Nova Patents
EP0342045A2

Electronic device testing system.

Abstract

An electronic device testing system of the type in which a test head is mounted for pivotal movement about three orthogonal axes. A cable is introduced to the test head along an axis perpendicular to the horizontal axis extending through the means by which the test head is mounted for pivotal movement about the horizontal axis. The system also has a cable support attached at one end to the test head or a test head yoke and at its opposite end to a test cabinet containing part of the electronics. The cable, extending between the test cabinet and the test head, is supported by the cable support. The cable support is arranged to adjust to changes in the spacing of its end and the orientation of its axis caused by changes in the position or orientation of the test head.

EP0342045A2, drawing sheet 1
Sheet 1 of 6

Term

Term ended

Projected expiry passed 11 May 2009, 17.4 years ago.

  1. Priority
  2. Filed
  3. Published
  4. Projected expiry
  5. Today

12 claims: 5 independent, 7 dependent

  1. 1
    An electronic device testing system comprising:a support structure (10);a positioner (12) movable along said support structure;a test head assembly including: (a) a cradle (14), (b) means (16,44) for attaching said cradle to said positioner for pivo­tal movement of said cradle about a horizontal axis, (c) a test head (22), and (d) means (24, 46, 48, 50) for attaching said test head to said cradle for pivo­tal movement of said test head about a second axis pivotable about said horizontal axis in a plane perpendicular to said horizontal axis;a test cabinet (26);a cable support (100);means (130) for attaching a first end of said cable support to said test head assembly;and a cable (28) connected between said test head and said test cabinet and extending along said cable support away from said test head assembly.
  2. 8
    An electronic device testing system accord­ing to claim 7 wherein said cable support includes a telescoping unit (110, 112) having said first end at­tached to said test heat assembly and said second end attached to said support structure.
  3. 9
    An electronic device testing system accord­ing to claim 8 wherein said cable support further in­cludes means (120, 122) mounted on said telescoping unit for twisting said cable about said telescoping unit as said test head pivots about said second axis.
  4. 10
    An electronic device testing system accord­ing to claim 7 wherein said means for attachhing said first end of said cable support to said test head assembly and said means for attaching said second end of said cable support to said support structure each include a spherical bearing (130, 132) which permits rotation and gimbaling between said cable support and said test head assembly and between said cable support and said support structure.
  5. 11
    A cable support comprising:a telescoping unit having a piston (112) movable within a cylindrical assembly (110) toward and away from a closed end (110a) of said cylindrical assembly;first (120), second (122) and third (124) cable support webs each having a plurality of vanes extending radially outward from its center;first means (126) for mounting said first cable support web on said cylindrical assembly at said closed end for turning movement of said first cable support web relative to said cylindrical assembly;second means (128) for mounting said second cable support web on said cylindrical assembly spaced from said closed end for turning movement of said second cable support web relative to said cylindrical assembly;and third means for mounting said third cable support web in tightly fitted engagement on said cylindri­cal assembly on the side of said second cable support web opposite from said first cable support web.