EP0592017A3

Rotatable substrate supporting mechanism with temperature sensing device for use in chemical vapor deposition equipment

Abstract

The invention describes an apparatus used for chemical vapor deposition of materials on substrates such as semi conductor wafers, comprising:    a circular, substantially planar susceptor having an upper surface for centrally receiving a substrate for chemical deposition purposes; and    a susceptor ring structure separate from said susceptor having an inner diameter slightly larger than the outer diameter of said susceptor to enable the positioning of said ring structure in substantially concentric relation with the susceptor and to enable said susceptor to be rotated while the ring structure is fixed, including a passage for supporting one or more sensors close to the periphery of the susceptor to monitor the temperature adjacent the periphery of the susceptor.

Term

Term ended

Projected expiry passed 30 March 2008, 18.5 years ago.

  1. Priority
  2. Filed
  3. Published
  4. Projected expiry
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Every citation, both ways

Citations
DocumentRelationOfficeCategoryCited duringRelevant claims
EP0150878A2CitesEuropean Patent Office (EPO)ASearch report1
"rotatable wafer chuck for testing", IBM TECHNICAL DISCLOSURE BULLETIN., vol. 21, no. 10, March 1979 (1979-03-01), NEW YORK US, pages 4086 - 4087Non-patentSearch report