ATE423966T1

Method and system for reference-free thermographic detection of subsurface defects using compressed image data

Abstract

A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics. Defects can be detected by observing the zero-crossing characteristic of the second derivative of the polynomial.

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Projected expiry passed 4 December 2020, 5.8 years ago.

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16855699United States of AmericaP
17579200United States of AmericaP

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EP1258136A2European Patent Office (EPO)A2
US2002172410A1United States of AmericaA1
US6516084B2United States of AmericaB2
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JP2004530309AJapanA
US2005008215A1United States of AmericaA1
EP1258136A4European Patent Office (EPO)A4
EP1258136B1European Patent Office (EPO)B1
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ATE423966T1This recordAustriaT1
DE60041661D1GermanyD1
EP1258136B8European Patent Office (EPO)B8
US7724925B2United States of AmericaB2
JP4467862B2JapanB2