EP1595211A4

Compressing test responses using a compactor

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Projected expiry passed 13 February 2024, 2.6 years ago.

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Citations
DocumentRelationOfficeCategoryCited duringRelevant claims
WO0139254A2CitesWorld Intellectual Property Organization (WIPO)ASearch report1-79
WO0139254ACitesWorld Intellectual Property Organization (WIPO)–––
MITRA S ET AL: "X-compact an efficient response compaction technique for test cost reduction", PROCEEDINGS INTERNATIONAL TEST CONFERENCE 2002. ITC 2002. BALTIMORE, MD, OCT. 7-10, 2002, INTERNATIONAL TEST CONFERENCE, NEW YORK, NY : IEEE, US, 7 October 2002 (2002-10-07), pages 311 - 320, XP010609755, ISBN: 0-7803-7542-4Non-patent––Search report–
RAJSKI J ET AL: "TEST DATA DECOMPRESSION FOR MULTIPLE SCAN DESIGNS WITH BOUNDARY SCAN", IEEE TRANSACTIONS ON COMPUTERS, IEEE SERVICE CENTER, LOS ALAMITOS, CA, US, vol. 47, no. 11, November 1998 (1998-11-01), pages 1188 - 1200, XP000831123, ISSN: 0018-9340Non-patent––Search report–