Apparatus for inspecting components of transparent material as to surface defects and inclusions
7 claims: 7 independent, 0 dependent
- 1Dispositif pour contrôler les défauts de surface et les inclusions de composants réalisés en un matériau transparent, dispositif dans lequel le composant (1) est détecté ponctuellement à l'aide d'un faisceau lumineux (7) déplacé de manière linéaire et comportant au moins une installation (8) inclinée par rapport à la direction d'incidence du faisceau lumineux (7), installation qui se compose d'un système optique (9) de reproduction dont le plan image (10) comporte un masque (11) pour séparer l'image d'un plan du composant contrôlé (1), et comprend un récepteur (17) recevant le faisceau lumineux traversant le masque (11) pour détecter la lumière influencée par les défauts du composant, et est reliée à un dispositif (18) pour exploiter les signaux reçus et donner des signaux caractéristiques des défauts du composant, dispositif caractérisé en ce que le composant (1) à contrôler peut tourner autour de son axe et est détecté pendant sa rotation autour de son axe, par un faisceau lumineux (7) déplacé linéairement dans la direction du diamètre, et l'installation (8) peut être inclinée suivant un angle pré-sélectionné par rapport à la direction d'incidence du faisceau d'éclairage et en ce que le masque (11) peut être remplacé pour sélectionner l'image d'un plan. Method of examining structural components made of transparent material for surface defects and inclusions, a moved light beam (4) being used for spot-type scanning of the component (1) and the light affected by defects of the structural component being detected and used for generating signals, the moved light beam (4) making a light section through the structural component (1), said light section being moved throughout said component, signals being generated during this movement which are assigned to the front and rear faces of the structural component (1), and these signals assigned to the faces being digitized, comprising:feeding the signals assigned to the faces in parallel both to a matrix memory (24, 30) and, via a preselectable number (x) of thresholds (20, 31), to a number (y) of sector counters (21, 32);evaluating the sector counters (21, 32) on-line according to a preselectable criterion with respect to number, position and grey-level distribution of the defect signals;if this criterion is not sufficiently satisfied, subsequently evaluating the signals of the matrix memory (24, 30) automatically via a computer (22);in addition, providing receivers (36 to 38) to detect anisotropically scattering defects of the structural component (1);feeding the signals generated by said receivers (36 to 38), via separate preamplifiers (39 to 41), to one common main amplifier (47), and deriving one trigger signal from the signal of each of the preamplifiers (39 to 41) as soon as the preamplifier signal exceeds a predetermined threshold value;adding all the trigger signals (46) and using the aggregate signal to control the gain factor of the main amplifier (47), and digitizing and evaluating the signal generated by said main amplifier. Vorrichtung zum Prüfen von Bauteilen aus transparentem Material auf Oberflächenfehler und Einschlüsse, bei dem das Bauteil (1) mittels eines linear bewegten Lichtstrahles (7) punktförmig abgetastet ist und mindestens eine geneigt zur Auftreffrichtung des Beleuchtungsstrahls (7) angeordnete Einrichtung (8) vorgesehen ist, die aus einem abbildenden optischen System (9) besteht, in dessen Bildebene (10) eine Maske (11) zur Aussonderung des Bildes einer Ebene des Prüflings (1) angeordnet ist, und die einen von den die Maske (11) passierenden Lichtstrahlen beaufschlagten Empfänger (17) zur Detektion des von Fehlern des Bauteils beeinflußten Lichts enthält, der mit einer Anordnung (18) zur Auswertung der Empfangersignale zur Gewinnung von Signalen, die für die Bauteilfehler kennzeichnend sind, verbunden ist, dadurch gekennzeichnet, daß das zu prüfende Bauteil (1) um seine Achse rotierbar ist und um seine Achse rotierend vom linear in Durchmesser-richtung bewegten Lichtstrahl (7) abgetastet wird, daß die Einrichtung (8) unter einem vorwählbaren Winkel zur Auftreffrichtung des Beleuchtungsstrahls neigbar ist und daß die Maske (11) zur Aussonderung des Bildes einer Ebene auswechselbar ist.
- 2Dispositif selon la revendication 1, caractérisé en ce que l'installation (20) comprend un diviseur de faisceau (21) placé dans le chemin du faisceau du système optique (23), diviseur qui dévie une partie de la lumière dans une seconde direction contenant également un masque interchangeable (26) et un récepteur (29). Method as claimed in Claim 1, wherein the sector counters (21, 32) generate address signals for assigned areas of the matrix memory (24, 30). Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, daß die Einrichtung (20) im Strahlengang des optischen Systems (21) einen Strahlenteiler (23) enthält, der einen Teil des Lichtes in eine zweite Einrichtung umlenkt, die ebenfalls eine auswechselbare Maske (26) und einen Empfänger (29) enthält.
- 3Dispositif selon la revendication 1 et 2, caractérisé en ce que le système optique de reproduction (9, 21) est un système optique à focal variable. Method as claimed in Claim 1, wherein the evaluation criterion evaluates the signals assigned to the front and rear faces of the structural component (1). Vorrichtung nach Anspruch 1 und 2, dadurch gekennzeichnet, daß das abbildende optische System (9, 21) als Zoom-Objektiv ausgebildet ist.
- 4Dispositif selon les revendications 1-3, caractérisé en ce qu'il comporte deux installations (30, 31) pour générer des signaux et celles-ci sont montées symétriquement par rapport à l'axe de rotation du composant (1) à contrôler. Method as claimed in Claim 1, wherein the signals emitted by area elements of the structural component (1), which are scanned repeatedly during the movement of the light section, are subjected to averaging (18, 29) prior to their digitization. Vorrichtung nach Anspruch 1-3, dadurch gekennzeichnet, daß zwei Einrichtungen (30, 31) zur Signalerzeugung vorgesehen und symmetrisch zur Drehachse des zu prüfenden Bauteils (1) angeordnet sind.
- 5Dispositif selon les revendications 1-4, caractérisé par des installations complémentaires de génération de signaux placées dans une demi coquille (32) qui comporte plusieurs récepteurs répartis sur la surface associée au composant (1) à contrôler. Method as claimed in any of Claims 1 to 4, wherein the digitized signals are used in addition to generate an image (12) of the selected area of the structural component (1). Vorrichtung nach Anspruch 1-4, dadurch gekennzeichnet, daß zusätzliche Einrichtungen zur Signalerzeugung in einer Halbschale (32) angordnet sind, die über ihre dem zu prüfenden Bauteil (1) zugeordnete Fläche verteilt mehrere Empfänger enthält.
- 6Dispositif selon la revendication 5, caractérisé par plusieurs récepteurs distincts dont les signaux sont combinés électriquement. Method as claimed in any of Claims 1 to 5, wherein the signals evaluated according to the specified evaluation criterion are used to classify the evaluated structural component (1). Vorrichtung nach Anspruch 5, dadurch gekennzeichnet daß mehrere separate Empfänger vorgesehen sind, deren Signale elektrisch verknüpft werden.
- 7Dispositif selon la revendication 5, caractérisé en ce que la demi coquille (32) comporte plusieurs lentilles qui transmettent la lumière incidente respective à une fibre optique souple (36) pour un récepteur commun (34). Method as claimed in Claim 6, wherein classification is effected by controlling a unit (65) for sorting the evaluated structural components (66) into different sort stores (67 to 70). Vorrichtung nach Anspruch 5, dadurch gekennzeichnet, daß die Halbschale (32) mehrere Linsen enthält, die jeweils das auftreffende Licht in eine flexible Lichtleitfasern (36) zu einem gemeinsamen Empfänger (34) führen.
Independent claims7
39 paragraphs, as filed
The present invention relates to a device according to the preamble of claim 1.
Components made of transparent material, for example, optical or ophthalmic lenses must be tested prior to use for errors, particularly surface defects such as scratches, wiper, cracks, dig, stains and inclusions such as bubbles or streaks. Such errors would reduce the usability of a lens if they exceed the specified in DIN 3140 limits.
Typically, the testing of optical components is carried out as a visual inspection by humans. Such an assessment must be carried out in a largely darkened room. It is expensive, not reliable enough not sufficiently objective and because of the high monotony of testing procedures.
It has therefore endeavored to develop methods and devices for automatic, objective testing of optical components.
From DE-OS 32 37 511 it is known to bring test optical components in the optical beam path of a television camera and through the component a test pattern imaged on the camera. The induced errors in the component faults lead to a video signal, which differs from the non-affected by the component desired signal. From the deviation from the desired and actual signal is Closed to the error en. An operating according to this method apparatus is quite complicated and can minor faults, not to recognize, for example, by scratches, wiper or hairline cracks.
In order to increase the sensitivity of the test procedure, it is proposed in DE-OS 30 11 014, the component to be tested to light as a whole, to produce a television image and to analyze the video signal line by line. This method is not sufficiently precise.
An even older proposal for a test method can be found in DE-OS 23 37 597. There, a light beam is focused onto the surface of the component to be tested and is point-like moves while maintaining its focus state on the surface. The light passing through the component light is reflected, passes again through the component, and then falls on a detector. Variations in the intensity of the receiver signal make it possible to infer a fault and to locate these also.
An operating according to this method is very expensive device. It only allows the examination of the surface of the workpiece to which the scanning beam is focused.
GB-A-2085579, it is assumed that the in the preamble of patent claim 1, allows the detection of defects in the upper and lower surfaces of transparent plates. In an apparatus described therein, a laser beam on one of the surfaces of the plates and is focused the scattered light as a result of errors is detected by a laser beam which is arranged inclined to the direction of the optical imaging device. This includes an aperture that is either as a mask for detecting the scattered light from defects in Plattenober- or plate underside. Thus it is possible with sufficiently thick plates to detect either the top or bottom fault, since the scattered light from defects of the other side of the plate is hidden by the pinhole. With very thin plates that isolation does not work anymore. To remedy this shortcoming and to simultaneously investigate both panel tops, is the use of two laser beams proposed in this document, each of which is focused on a disk surface, which is scanned with the beam. The purpose described arrangement, however, is quite expensive and also does not allow the detection of faults in other levels of the plate. The device is specifically designed for sheet-like transparencies.
It is the object of the present invention to provide an apparatus for testing components of transparent material for surface flaws and inclusions that enables reliable detection of such errors in one or more pre-selected planes or surfaces of the component.
This object is achieved by a device, whose structure is indicated in the characterizing part of claim 1.
The inventive device is characterized in that the component to be tested is rotatably disposed and is rotatively scanned about its axis in the diameter direction of a linear moving light beam. Furthermore, the inclination of an imaging device relative to the incident direction of the illumination beam can be preselected and the mask for separating the image of a plane of the test piece is interchangeable.
In the apparatus according to the invention, a light-section is generated by the component to be tested by the scanning light beam. This light-section is imaged by the serving for signal acquisition means, for illustration only, the light is used, which is deflected by error in the component. The angle formed by the optical axis of this device, with the rotational axis of the component is advantageously adjustable. It can be, depending on the deflection behavior of festzustellenden error between 10 and 60 °, with an angle of 40 ° has proved to be expedient. This allows scratches, hairline cracks and evidence of other, relatively sharp limited defects in the surface of the component.
In the apparatus according to the invention, provided in the image plane of the device for signal acquisition mask is used to separate the images from the back and front of the component to be tested. With an appropriate design of the masks also have a preferred inside the component level can be used for error detection.
The arrangement for evaluating the image signals generated can for example be designed as a monitor, practically a dark field image of the observed surface of the lens appear on the in which the errors are highlighted.
It can also automatically operating arrangement can be provided, detects the error by certain criteria and those classified according to size, burst and place in accordance with DIN 3140, Part 2 and 7. FIG. Such an arrangement is for example the subject of the patent application EP-A-0249798 entitled "Method of testing components of transparent material for surface defects and inclusions", which was filed by the applicant on the same day as the present application. Such automatically operating device allows serial testing of optical components.
The claims 2 and 3 indicate a suitable embodiment of the device according to the invention, which allows the front and rear of the component separated or to check simultaneously.
It has proved advantageous to the device according to claim 4 form.
Failure of the component that are not sharp limited, scatter the incident light is not isotropic but strongly anisotropic in a narrowly restricted solid angle which can assume very large values. Such, not sharp limited surface defects are, for example wiper. These errors can be with the device, as previously described, generally not demonstrate. It is therefore particularly advantageous to design the device according to claims 5 to 7, that is an additional system to provide for signal generation.
The invention is explained below with reference to Figures 1 to 5 of the accompanying drawings. In detail:<dl id="dl0001"><dt>Fig. 1</dt><dd>an embodiment of a device according to the invention in principle representation;</dd><dt>FIG. 2</dt><dd>the embodiment of Figure 1 in a position rotated by 90 °.</dd><dt>Fig. 3</dt><dd>an embodiment of a device for signal acquisition;</dd><dt>Fig. 4</dt><dd>another embodiment of the apparatus of the invention in schematic representation;</dd><dt>Fig. 5</dt><dd>an example arrangement for generating evaluation signals.</dd></dl>
In Fig. 1, (1) a lens made of transparent material designated to be tested for surface flaws. This lens is placed in a turntable (2), which is rotated by the stepping motor (3).
For the illumination of the lens (1) is a laser (4), the parallel light beam (7) is used by a mirror scanner (5) within a predetermined solid angle is deflected linear. A converging lens (6) is arranged so that it coincides with a focal point of the fulcrum of the mirror scanner (5). Accordingly, the deflected light beams are behind the lens (6) moved parallel to each other taken along a diameter of the lens (1) between the extreme positions (7a) and (7b). Such a lighting device is the subject of patent application EP-A-0249800 with the title "Apparatus for illuminating of components made of transparent material in the error check," which was filed on the same day as the present application by the Applicant.
The resulting light-section of the laser beam (7) with the lens (1) is observed by means of a device (8) which is arranged inclined to the axis of rotation of the lens (1). The tilt angle of the device (8) is chosen so that they, the surface defects of the lens (1) isotropic scattered light detects and maps via the imaging optical system (9), which is designed for example as a zoom lens, in the intermediate image plane (10) , In the intermediate image plane (10) a mask (11) is arranged which either the image of the front surface (12) or the image of the rear surface (13) of the lens (1) wegblendet. The mask (11) is arranged on a turntable in the housing (14). By means of a knob (15) the particular required mask (11) are pivoted into the beam path.
The mask (11) passing light is imaged by means of a relay lens (16) full-screen on a detector (17). The image signals generated by this be fed to an evaluation unit (18) shown schematically.
In bi-concave, bi-convex, plano-concave and plano-convex lenses (1) the mask (11) consists only of a straight edge. At concave-convex lenses in addition to a cutting mask still curved masks are required to both lens surfaces to be clearly separated.
With an appropriate design of the mask (11) between the surfaces (12) and (13) of the lens it is also possible to (1) select preferred level for signal acquisition. This level can then be checked for inclusions.
The detector (17) can also be designed as spatially resolving detector line. In this case, the mask (11) to be arranged displaceably in order to make a separation of the lens surfaces for evaluating a in the evaluation unit (18) used soft goods can.
Instead of the physical masks (11), it is also possible to use a mask whose optical transparency is controllable.
Instead of the means (8) for signal acquisition, such as shown and described in connection with FIGS. 1 and 2, a device can use, as shown for example in Fig. 3. This means (20) comprises a lens (21) which images the light section through the lens to be tested (1) in the intermediate image plane (22). Between the objective lens (21) and the intermediate image plane (22) is a beam splitter cube (23) is arranged, which deflects part of the light by 90 °. This redirected light is displayed in the second intermediate image plane (24). In the intermediate image plane (22) a replaceable mask (25) is arranged, which hides example the image of the front surface (12) of the lens (1). Also in the side branch of the device (20) a mask (26) is disposed in the intermediate image plane (24), which hides example the image of the back surface (13) of the lens (1). The to the masks (22) and (24) passing by light is imaged by relay lenses (26) and (27) shown schematically on detectors (28) and (29).
The device (20) can also be formed by provision of a further beam splitter cube so that it enables the reception of three evaluation signals from three different surfaces or planes of the lens (1) simultaneously.
In the embodiment of the novel apparatus shown in Fig. 4, two means (30) and (31) for signal acquisition are provided which are arranged symmetrically to the axis of rotation of the lens (1). The two bodies (30) and (31) may be formed 3 example of FIG.. By this means it is possible to detect surface defects of the front and back of the lens (1), which are relatively sharp limits and the isotropic scatter light. Such errors are, for example, scratches and crazing. As problematic cases surface defects have been found, in which the surface is only lightly pressed. Such errors are known as wiper. It has been found that wipers can scatter light strongly anisotropic namely accept only in a narrow solid angle, the large values. In order to detect these surface flaws, a so-called integral optics is provided, which consists of a hemisphere (32). this hemisphere plurality of bores (33) are distributed into each of which a small imaging lens and a downstream detector are used. Each detector has an associated adjustable pre-amplifier and the signals from all detectors of an array (34) supplied, which forms therefrom a signal that is comparable in strength to the signals which provide the means (30) and (31). All signals, that the signals of the means (30) and (31) as well as signals of the array (34) are together fed to an assembly (35), which is used for electronic signal processing.
It is also possible to arrange in each case only one imaging lens which supplies the incident light an incoherent light beam (36) in the bores (33) of the half-shell (32). All these light beams lead together to a detector, which, instead of the arrangement (34) of FIG. 4 is provided.
The means (30) and (31) can distinguish between the signals which are associated with the front or back of the lens (1). This may not be the integral appearance of the hemisphere (32). It is therefore necessary to make a signal combination of all signals fed to the evaluation arrangement (35). Since at all times the outputs of the receiver can be queried on coincident events by the pointwise scanning, an assignment of the recorded in the integral receiver information on the individual lens sides can take place as long as at least some of the pixels are detected in the bodies (30) and (31) ,
In the embodiment of Fig. 5 is a plan view of the evaluated lens (1) is shown, which is rotated in the arrow direction and which is to scan by the laser light beam (7) in direction of a diameter. The resulting light section is observed by means of a device (8), as shown in FIG. 1. For reasons of clarity only one such device for signal extraction is illustrated.
The turntable (2), in which the lens (1) is centered, is provided with a mark (40), which is detected by a receiver (41). The signal from the receiver (41) marks the beginning of the image and, after actuation of the switch (42) for switching of the rotation motor (3) via an AND-gate an arrangement (44) is supplied, which starts the image recording. Of the assembly (44) the signals pass to a line counter (45), at the output line (46) of the row clock is applied. The line counter (45) is controlled by a motor-pulse generator (47) and a divider (48).
With the turntable (2), a further receiver (49) cooperates, which generates a signal at the beginning of a line, which is supplied to an AND gate (50). This AND-gate, a further signal which is controlled by the pixel clock (52) fed via a pixel counter (51). At the starting line (53) of the AND gate (50) then lies on a pixel clock signal.
The pixel counter (51) controls a generator (54) for the scanner function, ie for the movement of the scanner mirror (5). Over the assembly (54), the scanner controller (55) is actuated which moves the scanner (5).
At the output (56) of the device (8), the video signal is present. The signals on the lines (46, 53, 56) to be a receiver (57) supplied showing a monitor image of the selected area of the lens (1). On this monitor screen surface error of the lens (1) are light, while the non-faulty areas remain dark.
Instead of the pictorial evaluation on the monitor (57) can also be an arrangement for electronic image evaluation can be provided as described in the patent application EP-A-0249798 with the title "A method for testing of parts made of transparent material for surface defects and inclusions", and is shown, which has the same filing date as the present application.
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| Document | Relation | Office | Cited during |
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| US6765661B2 | Cited by | United States of America | Applicant |
10 members in 7 offices
Priority claims5
| Document | Office | Kind | Date |
|---|---|---|---|
| 3620129 | Germany | A | |
| 3620129 | Germany | A | |
| 3620129 | Germany | – | |
| 3620129 | – | – | – |
| DE19863620129 | – | – | – |
Members10
| Document | Office | Kind | |
|---|---|---|---|
| DE3620129A1 | Germany | A1 | |
| EP0249799A2 | European Patent Office (EPO) | A2 | |
| JPS6345543A | Japan | A | |
| US4815844A | United States of America | A | |
| EP0249799A3 | European Patent Office (EPO) | A3 | |
| EP0249799B1This record | European Patent Office (EPO) | B1 | |
| AT72045T | Austria | T | |
| DE3776205D1 | Germany | D1 | |
| ES2027996T3 | Spain | T3 | |
| GR3004314T3 | Greece | T3 |
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Numbers
- Publication
- 0249799
- Publication, DOCDB
- 0249799
- Publication, EPODOC
- EP0249799
- Application
- 87107992
- Application, DOCDB
- 87107992
- Application, EPODOC
- EP19870107992
Titles3
- German
- Vorrichtung zum Prüfen von Bauteilen aud transparentem Material auf Oberflächenfehler und Einschlüsse
- English
- Apparatus for inspecting components of transparent material as to surface defects and inclusions
- French
- Appareil pour inspecter des éléments en matériau transparent pour la détection de défauts de surface et d'inclusions
Classification
- CPC, 9
- G01M11/0278
- G01N21/88
- G01N21/8851
- G01N21/958
- G01N2021/4719
- G01N2021/9511
- G01N2201/06113
- G01N2201/065
- G01N2201/1045
- IPC, 5
- G01M11 00
- G01M11 02
- G01N21 88
- G01N21 95
- G01N21 958
Designated states13
- Contracting states, 13
- Austria
- Belgium
- Switzerland
- Germany
- Spain
- France
- United Kingdom
- Greece
- Italy
- Liechtenstein
- Luxembourg
- Netherlands (Kingdom of the)
- Sweden
