System for investigating microscopic samples using a scanning microscope

The arrangement for examining microscopic preparations with a Scanning microscope consists of a laser (1) and a lens (12) containing the of the laser (1) light generated to a sample to be examined (13) focused, wherein between the laser (1) and the lens (12) Light-guiding element (3) is provided, the light from the laser (1) generated transported. The light guide is microoptical from a variety of constructed structural members, the at least two different optical have densities. It is particularly advantageous when the optical Light-guiding element (3) consists of photonic band gap material and as Optical fiber is configured.