AT345577T
Contamination controlling method and plasma processing chamber
Abstract
(57) The summary plasma treatment chamber contains a substrate holding fixture and silicon carbide components, such as Rajna, a focusing ring, punched バッフル, and a gas distribution board, and it has the exposure surface where a component adjoins a substrate holding fixture, and is effective for the exposure surface making contamination under substrate processing the minimum. The antenna with which a chamber carries out inductive coupling of the RF energy through a gas distribution board, and excites processing gas to a plasma state can be included.
Term
No projected expiry on record.
- Priority
- Filed
- Granted
- Today
34 members in 11 offices
Priority claims1
| Document | Office | Kind | Date |
|---|---|---|---|
| 5090298 | United States of America | A |
Members34
| Document | Office | Kind | |
|---|---|---|---|
| WO9950886A1 | World Intellectual Property Organization (WIPO) | A1 | |
| WO0019481A2 | World Intellectual Property Organization (WIPO) | A2 | |
| AU1440100A | Australia | A | |
| US6129808A | United States of America | A | |
| EP1068632A1 | European Patent Office (EPO) | A1 | |
| KR20010042268A | Republic of Korea | A | |
| KR20010075264A | Republic of Korea | A | |
| EP1145273A2 | European Patent Office (EPO) | A2 | |
| TW460972B | Taiwan Province of China | B | |
| CN1319247A | China | A | |
| WO0019481A3 | World Intellectual Property Organization (WIPO) | A3 | |
| WO0019481A9 | World Intellectual Property Organization (WIPO) | A9 | |
| EP1145273A3 | European Patent Office (EPO) | A3 | |
| JP2002510858A | Japan | A | |
| US6394026B1 | United States of America | B1 | |
| US2002102858A1 | United States of America | A1 | |
| JP2002533911A | Japan | A | |
| US6464843B1 | United States of America | B1 | |
| US6583064B2 | United States of America | B2 | |
| TW575676B | Taiwan Province of China | B | |
| RU2237314C2 | Russian Federation | C2 | |
| EP1145273B1 | European Patent Office (EPO) | B1 | |
| DE69928289D1 | Germany | D1 | |
| KR100566908B1 | Republic of Korea | B1 | |
| KR100602072B1 | Republic of Korea | B1 | |
| DE69928289T2 | Germany | T2 | |
| EP1068632B1 | European Patent Office (EPO) | B1 | |
| AT345577TThis record | Austria | T | |
| ATE345577T1 | Austria | T1 | |
| DE69934000D1 | Germany | D1 | |
| CN1328755C | China | C | |
| DE69934000T2 | Germany | T2 | |
| JP4554815B2 | Japan | B2 | |
| JP4612190B2 | Japan | B2 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER | RER |
Numbers
- Application
- 99915049
Titles2
- German
- PLASMA-BEARBEITUNGS-KAMMER UND VERFAHREN ZUR KONTROLLE VON VERUNREINIGUNGEN
- English
- PLASMA MACHINING CHAMBER AND METHOD FOR CONTROLLING CONTAMINATION
Classification
- CPC, 3
- H01J37/32477
- H01J37/321
- H01J2237/022
- IPC, 6
- C23C16 44
- H01J37 32
- H01L21 205
- H01L21 302
- H01L21 3065
- H05H1 46