EP1522087B1

Tandem time of flight mass spectrometer and method of use

Abstract

To provide comprehensive, i.e. rapid and sensitive, MS-MS analysis, the invention involves a time-nested separation, using two time-of-flight (TOF) mass spectrometers 13 and 15. Parent ions are separated in a slow and long TOF1 13, operating at a low ion energy (1 to 100eV), and fragment ions are mass analysed in a fast and short TOF2 15, operating at a much higher keV energy. A low energy fragmentation (CID) cell 14 between TOF1 and TOF2 is tailored to accelerate fragmentation and dampening steps by shortening the cell and employing a higher collision gas pressure. Since separation in TOF1 takes milliseconds and mass analysis in TOF2 takes microseconds, the invention provides comprehensive MS-MS analysis of multiple precursor ions per single ion pulse. Preferably the second time-of-flight mass analyser TOF2 is of the orthogonal acceleration type (oa-TOF).

EP1522087B1, drawing sheet 1
Sheet 1 of 13

Term

Term ended

Expired 29 April 2023, 3.4 years ago.

  1. Priority
  2. Filed
  3. Granted
  4. Expired
  5. Today

39 claims: 2 independent, 37 dependent

  1. 1
    A tandem mass spectrometer comprising a pulsed ion source (12), a parent ion separator in the form of a first time-of-flight mass spectrometer (TOF1) (13), a fragmentation cell (14), and a second time-of-flight mass spectrometer (TOF2) (15), the tandem mass spectrometer being characterized in that it comprises a time nested data acquisition system (16) acquiring fragment mass spectra for multiple parent ions, and in that said tandem mass spectrometer is configured so that the time between arrival of adjacent parent ion species in said TOF1 is sufficient to fragment said parent ion species in said fragmentation cell (14) and to mass analyze the resulting fragments in said TOF2.
  2. 23
    A method of comprehensive tandem mass spectroscopy analysis, comprising the steps of:(1) ejecting a plurality of parent ions having various mass-to-charge ratios from a pulsed ion source;(2) separating said parent ions as a function of time within a first time-of-flight mass spectrometer (TOF1) (13);(3) fragmenting the time-separated parent ions;and (4) analyzing the fragmented parent ions within a second time-of-flight mass spectrometer (TOF2) (15), wherein the method is characterized in that it further comprises the step of: (5) time nesting the fragmented parent ion spectra acquisition corresponding to multiple parent ions per ion pulse without mixing fragment spectra of different parent ions, wherein, to improve sensitivity and throughput of MS-MS analysis, the time of said parent ion separation significantly exceeds the time of both fragmentation and fragment mass analysis.