Electronic device testing system

An electronic device testing system of the type in which a test head is mounted for pivotal movement about three orthogonal axes. A cable is introduced to the test head along an axis perpendicular to the horizontal axis extending through the means by which the test head is mounted for pivotal movement about the horizontal axis. The system also has a cable support attached at one end to the test head or a test head yoke and at its opposite end to a test cabinet containing part of the electronics. The cable, extending between the test cabinet and the test head, is supported by the cable support. The cable support is arranged to adjust to changes in the spacing of its end and the orientation of its axis caused by changes in the position or orientation of the test head.