substrate surface plate 41 easily leaks. It can be routed freely and can be arranged in any form. In particular, by attaching the optical fiber 80 around the air bearing 42, it is possible to satisfactorily detect whether or not the liquid 1 has adhered (leaked) in the vicinity of the air bearing 42, and the liquid 1 can be detected at the intake port 42A of the air bearing 42. It is possible to prevent the inconvenience of inflow.
0101By the way, in the above-mentioned optical fiber 80, if the distance from the incident end to the ejection end is long, it may be difficult to specify the position where the liquid 1 adheres to the optical fiber 80, that is, the leakage position of the liquid 1. Therefore, as shown in FIG. 11, the leakage position of the liquid 1 can be specified by arranging the plurality of optical fibers 80 two-dimensionally in a matrix. In FIG. 11, a plurality of detectors 90 are provided side by side in a second direction (X-axis direction) orthogonal to the first direction, with the first direction (Y-axis direction) as the longitudinal direction. It includes 80A and a second optical fiber 80B provided side by side in the first direction with the second direction as the longitudinal direction. These plurality of first and second optical fibers 80A and 80B are arranged in a matrix (mesh). The incident ends of each of the plurality of first optical fibers 80A are aggregated, and the aggregated portion and the ejection end of the aggregated fiber 85A are connected to each other. The incident end of the collective fiber 85A is connected to the light projecting unit 83A. On the other hand, the ejection ends of each of the plurality of first optical fibers 80A are connected to a light receiving portion 84A including, for example, a one-dimensional CCD line sensor or the like. Similarly, the incident ends of each of the plurality of second optical fibers 80B are aggregated, and the aggregated portion and the ejected end portion of the aggregated fiber 85B are connected to each other. The incident end of the collective fiber 85B is connected to the light projecting unit 83B. On the other hand, the ejection ends of each of the plurality of second optical fibers 80B are connected to a light receiving portion 84B including, for example, a one-dimensional CCD line sensor or the like.
0102The light emitted from the light projecting unit 83A propagates through the collective fiber 85A and then is branched into each of the plurality of first optical fibers 80A. The light incident from each incident end of the first optical fiber 80A propagates through the first optical fiber 80A, is emitted from the emission end, and is received by the light receiving portion 84A. The light receiving unit 84A detects each of the amount of light emitted from the emission end of each of the plurality of first optical fibers 80A. Here, as shown in FIG. 11, when the liquid 1 is attached to a specific first optical fiber 80AL among the plurality of first optical fibers 80A, the amount of light at the injection end of the first optical fiber 80AL. Decreases. The light receiving result of the light receiving unit 84A is output to the control device CONT. Similarly, the light emitted from the light projecting unit 83B propagates through the collective fiber 85B and then is branched into each of the plurality of second optical fibers 80B. The light incident from each incident end of the second optical fiber 80B propagates through the second optical fiber 80B, is emitted from the emission end, and is received by the light receiving portion 84B. The light receiving unit 84B detects each of the amount of light emitted from the emission end of each of the plurality of second optical fibers 80B. Here, as shown in FIG. 11, when the liquid 1 is attached to a specific second optical fiber 80BL among the plurality of second optical fibers 80B, the amount of light at the injection end of the second optical fiber 80BL. Decreases. The light receiving result of the light receiving unit 84B is output to the control device CONT. In the control device CONT, the leakage position of the liquid 1 (the position where the leaked liquid 1 adheres to the detector 90) is determined by the first optical fiber 80AL and the second optical fiber based on the light reception results of the light receiving units 84A and 84B respectively. It can be identified that it is near the intersection with the fiber 80BL.
0103FIG. 12 is a diagram showing an example in which a detector 90 having optical fibers 80A and 80B arranged in a matrix is arranged in a linear motor 47 (stator 47A) which is an electromagnetic drive source for driving a substrate stage PST. Is. By arranging the detector 90 on the linear motor 47, it is possible to locate the liquid 1 that leaks to the outside of the substrate stage PST and adheres to the linear motor 47. By identifying the position of the leaked liquid 1, for example, the work of removing the leaked liquid 1 can be efficiently performed.
0104When the liquid 1 is water and the leaked liquid (water) is to be removed, the water can be satisfactorily removed by performing the removal work (wiping work) using anhydrous alcohol, and the alcohol can be removed. Since it volatilizes immediately, the removal work can be performed smoothly.
0105As shown in the schematic diagram shown in FIG. 13, the position of the liquid 1 adhering to the surface of the optical fiber 80 can be specified by injecting pulsed light from the incident end portion of the optical fiber 80. When the liquid 1 is attached to the surface of the optical fiber 80, the pulsed light L1 incident from the incident end of the optical fiber 80 is reflected at the adhesion position of the liquid 1, and the reflected light L2 returns to the incident end side again. The phenomenon that comes occurs. Therefore, an optical element such as a polarizing beam splitter is provided on the incident side, and the reflected light is guided to the receiver by the optical element for detection. From the detection results, the incident end and the liquid are based on the time difference between the timing when the pulsed light L1 is incident on the optical fiber 80 and the timing when the reflected light L2 is received at the incident end, and the speed of light propagating through the optical fiber 80. The distance from the adhesion position of 1 can be obtained, and thus the adhesion position of the liquid 1 (leakage position of the liquid 1) can be specified. Since the speed of light propagating through the optical fiber 80 changes depending on the material for forming the optical fiber 80 (core portion 81), it can be obtained based on the material for forming the optical fiber 80.
0106<Third embodiment> Next, a third embodiment of the exposure apparatus EX of the present invention will be described. In the present embodiment, the leakage of the liquid 1 is optically detected by using a detector including a prism (optical element), and when the leakage of the liquid 1 is detected, the liquid supply operation by the liquid supply mechanism 10 is stopped and electricity is supplied. Execute at least one of stopping the power supply to the equipment and stopping the intake operation from the intake port.
0107The detection principle of the detector that detects the leakage of the liquid 1 will be described with reference to FIGS. 14 and 15. In this embodiment, a prism is used as a detector. FIG. 14 is a diagram showing a schematic configuration of a detector 100 using a prism. In FIG. 14, the detector 100 is attached to the prism 101, the first surface 101A of the prism 101, the light projecting unit 102 that projects light onto the prism 101, and the second surface 101B of the prism 101. It is provided with a light receiving unit 103 that receives the reflected light on the third surface 101C of the prism 101 of the light emitted from the light projecting unit 102. The first surface 101A and the second surface 101B are almost at right angles.
0108The prism 101 has a higher refractive index than the gas (air in the present embodiment) around it, and has a lower refractive index than the liquid (pure water in the present embodiment) 1. When the periphery of the prism 101 is filled with air, the refractive index of the prism is selected so that the light projected from the light projecting unit 102 onto the third surface 101C is totally reflected by the third surface 101C. .. Therefore, the light emitted from the light projecting unit 102 is received by the light receiving unit 103 without significantly attenuating the amount of light.
0109FIG. 15 is a diagram showing a state in which the liquid 1 is attached to the third surface 101C of the prism 101 of the detector 100. In FIG. 15, the light projected from the light projecting unit 102 onto the third surface 101C is not totally reflected by the third surface 101C due to the presence of the liquid 1, and a part (or all) of the light component adheres to the liquid of the prism 101. It leaks from the part to the outside. Therefore, the amount of light of the light component reaching the second surface 101B of the light emitted from the light projecting unit 102 is attenuated, so that the light receiving unit 103 bases the received light amount (light information) on the third surface 101C of the prism 101. It is possible to detect whether or not the liquid 1 has adhered to the light. Therefore, by installing the detector 100 provided with the prism 101 at a predetermined position of the exposure apparatus EX, the control device CONT determines whether the liquid 1 has adhered to the prism 101 based on the light receiving result of the light receiving unit 103. That is, it is possible to detect whether or not the liquid 1 has leaked.
0110FIG. 16 is a plan view showing an example in which the detector 100 having the prism 101 is arranged around the substrate stage PST. In FIG. 16, a plurality of detectors 100 are mounted around the substrate stage PST (board holder PH) at predetermined intervals with the third surface 101C of the prism 101 facing upward. The control device CONT is based on the amount of light emitted from the light projecting unit 102 of each detector 100 to the prism 101 and the amount of light received by the light receiving unit 103, and the amount of emitted light with respect to the amount of light incident on the prism 101. Based on the obtained result, it is determined whether or not the liquid 1 adheres to the prism 101, that is, whether or not the liquid 1 leaks to the outside of the substrate stage PST (substrate holder PH). Then, when the control device CONT determines that the liquid 1 has leaked, the liquid supply mechanism 10 stops the liquid supply operation, stops the power supply to the electric device, stops the intake operation from the intake port, and the like. ..
0111In the present embodiment, the control device CONT can easily identify the leakage position of the liquid 1 based on the detection results of each of the plurality of detectors 100 and the mounting position information of the detectors 100. Further, since the prism 101 is relatively small, it can be easily attached to an arbitrary position of the exposure apparatus EX, and the installation workability is good.
0112The detector 100 described above can also be applied to a water level gauge (liquid level gauge). FIG. 17 is a schematic view showing an example in which a plurality of detectors 100 are arranged side by side in the height direction (Z-axis direction) on the wall surface of the tank 110 capable of accommodating the liquid (water) 1. The wall surface of the tank 110 is transparent, and the detector 100 is attached so that the third surface 101C of the prism 101 is in contact with the wall surface of the tank 110. Of the plurality of detectors 100, the light receiving signal of the detector 100 (light receiving unit 103) that detects the liquid 1 in the tank 110 is lower than the light receiving signal of the detector 100 (light receiving unit 103) that does not detect the liquid 1. The control device CONT determines that the liquid 1 in the tank 110 is based on the detection result (light receiving result) of each of the plurality of detectors 100 and the mounting position information of the plurality of detectors 100 with respect to the tank 110. The liquid level (water level) can be obtained, and thus the amount of liquid in the tank 110 can be obtained.
0113FIG. 18 is a schematic configuration diagram showing an example in which a tank 110 including a detector 100 constituting a water level gauge is applied to a part of the liquid recovery mechanism 20. The liquid recovery mechanism 20 shown in FIG. 18 includes a recovery nozzle 21, a vacuum system 25 connected to the recovery nozzle 21 via a recovery pipe 24, and a gas-liquid separator 22 and a dryer provided in the middle of the recovery pipe 24. It has 23 and. Then, the liquid 1 separated by the gas-liquid separator 22 is accommodated in the tank 110 provided with the detector 100 via the second recovery pipe 26. That is, in the present embodiment, the tank 110 is provided in place of the flow meter 27 of the liquid recovery mechanism 20 described with reference to FIG. The detection result of the detector 100 is output to the control device CONT, and the control device CONT obtains the amount of liquid recovered through the recovery nozzle 21 based on the detection result of the detector 100. Then, the control device CONT can detect an abnormality in the recovery operation of the liquid recovery mechanism 20 by comparing the amount of liquid recovered from the recovery nozzle 21 with the amount of liquid supplied from the liquid supply mechanism 10. Further, a liquid recovery unit 28 is connected to the tank 110 via a pipe line 28A, and a valve 28B is provided in the middle of the pipe line 28A. The control device CONT operates the valve 28B (or periodically) when the tank 110 is filled with a predetermined amount or more to open the flow path 28A, and the liquid 1 in the tank 110 is collected by the liquid recovery unit 28. ..
0114Further, in the embodiment shown in FIG. 18, a detector 100 is attached to each of the supply pipe 15 and the recovery pipe 24. Here, each of the supply pipe 15 and the recovery pipe 24 is formed of a transparent material, and the detector 100 is attached so that the detection surface 100c of the detector 100 is in close contact with the outer surface of these pipes. Based on the light receiving result of the light receiving unit 103 of the detector 100 attached to the supply pipe 15, the control device CONT can detect whether or not the liquid 1 is flowing through the supply pipe 15. That is, since the value of the light receiving signal of the light receiving unit 103 is smaller in the case where the liquid 1 is distributed than in the case where the liquid 1 is not distributed in the supply tube 15, the control device CONT receives the light received by the light receiving unit 103. Based on the result, it is possible to detect whether or not the liquid 1 is flowing through the supply pipe 15, that is, whether or not the supply operation of the liquid supply mechanism 10 is normally performed. Similarly, the control device CONT determines whether or not the liquid 1 is flowing through the recovery tube 24, that is, the recovery of the liquid recovery mechanism 20, based on the light receiving result of the light receiving unit 103 of the detector 100 attached to the recovery tube 24. It is possible to detect whether or not the operation is performed normally. As described above, the detector 100 can also be used as a liquid presence / absence sensor that optically detects whether or not the liquid 1 is flowing through the supply pipe or the recovery pipe.
0115Further, by attaching the detector 100 having the prism 101, for example, near the tip of the projection optical system PL (near the optical element 2), the detector 100 is used between the projection optical system PL and the substrate P. It is also possible to detect whether the optics 1 is filled.
0116In the above-described embodiment, the leakage of the liquid 1 and the presence or absence of the liquid 1 are optically detected by using the optical fiber 80 or the prism 101, but the leakage or the presence or absence of the liquid 1 is electrically detected by using a capacitance sensor or the like. It may be.
0117When the liquid 1 is water, it is composed of two electric wires separated by a certain interval, and the leak of the liquid 1 or the leakage of the liquid 1 is detected by a water leakage sensor that detects the leakage of the liquid 1 depending on the presence or absence of continuity between the two electric wires. The presence or absence can also be detected electrically. Since water is used as the liquid 1 in this embodiment, the water leakage sensor having the above configuration can be used. When ultrapure water is used as the liquid 1, the presence or absence of the liquid 1 cannot be detected by the water leakage sensor having the above configuration because the ultrapure water has no conductivity. In that case, if the coating of the two separated electric wires contains an electrolytic substance in advance, conductivity will be obtained when the ultrapure water infiltrates. Therefore, the liquid 1 which is the ultrapure water is used by the water leakage sensor having the above configuration. Can be detected.
0118Needless to say, the feature portions of the above-described embodiments can be combined and used. For example, it is possible to lay an optical fiber 80 around a linear motor and arrange a detector 100 having a prism 101 around a substrate stage PST (board holder PH).
0119Further, the optical fiber and the prism do not have to be installed at all the above-mentioned positions, and may be installed as needed, such as inside the substrate stage PST or near an actuator such as a photoelectric detector or a piezo element.
0120Further, as described with reference to FIGS. 8 to 10, the optical fiber 80 can be arranged so as to wind around the substrate stage PST and the substrate surface plate 41, but the side surface of FIG. 19 (b). As shown in the figure, it is of course possible to provide the first optical fiber 80C around the substrate stage PST and the second optical fiber 80D around the substrate surface plate 41 in combination. Further, the optical fiber 80 (80E) may be arranged inside the collection port 61 provided on the substrate stage PST. Similar to the above-described embodiment, in FIG. 19, the substrate stage PST includes an auxiliary plate 43 formed so as to surround the substrate P held by the substrate holder PH, and a collection port 61 provided on the outside thereof. ing. The auxiliary plate 43 is provided around the substrate P held by the substrate holder PH, and has a flat surface (flat portion) 43A that is substantially flush with the surface of the substrate P. The flat surface 43A is provided in an annular shape so as to surround the periphery of the substrate P. Further, a collection port 61 is provided on the outside of the auxiliary plate 43 (flat surface 43A). The collection port 61 is an annular groove formed so as to surround the auxiliary plate 43 (board P). In the present embodiment, the liquid absorbing member (62) is not arranged inside the recovery port 61. Then, as shown in the plan view of FIG. 19A, the optical fiber 80E is arranged over the entire circumference of the collection port 61 formed in an annular shape. By providing the optical fiber 80E for detecting the presence or absence of the liquid 1 inside the recovery port 61, even if the liquid 1 leaks from the substrate P, the leaked liquid 1 leaks in the optical fiber 80E before it diffuses. Liquid 1 can be detected. Therefore, when the optical fiber 80E detects the presence of the liquid 1, the control device CONT takes appropriate measures such as stopping the liquid supply operation of the liquid supply mechanism 10 by using the valve 13 to reduce the liquid 1. It is possible to prevent diffusion and leakage from the substrate stage PST. When the optical fiber 80E is arranged inside the recovery port 61, the liquid absorbing member (62) may be arranged in the recovery port 61.
0121Further, as shown in FIG. 19B, when the optical fibers 80 for detecting the presence or absence of the liquid 1 are provided at each of the plurality of predetermined positions of the exposure apparatus EX (board stage PST), these plurality of optical fibers Depending on the detection result of 80, the control device CONT may control the operation of the exposure device EX. For example, the control device CONT stops the liquid supply by the liquid supply mechanism 10 and stops the power supply to the electric device at least according to the position of the optical fiber 80 in which the liquid 1 is detected among the plurality of optical fibers 80. Select one action.
0122Specifically, the control device CONT stops the liquid supply operation of the liquid supply mechanism 10 when the first optical fiber 80C provided on the substrate stage PST detects the presence of the liquid 1, and causes the substrate platen 41 to stop the liquid supply operation. When the provided second optical fiber 80D detects the presence of the liquid 1, the power supply to the predetermined electric device is stopped. Here, the predetermined electrical equipment includes linear motors 47 and 48 for driving the substrate stage PST, vibration isolation unit 9 for vibration isolation and support of the substrate surface plate 41, and the like.
0123When the first optical fiber 80C provided on the board stage PST detects the presence of liquid 1 and the second optical fiber 80D provided on the board surface plate 41 does not detect the presence of liquid 1, the control device CONT Determines that the leaked liquid 1 does not reach the linear motors 47 and 48 that drive the board stage PST and the vibration isolation unit 9. That is, the control device CONT determines that the diffusion range of the leaked liquid 1 is a relatively narrow range. In this case, the control device CONT stops the liquid supply operation of the liquid supply mechanism 10, but continues to supply power to the linear motors 47 and 48 and the vibration isolation unit 9. On the other hand, when the second optical fiber 80D provided on the substrate surface plate 41 detects the presence of the liquid 1, the control device CONT is covered by the liquid 1 leaked to the linear motors 47 and 48 and the vibration isolation unit 9. Judge that there is. That is, the control device CONT determines that the diffusion range of the leaked liquid 1 is a relatively wide range. In this case, the control device CONT stops the liquid supply operation of the liquid supply mechanism 10 and stops the power supply to at least one of the linear motors 47 and 48 and the vibration isolation unit 9. When the second optical fiber 80D detects the presence of the liquid 1, the control device CONT stops the power supply to the linear motors 47 and 48 or the vibration isolation unit 9, but the power to the entire exposure device EX is increased. It is preferable not to stop the supply. This is because if the power supply to the entire exposure apparatus EX is stopped, it takes a long time for the subsequent restoration work and stabilization.
0124In this way, the operation of the exposure apparatus EX is controlled according to the detection results of the first optical fiber 80C and the second optical fiber 80D provided at different positions, so that the diffusion range of the leaked liquid 1 is controlled. Appropriate measures can be taken according to the situation. Therefore, it is possible to shorten the time required for the recovery work after the leakage of the liquid 1 occurs, and it is possible to prevent a decrease in the operating rate of the exposure apparatus EX. Then, when the first optical fiber 80C provided on the substrate stage PST detects the presence of the liquid 1, the control device CONT stops the liquid supply by the liquid supply mechanism 10 and continues the power supply to the electric equipment. As a result, the time required for restoration work and stabilization can be minimized. On the other hand, when the second optical fiber 80D provided on the board surface plate 41 detects the presence of the liquid 1, the control device CONT powers the linear motors 47 and 48 and the vibration isolation unit 9 for driving the board stage PST. Stop supply. By doing so, even if the leaked liquid diffuses over a wide range, it is possible to prevent damage such as electric leakage or failure.
0125Further, the control device CONT may control the operation of the exposure device EX according to the amount of the liquid 1 detected by the optical fiber 80. For example, the control device CONT selects at least one operation of stopping the liquid supply operation of the liquid supply mechanism 10 and stopping the power supply to the electric device according to the amount of the liquid 1 detected by the optical fiber 80.
0126Specifically, the control device CONT supplies the liquid when at least one of the first optical fiber 80C and the second optical fiber 80D detects a liquid 1 in an amount equal to or more than a predetermined first reference value. When the liquid supply operation of the mechanism 10 is stopped and the amount of liquid 1 equal to or greater than the second reference value is detected, the linear motors 47 and 48 that drive the substrate stage PST and the substrate platen 41 are vibration-proofed and supported. Stop the power supply to electrical equipment such as unit 9. Here, the second reference value is larger than the first reference value.
0127When the control device CONT determines that the amount of liquid 1 detected in at least one of the first optical fiber 80C and the second optical fiber 80D is equal to or more than the first reference value and less than the second reference value, It is judged that the amount of leaked liquid 1 is relatively small. In this case, the control device CONT stops the liquid supply operation of the liquid supply mechanism 10, but continues to supply power to the linear motors 47 and 48 and the vibration isolation unit 9. On the other hand, when the control device CONT determines that the amount of liquid 1 detected in at least one of the first optical fiber 80C and the second optical fiber 80D is equal to or more than the second reference value, the amount of leaked liquid 1 Is judged to be a large amount. In this case, the control device CONT stops the liquid supply operation of the liquid supply mechanism 10 and stops the power supply to at least one of the linear motors 47 and 48 and the vibration isolation unit 9. When the optical fibers 80C and 80D detect an amount of liquid 1 equal to or greater than the second reference value, the control device CONT stops the power supply to the linear motors 47 and 48 or the vibration isolation unit 9, but exposes the light. It is preferable not to stop the power supply to the entire device EX. This is because if the power supply to the entire exposure apparatus EX is stopped, it takes a long time for the subsequent restoration work and stabilization.
0128In this way, it is possible to control the operation of the exposure apparatus EX according to the amount of liquid 1 detected by the optical fiber 80, and even in this case, appropriate measures are taken according to the amount of leaked liquid 1. You can take it. Therefore, it is possible to shorten the time required for the recovery work after the leakage of the liquid 1 occurs, and it is possible to prevent a decrease in the operating rate of the exposure apparatus EX.
0129In the above-described embodiment, one optical fiber 80 is arranged so as to surround the periphery of the substrate stage PST and the substrate surface plate 41, but a plurality of optical fibers surround the periphery of the substrate stage PST and the substrate surface plate 41. You can also do it. For example, one optical fiber 80 can be arranged on each of the four sides of the substrate surface plate 41, and a total of four optical fibers 80 can surround the substrate surface plate 41. In this way, when one of the optical fibers detects the liquid 1, it is possible to easily identify the leakage location of the liquid 1 by examining which optical fiber is reacting.
0130Further, as described above, when the positional relationship between the projection optical system PL and the substrate stage PST becomes abnormal, the liquid 1 cannot be held under the projection optical system PL, and the liquid 1 leaks. .. Therefore, to prevent the leakage liquid 1 in order, may be limiting the movement range of the substrate stage PST. This will be described with reference to FIG.
0131In FIG. 20, the substrate stage PST is a first region which is a flat region including a substrate P (or dummy substrate DP) surface held by the substrate holder PH and a flat surface 43A of an auxiliary plate 43 flush with the substrate P surface. Has LA1. Further, the position facing the first region LA1 is a flat region including a part of the lower surface (lower surface) 2a on the image plane side of the projection optical system PL and a part of the lower surface of the plate member 2P flush with the lower surface 2a. A second region LA2 is provided. Here, the liquid 1 is held between the first flat surface on the substrate stage PST and the second flat surface including the tip surface 2a of the projection optical system PL and facing the first flat surface. It forms an immersion area AR2. Therefore, the first region LA1 on the substrate stage PST and the second region LA2 facing the first region LA1 and including the tip surface 2a of the projection optical system PL are liquid holding regions. Then, the liquid 1 is held between a part of the first region LA1 and the second region LA2 to form the immersion region AR2.
0132The first region LA1 and the second region LA2 do not necessarily have to be flat surfaces, and the surfaces may have curved surfaces or irregularities as long as the liquid 1 can be held.
0133In the present embodiment, the liquid 1 in the immersion region AR2 is a supply nozzle 14 having a liquid supply port 14K and a recovery nozzle having a liquid recovery port 21K arranged around the optical element 2 at the tip of the projection optical system PL. It is also in contact with some of the 21. That is, the second region LA2 capable of holding the liquid 1 includes the liquid contact surfaces of the supply nozzle 14 and the recovery nozzle 21.
0134Then, in the present embodiment, the control device CONT limits the movement of the substrate stage PST according to the positional relationship between the first region LA1 and the second region LA2. Specifically, as shown in FIG. 20 (a), when the liquid 1 is held between the first region LA1 and the second region LA2, the first region as shown in FIG. 20 (b). Liquid 1 can be retained up to the positional relationship between LA1 and the second region LA2. However, when the substrate stage PST moves in the + X direction from the positional relationship shown in FIG. 20 (b), a part of the immersion region AR2 goes out of the first region LA1 and the first region LA1 A situation occurs in which liquid 1 cannot be retained between and the second region LA2. At this time, the control device CONT determines that an abnormality has occurred in the positional relationship between the first region LA1 and the second region LA2, and restricts the movement of the substrate stage PST. Specifically, the control device CONT stops the movement of the substrate stage PST. This makes it possible to prevent inconveniences such as the outflow of liquid 1.
0135Here, the control device CONT can determine whether or not an abnormality has occurred in the positional relationship between the first region LA1 and the second region LA2 based on the measurement result of the interferometer 46. The control device CONT detects the position of the substrate stage PST in the XY direction by the interferometer 46, and based on the position detection result, the position information of the first region LA1 with respect to the second region LA2, that is, the first region LA1 and the second region LA2. Find the positional relationship with the region LA2. Information on the sizes of the first region LA1 and the second region LA2 is stored in advance in the control device CONT. Further, information on the size of the immersion region AR2 formed between the first region LA1 and the second region LA2 is also obtained in advance by, for example, an experiment or a simulation, and is stored in the control device CONT. Further, an abnormal value regarding the positional relationship between the first region LA1 and the second region LA2 is obtained in advance from the control device CONT, and is stored in the control device CONT. Here, the abnormal value is a value (relative distance) in which the liquid 1 cannot be held between the first region LA1 and the second region LA2, and the first region LA1 with respect to the second region LA2. When exceeds the above abnormal value, the liquid 1 cannot be held between the first region LA1 and the second region LA2.
0136Based on the measurement result of the interferometer 46, the control device CONT limits (stops) the movement of the substrate stage PST when the position of the first region LA1 with respect to the second region LA2 exceeds the abnormal value. By doing so, it is possible to prevent inconveniences such as the outflow of the liquid 1.
0137Further, based on the measurement result of the interferometer 46, the control device CONT stops the movement of the substrate stage PST when the position of the first region LA1 with respect to the second region LA2 exceeds the abnormal value, but instead stops the movement of the substrate stage PST. The moving direction of the stage PST may be changed. Specifically, in FIG. 20, when the substrate stage PST moves in the + X direction and the second region LA2 has an abnormal positional relationship with respect to the first region LA1, the control device CONT sets the substrate stage. Move the PST, for example, in the -X direction. By doing so, it is possible to prevent inconveniences such as the outflow of the liquid 1.
0138Further, the control device CONT has a liquid supply mechanism when an abnormality occurs in the positional relationship between the first region LA1 and the second region LA2 and the position of the first region LA1 with respect to the second region LA2 exceeds the abnormal value. The operation of (10) may be restricted. Specifically, the control device CONT stops the liquid supply operation by the liquid supply mechanism (10) when an abnormality occurs in the positional relationship between the first region LA1 and the second region LA2. By doing so, it is possible to prevent inconveniences such as the outflow of the liquid 1. Alternatively, the control device CONT reduces the liquid supply amount (liquid supply amount per unit time) by the liquid supply mechanism (10) when the second region LA2 has an abnormal positional relationship with respect to the first region LA1. .. Alternatively, the control device CONT may stop the power supply to the linear motor (47, 48) or the vibration isolator (9) when an abnormality occurs in the positional relationship between the first region LA1 and the second region LA2. The intake air from the intake port (42A) may be stopped.
0139On the other hand, for example, after the immersion exposure of the substrate P is completed, the liquid supply by the liquid supply mechanism (10) is stopped, and the liquid 1 on the substrate P (the substrate stage PST) is recovered by the liquid recovery mechanism (20). , Liquid 1 is not retained between the first region LA1 and the second region LA2. In that case, the control device CONT releases the restriction on the movement of the board stage PST. That is, the control device CONT can hold the moving range of the substrate stage PST between the first region LA1 and the second region LA2 while the liquid supply mechanism (10) supplies the liquid 1. It is limited to the first range, and while the liquid supply mechanism (10) is stopping the supply of the liquid 1, it is limited to the second range wider than the first range. That is, when the control device CONT holds the liquid 1 between the projection optical system PL and the substrate stage PST (substrate P), the control device CONT limits the movement range of the substrate stage PST to the first range and projects the liquid 1. When the liquid 1 is not held between the optical system PL and the substrate stage PST (substrate P), the substrate stage PST is allowed to move within the second range wider than the first range. By doing so, for example, during the exposure of the substrate P, it becomes possible to keep the liquid 1 satisfactorily held between the projection optical system PL and the substrate stage PST (substrate P), for example, the substrate stage which is a subsequent operation. Predetermined operations such as the operation of the PST moving to the load / unload position of the board P can be smoothly performed.
0140<Fourth Embodiment> 21 is a view showing a fourth embodiment of the present invention, FIG. 21 (a) is a side view, and FIG. 21 (b) is a plan view of a substrate stage viewed from above. In FIG. 21A, a nozzle member 18 having a liquid supply port 14K and a liquid recovery port 21K is provided around the optical element 2 of the projection optical system PL. In the present embodiment, the nozzle member 18 is an annular member provided above the substrate P (substrate stage PST) so as to surround the side surface of the optical element 2. A gap is provided between the nozzle member 18 and the optical element 2, and the nozzle member 18 is supported by a predetermined support mechanism so as to be isolated from the vibration of the optical element 2.
0141The nozzle member 18 includes a liquid supply port 14K provided above the substrate P (substrate stage PST) and arranged so as to face the surface of the substrate P. In this embodiment, the nozzle member 18 has two liquid supply ports 14K. The liquid supply port 14K is provided on the lower surface 18a of the nozzle member 18.
0142Further, the nozzle member 18 includes a liquid recovery port 21K provided above the substrate P (substrate stage PST) and arranged so as to face the surface of the substrate P. In this embodiment, the nozzle member 18 has two liquid recovery ports 21K. The liquid recovery port 21K is provided on the lower surface 18a of the nozzle member 18.
0143The liquid supply ports 14K and 14K are provided at positions on both sides of the projection area AR1 of the projection optical system PL in the X-axis direction, and the liquid recovery ports 21K and 21K are located in the projection area AR1 of the projection optical system PL. On the other hand, it is provided outside the liquid supply ports 14K and 14K. The projection region AR1 of the projection optical system PL in the present embodiment is set in a rectangular shape in a plan view with the Y-axis direction as the longitudinal direction and the X-axis direction as the lateral direction.
0144The lower surface (the surface facing the substrate P side) 18a of the nozzle member 18 is a substantially flat surface, the lower surface (liquid contact surface) 2a of the optical element 2 is also a flat surface, and the lower surface 18a of the nozzle member 18 and the optical element 2 It is almost flush with the lower surface 2a of. Thereby, the immersion region AR2 can be satisfactorily formed in a wide range. The second region LA2 capable of holding the liquid 1 is a region inside the recovery port 21K of the lower surface 2a of the optical element 2 and the lower surface 18a of the nozzle member 18.
0145A recess 55 is provided on the board stage PST, and the board holder PH is arranged in the recess 55. The upper surface 57 of the substrate stage PST other than the recess 55 is a flat surface (flat portion) so as to have substantially the same height (flat portion) as the surface of the substrate P held by the substrate holder PH. The first region LA1 capable of holding the liquid 1 is a region including the substrate P surface and the upper surface 57.
0146As shown in FIG. 21 (b), the moving mirror 45 is arranged at two edges of the plan-view rectangular substrate stage PST perpendicular to each other. Further, on the substrate stage PST, a reference member 300 is arranged at a predetermined position outside the substrate P. The reference member 300 is provided with a reference mark PFM detected by a substrate alignment system (not shown) and a reference mark MFM detected by a mask alignment system in a predetermined positional relationship. In the substrate alignment system of the present embodiment, for example, as disclosed in Japanese Patent Application Laid-Open No. 4-65603, the substrate stage PST is stationary and the mark is irradiated with illumination light such as white light from a halogen lamp. An FIA (field image alignment) method is adopted in which an image of the obtained mark is imaged in a predetermined imaging field of view by an image sensor and the position of the mark is measured by image processing. Further, in the mask alignment system of the present embodiment, for example, as disclosed in Japanese Patent Application Laid-Open No. 7-176468, the mark is irradiated with light, and the image data of the mark captured by a CCD camera or the like is image-processed. The VRA (Visual Reticle Alignment) method that detects the mark position is adopted. The upper surface 301A of the reference member 300 is a substantially flat surface, and is provided at substantially the same height (flush) as the surface of the substrate P held by the substrate stage PST and the upper surface 57 of the substrate stage PST. The upper surface 301A of the reference member 300 can also serve as a reference surface for the focus detection system 56.
0147The substrate alignment system also detects the alignment mark AM formed on the substrate P. As shown in FIG. 21 (b), a plurality of shot regions S1 to S24 are formed on the substrate P, and a plurality of alignment mark AMs are provided on the substrate P corresponding to the plurality of shot regions S1 to S24. ing.
0148Further, on the substrate stage PST, an illuminance unevenness sensor 400 as disclosed in Japanese Patent Application Laid-Open No. 57-117238 is arranged as a measurement sensor at a predetermined position outside the substrate P. The illuminance unevenness sensor 400 includes a top plate 401 having a rectangular shape in a plan view. The upper surface 401A of the upper plate 401 is a substantially flat surface, and is provided at substantially the same height (flush) as the substrate P surface held by the substrate stage PST and the upper surface 57 of the substrate stage PST. A pinhole portion 470 that allows light to pass through is provided on the upper surface 401A of the upper plate 401. Of the upper surface 401A, except for the pinhole portion 470, it is covered with a light-shielding material such as chrome.
0149Further, on the substrate stage PST, a spatial image measurement sensor 500 as disclosed in, for example, Japanese Patent Application Laid-Open No. 2002-14005 is provided as a measurement sensor at a predetermined position outside the substrate P. The spatial image measurement sensor 500 includes a top plate 501 having a rectangular shape in a plan view. The upper surface 501A of the upper plate 501 is a substantially flat surface, and is provided at substantially the same height (floating surface) as the surface of the substrate P held by the substrate stage PST and the upper surface 57 of the substrate stage PST. The upper surface 501A of the upper plate 501 is provided with a slit portion 570 through which light can pass. Of the upper surface 501A, except for the slit portion 570, it is covered with a light-shielding material such as chrome.
0150Further, on the substrate stage PST, for example, an irradiation amount sensor (illuminance sensor) 600 as disclosed in Japanese Patent Application Laid-Open No. 11-16816 is also provided, and the upper surface 601A of the upper plate 601 of the irradiation amount sensor 600 is also provided. Is provided at almost the same height (flush) as the surface of the substrate P held by the substrate stage PST and the upper surface 57 of the substrate stage PST.
0151Further, on the side surface of the substrate stage PST, a gutter member 89 is provided so as to surround the substrate stage PST. The gutter member 89 is capable of recovering (holding) the liquid 1 leaked from the substrate P or the substrate stage PST, and is provided outside the upper surface (flat surface) 57 of the substrate stage PST. An optical fiber 80 capable of detecting the presence or absence of the liquid 1 is arranged inside the gutter member 89. When the optical fiber 80 of the gutter member 89 detects the presence of the liquid 1, the control device CONT takes appropriate measures such as stopping the liquid supply operation of the liquid supply mechanism (10) as in the above-described embodiment.
0152In the present embodiment, not only the immersion region AR2 is formed on the substrate P when the substrate P is exposed, but also when measuring the reference mark MFM of the reference member 300, for example, or when the sensors 400, 500, 600 are used. When the measurement process used is performed, the immersion region AR2 is formed on each of the upper plates 301, 401, 501, and 601. Then, the measurement process is performed via the liquid 1. For example, when the reference mark MFM on the reference member 300 is measured through the liquid 1, the region of the first region LA1 including the upper surface 301A of the reference member 300 and the second region LA2 face each other, and the first region LA1 Liquid 1 is filled between a part of and the second region LA2. When the measurement process via the liquid 1 is performed using the illuminance unevenness sensor 400, the region including the upper surface 401A of the upper plate 401 and the second region LA2 of the first region LA1 face each other, and a part of the first region LA1. Liquid 1 is filled between and the second region LA2. Similarly, when performing measurement processing via the liquid 1 using the sensors 500 and 600, the region of the first region LA1 including the upper surfaces 501A and 601A of the upper plates 501 and 601 and the second region LA2 face each other. Liquid 1 is filled between a part of the first region LA1 and the second region LA2.
0153Then, the control device CONT moves the substrate stage PST while the liquid supply mechanism (10) supplies the liquid 1 in order to form the immersion region AR2 on the substrate stage PST (on the first region LA1). The range is limited to the first range SR1 shown in FIG. 21 (b). In FIG. 21 (b), the symbol LA2a indicates the position when the second region LA2 is arranged on the most + Y side and the -X side of the first region LA1 within the range in which the liquid 1 can be held. .. Here, in FIG. 21 (b), for the sake of simplicity, it is assumed that the optical axis AX (second region LA2) of the projection optical system PL moves with respect to the substrate stage PST (first region LA1). To do. Similarly, the reference numeral LA2b indicates the position when the second region LA2 is arranged on the most + Y side and + X side of the first region LA1. The symbol LA2c indicates the position when the second region LA2 is arranged on the most -Y side and + X side of the first region LA1. The symbol LA2d indicates the position when the second region LA2 is arranged on the most -Y side and -X side of the first region LA1.
0154The inner region connecting the centers of each of the second regions LA2a to LA2d (here, the optical axis AX of the projection optical system PL) is the first range SR1. In this way, while the liquid supply mechanism (10) is supplying the liquid 1, by limiting the movement range of the substrate stage PST to the first range SR1, the first region AL1 and the second region AL2 are always used. The liquid 1 can be held between the two, and inconveniences such as leakage of the liquid 1 can be prevented.
0155On the other hand, while the liquid supply mechanism (10) is not supplying the liquid 1, the control device CONT limits the movement range of the substrate stage PST to the second range SR2, which is wider than the first range SR1. Here, the first range SR1 is included in the second range SR2. In this way, while the liquid supply mechanism (10) stops supplying the liquid 1, the substrate stage PST loads the substrate P by limiting it to the second range SR2, which is wider than the first range SR1. -It is possible to smoothly perform a predetermined operation such as moving to the unload position.
0156Although each embodiment of the present invention has been specifically described above, in the present invention, when an abnormality is detected by the control device provided in the exposure device, the control device controls an appropriate mechanism or device of the exposure device. Therefore, it is possible to prevent electric leakage, water leakage suction, etc. due to water leakage. Here, the relationship between the detection site for detecting an abnormality, the control device, and the controlled unit controlled by the control device is summarized in the block diagram of FIG. 23. The control device of the exposure device is a detection device provided inside the exposure device, for example, as described above, an abnormality (liquid flow) is detected by the supply side flow meter or the recovery side flow meter alone or from the difference in the flow rates thereof. Supply / recovery flowmeter to detect, stage interferometer to detect stage position abnormality (resulting in water leakage) by measuring the stage position of the board stage, stage position abnormality to measure the focus status of the board stage (according to it) Focus detection system that detects (leakage), leak detectors 1 and 2 that detect water leakage (abnormality) adhering to optical fibers and prisms installed on the substrate stage and base plate, and abnormalities in the amount of recovery from the water level of the recovery tank. It is connected to various detection systems such as a water level gauge that detects it. The control device can receive an abnormal signal from those detection systems. At this time, the control device can compare the predetermined reference signal with the signal received from each detector to determine whether it is a normal signal or an abnormal signal.
0157The control device of the exposure device is also connected to various related devices outside the exposure device, for example, a liquid (pure water) production device, a liquid (pure water) temperature control device, a developing device, a substrate transfer device, and the like. It is possible to receive a signal notifying the abnormality of the related device of. Further, the control device of the exposure apparatus can also receive a signal notifying the abnormality of the factory in which the exposure apparatus is installed. Abnormalities in factories where exposure equipment is installed include abnormalities in clean rooms where exposure equipment is installed, abnormalities in the power of pure water and electric power supplied to the exposure equipment, earthquakes and fires. The control device may compare a predetermined reference signal with a signal received from each related device to determine whether it is a normal signal or an abnormal signal.
0158As described in each of the above-described embodiments, the control device of the exposure device further includes a controlled device, for example, a liquid supply mechanism, a liquid recovery mechanism, a stage device, particularly a stage air bearing, a stage linear motor, and a substrate holder suction system. , Photomal and other sensors, anti-vibration units, actuators and other components are connected, and signals for notifying abnormalities of each component can be received. Further, if a sensor for detecting an earthquake is provided, the control device can also receive an abnormal signal from the earthquake sensor. Further, when a water quality sensor for measuring the quality of the liquid 1 (temperature, dissolved oxygen concentration, ratio of impurities such as organic substances) is provided, an abnormal signal can be received from the water quality sensor as well.
0159The control operation of the control device will be briefly described with reference to FIG. 24. The control device receives a signal indicating an abnormality from the detection system inside the exposure apparatus or the related devices 1 to 4 outside the exposure apparatus. The signal indicating the abnormality is, for example, a signal that affects the flow of the liquid supplied (and further recovered) for immersion exposure. At this time, the control device may compare the received signal with the reference signal and determine that the received signal is an abnormal signal. Next, the control device identifies the site where the abnormality has occurred from the abnormality signal. At this time, the control device may issue an alarm with the alarm device. Then, the control device determines which device should be controlled according to the site where the abnormality has occurred, and sends a control signal to the device to deal with the abnormal situation. For example, when a liquid leak is detected by a leak detector 1 (optical fiber, etc.) provided on the substrate stage, the control device supplies the liquid by the liquid supply mechanism and moves the stage by the stage control system according to the detection signal. , Stops the intake by the stage air bearing and the substrate holder adsorption system, and also stops the power supply to the stage linear motor, the substrate holder adsorption system, the sensor, the vibration isolation unit, and the actuator, while continuing only the liquid recovery of the liquid recovery mechanism. Can be made to. The control device determines which device to stop operating according to the location where the liquid leaked and the degree of leakage (the magnitude of the signal). Depending on the magnitude of the detection signal, the electrical equipment such as the stage linear motor and the sensor may be operated as it is, and only the operation of the liquid supply mechanism may be stopped.
0160As described above, pure water was used as the liquid 1 in this embodiment. Pure water has the advantage that it can be easily obtained in large quantities at semiconductor manufacturing factories and the like, and that there is no adverse effect on the photoresist, optical element (lens), etc. on the substrate P. Further, since pure water has no adverse effect on the environment and the content of impurities is extremely low, it can be expected to have an effect of cleaning the surface of the substrate P and the surface of the optical element provided on the tip surface of the projection optical system PL. ..
0161The refractive index n of pure water (water) with respect to the exposure light EL having a wavelength of about 193 nm is said to be about 1.44. When ArF excimer laser light (wavelength 193 nm) is used as the light source of the exposure light EL, the substrate On P, the wavelength is shortened to 1 / n, that is, about 134 nm, and high resolution can be obtained. Furthermore, since the depth of focus is magnified about n times, that is, about 1.44 times that in air, if it is sufficient to secure the same depth of focus as when using in air, the projection optical system PL The numerical aperture can be further increased, which also improves the resolution.
0162In the present embodiment, the optical element 2 is attached to the tip of the projection optical system PL, but the optical element attached to the tip of the projection optical system PL includes optical characteristics of the projection optical system PL, such as aberration (spherical aberration, coma). It may be an optical plate used for adjusting (abrasiveness, etc.). Alternatively, it may be a parallel flat plate capable of transmitting the exposure light EL. By using a parallel flat plate that is cheaper than the lens for the optical element that comes into contact with the liquid 1, the transmittance of the projection optical system PL and the exposure light EL on the substrate P during transportation, assembly, adjustment, etc. of the exposure device EX Even if a substance that reduces the optics and the uniformity of the illuminance distribution (for example, a silicon-based organic substance) adheres to the parallel flat plate, it is only necessary to replace the parallel flat plate immediately before supplying the liquid 1, and the liquid 1 needs to be replaced. There is an advantage that the replacement cost is lower than that in the case where the optical element in contact with the lens is used as a lens. That is, since the surface of the optical element that comes into contact with the liquid 1 becomes dirty due to the scattering particles generated from the resist or the adhesion of impurities in the liquid 1 due to the irradiation of the exposure light EL, the optical element is replaced regularly. Although it is necessary, by using an inexpensive parallel flat plate for this optical element, the cost of replacement parts is lower than that of a lens, the time required for replacement can be shortened, and the maintenance cost (running cost) increases. And the decrease in throughput can be suppressed.
0163Although the liquid 1 of the present embodiment is water, it may be a liquid other than water. For example, when the light source of the exposure light EL is an F2 laser, the F2 laser light does not transmit water. In this case, as the liquid 1, a fluorine-based liquid such as a fluorine-based oil or a perfluorinated polyether (PFPE) capable of transmitting F2 laser light may be used. In addition, the liquid 1 is transparent to the exposure light EL, has a high refractive index as much as possible, and is stable to the photoresist applied to the surface of the projection optical system PL and the substrate P (for example, cedar). It is also possible to use oil).
0164In each of the above embodiments, the shape of the nozzles described above is not particularly limited, and for example, the liquid 1 may be supplied or recovered by two pairs of nozzles on the long side of the projection region AR1. In this case, the supply nozzle and the recovery nozzle may be arranged side by side so that the liquid 1 can be supplied and recovered from either the + X direction or the -X direction. Good.
0165The substrate P of each of the above embodiments is not only a semiconductor wafer for manufacturing a semiconductor device, but also a glass substrate for a display device, a ceramic wafer for a thin film magnetic head, or an original plate of a mask or reticle used in an exposure apparatus. (Synthetic quartz, silicon wafer) etc. are applied.
0166Further, in the above-described embodiment, the exposure apparatus that locally fills the space between the projection optical system PL and the substrate P with a liquid is adopted, but the stage holding the substrate to be exposed is moved in the liquid tank. The present invention can also be applied to an immersion exposure apparatus for making a liquid immersion exposure apparatus and an immersion exposure apparatus for forming a liquid tank having a predetermined depth on a stage and holding a substrate in the liquid bath. The structure and exposure operation of the immersion exposure apparatus for moving the stage holding the substrate to be exposed in the liquid tank are described in detail in, for example, Japanese Patent Application Laid-Open No. 6-124873, and a predetermined depth is provided on the stage. The structure and exposure operation of the immersion exposure apparatus that forms the liquid tank and holds the substrate in it are described in detail in, for example, Japanese Patent Application Laid-Open No. 10-303114 and US Pat. No. 5,825,043. To the extent permitted by the law of the country designated or selected in, the contents of these documents shall be incorporated as part of the text.
0167As the exposure device EX, in addition to a step-and-scan scanning type exposure device (scanning stepper) in which the mask M and the substrate P are synchronously moved to scan and expose the pattern of the mask M, the mask M and the substrate P are used. It can also be applied to a step-and-repeat projection exposure apparatus (stepper) in which the pattern of the mask M is collectively exposed in a stationary state and the substrate P is sequentially moved step by step. The present invention can also be applied to a step-and-stitch exposure apparatus in which at least two patterns are partially overlapped and transferred on the substrate P.
0168The present invention can also be applied to a twin-stage type exposure apparatus provided with two stages in which substrates to be processed such as wafers are placed separately and can be moved independently in the XY directions. The structure and exposure operation of the twin-stage exposure apparatus are, for example, JP-A-10-163099 and JP-A-10-214783 (corresponding US Pat. Nos. 6,341,007, 6,400,441, 6,549,269 and 6,590,634), and JP-A-2000-505958 (corresponding US Pat. 5,9 69,441) or US Pat. No. 6,208,407, and to the extent permitted by the legislation of the country designated or selected in this international application, those disclosures shall be incorporated as part of the text.
0169Further, as disclosed in Japanese Patent Application Laid-Open No. 11-135400, the present invention is also applied to an exposure apparatus including a substrate stage for holding a substrate P and a measurement stage including various measuring members and sensors. be able to. In this case, it is possible to hold the liquid between the projection optical system and the upper surface of the measurement stage, and the measurement stage can also be provided with measures such as the above-mentioned water leakage detector.
0170The type of the exposure apparatus EX is not limited to the exposure apparatus for manufacturing a semiconductor element that exposes the semiconductor element pattern on the substrate P, but also the exposure apparatus for manufacturing a liquid crystal display element or a display, a thin film magnetic head, and an imaging element (CCD). ) Or, it can be widely applied to an exposure apparatus for manufacturing a reticle, a mask, or the like.
0171When a linear motor is used for the substrate stage PST or the mask stage MST, either an air levitation type using an air bearing or a magnetic levitation type using a Lorentz force or a reactance force may be used. Further, each stage PST and MST may be a type that moves along a guide, or may be a guideless type that is not provided with a guide. Examples of using linear motors for the stage are disclosed in US Pat. Nos. 5,623,853 and 5,528,118, respectively, with reference to the content of these documents to the extent permitted by national legislation designated or selected in this international application. Is part of the description in the text.
0172As the drive mechanism of each stage PST and MST, a flat motor that drives each stage PST and MST by electromagnetic force by facing a magnet unit in which magnets are arranged in two dimensions and an armature unit in which coils are arranged in two dimensions is used. You may use it. In this case, either one of the magnet unit and the armature unit may be connected to the stage PST and MST, and the other of the magnet unit and the armature unit may be provided on the moving surface side of the stage PST and MST.
0173The reaction force generated by the movement of the substrate stage PST may be mechanically released to the floor (ground) by using a frame member so as not to be transmitted to the projection optical system PL. This reaction force processing method is disclosed in detail in, for example, U.S. Pat. No. 5,528,118 (Japanese Patent Laid-Open No. 8-166475), and to the extent permitted by the laws of the country specified or selected in this international application. Incorporate the content of the literature to make it part of the text.
0174The reaction force generated by the movement of the mask stage MST may be mechanically released to the floor (ground) by using a frame member so as not to be transmitted to the projection optical system PL. This reaction force treatment method is disclosed in detail in, for example, U.S. Pat. No. 5,874,820 (Japanese Patent Laid-Open No. 8-330224), as long as it is permitted by the law of the country specified or selected in this international application. The disclosure of this document is incorporated as part of the text.
0175The exposure apparatus EX of the present embodiment is manufactured by assembling various subsystems including each component listed in the claims of the present application so as to maintain predetermined mechanical accuracy, electrical accuracy, and optical accuracy. Will be done. In order to ensure these various accuracy, before and after this assembly, adjustments for achieving optical accuracy for various optical systems, adjustments for achieving mechanical accuracy for various mechanical systems, and various electrical systems Is adjusted to achieve electrical accuracy. The assembly process from the various subsystems to the exposure apparatus includes mechanical connections between the various subsystems, wiring connections of electric circuits, piping connections of atmospheric pressure circuits, and the like. It goes without saying that there is an individual assembly process for each subsystem before the assembly process from the various subsystems to the exposure apparatus. After the process of assembling the various subsystems into the exposure apparatus is completed, comprehensive adjustment is performed to ensure various accuracy of the exposure apparatus as a whole. It is desirable that the exposure apparatus is manufactured in a clean room where the temperature, cleanliness, etc. are controlled.
0176As shown in FIG. 22, for microdevices such as semiconductor devices, step 201 for designing the function and performance of the microdevice, step 202 for manufacturing a reticle (mask) based on this design step, and a substrate which is a base material of the device. 203, substrate processing step 204 for exposing the reticle pattern to the substrate by the exposure apparatus EX of the above-described embodiment, device assembly step (including dicing step, bonding step, packaging step) 205, inspection step 206, etc. Manufactured after.
01771 ... Liquid, 9 ... Vibration isolation unit (vibration isolation device), 10 ... Liquid supply mechanism, 14 ... Supply nozzle, 14K ... Supply port, 20 ... Liquid recovery mechanism, 21 ... Recovery nozzle (suction port), 21K ... Recovery port, 22 ... Separator, 23 ... Dryer, 25 ... Vacuum system, 41 ... Board platen (base member), 41A ... guide surface, 42 ... air bearing, 42A ... intake port, 43A ... flat surface (flat part), 46 ... interferometer (measuring device), 47, 48 ... linear Motor (electrical equipment, electromagnetic drive source, drive device), 61 ... recovery port (suction port), 66 ... suction hole (intake port, suction port), 70 ... vacuum system, 71 ... separation Vessel, 72 ... Dryer, 74 ... Vacuum system, 75 ... Separator, 76 ... Dryer, 80 ... Optical fiber (detector), 80C ... 1st optical fiber ( 1st detector), 80D ... 2nd optical fiber (2nd detector), 81 ... core part, 90 ... detector, 100 ... detector, 101 ... prism, CONT. .. Control device, EX ... exposure device, LA1 ... 1st area, LA2 ... 2nd area, P ... board, PH ... board holder (board holding member), PL ... Projection optical system, PST ... Substrate stage (movable member)
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| HK1151106A1 | Hong Kong, China | A1 | |
| HK1151107A1 | Hong Kong, China | A1 | |
| TW201205644A | Taiwan Province of China | A | |
| CN101644899B | China | B | |
| CN101436001B | China | B | |
| KR20120066054A | Republic of Korea | A | |
| JP2012151493A | Japan | A | |
| EP1653501B1 | European Patent Office (EPO) | B1 | |
| EP2264533B1 | European Patent Office (EPO) | B1 | |
| JP5088389B2 | Japan | B2 | |
| EP2264535B1 | European Patent Office (EPO) | B1 | |
| JP5170126B2 | Japan | B2 | |
| US8451424B2 | United States of America | B2 | |
| US2013135597A1 | United States of America | A1 | |
| EP2264534B1 | European Patent Office (EPO) | B1 | |
| KR20130086635A | Republic of Korea | A | |
| KR101298864B1 | Republic of Korea | B1 | |
| JP5287926B2 | Japan | B2 | |
| JP2013214761A | Japan | A | |
| CN101644900B | China | B | |
| KR101343720B1 | Republic of Korea | B1 | |
| TW201403666A | Taiwan Province of China | A | |
| TW201403667A | Taiwan Province of China | A | |
| TW201403668A | Taiwan Province of China | A | |
| TW201403669A | Taiwan Province of China | A | |
| TWI424463B | Taiwan Province of China | B | |
| CN102043350B | China | B | |
| JP2014017527A | Japan | A | |
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| KR20140027560A | Republic of Korea | A | |
| KR101403117B1 | Republic of Korea | B1 | |
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| KR101414896B1 | Republic of Korea | B1 | |
| JP2014140079A | Japan | A | |
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| US2014233002A1 | United States of America | A1 | |
| JP5594399B2 | Japan | B2 | |
| KR20140119832A | Republic of Korea | A | |
| CN104122760A | China | A | |
| JP5664740B2 | Japan | B2 | |
| CN102012641B | China | B | |
| TWI490914B | Taiwan Province of China | B | |
| TWI490915B | Taiwan Province of China | B | |
| TWI490916B | Taiwan Province of China | B | |
| KR20150092349A | Republic of Korea | A | |
| HK1200922A1 | Hong Kong, China | A1 | |
| JP5776818B2This record | Japan | B2 | |
| JP2015172772A | Japan | A | |
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| KR101641011B1 | Republic of Korea | B1 | |
| KR101642670B1 | Republic of Korea | B1 | |
| KR20160088447A | Republic of Korea | A | |
| TWI547971B | Taiwan Province of China | B | |
| JP2016170437A | Japan | A | |
| JP6020653B2 | Japan | B2 | |
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| US2017038694A1 | United States of America | A1 | |
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| CN104122760B | China | B | |
| CN106707699A | China | A | |
| US9760026B2 | United States of America | B2 |
12 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Cancellation because of no payment of annual feesLAPS | LAPS | |
| Receipt of annual feesJAPANESE INTERMEDIATE CODE: R250R250 | R250 | |
| Receipt of annual feesJAPANESE INTERMEDIATE CODE: R250R250 | R250 | |
| Certificate of patent or registration of utility modelJAPANESE INTERMEDIATE CODE: R150R150 | R150 | |
| First payment of annual fees (during grant procedure)JAPANESE INTERMEDIATE CODE: A61A61 | A61 | |
| Written decision to grant a patent or to grant a registration (utility model)JAPANESE INTERMEDIATE CODE: A01A01 | A01 | |
| Decision of grant or rejection writtenTRDD | TRDD | |
| Written amendmentJAPANESE INTERMEDIATE CODE: A523A521 | A521 | |
| Report on retrievalJAPANESE INTERMEDIATE CODE: A971007A977 | A977 | |
| Notification of reasons for refusalJAPANESE INTERMEDIATE CODE: A131A131 | A131 | |
| Written amendmentJAPANESE INTERMEDIATE CODE: A523A521 | A521 | |
| Written request for application examinationJAPANESE INTERMEDIATE CODE: A621A621 | A621 |
Numbers
- Publication
- 5776818
- Application
- 95544
Titles2
- Japanese
- 露光装置及びデバイス製造方法、並びに露光装置の制御方法
- English
- Exposure equipment and device manufacturing method, and exposure equipment control method
Classification
- CPC, 11
- G03F7/70341
- G03F7/70866
- G03F7/70525
- G03F7/70725
- G03F7/70858
- G03F7/709
- G03F7/70533
- G03F7/7085
- G03F7/2041
- G03F7/707
- G03F7/706851
- IPC, 2
- G03F7 20
- H10P72 50
