EP3210189A4
Apparatus and methods for predicting wafer-level defect printability
4 sheets
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Every citation, both ways
| Document | Relation | Office | Cited during |
|---|---|---|---|
| US2010080443A1 | Cites | United States of America | Search report |
| US2013283217A1 | Cites | United States of America | Search report |
| US2015054940A1 | Cites | United States of America | Search report |
| US7703069B1 | Cites | United States of America | Search report |
| See also references of WO 2017027366A1 | Non-patent | – | Search report |
50 members in 9 offices
Priority claims3
| Document | Office | Kind | Date |
|---|---|---|---|
| 201514822571 | United States of America | – | |
| 201514822571 | United States of America | A | |
| 2016045749 | United States of America | W |
Members50
| Document | Office | Kind | |
|---|---|---|---|
| US2015324963A1 | United States of America | A1 | |
| WO2015171506A1 | World Intellectual Property Organization (WIPO) | A1 | |
| US2016012579A1 | United States of America | A1 | |
| TW201602717A | Taiwan Province of China | A | |
| US9478019B2 | United States of America | B2 | |
| KR20170005054A | Republic of Korea | A | |
| US9547892B2 | United States of America | B2 | |
| WO2017027366A1 | World Intellectual Property Organization (WIPO) | A1 | |
| CN106463428A | China | A | |
| TW201708942A | Taiwan Province of China | A | |
| JP2017523444A | Japan | A | |
| EP3210189A1 | European Patent Office (EPO) | A1 | |
| US2017309008A1 | United States of America | A1 | |
| KR20180030228A | Republic of Korea | A | |
| US2018082415A1 | United States of America | A1 | |
| CN106463428B | China | B | |
| CN107851315A | China | A | |
| EP3210189A4This record | European Patent Office (EPO) | A4 | |
| JP2018532139A | Japan | A | |
| WO2018212787A1 | World Intellectual Property Organization (WIPO) | A1 | |
| TWI644169B | Taiwan Province of China | B | |
| TW201901291A | Taiwan Province of China | A | |
| US10304180B2 | United States of America | B2 | |
| US10395361B2 | United States of America | B2 | |
| KR20190143450A | Republic of Korea | A | |
| IL270618A | Israel | A | |
| DE112017007551T5 | Germany | T5 | |
| CN107851315B | China | B | |
| JP6669669B2 | Japan | B2 | |
| TWI695222B | Taiwan Province of China | B | |
| CN111340762A | China | A | |
| JP2020520481A | Japan | A | |
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| JP6840129B2 | Japan | B2 | |
| KR102245701B1 | Republic of Korea | B1 | |
| CN111340762B | China | B | |
| TWI755453B | Taiwan Province of China | B | |
| EP3210189B1 | European Patent Office (EPO) | B1 | |
| JP7116757B2 | Japan | B2 | |
| JP2022164702A | Japan | A | |
| JP7262423B2 | Japan | B2 | |
| KR20230070057A | Republic of Korea | A | |
| IL270618B1 | Israel | B1 | |
| IL270618B2 | Israel | B2 | |
| JP7440580B2 | Japan | B2 | |
| KR102721342B1 | Republic of Korea | B1 | |
| KR102735948B1 | Republic of Korea | B1 | |
| KR20240169729A | Republic of Korea | A | |
| KR102875951B1 | Republic of Korea | B1 |
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Numbers
- Publication
- 3210189
- Application
- 168356897
Titles3
- German
- VORRICHTUNG UND VERFAHREN ZUR VORHERSAGE DER DRUCKBARKEIT VON FEHLERN AUF WAFEREBENE
- English
- APPARATUS AND METHODS FOR PREDICTING WAFER-LEVEL DEFECT PRINTABILITY
- French
- APPAREIL ET PROCÉDÉS DE PRÉDICTION DE L'IMPRIMABILITÉ D'UN DÉFAUT AU NIVEAU D'UNE GALETTE
Classification
- CPC, 11
- G06T7/001
- G06T7/0006
- G03F1/84
- G03F7/705
- G01N21/956
- G06T2207/30148
- G06T2207/10144
- G06T2207/10152
- G01N2021/95676
- H10P74/235
- G06T2207/10016
- IPC, 2
- G06T7 00
- G03F1 84
Designated states3
- Contracting states, 1
- Türkiye
- Extension states, 1
- Montenegro
- Validation states, 1
- Republic of Moldova
