Nova Patents
EP0503379A3

Test device sample delivery means

Abstract

A test device is disclosed having a semicrater sample application site attached or associated with a substrate. The semicrater sample application site has walls of nonuniform height surrounding the area designed to receive the application of sample. In particular, the walls of the semicrater on one side are higher than the walls of the semicrater on the opposite side. This facilitates the application of a small amount of sample directly onto the desired sample application site.

Term

Term ended

Projected expiry passed 27 February 2012, 14.6 years ago.

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Every citation, both ways

Citations
DocumentRelationOfficeCategoryCited during
EP0212634A1CitesEuropean Patent Office (EPO)ASearch report
EP0279988A1CitesEuropean Patent Office (EPO)ASearch report
EP0283613A2CitesEuropean Patent Office (EPO)ASearch report
DE2652597A1CitesGermanyASearch report