Nova Patents
EP0503379A2

Test device sample delivery means.

Abstract

A test device is disclosed having a semicrater sample application site attached or associated with a substrate. The semicrater sample application site has walls of nonuniform height surrounding the area designed to receive the application of sample. In particular, the walls of the semicrater on one side are higher than the walls of the semicrater on the opposite side. This facilitates the application of a small amount of sample directly onto the desired sample application site.

EP0503379A2, drawing sheet 1
Sheet 1 of 2

Term

Term ended

Projected expiry passed 27 February 2012, 14.6 years ago.

  1. Priority
  2. Filed
  3. Published
  4. Projected expiry
  5. Today

10 claims: 2 independent, 8 dependent

  1. 1
    A test device comprising:(a) a substrate, and(b) a sample delivery means associated with said substrate, wherein said sample delivery means has walled semicrater shaped means surrounding a center sample application area, at least one portion of the walls of said semicrater shaped means being higher than an opposite portion of walls of said semicrater shaped means.
  2. 6
    Test device sample delivery means comprising walled semicrater means forming a recessed well for the application of sample, wherein the walls forming a portion of said walled semicrater means are lower than another opposite portion of said walled semicrater means.