Inspection system and apparatus
Abstract
Method for identifying a defect or contamination on the surface of the sample and system are provided. The system operates by detecting changes in the crossing through both the work function across the surface, and nvCPD vCPD. Ratio for imaging the work function trend throughout the sample-vibrating contact potential difference uses (nvCPD) sensor. The data is differential, this indicates a change in work function across the sample surface (or geometric shape, or surface voltage). vCPD probe is used to determine the absolute CPD data for a particular point on the surface of the sample. Vibrating CPD and the non-vibrating CPD measurement mode by combining, for rapid imaging of the entire sample becomes possible, it becomes possible to detect an absolute work function of at least one point.
Term
No projected expiry on record.
- Priority
- Filed
- Granted
- Today
45 members in 9 offices
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| 7825505 | United States of America | A | |
| 2006007872 | United States of America | W |
Members45
| Document | Office | Kind | |
|---|---|---|---|
| US2004152250A1 | United States of America | A1 | |
| WO2004070355A2 | World Intellectual Property Organization (WIPO) | A2 | |
| US2004241890A1 | United States of America | A1 | |
| WO2004070355A3 | World Intellectual Property Organization (WIPO) | A3 | |
| US2005059174A1 | United States of America | A1 | |
| WO2004070355B1 | World Intellectual Property Organization (WIPO) | B1 | |
| US2005162178A1 | United States of America | A1 | |
| TW200526949A | Taiwan Province of China | A | |
| WO2005083407A1 | World Intellectual Property Organization (WIPO) | A1 | |
| US6957154B2 | United States of America | B2 | |
| US2005234658A1 | United States of America | A1 | |
| KR20050105197A | Republic of Korea | A | |
| EP1597569A2 | European Patent Office (EPO) | A2 | |
| JP2006517349A | Japan | A | |
| US7092826B2 | United States of America | B2 | |
| US7103482B2 | United States of America | B2 | |
| US7107158B2 | United States of America | B2 | |
| WO2006098925A1 | World Intellectual Property Organization (WIPO) | A1 | |
| EP1711801A1 | European Patent Office (EPO) | A1 | |
| US2006276976A1 | United States of America | A1 | |
| US2007010954A1 | United States of America | A1 | |
| TW200710386A | Taiwan Province of China | A | |
| JP2007520721A | Japan | A | |
| CN101069092A | China | A | |
| KR20070112156A | Republic of Korea | A | |
| US7308367B2 | United States of America | B2 | |
| EP1869436A1 | European Patent Office (EPO) | A1 | |
| US7337076B2 | United States of America | B2 | |
| US7379826B2 | United States of America | B2 | |
| US2008162066A1 | United States of America | A1 | |
| JP2008536104A | Japan | A | |
| EP1711801B1 | European Patent Office (EPO) | B1 | |
| AT434178T | Austria | T | |
| ATE434178T1 | Austria | T1 | |
| DE602004021637D1 | Germany | D1 | |
| EP1869436B1 | European Patent Office (EPO) | B1 | |
| AT445154TThis record | Austria | T | |
| ATE445154T1 | Austria | T1 | |
| DE602006009637D1 | Germany | D1 | |
| TWI317809B | Taiwan Province of China | B | |
| US7634365B2 | United States of America | B2 | |
| KR100950641B1 | Republic of Korea | B1 | |
| JP4459289B2 | Japan | B2 | |
| CN101069092B | China | B | |
| TWI350914B | Taiwan Province of China | B |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER | RER |
Numbers
- Application
- 6737092
Titles2
- German
- INSPEKTIONSSYSTEM UND -VORRICHTUNG
- English
- INSPECTION SYSTEM AND DEVICE
Classification
- CPC, 3
- G01R31/312
- G01N27/002
- G01N2033/0095
- IPC, 2
- G01N27 00
- G01N33 00