Nova Patents
AT423966T

Method and system for reference-free thermographic detection of subsurface defects using compressed image data

Abstract

This record has no abstract on file.

Term

Term ended

Expired 4 December 2020, 5.8 years ago.

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19 members in 7 offices

This recordMember, by publication datePriority claim

Priority claims2

Priority claims
DocumentOfficeKindDate
16855699United States of AmericaP
17579200United States of AmericaP

Members19

Family members, oldest first
DocumentOfficeKind
WO0141421A2World Intellectual Property Organization (WIPO)A2
AU1813201AAustraliaA
WO0141421A3World Intellectual Property Organization (WIPO)A3
US2002044679A1United States of AmericaA1
WO02089042A1World Intellectual Property Organization (WIPO)A1
EP1258136A2European Patent Office (EPO)A2
US2002172410A1United States of AmericaA1
US6516084B2United States of AmericaB2
US6751342B2United States of AmericaB2
JP2004530309AJapanA
US2005008215A1United States of AmericaA1
EP1258136A4European Patent Office (EPO)A4
EP1258136B1European Patent Office (EPO)B1
AT423966TThis recordAustriaT
ATE423966T1AustriaT1
DE60041661D1GermanyD1
EP1258136B8European Patent Office (EPO)B8
US7724925B2United States of AmericaB2
JP4467862B2JapanB2