Nova Patents
IL282673B

Spectroscopic beam profile metrology

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Published
  4. Today

17 members in 6 offices

This recordMember, by publication datePriority claim

Priority claims5

Priority claims
DocumentOfficeKindDate
201462088290United States of AmericaP
62088290United States of America–
14960121United States of America–
201514960121United States of AmericaA
2015064150United States of AmericaW

Members17

Family members, oldest first
DocumentOfficeKind
US2016161245A1United States of AmericaA1
WO2016090349A1World Intellectual Property Organization (WIPO)A1
TW201629469ATaiwan Province of ChinaA
IL252160D0IsraelD0
CN107003114AChinaA
KR20170094288ARepublic of KoreaA
US10072921B2United States of AmericaB2
US2018347961A1United States of AmericaA1
US10234271B2United States of AmericaB2
TWI659204BTaiwan Province of ChinaB
CN107003114BChinaB
CN110986818AChinaA
CN110986818BChinaB
IL252160BIsraelB
IL282673AIsraelA
IL282673BThis recordIsraelB
KR102386664B1Republic of KoreaB1