EP0223260A2

Signal reading circuit for masked and overlapping linear image sensors.

Abstract

A reading out circuit for a series of linear image sensors (11-15) having end light elements masked (11M-15M) and being arranged in a staggered line. The data is written in parallel into a series of multilocation storage elements (51-55 or 61-65), beginning with the masked light element being stored in a central location. The storing is then wrapped around so that the masked value is overwritten.

EP0223260A2, drawing sheet 1
Sheet 1 of 3

Term

Term ended

Projected expiry passed 21 November 2006, 19.8 years ago.

  1. Priority
  2. Filed
  3. Published
  4. Projected expiry
  5. Today

6 claims: 2 independent, 4 dependent

  1. 1
    A signal reading circuit for linear image sensors, including a linear image sensor unit (10) having a plurality of linear image sensors (11-15) at different locations transverse to a main scanning direction of said linear image sensors (11-15), each linear image sensor having a plurality of photoelements arranged along said main scanning direction, and an opaque metalization mask (11M-15M) covering at least one photoelement at a first end of said each linear image sensor;a plurality of A/D Converters (41-45) in an A/D conversion unit (40) digitizing in parallel outputs of said linear image sensors (11-15);and a line memory (50 or 60) comprising a plurality of storage elements (51-55 or 61-65) receiving respective outputs of said A/D converters (41-45), each of laid storage elements having a number of sequentially arranged storage elements of a number not less than an effective number of photoelements of a corresponding one of said linear image sensors (11-15), said effective number being no more than the number of photoelements being not covered by said opaque metalization mask CHARACTERIZED IN THAT output signals of said A/D converters (41-45) are sequentially written in parallel into said storage elements, said sequential writing being of data derived from respective ones of said linear image sensors (11-15) beginning at said first ends thereof, said sequential writing being performed into sequential ones of said storage locations beginning at an intermediate storage location (P1 or P2) of each of said storage elements (51-55 or 61-65), proceeding to first ends of said storage elements (51-55 or 61-63) and continuing from a second end (PE1 or PE2) of said storage elements (51-55 or 61-65).
  2. 6
    A process for reading out signals from a plurality of linear image sensors (11-15), each of said linear image sensors having a plurality of photoelements arranged in a scanning direction, an opaque metalization mask (11M-15M) covering at least one photoelement at a first end of each of said sensors, CHARACTERIZED BY the steps of A/D converting in parallel outputs of respective ones of said linear image sensors, said A/D converting being done sequentially from said first ends of said linear image sensors;writing the parallel products of said A/D converting into sequential locations of a plurality of storage elements each storage element having a number of sequentially arranged storage locations, said writing being sequentially performed beginning with intermediate storage locations of said storage elements, proceeding to first ends of said storage elements and then continuing from second ends of said storage elements, said number of storage locations being no more than an effective number of photoelements of a corresponding one of said linear image sensors, said effective number being no more than the number of photoelements being not covered by said opaque metalization mask.