EP0876584A4
System for measuring surface flatness using shadow moire technology
13 sheets
Sheet 1 Sheet 2 Sheet 3 Sheet 4 Sheet 5 Sheet 6 Sheet 7 Sheet 8 Sheet 9 Sheet 10 Sheet 11 Sheet 12 Sheet 13
Every citation, both waysCites: the store holds 2 of 3
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| US4525858A | Cites | United States of America | Y | Search report | 10,11,13 |
| US5367378A | Cites | United States of America | XY | Search report | 1,2,6 |
| PATENT ABSTRACTS OF JAPAN vol. 013, no. 185 (P - 865) 2 May 1989 (1989-05-02) | Non-patent | – | – | Search report | – |
10 members in 6 offices
Priority claims9
| Document | Office | Kind | Date |
|---|---|---|---|
| 19960009637P | United States of America | – | |
| 963796 | United States of America | P | |
| 963796 | United States of America | P | |
| 9700247 | United States of America | W | |
| 9700247 | United States of America | W | |
| 9637P | – | – | – |
| US19960009637P | – | – | – |
| US9700247 | – | – | – |
| WO1997US00247 | – | – | – |
Members10
| Document | Office | Kind | |
|---|---|---|---|
| WO9725590A1 | World Intellectual Property Organization (WIPO) | A1 | |
| AU2111497A | Australia | A | |
| US5835223A | United States of America | A | |
| EP0876584A1 | European Patent Office (EPO) | A1 | |
| CN1210585A | China | A | |
| EP0876584A4This record | European Patent Office (EPO) | A4 | |
| CN1093254C | China | C | |
| EP0876584B1 | European Patent Office (EPO) | B1 | |
| DE69717072D1 | Germany | D1 | |
| DE69717072T2 | Germany | T2 |
25 legal events, as 3 offices reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | Office | |
|---|---|---|---|
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Gb: european patent ceased through non-payment of renewal feeCeasedGBPC | GBPC | EP | |
| Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal feeWithdrawnR119 | R119 | DE | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| No opposition filedOpposition26N | 26N | EP | |
| No opposition filed within time limitOppositionORIGINAL CODE: 0009261PLBE | PLBE | EP | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: NO OPPOSITION FILED WITHIN TIME LIMITSTAA | STAA | EP | |
| Corresponds to:REF | REF | EP | |
| Designated contracting statesAK | AK | EP | |
| European patent grantedGrantedFG4D | FG4D | GB | |
| (expected) grantORIGINAL CODE: 0009210GRAA | GRAA | EP | |
| Despatch of communication of intention to grant a patentORIGINAL CODE: EPIDOS IGRAGRAH | GRAH | EP | |
| Despatch of communication of intention to grantORIGINAL CODE: EPIDOS AGRAGRAG | GRAG | EP | |
| Despatch of communication of intention to grant a patentORIGINAL CODE: EPIDOS IGRAGRAH | GRAH | EP | |
| Despatch of communication of intention to grantORIGINAL CODE: EPIDOS AGRAGRAG | GRAG | EP | |
| First examination report despatched17Q | 17Q | EP | |
| Party data changed (applicant data changed or rights of an application transferred)RAP1 | RAP1 | EP | |
| Supplementary search report drawn up and despatchedA4 | A4 | EP | |
| Designated contracting statesAK | AK | EP | |
| Information provided on ipc code assigned before grant7G 01B 11/30 A, 7G 01B 11/24 BRIC1 | RIC1 | EP | |
| Request for examination filed17P | 17P | EP | |
| Designated contracting statesAK | AK | EP | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | EP |
Numbers
- Publication
- 0876584
- Publication, DOCDB
- 0876584
- Publication, EPODOC
- EP0876584
- Application
- 97906417
- Application, DOCDB
- 97906417
- Application, EPODOC
- EP19970906417
Titles3
- English
- SYSTEM FOR MEASURING SURFACE FLATNESS USING SHADOW MOIRE TECHNOLOGY
- French
- SYSTEME DE MESURE DE LA PLANEITE DE SURFACES PAR ANALYSE DE MOTIFS DE FRANGES MOIREES
- German
- PLANHEITSMESSV0RRICHTUNG FÜR OBERFLÄCHEN MITTELS MOIRESTREIFENTECHNOLOGIE
Classification
- CPC, 2
- G01B11/306
- G01B11/30
- IPC, 1
- G01B11 30
Designated states1
- Contracting states, 1
- United Kingdom
