EP1526409A3
Scanning exposure apparatus and device manufacturing method
Abstract
A scanning exposure apparatus includes a projection optical system; a stage to move while holding a substrate; a measurement system to measure a position of the substrate in an optical axis direction of the projection optical system; a generation system to generate a driving signal, in which a change amount being controlled to be equal to or less than an upper limit value, to the stage based on the result of measurement by the measurement system; and a setting system to set the upper limit value based on a running status of the stage.

Term
Term ended
Projected expiry passed 20 October 2024, 1.9 years ago.
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- Filed
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1 sheet
Sheet 1
Every citation, both ways
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| EP1477852A1 | Cites | European Patent Office (EPO) | E | Search report | 1-5,7-11,13-17 |
| US2001028446A1 | Cites | United States of America | Y | Search report | 18,19 |
| US5073748A | Cites | United States of America | A | Search report | 1,7 |
| US5448332A | Cites | United States of America | A | Search report | 1-4,7-10,13-17 |
| US5483311A | Cites | United States of America | XY | Search report | 1-4,6-10,12-17 |
| US6008610A | Cites | United States of America | X | Search report | 1-4,7-10,13-19 |
| US6455214B1 | Cites | United States of America | Y | Search report | 5,11 |
| ROTARIU I ET AL: "Time-frequency analysis of a motion system with learning control", PROCEEDINGS OF THE 2003 AMERICAN CONTROL CONFERENCE. ACC. DENVER, CO, JUNE 4 - 6, 2003; [AMERICAN CONTROL CONFERENCE], NEW YORK, NY : IEEE, US, vol. 4, 4 June 2003 (2003-06-04), pages 3650 - 3654, XP010667057, ISBN: 978-0-7803-7896-4 | Non-patent | – | – | Search report | – |
7 members in 3 offices; this record represents the family
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| 2003361135 | Japan | – | |
| 2003361135 | Japan | A |
Members7
| Document | Office | Kind | |
|---|---|---|---|
| US2005083501A1 | United States of America | A1 | |
| EP1526409A2 | European Patent Office (EPO) | A2 | |
| JP2005129595A | Japan | A | |
| US7158212B2 | United States of America | B2 | |
| EP1526409A3This record | European Patent Office (EPO) | A3 | |
| JP4840958B2 | Japan | B2 | |
| EP1526409B1 | European Patent Office (EPO) | B1 |
30 legal events, as 4 offices reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | Office | |
|---|---|---|---|
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Lapsed because of non-payment of the annual feeLapsedMM | MM | NL | |
| Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal feeWithdrawnR119 | R119 | DE | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| No opposition filedOpposition26N | 26N | EP | |
| Gb: european patent ceased through non-payment of renewal feeCeasedGBPC | GBPC | EP | |
| No opposition filed within time limitOppositionORIGINAL CODE: 0009261PLBE | PLBE | EP | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: NO OPPOSITION FILED WITHIN TIME LIMITSTAA | STAA | EP | |
| No opposition filed against granted patent, or epo opposition proceedings concluded without decisionGrantedR097 | R097 | DE | |
| Translation for ep filed (entry of ep into country)FP | FP | NL | |
| Dpma publication of mentioned ep patent grantGrantedR096 | R096 | DE | |
| Designated contracting statesAK | AK | EP | |
| European patent grantedGrantedFG4D | FG4D | GB | |
| (expected) grantORIGINAL CODE: 0009210GRAA | GRAA | EP | |
| Grant fee paidORIGINAL CODE: EPIDOSNIGR3GRAS | GRAS | EP | |
| Intention to grant announcedINTG | INTG | EP | |
| Information on inventor provided before grant (corrected)RIN1 | RIN1 | EP | |
| Despatch of communication of intention to grant a patentORIGINAL CODE: EPIDOSNIGR1GRAP | GRAP | EP | |
| First examination report despatched17Q | 17Q | EP | |
| Designation fees paidAKX | AKX | EP | |
| Request for examination filed17P | 17P | EP | |
| Designated contracting statesAK | AK | EP | |
| Request for extension of the european patentAX | AX | EP | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | EP | |
| Designated contracting statesAK | AK | EP | |
| Request for extension of the european patentAX | AX | EP | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | EP |
Numbers
- Publication
- 1526409
- Application
- 42564815
Titles3
- German
- Abtastbelichtungsapparat und Verfahren zur Herstellung einer Vorrichtung
- English
- Scanning exposure apparatus and device manufacturing method
- French
- Appareil d'exposition par balayage et méthode de fabrication d'un dispositif
Classification
- CPC, 2
- G03F7/70725
- G03F9/7034
- IPC, 2
- G03F7 20
- H01L21 027
Designated states33
- Contracting states, 28
- Austria
- Belgium
- Bulgaria
- Switzerland
- Cyprus
- Czechia
- Germany
- Denmark
- Estonia
- Spain
- Finland
- France
- United Kingdom
- Greece
- Hungary
- Ireland
- Italy
- Liechtenstein
- Luxembourg
- Monaco
- Netherlands (Kingdom of the)
- Poland
- Portugal
- Romania
and 4 moreShow fewer
- Sweden
- Slovenia
- Slovakia
- Türkiye
- Extension states, 5
- Albania
- Croatia
- Lithuania
- Latvia
- North Macedonia