Method for shaping a periphal edge of a wafer
Abstract
The invention relates to a method for shaping an edge region of a wafer with the method steps: (a) a wafer having a first and a second surface is provided; (b) at least one layer is applied to an inner region of the first surface such that at least a portion of an edge region on the first surface remains uncovered by the at least one layer; (c) the edge region of the wafer is removed until all edge regions on the first surface are covered by the at least one layer; (d) The wafer is thinly ground from the second surface to a predetermined thickness.

Term
Term ended
Projected expiry passed 23 April 2023, 3.4 years ago.
- Priority
- Filed
- Published
- Projected expiry
- Today
1 sheet
Sheet 1
Every citation, both ways
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| US5340435A | Cites | United States of America | A | Search report | 1 |
| US6113721A | Cites | United States of America | XA | Search report | 1,2,4,9 |
| US6328641B1 | Cites | United States of America | A | Search report | 1 |
3 members in 2 offices; this record represents the family
Priority claims5
| Document | Office | Kind | Date |
|---|---|---|---|
| 10220647 | Germany | A | |
| 10220647 | Germany | A | |
| 10220647 | Germany | – | |
| 10220647 | – | – | – |
| DE2002120647 | – | – | – |
Members3
| Document | Office | Kind | |
|---|---|---|---|
| DE10220647C1 | Germany | C1 | |
| EP1361602A2 | European Patent Office (EPO) | A2 | |
| EP1361602A3This record | European Patent Office (EPO) | A3 |
12 legal events, as 2 offices reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | Office | |
|---|---|---|---|
| Application deemed to be withdrawnWithdrawn18D | 18D | EP | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWNSTAA | STAA | EP | |
| De no longer designated stateR108 | R108 | DE | |
| No designation fees paidAKY | AKY | EP | |
| De no longer designated stateR108 | R108 | DE | |
| Designated contracting statesAK | AK | EP | |
| Request for extension of the european patentAX | AX | EP | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | EP | |
| Party data changed (applicant data changed or rights of an application transferred)RAP1 | RAP1 | EP | |
| Designated contracting statesAK | AK | EP | |
| Request for extension of the european patentAX | AX | EP | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | EP |
Numbers
- Publication
- 1361602
- Publication, DOCDB
- 1361602
- Publication, EPODOC
- EP1361602
- Application
- 3009260
- Application, DOCDB
- 03009260
- Application, EPODOC
- EP20030009260
Titles3
- German
- Verfahren zur Formgebung eines Randbereichs eines Wafers
- English
- Method for shaping a periphal edge of a wafer
- French
- Methode de faconnage d'une zone périphérique d'une plaquette
Classification
- CPC, 2
- H10P90/128
- B24B9/065
- IPC, 3
- H01L21 304
- H01L21 461
- B24B9 06
Designated states2
- Contracting states, 1
- Türkiye
- Extension states, 1
- North Macedonia