IL252160B

Spectroscopic beam profile metrology

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

17 members in 6 offices

This recordMember, by publication datePriority claim

Priority claims3

Priority claims
Document	Office	Kind	Date
201462088290	United States of America	P	2014-12-05
201514960121	United States of America	A	2015-12-04
2015064150	United States of America	W	2015-12-05

Members17

Family members, oldest first
Document	Office	Kind
US2016161245A1	United States of America	A1	2016-06-09
WO2016090349A1	World Intellectual Property Organization (WIPO)	A1	2016-06-09
TW201629469A	Taiwan Province of China	A	2016-08-16
IL252160D0	Israel	D0	2017-07-31
CN107003114A	China	A	2017-08-01
KR20170094288A	Republic of Korea	A	2017-08-17
US10072921B2	United States of America	B2	2018-09-11
US2018347961A1	United States of America	A1	2018-12-06
US10234271B2	United States of America	B2	2019-03-19
TWI659204B	Taiwan Province of China	B	2019-05-11
CN107003114B	China	B	2020-01-03
CN110986818A	China	A	2020-04-10
CN110986818B	China	B	2021-05-18
IL252160BThis record	Israel	B	2021-05-31
IL282673A	Israel	A	2021-06-30
IL282673B	Israel	B	2022-03-01
KR102386664B1	Republic of Korea	B1	2022-04-13

2 legal events, as the office reported them to INPADOC

Over the term

Point at a mark for the event

Events

Legal events, newest first
	Event	Code
2021-09-30	Patent grantedGrantedFF	FF
2021-09-30	Patent renewedKB	KB