EP1992004A4
Active damping of high speed scanning probe microscope components
Abstract
This record has no abstract on file.
Term
Projected expiry 23 February 2027.
- Priority
- Filed
- Published
- Today
- Projected expiry
13 sheets
Sheet 1 Sheet 2 Sheet 3 Sheet 4 Sheet 5 Sheet 6 Sheet 7 Sheet 8 Sheet 9 Sheet 10 Sheet 11 Sheet 12 Sheet 13
Every citation, both ways
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| JP2004163217A | Cites | Japan | – | Examiner | – |
| US5783899A | Cites | United States of America | Y | Search report | 8 |
| US6278113B1 | Cites | United States of America | Y | Search report | 3,9,10 |
| KODERA NORIYUKI ET AL: "Active damping of the scanner for high-speed atomic force microscopy", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 76, no. 5, 26 April 2005 (2005-04-26), pages 53708 - 053708, XP012079381, ISSN: 0034-6748, DOI: 10.1063/1.1903123 | Non-patent | – | – | Search report | – |
| See also references of WO 2007101133A2 | Non-patent | – | – | Examiner | – |
13 members in 5 offices
Priority claims5
| Document | Office | Kind | Date |
|---|---|---|---|
| 776385P | United States of America | – | |
| 77638506 | United States of America | P | |
| 678018 | United States of America | – | |
| 67801807 | United States of America | A | |
| 2007062760 | United States of America | W |
Members13
| Document | Office | Kind | |
|---|---|---|---|
| WO2007101133A2 | World Intellectual Property Organization (WIPO) | A2 | |
| US2007214864A1 | United States of America | A1 | |
| WO2007101133A3 | World Intellectual Property Organization (WIPO) | A3 | |
| EP1992004A2 | European Patent Office (EPO) | A2 | |
| KR20090014339A | Republic of Korea | A | |
| JP2009528516A | Japan | A | |
| EP1992004A4This record | European Patent Office (EPO) | A4 | |
| KR20120089373A | Republic of Korea | A | |
| US8302456B2 | United States of America | B2 | |
| US2013061356A1 | United States of America | A1 | |
| JP5202337B2 | Japan | B2 | |
| US8763475B2 | United States of America | B2 | |
| KR101440450B1 | Republic of Korea | B1 |
20 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Application deemed to be withdrawnWithdrawn18D | 18D | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWNSTAA | STAA | |
| Intention to grant announcedINTG | INTG | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Despatch of communication of intention to grant a patentORIGINAL CODE: EPIDOSNIGR1GRAP | GRAP | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: GRANT OF PATENT IS INTENDEDSTAA | STAA | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: EXAMINATION IS IN PROGRESSSTAA | STAA | |
| Request for extension of the european patent (deleted)DAX | DAX | |
| First examination report despatched17Q | 17Q | |
| Supplementary search report drawn up and despatchedA4 | A4 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information on inventor provided before grant (corrected)RIN1 | RIN1 | |
| Request for examination filed17P | 17P | |
| Designated contracting statesAK | AK | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI |
Numbers
- Publication
- 1992004
- Application
- 77574432
Titles3
- German
- AKTIVE DÄMPFUNG VON KOMPONENTEN EINES HOCHGESCHWINDIGKEITS-RASTERSONDENMIKROSKOPS
- English
- ACTIVE DAMPING OF HIGH SPEED SCANNING PROBE MICROSCOPE COMPONENTS
- French
- AMORTISSEMENT ACTIF DE COMPOSANTS À GRANDE VITESSE DE MICROSCOPE À CHAMP PROCHE
Classification
- CPC, 8
- F16F7/1011
- G01Q10/06
- G01Q10/065
- G01Q70/04
- G01Q60/24
- G01Q10/04
- G01L5/0038
- G01L5/0061
- IPC, 2
- H01J37 20
- G01Q10 06
Designated states31
- Contracting states, 31
- Austria
- Belgium
- Bulgaria
- Switzerland
- Cyprus
- Czechia
- Germany
- Denmark
- Estonia
- Spain
- Finland
- France
- United Kingdom
- Greece
- Hungary
- Ireland
- Iceland
- Italy
- Liechtenstein
- Lithuania
- Luxembourg
- Latvia
- Monaco
- Netherlands (Kingdom of the)
and 7 moreShow fewer
- Poland
- Portugal
- Romania
- Sweden
- Slovenia
- Slovakia
- Türkiye