Nova Patents
IL253189B

System and method for assigning classifications to defects detected on a wafer

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

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85 members in 6 offices

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Priority claims5

Priority claims
DocumentOfficeKindDate
73794705United States of AmericaP
73829005United States of AmericaP
56165906United States of AmericaA
56173506United States of AmericaA
2006061113United States of AmericaW

Members85

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US2007156379A1United States of AmericaA1
US2007230770A1United States of AmericaA1
WO2007120279A2World Intellectual Property Organization (WIPO)A2
WO2007120280A2World Intellectual Property Organization (WIPO)A2
US2007288219A1United States of AmericaA1
EP1955225A2European Patent Office (EPO)A2
KR20080080130ARepublic of KoreaA
WO2007120280A3World Intellectual Property Organization (WIPO)A3
WO2007120279A3World Intellectual Property Organization (WIPO)A3
IL191527A0IsraelA0
WO2009038838A2World Intellectual Property Organization (WIPO)A2
JP2009516832AJapanA
US7570796B2United States of AmericaB2
EP1955225A4European Patent Office (EPO)A4
WO2009038838A3World Intellectual Property Organization (WIPO)A3
US2009297019A1United States of AmericaA1
US7676077B2United States of AmericaB2
US2010119144A1United States of AmericaA1
JP2010529683AJapanA
US8041103B2United States of AmericaB2
US2011286656A1United States of AmericaA1
US8139843B2United States of AmericaB2
JP2012168195AJapanA
KR20130043223ARepublic of KoreaA
KR20130055013ARepublic of KoreaA
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KR101285967B1Republic of KoreaB1
JP2013217940AJapanA
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KR101370154B1Republic of KoreaB1
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IL234319AIsraelA
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KR101682838B1Republic of KoreaB1
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IL253189AIsraelA
IL253189BThis recordIsraelB