EP4257939A4
Wavelength measurement chip and wavelength measurement system
Abstract
This record has no abstract on file.
Term
15.2 yearsto projected expiry
Projected expiry 30 November 2041, counted from filing; an application has no term until it is granted.
- Priority and filed
- Published
- Today
- Projected expiry
5 sheets
Sheet 1 Sheet 2 Sheet 3 Sheet 4 Sheet 5
Every citation, both ways
| Document | Relation | Office | Cited during |
|---|---|---|---|
| US10006809B2 | Cites | United States of America | Search report |
| US2010110443A1 | Cites | United States of America | Search report |
| US2014092385A1 | Cites | United States of America | Search report |
| US2015085292A1 | Cites | United States of America | Search report |
| US8237102B1 | Cites | United States of America | Search report |
| US9964703B2 | Cites | United States of America | Search report |
| See also references of WO 2022142966A1 | Non-patent | – | Search report |
7 members in 5 offices; this record represents the family
Members7
| Document | Office | Kind | |
|---|---|---|---|
| CN114689188A | China | A | |
| WO2022142966A1 | World Intellectual Property Organization (WIPO) | A1 | |
| EP4257939A1 | European Patent Office (EPO) | A1 | |
| US2023341266A1 | United States of America | A1 | |
| JP2024501712A | Japan | A | |
| EP4257939A4This record | European Patent Office (EPO) | A4 | |
| JP7648770B2 | Japan | B2 |
13 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| First examination report despatched17Q | 17Q | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: EXAMINATION IS IN PROGRESSSTAA | STAA | |
| Supplementary search report drawn up and despatchedA4 | A4 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Request for validation of the european patent (deleted)DAV | DAV | |
| Request for extension of the european patent (deleted)DAX | DAX | |
| Request for examination filed17P | 17P | |
| Designated contracting statesAK | AK | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: REQUEST FOR EXAMINATION WAS MADESTAA | STAA | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADESTAA | STAA |
Numbers
- Publication
- 4257939
- Application
- 219137072
Titles3
- German
- WELLENLÄNGENMESSCHIP UND WELLENLÄNGENMESSSYSTEM
- English
- WAVELENGTH MEASUREMENT CHIP AND WAVELENGTH MEASUREMENT SYSTEM
- French
- PUCE DE MESURE DE LONGUEUR D'ONDE ET SYSTÈME DE MESURE DE LONGUEUR D'ONDE
Classification
- CPC, 7
- G01J9/0246
- G01J9/02
- G01J3/45
- G01J2009/023
- G01J2009/0288
- G01J3/0229
- G02B27/1006
- IPC, 3
- G01J3 12
- G01J3 28
- G01J9 02
Designated states38
- Contracting states, 38
- Albania
- Austria
- Belgium
- Bulgaria
- Switzerland
- Cyprus
- Czechia
- Germany
- Denmark
- Estonia
- Spain
- Finland
- France
- United Kingdom
- Greece
- Croatia
- Hungary
- Ireland
- Iceland
- Italy
- Liechtenstein
- Lithuania
- Luxembourg
- Latvia
and 14 moreShow fewer
- Monaco
- North Macedonia
- Malta
- Netherlands (Kingdom of the)
- Norway
- Poland
- Portugal
- Romania
- Serbia
- Sweden
- Slovenia
- Slovakia
- San Marino
- Türkiye