AT433216T

Method for fabricating lateral semiconductor device

Abstract

A transverse junction semiconductor device and manufacturing method thereof, wherein the method comprises the steps: Formed with an overlapping semiconductor structure (2), which are laminated in the top semiconductor material annular of multiple basic parallel planes; the first (4) semiconductor material with the first concentration first polar of charging current substrate, and from the first (4) selective removal semiconductor material with one of the depth of the first direction exchange, the first direction is substantially parallel in structure and plane; to provide of the first direction of the three (8) first polar charging current carrier concentration gradient. A photon source, wherein comprises the junction semiconductor device.

Term

No projected expiry on record.

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24 members in 15 offices

This recordMember, by publication datePriority claim5 more offices are in the list below

Priority claims2

Priority claims
DocumentOfficeKindDate
0417738United KingdomA
2005003021United KingdomW

Members24

Family members, oldest first
DocumentOfficeKind
GB0515863D0United KingdomD0
GB2417126AUnited KingdomA
GB2417133AUnited KingdomA
CA2574591A1CanadaA1
WO2006016118A1World Intellectual Property Organization (WIPO)A1
TW200625742ATaiwan Province of ChinaA
GB2417133BUnited KingdomB
KR20070041780ARepublic of KoreaA
EP1776743A1European Patent Office (EPO)A1
NO20070626LNorwayL
CN101002370AChinaA
JP2008509570AJapanA
HK1107727AHong Kong, ChinaA
US2008087876A1United States of AmericaA1
MY136199AMalaysiaA
EP1776743B1European Patent Office (EPO)B1
AT433216TThis recordAustriaT
ATE433216T1AustriaT1
CN100511884CChinaC
DE602005014781D1GermanyD1
US7589347B2United States of AmericaB2
ES2328162T3SpainT3
JP4794558B2JapanB2
TWI397228BTaiwan Province of ChinaB