Patterning substrates employing multiple chucks
21 claims: 5 independent, 16 dependent
- 1ナノインプリント・リソグラフィ・システムにおいて第1と第2の基板をパターニングする方法であって、 空洞と、ナノインプリント・モールド・アセンブリに向かって配置される前記第1の基板の第1側面と、第1の基板チャックに向かって配置される前記第1の基板の第2側面を有する前記第1の基板チャック上に前記第1の基板を配置するステップと、 前記第1の基板の前記第1側面上にナノインプリント材料を配置するステップと、 前記第1の基板とナノインプリント・モールド・アセンブリ間の空間関係を取得して、第2の基板チャック上に前記第2の基板を配置するのと同時に、前記ナノインプリント・モールド・アセンブリを用いて、前記第1の基板の前記第1の側面上の前記ナノインプリント材料内にパターンをインプリントするステップと、 前記ナノインプリント・モールド・アセンブリを前記第1の基板上の前記ナノインプリント材料から分離するステップと、 前記第2の基板上にナノインプリント材料を配置するステップと、 前記第2の基板と前記ナノインプリント・モールド・アセンブリ間の空間関係を取得するのと同時に、前記第1の基板を前記第1の基板チャックから取り外し、かつ前記ナノインプリント・モールド・アセンブリを用いて前記第2の基板上の前記ナノインプリント材料内にパターンをインプリントするステップと、 前記ナノインプリント・モールド・アセンブリを前記第2の基板上の前記ナノインプリント材料から分離するステップであって、前記第1と第2の基板は、実質的に同じ処理条件を受ける、ステップと、から構成され、 前記前記第1の基板を前記第1の基板チャックから取り外すステップは、前記ナノインプリント・モールド・アセンブリに対して前記第1の基板を180度フリッピングするステップをさらに含み、前記第1の基板上のナノインプリント材料が前記第1の基板チャックの前記空洞内に配置されるようにすることを特徴とする方法。
- 2前記第2の基板チャックから前記第2の基板を取り外すステップをさらに含むことを特徴とする請求項1に記載の方法。
- 3前記第2の基板を取り外す前記ステップは、前記ナノインプリント・モールド・アセンブリに対して前記第2の基板を180度フリッピングするステップをさらに含むことを特徴とする請求項2に記載の方法。
- 4前記第1の基板を配置する前記ステップは、第3の基板と前記ナノインプリント・モールド・アセンブリ間の空間関係を取得し、かつ前記第2の基板チャック上に配置された前記第3の基板上のナノインプリント材料にパターンを形成するステップをさらに含むことを特徴とする請求項1に記載の方法。
- 5前記第1の基板と前記ナノインプリント・モールド・アセンブリとの間の空間関係を取得する前記ステップは、同時に第3の基板を前記第2の基板チャックから取り外すステップをさらに含むことを特徴とする請求項1に記載の方法。
- 6前記第1の基板を前記第1の基板チャックから取り外す前記ステップは、同時に第3の基板を前記第1の基板チャック上に配置するステップをさらに含むことを特徴とする請求項1に記載の方法。
- 7前記第1と第2の基板に平行な軸の周りで前記第1と第2の基板チャックを並進させるステップをさらに含むことを特徴とする請求項1に記載の方法。
- 8前記第1と第2の基板に垂直な軸の周りで前記第1と第2の基板チャックを回転させるステップをさらに含むことを特徴とする請求項1に記載の方法。
- 9ナノインプリント・リソグラフィ・システムにおける第1と第2の基板を処理する方法であって、 空洞を有する第1の基板チャックとナノインプリント・モールド・アセンブリ間の第1の空間関係、および前記第1の空間関係とは異なる、第2の基板チャックと前記ナノインプリント・モールド・アセンブリ間の第2の空間関係を取得して、前記第2の基板と前記第2の基板チャックと間に所望の空間関係を取得する間に、前記ナノインプリント・モールド・アセンブリを用いて、パターンが前記第1の基板チャック上に配置された前記第1の基板上のナノインプリント材料にインプリントされるようにするステップと、 前記第1の基板上の前記ナノプリント材料から前記ナノインプリント・モールド・アセンブリを分離するステップと、 前記ナノインプリント・モールド・アセンブリに対して、前記第1の基板を180度フリッピングして、前記第1の基板が前記第1の基板チャックの前記空洞内に配置されるようにするステップと、から構成されることを特徴とする方法。
- 10前記第1と第2の基板は、実質的に同じ処理条件を受けることを特徴とする請求項9に記載の方法。
- 11前記第2の基板と前記第2の基板チャックとの間に所望の空間関係を取得する前記ステップは、前記第2の基板を前記第2の基板チャック上に配置するステップをさらに含むことを特徴とする請求項9に記載の方法。
- 12前記第2の基板と前記第2の基板チャックとの間に所望の空間関係を取得する前記ステップは、前記第2の基板を前記第2の基板チャック上に配置されることから取り外すステップをさらに含むことを特徴とする請求項9に記載の方法。
- 13前記第2の基板を取り外す前記ステップは、前記ナノインプリント・モールド・アセンブリに対して前記第2の基板を180度フリッピングするステップをさらに含むことを特徴とする請求項12に記載の方法。
- 14前記第1の基板を前記第1の基板チャック上に配置するステップをさらに含むことを特徴とする請求項9に記載の方法。
- 15前記第1の基板上に前記ナノインプリント材料を配置するステップをさらに含むことを特徴とする請求項9に記載の方法。
- 16第1と第2の基板をパターニングする方法であって、 空洞と、モールド・アセンブリに向かって配置される前記第1の基板の第1側面と、前記第1の基板チャックに向かって配置された前記第1の基板の第2側面を有する第1の基板チャック上に前記第1の基板を配置するステップと、 前記第1の基板上に材料を配置するステップと、 前記第1の基板と前記モールド・アセンブリとの間の空間関係を取得し、第2の基板チャック上に前記第2の基板を配置するのと同時に、前記モールド・アセンブリを用いて、前記第1の基板上の前記材料内にパターンを形成するステップと、 前記モールド・アセンブリを前記第1の基板上の前記材料から分離するステップと、 前記第2の基板上に材料を配置するステップと、 前記第2の基板と前記モールド・アセンブリとの間の空間関係を取得するのと同時に、前記第1の基板を前記第1の基板チャックから取り外し、前記モールド・アセンブリを用いて、前記第2の基板上の前記材料内にパターンを形成するステップであって、前記第1の基板を取り外すステップは、前記プリント・モールド・アセンブリに対して前記第1の基板を180度フリッピングして、前記第1の基板上の材料が前記第1の基板チャックの前記空洞内に配置されるようにするステップと、 前記モールド・アセンブリを、前記第2の基板上の前記材料から分離するステップと、を含み、 前記第1と第2の基板は実質的に同じ処理条件を受けることを特徴とする方法。
- 17前記第2の基板を前記第2の基板チャックから取り外すステップをさらに含むことを特徴とする請求項16に記載の方法。
- 18前記第2の基板を取り外す前記ステップは、前記モールド・アセンブリに対して前記第2の基板を180度フリッピングするステップをさらに含むことを特徴とする請求項17に記載の方法。
- 19前記第1の基板を配置する前記ステップは、第3の基板と前記モールド・アセンブリ間の空間関係を取得し、前記第2の基板チャック上に配置された前記第3の基板上の材料内にパターンを形成するステップをさらに含むことを特徴とする請求項16に記載の方法。
- 20前記第1の基板と前記モールド・アセンブリ間の空間関係を取得する前記ステップは、同時に第3の基板を前記第2の基板チャックから取り外すステップをさらに含むことを特徴とする請求項16に記載の方法。
- 21前記第1の基板を前記第1の基板チャックから取り外す前記ステップは、同時に第3の基板を前記第1の基板チャック上に配置するステップをさらに含むことを特徴とする請求項16に記載の方法。
Independent claims21
68 paragraphs, as filed
Related application
(Mutual citation of related applications) U.S. Patent Application No. 60/760738, filed January 20, 2006, under the name "Apparatus for and Methods for Nano-Imprinting with Multi-Substrate Chucks," which is incorporated herein by reference in its entirety. , US Patent Provisional Application No. 60/827125 filed on September 27, 2006 under the name "Apparatus and Method for Nano-Imprinting with Multi-Substrate Chucks", and the name "Apparatus For and Methods For Imprinting, Aligning and Separation" The name "Method and System for Double-Sided Patterning of", which claims the priority of US Patent Provisional Application No. 60/748430 filed on December 8, 2005 for "for Double Side Imprinting". The United States filed on April 3, 2006 under the name "Residual Layer Thickness Measurement and Correction," which is a partial continuation of US Patent Application No. 11/565350 filed on November 30, 2006 in "Substrates." Claim the priority of Patent Provisional Application No. 60/788808.
The field of the present invention generally relates to the nano-manufacturing of structures. More specifically, the present invention covers methods and systems for double-sided patterning of substrates.
Nanomanufacturing involves the manufacture of very small structures, for example having futures on the order of a few nanometers or less. One area where nanomanufacturing has a significant impact is the processing of integrated circuits. Nano-manufacturing is becoming increasingly important as the semiconductor processing industry continues to strive for higher manufacturing yields while increasing the number of circuits per unit area formed on the substrate. Nanomanufacturing provides greater process control while allowing further reduction of the minimum future dimensions of the formed structure. Other areas of development in which nanomanufacturing is used include biotechnology, optics, mechanical systems, and the like.
An example of nanomanufacturing technology is commonly referred to as imprint lithography. All exemplary imprint lithography processes have been transferred to the transferor of the present invention under the name "Method and a Mold to Arrange Features on a Substrate to Replicate Features having Minimal Dimensional Variability" U.S. Patent Application No. 10/264960. US Patent Application Published as US Patent Application Publication No. 2004/0065976, US Patent Application No. 10/264926 under the name "Method of Forming a Layer on a Substrate to Facilitate Fabrication of Metrology Standards" Published 2004/0065252, entitled "Functional Patterning Material for Imprint Lithography" It is described in detail in many publications, such as US Pat. No. 6936194 of Processes.
The imprint lithography techniques disclosed in each of the U.S. patent application publications and U.S. patents described above are the formation of relief patterns in polymerizable layers and the transfer of patterns corresponding to the relief patterns to the underlying substrate. including. The substrate is placed on the moving stage to obtain the desired position to facilitate its patterning. For this purpose, the template is used away from the substrate having the moldable liquid that exists between the template and the substrate. The liquid is solidified to form a solidified layer, the solidified layer has a pattern recorded on it, and the recorded pattern matches the shape of the surface of the template in contact with the liquid. The template is then separated from the solidified layer so that the template is separated from the substrate. The substrate and the solidified layer then undergo a process for transferring the relief image corresponding to the pattern within the solidified layer to the substrate.
With reference to FIG. 1, a system 10 forming a relief pattern on the first substrate 12a is shown. The first substrate 12a is coupled to the first substrate chuck 14a. The first substrate chuck 12a is incorporated herein by reference in the name "High-Precision Orientation Alignment and Gap Control Stages for Imprint Lithography". Any chuck, including but not limited to vacuum, pin type, groove type, or electromagnetic, as described in Processes, US Pat. No. 6873087, may be used. The first substrate chuck 14a includes a cavity 16a facing the first substrate 12a. The first substrate 12a and the first substrate chuck 14a are supported on the first and second stages 18 and 20, and the first stage 18 is formed by the first substrate chuck 14a and the second stage 20. Placed in between. Further, the first and second stages 18 and 20 are arranged on the base 22. The first stage 18 can give movement around the first axis, while the second stage 20 can give movement around the second axis and the second axis It is perpendicular to the first axis, i.e. the first and second axes are the x and y axes. The exemplary stages in the present invention are both Newport, Irvine, CA. Available from Corporation under part numbers XM200L350 and XM200S50. The first substrate 12a further includes a throughway 24a. However, in a further embodiment, the first substrate 12a may be substantially free of the throughway 24a.
A template 26 having a patterning surface 30 and a mesa 28 extending from it towards the first substrate 12a is separated from the first substrate 12a. Mesa 28 is sometimes called mold 28. Mesa 28 is sometimes referred to as nanoimprint mold 28. In a further embodiment, template 26 may be substantially free of mold 28. Template 26 and / or mold 28 is formed from such materials including, but not limited to, fused silica, quartz, silicon, organic polymers, siloxane polymers, borosilicate glass, fluorocarbon polymers, metals and cured sapphires. .. As shown, the patterning surface 30 comprises a future formed by a plurality of isolated recesses 32 and protrusions 34. However, in a further embodiment, the patterning surface 30 may be substantially smooth and / or flat. The patterning surface 30 can form an ingenious pattern, which forms the basis of the pattern formed on the first substrate 12a, which is further discussed below. Template 26 is coupled to template chuck 36, which is named "High-Precision Orientation Alignment and Gap Control Stages for Imprint Lithography". Any chuck, including but not limited to vacuum, pin type, groove type, or electromagnetic, as described in Processes, US Pat. No. 6873087, may be used. Further, the template chuck 36 is coupled to the imprint head 38 to facilitate the movement of the template 26 and the mold 28. In one example, the imprint head 38 has three degrees of freedom (two tilts and one translation) controlled by a three-voice coil actuator (not shown) or another linear actuator (not shown). The stage is fine.
System 10 further comprises a first fluid dispenser 40a. The first fluid dispenser 40a is fluid-communicated with the first substrate 12a to place the polymeric material 42a on top of the substrate, further described below. As shown, the first fluid dispenser 40a is coupled to the template chuck 36, but in a further embodiment, the first fluid dispenser 40a is any component of system 10, ie template 26 or imprint head. Combined with 38. Further, the system 10 can include any number of fluid dispensers, the first fluid dispenser 40a comprising a plurality of dispense units within it. An exemplary fluid dispenser in the present invention is available from Xaar Corporation, located in Cambridge, England, under the part name Leopard.
The polymeric material 42a is placed on the first substrate 12a using any known technique such as drop dispensing, spin coating, immersion coating, thin film deposition, thick film deposition, and the like. As shown, the polymeric material 42a is placed on the first substrate 12a as a plurality of spaced droplets 44a. In one example, each droplet of the plurality of droplets 44a has a unit volume of approximately 6 picolitres. Typically, the polymeric material 42a is placed on the first substrate 12a before the desired volume is defined between the mold 28 and the first substrate 12a, which is further described below. However, the polymeric material 42a can also fill the volume after the desired volume has been obtained.
System 10 further comprises a source 46 of energy 48 for directing energy 48 along path 50. The imprint head 38 and the first and second stages 18 and 20 are further described below, the mold 28 and the first substrate 12a so as to be superposed on the path 50 and arranged within the path 50, respectively. Is configured to be placed. Either the imprint head 38, the first and second stages 18, 20, or a combination thereof is filled with the polymeric material 42a, to form the desired volume between them, the mold 28 and the second. The distance between 1 and the substrate 12a can be changed. In one example, the source 46 may be a He lamp or a He / Xe lamp, or an LED-based source that emits UV in the 300 nm to 380 nm range.
With reference to FIGS. 1 and 2, the system 10 is a robot 52 for arranging the first substrate 12a on the first substrate chuck 14a and removing the first substrate 12a from the first substrate chuck 14a. Further prepare. The robot 52 may be any handling robot known in the art. In one example, the robot 52 comprises an arm 54 coupled to a drive means 56. The arm 54 further has an end effector 58 coupled to it to handle the first substrate 12a. In one example, the end effector 58 has edge gripping or edge gripping to hold the substrate 12a without contacting the region of the first substrate 12a, each having the polymeric material 42a placed on top of it, i.e. the active region of the substrate 12a. A thin air cavity chuck may be used. The driving means 56 can expand or contract the arm 54, move the arm 54 in a circular shape in the horizontal direction, or give the arm 54 any desired movement. The drive means 56 can also give motion around the first and second axes described above. The drive means 56 can also rotate around its axis, i.e. around the joint 59. The arm 54 can also rotate around a shaft 55 to flip the first substrate 12a 180 ° with respect to the mold 28, which is further described below. The arm 54 can also rotate around the fitting 57. Further, the robot 52 transports the first substrate 12a between the first substrate chuck 14a and the substrate cassette (not shown). A substrate cassette (not shown) comprises a plurality of substrates therein.
Referring to FIG. 1, system 10 is tuned by processor 58, which includes first and second stages 18 and 20, imprint head 38, first fluid dispenser 40a, and source 46. , It communicates data with the robot 52 and operates with a computer-readable program stored in the memory 60.
With reference to FIGS. 1 and 3, according to the prior art, a processing flow for processing the first substrate 12a is shown. In step 70, the first substrate 12a is placed on the first substrate chuck 14a. More specifically, the first and second stages 18 and 20 are first in a desired spatial relationship to the robot 52 such that the robot 52 places the first substrate 12a on the first substrate chuck 14a. Place the board chuck 14a of. The robot 52 transfers the first substrate 12a from the substrate cassette (not shown) and arranges the first substrate 12a on the first substrate chuck 14a. In step 72, the first and second stages 18, 20 translate the first substrate 12a so that the desired position is obtained between the first substrate 12a and the first fluid dispenser 40a. .. As a result, the first fluid dispenser 40a places the polymer material 42a on the first substrate 12a as described above. The polymer material 42a may be a nanoimprint material.
In step 74, the desired spatial relationship is obtained between the first substrate 12a and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the first substrate 12a is superimposed on the mold 28, and the additional polymer material 42a is molded with the first substrate 12a. The first substrate chuck 14a is placed so as to meet the desired volume between 28. Prior to contact between the mold 28 and the droplet 44a, the atmosphere between the mold 28 and the droplet 44a is saturated with helium or completely exhausted, or helium to facilitate filling of the recess 32. It is a partially exhausted atmosphere. Further in step 74, after the desired volume is filled with the polymeric material 42a, the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 is the first polymeric material 42a, the first. The substrate 12a and the patterning surface 30 of the mold 28 are solidified and / or crosslinked to match the shape of the patterning surface 30.
In step 76, the mold 28 is separated from the polymeric material 42a disposed on the first substrate 12a. In step 78, the first substrate 12a is removed from the first substrate chuck 14a. More specifically, in the first and second stages 18 and 20, the robot 52 removes the first board 12a from the first board chuck 14a and sets the first board 12a into a board cassette (not shown). The first substrate 12a is placed in a desired spatial relationship with respect to the robot 52 so as to be placed inside.
To this end, in one example, the aforementioned process of patterning the first substrate 12a has a total process time of 34 seconds per substrate. More specifically, the time for each step of the patterning process described above is clearly shown in Table 1.
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To this end, the steps of the method described above for processing the first substrate 12a are sequentially performed. As a result, part of system 10 does not have to operate at full capacity, i.e., part of system 10 may remain idle with respect to the rest of system 10. More specifically, 1) placing the first substrate 12a on the first substrate chuck 14a (step 1), 2) obtaining the desired spatial relationship between the first substrate 12a and the mold 28, The polymer material 42a fills the desired volume between the first substrate 12a and the mold 28 and solidifies and / or crosslinks the polymer material 42a (step 3), 3) from the first substrate chuck 14a to the first. The step of removing the substrate 12a of 1 (step 5) includes most of the process time for processing the first substrate 12a. As a result, among others, the imprint head 38 and / or the template 26 and / or the mold 28 and / or the robot 52 do not have to operate at full capacity, i.e. remain idle for undesired times. Is. For this reason, in order to maximize the efficiency of the system 10, the optimization of the above-mentioned method of patterning the substrate is desirable, and more specifically, the optimization of steps 1, 3 and 5 is desirable. The result is an overall increase in throughput for processing multiple substrates (and similarly a reduction in total process time per substrate), which may be desirable. To this end, systems and methods for processing a plurality of substrates at the same time are described below.
With reference to FIG. 4, the system 10'of the first embodiment is shown. System 10'is similar to system 10 described above with respect to FIG. 1, but system 10' includes a second substrate 12b coupled to a second substrate chuck 14b. The second substrate 12b and the second substrate chuck 14b are similar to the first substrate 12a and the first substrate chuck 14a, respectively, as described above with respect to FIG. The second substrate chuck 14b includes a cavity 16b facing the second substrate 12b. The second substrate 12b and the second substrate chuck 14b are supported on the first and second stages 18 and 20. The second substrate 12b further includes a throughway 24b. However, in a further embodiment, the second substrate 12b may be substantially free of the throughway 24b.
The system 10'also comprises a second fluid dispenser 40b similar to the first fluid dispenser 40a. As shown, the second fluid dispenser 40b is coupled to the template chuck 36, but in a further embodiment, the second fluid dispenser 40b is any component of system 10, ie template 24 or imprint head. Combined with 38. The control of the second fluid dispenser 40b is coordinated by the processor 58 that communicates with the second fluid dispenser 40b. Note that for the sake of simplicity in the illustration, the robot 52 is shown as two separate bodies and does not show the coupling between the processor 58 and the first and second stages 18 and 20.
With reference to FIGS. 5 and 6, a processing flow for processing the first substrate 12a and the second substrate 12b is shown. In step 100, the first substrate 12a is placed on the first substrate chuck 14a. More specifically, the first and second stages 18 and 20 are first in a desired spatial relationship to the robot 52 such that the robot 52 places the first substrate 12a on the first substrate chuck 14a. Place the board chuck 14a of. The robot 52 transfers the first substrate 12a from the substrate cassette (not shown) and arranges the first substrate 12a on the first substrate chuck 14a.
Referring to FIGS. 5 and 7, in step 102, the first and second stages 18 and 20 were positioned in the first substrate in order to place the polymer material 42a on the first substrate 12a. The first substrate chuck 14a is translated so that it can be obtained between 12a and the first fluid dispenser 40a.
With reference to FIGS. 5 and 8, in step 104, the desired spatial relationship is obtained between the first substrate 12a and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the first substrate 12a is superimposed on the mold 28, and the additional polymer material 42a is molded with the first substrate 12a. The first substrate chuck 14a is placed so as to meet the desired volume between 28. Further in step 104, after the desired volume is filled with the polymeric material 42a, the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 applies the polymeric material 42a to the first substrate 12a. And solidify and / or crosslink to match the shape of the patterning surface 30 of the mold 28. Therefore, the processing of the second substrate 12b can be performed at the same time as the processing of the first substrate 12a. More specifically, in step 106, at the same time as step 104, the robot 52 transfers the second substrate 12b from the substrate cassette (not shown) and places the second substrate 12b on the second substrate chuck 14b. To do.
With reference to FIGS. 5 and 9, in step 108, the mold 28 is separated from the polymeric material 42a disposed on the first substrate 12a. In a further embodiment, step 108 can be performed at the same time as step 104 and step 106.
Referring to FIGS. 5 and 10, in step 110, the first and second stages 18 and 20 are in the desired position for placing the polymer material 42b on the second substrate 12b, but in the second substrate. The second substrate chuck 14b is translated so that it can be obtained between 12b and the second fluid dispenser 40b. As shown, the polymeric material 42b is placed on the second substrate 12b as a plurality of spaced droplets 44b.
With reference to FIGS. 5 and 11, in step 112, the desired spatial relationship is obtained between the second substrate 12b and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the second substrate 12b is superimposed on the mold 28, and the additional polymer material 42b is molded with the second substrate 12b. The second substrate chuck 14b is placed so as to meet the desired volume between 28. Further in step 112, after the desired volume is filled with the polymeric material 42b, the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 applies the polymeric material 42b to the second substrate 12b. And solidify and / or crosslink to match the shape of the patterning surface 30 of the mold 28. At step 114, at the same time as step 112, the robot 52 can remove the first substrate 12a from the first substrate chuck 14a and place the first substrate 12a in a substrate cassette (not shown). Further, the robot 52 arranges the third substrate 12c on the first substrate chuck 14a as shown in FIG. The robot 52 transfers the third substrate 12c from the substrate cassette (not shown) and places the third substrate 12c on the first substrate chuck 14a, as shown in FIG.
With reference to FIGS. 5 and 12, in step 116, the mold 28 is separated from the polymeric material 42b disposed on the second substrate 12b. In a further embodiment, step 116 can be performed at the same time as step 112 and step 114.
Referring to FIGS. 5 and 13, in step 118, the first and second stages 18 and 20 are in the desired position to place the polymer material 42c on the third substrate 12c, but in the third substrate. The third substrate 12c is translated so that it can be obtained between the 12c and the first fluid dispenser 40a. As shown, the polymeric material 42c is placed on the third substrate 12c as a plurality of spaced droplets 44c.
With reference to FIGS. 5 and 14, in step 120, the desired spatial relationship is obtained between the third substrate 12c and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the third substrate 12c is superimposed on the mold 28, and the additional polymer material 42c is molded with the third substrate 12c. The first substrate chuck 14a is placed so as to meet the desired volume between 28. Further in step 120, after the desired volume is filled with the polymeric material 42c, the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 will add the polymeric material 42c to the third substrate 12c. And solidify and / or crosslink to match the shape of the patterning surface 30 of the mold 28. At step 122, at the same time as step 120, the robot 52 can remove the second substrate 12b from the second substrate chuck 14b and place the second substrate 12b in a substrate cassette (not shown). Further, the robot 52 arranges a fourth substrate (not shown) on the second substrate chuck 14b. The robot 52 transfers a fourth substrate (not shown) from a substrate cassette (not shown) and places the fourth substrate on the second substrate chuck 14b. A third substrate 12c and a fourth substrate (not shown), both similar to the first substrate 12a, can be subject to the aforementioned processing conditions similar to the first substrate 12a and the second substrate 12b. ..
Referring to FIGS. 4 and 5, additional substrates (not shown) are further patterned on the second substrate chuck 14b prior to patterning the second substrate 12b at the same time as the first substrate 12a is patterned. .. More specifically, in step 126, at the same time as step 100, an additional substrate (not shown) having a polymeric material (not shown) previously placed and placed on the second substrate chuck 14b , Has a pattern formed on it, similar to step 112 shown in FIG. Further, at step 128, the mold 28 is separated from the polymeric material (not shown) placed on an additional substrate (not shown), similar to step 116 shown in FIG. To this end, step 106 further comprises removing an additional substrate (not shown), similar to step 122 shown in FIG. Further, step 100 is similar to step 114 shown in FIG. 11 as a second additional substrate (shown) that is previously patterned and placed on the first substrate chuck 14a in front of the first substrate 12a. Includes further removal.
In a further embodiment, the first fluid dispenser 40a and the second fluid dispenser 40b are located outside the system 110, and the first substrate 12a and the second substrate 12b are located outside the system 110 and above it. It has the polymer materials 42a and 42b, respectively. In still further embodiments, the placement of the polymeric materials 42a, 42b on the first substrate 12a and the second substrate 12b may be arbitrary.
To this end, in one example, the aforementioned patterning process for the first substrate 12a and the second substrate 12b has a total process time of 20 seconds per substrate. In more detail, Table 2 clearly shows the time for each step of the patterning process described above.
<tables num="2"><img file="JP4472011B2_D0002.tif" /></tables>
To this end, the steps of the aforementioned method of processing the first substrate 12a and the second substrate 12b are performed in parallel. More specifically, 1) the step of placing the substrate on the substrate chuck or removing the substrate from the substrate chuck, 2) obtaining the desired spatial relationship between the substrate and the mold, the polymer material is the substrate and the mold. The steps of filling the desired volume between and solidifying and / or cross-linking the polymer material or separating the mold from the polymer material are performed in parallel. As a result, an overall increase in throughput for processing multiple substrates (and similarly a reduction in total process time per substrate) can be obtained, which may be desirable.
Referring to FIG. 4, in a further embodiment, the first and second stages 18 and 20 rotate about a third axis extending orthogonally to the first and second stages 18, i.e. the z-axis. And rotate more than 180 °.
With reference to FIGS. 4 and 15, as described above, the aforementioned methods are used to form a pattern on the first surface 62a of the first substrate 12a and the first surface 62b of the second substrate 12b, respectively. Used. Therefore, in a further embodiment, it is desirable to form a pattern on the second surface 64a of the first substrate 12a and the second surface 64b of the second substrate 12b, respectively, and the second surfaces 64a and 64b , Arranged on opposite sides of the first surfaces 62a and 62b, respectively.
With reference to FIGS. 6 and 15, the first surface 62a and the second surface 64a of the first substrate 12a, and the first surface 62b and the second surface of the second substrate 12b, as shown in FIG. The processing flow for processing surface 64b is shown. This is preferably the range of patterned media imprints. In step 200, the first substrate 12 is placed on the first substrate chuck 14a. More specifically, the first and second stages 18 and 20 are first in a desired spatial relationship to the robot 52 such that the robot 52 places the first substrate 12a on the first substrate chuck 14a. Place the board chuck 14a of. The robot 52 transfers the first substrate 12a from a substrate cassette (not shown) so that the first substrate 12a is located on the opposite side of the first substrate chuck 14a from the first substrate 12a. Is placed on the first substrate chuck 14a.
Referring to FIGS. 7 and 15, in step 202, the first and second stages 18 and 20 are for placing the polymer material 42a on the first surface 62a of the first substrate 12a at the desired position. The first substrate 12a is translated so that it can be obtained between the first substrate 12a and the first fluid dispenser 40a.
With reference to FIGS. 8 and 15, in step 204, the desired spatial relationship is obtained between the first substrate 12a and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the first substrate 12a is superimposed on the mold 28, and the additional polymer material 42a is molded with the first substrate 12a. The first substrate chuck 14a is placed so as to meet the desired volume between 28. Further in step 104, after the desired volume is filled with the polymeric material 42a, the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 applies the polymeric material 42a to the first substrate 12a. Solidified and / or crosslinked to match the shape of the first surface 62a of the mold 28 and the patterning surface 30 of the mold 28. Therefore, the processing of the second substrate 12b can be performed at the same time as the processing of the first substrate 12a. More specifically, in step 206, at the same time as step 204, the robot 52 transfers the second substrate 12b from the substrate cassette (not shown) so that the first surface 62b is on the opposite side of the second substrate chuck 14. The second substrate 12b is arranged on the second substrate chuck 14b so as to be arranged in.
With reference to FIGS. 9 and 15, in step 207, the mold 28 is separated from the polymeric material 42a disposed on the first surface 62a of the first substrate 12a. In a further embodiment, step 207 can be performed at the same time as step 204, step 206.
Referring to FIGS. 10 and 15, in step 208, the first and second stages 18 and 20 are for placing the polymer material 42b on the first surface 62b of the second substrate 12b at the desired position. The second substrate 12b is translated so that it can be obtained between the second substrate 12b and the second fluid dispenser 40b. As shown, the polymeric material 42b is placed on the second substrate 12b as a plurality of spaced droplets 44b.
With reference to FIGS. 15 and 16, in step 210, the desired spatial relationship is obtained between the second substrate 12b and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the second substrate 12b is superimposed on the mold 28, and the additional polymer material 42b is molded with the second substrate 12b. The second substrate chuck 14b is placed so as to meet the desired volume between 28. Further in step 210, after the desired volume is filled with the polymeric material 42b, the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 applies the polymeric material 42b to the second substrate 12b. Solidified and / or crosslinked to match the shape of the first surface 62b of the mold 28 and the patterning surface 30 of the mold 28. At step 212, at the same time as step 210, the robot 52 removes the first substrate 12a from the first substrate chuck 14a and around its axis to flip the first substrate 12a 180 ° with respect to the mold 28. The arm 54 can be rotated by the robot 52, and the robot 52 is placed on the first substrate 12a so that the second surface 64a is located on the opposite side of the first substrate chuck 14a, as shown in FIG. Is placed on the first substrate chuck 14a. Further, the polymeric material 42a is placed in the cavity 16a of the first substrate chuck 14a in order to minimize, if not prevent, damage to the polymeric material 42a.
With reference to FIGS. 15 and 17, in step 216, the mold 28 is separated from the polymeric material 42b disposed on the second substrate 12b. In a further embodiment, step 216 can be performed at the same time as step 210 and step 212.
Referring to FIGS. 15 and 18, in step 218, the first and second stages 18 and 20 were first placed in a desired position to place the polymer material 42a'on the first substrate 12a. The first substrate 12a is translated so that it is obtained between the substrate 12a and the first fluid dispenser 40a. As shown, the polymeric material 42a'is placed on the first substrate 12a as a plurality of spaced droplets 44a'.
With reference to FIGS. 15 and 19, in step 220, the desired spatial relationship is obtained between the first substrate 12a and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the first substrate 12a is superimposed on the mold 28, and the additional polymer material 42a'is combined with the first substrate 12a. The first substrate chuck 14a is placed so as to meet the desired volume between the mold 28 and the mold 28. Further in step 220, after the desired volume is filled with the polymeric material 42a', the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 is the first, the polymeric material 42a'. It is solidified and / or crosslinked to match the shape of the second surface 64a of the substrate 12a and the patterning surface 30 of the mold 28. At step 222, at the same time as step 220, the robot 52 removes the first substrate 12a from the first substrate chuck 14a and around its axis to flip the second substrate 12b 180 ° with respect to the mold 28. The arm 54 can be rotated by, and the robot 52 also has a second substrate 12b such that the second surface 64b is located on the opposite side of the second substrate chuck 14b, as shown in FIG. Is placed on the second substrate chuck 14b. Further, the polymeric material 42b is placed in the cavity 16b of the second substrate chuck 14b in order to minimize, if not prevent, damage to the polymeric material 42b.
With reference to FIGS. 15 and 20, in step 224, the mold 28 is separated from the polymeric material 42a'placed on the second surface 64a of the first substrate 12a. In a further embodiment, step 224 can be performed at the same time as step 220, step 222.
Referring to FIGS. 15 and 21, in step 226, the first and second stages 18 and 20 are such that the desired position is obtained between the second substrate 12b and the second fluid dispenser 40b. The second substrate chuck 14b is translated to place the polymer material 42b'on the second surface 64b of the second substrate 12b. As shown, the polymeric material 42b'is placed on the second substrate 12b as a plurality of spaced droplets 44b'.
With reference to FIGS. 15 and 22, in step 228, the desired spatial relationship is obtained between the second substrate 12b and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the second substrate 12b is superimposed on the mold 28, and the additional polymer material 42b'is combined with the second substrate 12b. The second substrate chuck 14b is placed so as to meet the desired volume between the mold 28 and the mold 28. Further in step 228, after the desired volume is filled with the polymeric material 42b', the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 is the polymeric material 42b', a second. It is solidified and / or crosslinked to match the shape of the second surface 64b of the substrate 12b and the patterning surface 30 of the mold 28. At step 230, at the same time as step 228, the robot 52 can remove the first substrate 12a from the first substrate chuck 14a and place the first substrate 12a in a substrate cassette (not shown). Further, the robot 52 arranges the third substrate 12c on the first substrate chuck 14a. The robot 52 can transfer the third substrate 12c from the substrate cassette (not shown) so that the first surface 62c is located on the opposite side of the first substrate chuck 14a. The substrate 12c is placed on the first substrate chuck 14a.
With reference to FIGS. 15 and 23, in step 232, the mold 28 is separated from the polymeric material 42b'placed on the second substrate 12b. In a further embodiment, step 232 can be performed at the same time as step 228 and step 230.
Referring to FIGS. 15 and 24, in step 234, the first and second stages 18 and 20 are in the desired position to place the polymer material 42c on the third substrate 12c, but in the third substrate. The third substrate 12c is translated so that it can be obtained between the 12c and the first fluid dispenser 40a. As shown, the polymeric material 42c is placed on the third substrate 12c as a plurality of spaced droplets 44c.
With reference to FIGS. 15 and 25, in step 236, the desired spatial relationship is obtained between the third substrate 12c and the mold 28. More specifically, in the first and second stages 18, 20 and the imprint head 38, the third substrate 12c is superimposed on the mold 28, and the additional polymer material 42c is molded with the third substrate 12c. The first substrate chuck 14a is placed so as to meet the desired volume between 28. Further in step 236, after the desired volume is filled with the polymeric material 42c, the source 46 can generate energy 48, eg, broadband ultraviolet radiation, which energy 48 will add the polymeric material 42c to the third substrate 12c. Solidified and / or crosslinked to match the shape of the first surface 62c of the mold 28 and the patterning surface 30 of the mold 28. At step 238, at the same time as step 236, the robot 52 can remove the second substrate 12b from the second substrate chuck 14b and place the second substrate 12b in a substrate cassette (not shown). Further, the robot 52 arranges an additional substrate (not shown) on the second substrate chuck 14b. Robot 52 transfers an additional substrate (not shown) from the substrate cassette (not shown) and places the additional substrate (not shown) on the second substrate chuck 14b. The third substrate 12c and the additional substrate can be subject to the processing conditions described above, similar to the first substrate 12a and the second substrate 12b.
Referring to FIGS. 4 and 15, additional substrates (not shown) are further patterned on the second substrate chuck 14b prior to patterning the second substrate 12b at the same time as the first substrate 12a is patterned. .. More specifically, in step 240, at the same time as step 200, an additional substrate (not shown) having a polymeric material (not shown) previously and placed on the second substrate chuck 14b Similar to step 228 shown in FIG. 22, it has a pattern formed on its second surface. Further, in step 242, the mold 28 is separated from the polymeric material (not shown) placed on an additional substrate (not shown), similar to step 232 shown in FIG. To this end, step 206 further comprises removing an additional substrate (not shown), similar to step 238 shown in FIG. Further, step 200 is a second additional substrate (illustrated) that is previously patterned and placed on the first substrate chuck 13a in front of the first substrate 12a, similar to step 230 shown in FIG. Includes further removal.
To this end, in one example, the aforementioned process of patterning the first surface 62a and the second surface 64a of the first substrate 12a and the first surface 62b and the second surface 64b of the second substrate 12b It has a total process time of 40 seconds per substrate. In more detail, Table 3 clearly shows the time for each step of the patterning process described above.
<tables num="3"><img file="JP4472011B2_D0003.tif" /></tables><img file="JP4472011B2_D0004.tif" />
To this end, the steps of the aforementioned method of processing the first and second surfaces 62a and 64a of the first substrate 12a and the first and second surfaces 62b and 64b of the second substrate 12b are: Executed in parallel. More specifically, similar to the steps described above with respect to Table 2, 1) the step of placing the substrate on or removing the substrate from the substrate chuck, 2) the desired spatial relationship between the substrate and the mold. As a result, the steps of filling the desired volume between the substrate and the mold and solidifying and / or cross-linking the polymer material or separating the mold from the polymer material are performed in parallel. As a result, an overall increase in throughput for processing multiple substrates (and similarly a reduction in total process time per substrate) can be obtained, which may be desirable. To this end, the processes described above can be used in imprint lithography systems, especially including step-and-repeat systems and full-wafer systems. The choice of system is known to those of skill in the art and typically depends on the particular application desired.
Referring to FIG. 26, in a further embodiment, the system 110 includes an arbitrary number of substrate chucks. In one example, system 110 includes a first module 66a and a second module 66b. The first module 66a can include a first substrate chuck 14a and a second substrate chuck 14b, and the second module 66b includes a third substrate chuck 14c and a fourth substrate chuck 14d. .. The third substrate chuck 14c and the fourth substrate chuck 14d are similar to the first substrate chuck 14a and the second substrate chuck 14b described above with respect to FIG. 4, respectively. To this end, the third substrate chuck 14c and the fourth substrate chuck 14d are similar to the first substrate 12a and the second substrate 12b described above with respect to FIG. It can have a substrate 12c and a fourth substrate 12d and is subject to substantially the same processing conditions as described above with respect to FIG. More specifically, the processing of the first module 66a and the second module 66b is performed in parallel, that is, the modules of the first module 66a and the second module 66b are simultaneously described above with respect to FIG. To undergo the process.
In one example, one substrate of the first substrate 12a and the second substrate 12b of the first module 66a, and one substrate of the third substrate 12c and the fourth substrate 12d of the second module 66b are patterned. On the other hand, at the same time, the remaining boards of the first board 12a and the second board 12b of the first module 66a, and the remaining boards of the third board 12c and the fourth board 12d of the second module 66b are input. / In the output process. More specifically, the first substrate 12a is patterned similar to steps 204 and 206 described above with respect to FIGS. 8 and 15, and the third substrate 12c is patterned with respect to FIGS. 15 and 22 described above. And 226 are patterned similar to. At the same time, the second substrate 12b is placed on the second substrate chuck 14b similar to step 206 described above with respect to FIGS. 8 and 15, and the fourth substrate 12d is described above with respect to FIGS. 15 and 25. Similar to step 230 (or similar to step 222 described above with respect to FIGS. 15 and 19), it is removed (or removed and flipped) from the fourth substrate chuck 14d. Note that template 26 is shown as a dashed rectangle for the sake of brevity.
Referring to FIG. 27, in a further example, the second substrate 12b is patterned similar to steps 204, 206 described above with respect to FIGS. 8 and 15, and the fourth substrate 12d is with respect to FIGS. 15 and 22. Patterning is similar to step 226 described above. At the same time, the first substrate 12a is placed on the first substrate chuck 14a similar to step 206 described above with respect to FIGS. 8 and 15, and the third substrate 12c is described above with respect to FIGS. 15 and 25. Similar to step 230 (or similar to step 222 described above with respect to FIGS. 15 and 19), it is removed (or removed and flipped) from the third substrate chuck 14c.
To this end, using the processes described above for the first module 66a and the second module 66b, and FIG. 15, substrates with patterns formed on the first and second surfaces are formed every n seconds. Here, n seconds is the time for patterning the surface of the substrate.
Referring to FIG. 28, a cross-sectional view of a first substrate chuck 14a having a first substrate 12a disposed on it is shown. The first substrate chuck 14a includes a plurality of lands 68 arranged around the active region 80 of the first substrate 12a. The first substrate chuck 14a further comprises a throughway 82 for fluid communication of the pump system 84 to facilitate obtaining the desired pressure in the cavity 16a. The control of the pump system 84 is coordinated by the processor 58.
Further, it is desirable that the first substrate 12a and the second substrate 12b are subjected to substantially the same processing conditions. To this end, referring to FIG. 29, a portion 86 of the first substrate 12a shown in FIG. 4 is shown, where the portion 86 determines the level of flatness of the plurality of first surfaces 62a of the first substrate 12a. indicate. The first surface 62a has multiple hills and valleys, but only hills 88 and 90 are shown. The hills and valleys of the first surface 62a form the average plane of the plurality of first surfaces 62a, shown as the plane "a". However, the hills and valleys of the first surface 62a can deviate from the plane "a" by different magnitudes, and for simplicity each deviation is Δ.<sub>dev1</sub>Is defined as. More specifically, the apex of hill 88 is of magnitude Δ<sub>1</sub>Only can deviate from the plane "a", the lowest point of valley 90 is of magnitude Δ<sub>2</sub>Only deviates from the plane "a". The above applies equally to the second surface 64a of the first substrate 12a, and to the first surface 62a and the second surface 64b of the second substrate 12b. With reference to FIG. 30, a portion 92 of the first substrate chuck 14a shown in FIG. 4 is shown, the portion 92 indicating the level of a plurality of surfaces 94 of the first substrate chuck 14a. Surface 94 has multiple hills and valleys, but only hills 96 and 98 are shown. The hills and valleys of the surface 94 form an average plane of the surfaces 94, shown as the plane "b". However, multiple hills and valleys on the surface 94 can deviate from the plane "b" by different magnitudes, and for simplicity each deviation is Δ.<sub>dev2</sub>Is defined as. More specifically, the apex of hill 96 is of magnitude Δ<sub>3</sub>Only can deviate from the plane "b", the lowest point of valley 98 is of magnitude Δ<sub>4</sub>Only deviates from the plane "b". The above applies equally to the second substrate chuck 12b. Therefore, the deviation Δ in the thickness of the surface 94 of the substrate chuck 14b<sub>dev2</sub>Is a deviation Δ in the thickness of the first surface 62a (or the second surface 64a) of the first substrate 12a.<sub>dev1</sub>Smaller. As a result, it becomes easy to receive the first substrate 12a and the second substrate 12b under substantially the same processing conditions.
Further, the first fluid dispenser 40a and the second fluid dispenser 40b are calibrated with respect to each other so that the first substrate 12a and the second substrate 12b can be subjected to substantially the same processing conditions. More specifically, the first fluid dispenser 40a has a volume V on the first substrate 12a.<sub>1</sub>The first fluid dispenser 40a is instructed by the processor 58 to place the polymer material 42a of the first substrate 12a in volume V.<sub>2</sub>Polymer material 42a can be placed, volume V<sub>2</sub>Is the volume V<sub>1</sub>Unlike the volume V<sub>1</sub>Is the desired volume. This may be the result of a miscalibration of the first fluid dispenser 40a, i.e. the result of a discharge of a volume of fluid that is different from the ordered volume. For this, the volume V<sub>1</sub>And V<sub>2</sub>The difference is that the processor 58, which is calculated and runs on a computer-readable program stored in memory 60, has a first fluid dispenser 40a with a volume V on a first substrate 12a.<sub>1</sub>Volume V on the first substrate 12a to compensate for miscalibration so that<sub>3</sub>Order the first fluid dispenser 40a to place. The above applies equally to the second fluid dispenser 40b. For this reason, it is easy for the first substrate 12a and the second substrate 12b to be subjected to substantially the same processing conditions.
Further, the polymer material 42a placed on the first substrate 12a and the polymer material 42b placed on the second substrate 12b, respectively, are subject to different evaporation conditions as a result of being placed on different substrate chucks. Therefore, the volumes of the polymer materials 42a and 42b can be different and are not desirable. More specifically, the airflow and environmental temperatures associated with the polymer material 42a, the first substrate 12a, the first substrate chuck 14a are related to the polymer material 42b, the second substrate 12b, the second substrate chuck 14b. It may be different from the environment in which it is used. As a result, the first fluid dispenser 40a has a volume V on the first substrate 12a.<sub>4</sub>The polymer material 42a of the second fluid dispenser 40b is placed on the second substrate 12b to compensate for the evaporation conditions described above.<sub>4</sub>Different volume V<sub>5</sub>Polymer materials 42b can be placed, and after the polymer materials 42a and 42b have been exposed to evaporation conditions, the polymer materials 42a and 42b have a volume V, respectively.<sub>6</sub>And V<sub>7</sub>Including volume V<sub>6</sub>And V<sub>7</sub>Are substantially the same.
Further, the geometric positions of the first fluid dispenser 40a and the second fluid dispenser 40b with respect to the first substrate 12a and the second substrate 12b are substantially the same for the first substrate 12a and the second substrate 12b. It may be substantially the same to facilitate acceptance of the condition. More specifically, the distance between the first fluid dispenser 40a and the first substrate 12a may be substantially the same as the distance between the second fluid dispenser 40b and the second substrate 40b.
To further facilitate that the first substrate 12a and the second substrate 12b are subject to substantially the same processing conditions, the reflectance of the surface 94 of the first substrate chuck 14a and the second substrate chuck 14b is set to The solidification and / or cross-linking of the first material 42a and the second material 42b may be substantially the same, just as they may be substantially the same.
The embodiments of the present invention described above are exemplary. Many changes and modifications can be made to the disclosures described above and remain within the scope of the invention. Therefore, the scope of the invention should not be limited by the above description, but instead should be determined with reference to the claims in addition to the scope of their perfect equivalents.
<figref num="1">It is a simplified top view of a lithography system having a mold separated from a substrate according to the prior art.</figref><figref num="2">It is a figure from the top to the bottom of the robot handling the substrate shown in FIG.</figref><figref num="3">It is a flow chart which shows the method of patterning the substrate shown in FIG.</figref><figref num="4">It is a simplified top view of a lithography system having molds separated from the first and second substrates placed on the first and second substrate chucks, respectively.</figref><figref num="5">It is a flow chart which shows the method of patterning the 1st and 2nd substrates shown in FIG.</figref><figref num="6">FIG. 4 is a simplified plan view of the lithography system shown in FIG. 4, in which the robot places the first substrate on the first substrate chuck.</figref><figref num="7">It is a simplified top view of the lithography system shown in FIG. 6 with a first substrate having a material placed on it.</figref><figref num="8">A simplified top view of the lithography system shown in FIG. 7, where the mold contacts the material placed on the first board and the robot places the second board on the second board chuck. ..</figref><figref num="9">A simplified top view of the lithography system shown in FIG. 8, where the mold is separated from the material on the first substrate.</figref><figref num="10">It is a simplified top view of the lithography system shown in FIG. 9, with a second substrate having material placed on it.</figref><figref num="11">A simplified top view of the lithography system shown in FIG. 10, where the mold contacts the material placed on the second substrate and the robot removes the first substrate from the first substrate chuck.</figref><figref num="12">A simplified top view of the lithography system shown in FIG. 11, where the mold is separated from the material on the second substrate and the third substrate is placed on the first substrate chuck.</figref><figref num="13">It is a simplified top view of the lithography system shown in FIG. 12, with a third substrate having material placed on it.</figref><figref num="14">A simplified top view of the lithography system shown in FIG. 13, where the mold contacts the material placed on the third substrate and the robot removes the second substrate from the second substrate chuck.</figref><figref num="15">It is a flow chart which shows the method of patterning the 1st and 2nd surfaces of the 1st and 2nd substrates shown in FIG.</figref><figref num="16">A simplified top view of the lithography system shown in FIG. 10, where the mold contacts a material placed on a second substrate and the robot flips the first substrate against the mold.</figref><figref num="17">A simplified top view of the lithography system shown in FIG. 16, where the mold is separated from the material on the second substrate and the first substrate is placed on the first substrate chuck in the second position. To.</figref><figref num="18">It is a simplified top view of the lithography system shown in FIG. 17, with a first substrate having a material placed on it.</figref><figref num="19">A simplified top view of the lithography system shown in FIG. 18, where the mold contacts a material placed on the first substrate and the robot flips the second substrate against the mold.</figref><figref num="20">A simplified top view of the lithography system shown in FIG. 19, where the mold is separated from the material on the first substrate and the second substrate is placed on the second substrate chuck in the second position. To.</figref><figref num="21">It is a simplified top view of the lithography system shown in FIG. 20, with a second substrate having material placed on it.</figref><figref num="22">A simplified top view of the lithography system shown in FIG. 21, where the mold contacts the material placed on the second substrate and the robot removes the first substrate from the first substrate chuck.</figref><figref num="23">A simplified top view of the lithography system shown in FIG. 22, where the mold is separated from the material on the second substrate and the third substrate is placed on the first substrate chuck.</figref><figref num="24">It is a simplified top view of the lithography system shown in FIG. 23, with a third substrate having material placed on it.</figref><figref num="25">A simplified top view of the lithography system shown in FIG. 24, where the mold contacts the material placed on the third substrate and the robot removes the second substrate from the second substrate chuck.</figref><figref num="26">A simplified top-to-bottom view of the lithography system shown in FIG. 4, wherein the lithography system has first and second modules with first and second substrate chucks, respectively. The substrate is patterned.</figref><figref num="27">A simplified top-to-bottom view of the lithography system shown in FIG. 4, where the lithography system has first and second modules with first and second substrate chucks, respectively, and a second. The substrate is patterned.</figref><figref num="28">It is a simplified top view of the substrate chuck which has the substrate arranged on it.</figref><figref num="29">It is an exploded view of a part of the substrate shown in FIG.</figref><figref num="30">It is an exploded view of a part of the substrate chuck shown in FIG.</figref>
34 sheets
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Every citation, both ways
| Document | Relation | Office |
|---|---|---|
| JP200545168A | Cites | Japan |
| JP2005153091A | Cites | Japan |
| JP2007165812A | Cites | Japan |
| JP2007182063A | Cites | Japan |
| WO03090985A1 | Cites | World Intellectual Property Organization (WIPO) |
| US20030189273A1 | Cites | United States of America |
59 members in 10 offices
Priority claims9
| Document | Office | Kind | Date |
|---|---|---|---|
| 60760738 | United States of America | – | |
| 76073806 | United States of America | P | |
| 60788808 | United States of America | – | |
| 78880806 | United States of America | P | |
| 60827125 | United States of America | – | |
| 82712506 | United States of America | P | |
| 11565350 | United States of America | – | |
| 56535006 | United States of America | A | |
| 2007001670 | United States of America | W |
Members59
| Document | Office | Kind | |
|---|---|---|---|
| US2005270312A1 | United States of America | A1 | |
| WO2005120834A2 | World Intellectual Property Organization (WIPO) | A2 | |
| TW200643654A | Taiwan Province of China | A | |
| WO2005120834A3 | World Intellectual Property Organization (WIPO) | A3 | |
| EP1768846A2 | European Patent Office (EPO) | A2 | |
| KR20070038987A | Republic of Korea | A | |
| US2007132152A1 | United States of America | A1 | |
| WO2007067488A2 | World Intellectual Property Organization (WIPO) | A2 | |
| US2007170617A1 | United States of America | A1 | |
| WO2007084774A2 | World Intellectual Property Organization (WIPO) | A2 | |
| CN101019066A | China | A | |
| TW200730325A | Taiwan Province of China | A | |
| TW200734706A | Taiwan Province of China | A | |
| US2007228593A1 | United States of America | A1 | |
| TWI290665B | Taiwan Province of China | B | |
| TW200746256A | Taiwan Province of China | A | |
| WO2007084774A3 | World Intellectual Property Organization (WIPO) | A3 | |
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| WO2008066562A2 | World Intellectual Property Organization (WIPO) | A2 | |
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| US7670529B2 | United States of America | B2 | |
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| JP2011171747A | Japan | A | |
| JP4792028B2 | Japan | B2 | |
| MY144847A | Malaysia | A | |
| US8109753B2 | United States of America | B2 | |
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| JP4987012B2 | Japan | B2 | |
| KR101193918B1 | Republic of Korea | B1 | |
| MY147830A | Malaysia | A | |
| KR101324544B1 | Republic of Korea | B1 | |
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Numbers
- Publication
- 4472011
- Application
- 2008551459
Titles2
- Japanese
- 複数のチャックを用いる基板パターニング
- English
- Substrate patterning using multiple chucks
Classification
- CPC, 6
- G03F7/0002
- B82Y10/00
- B82Y40/00
- Y10S977/887
- B29C59/022
- H10P72/76
- IPC, 2
- H01L21 027
- G03F1 92
