WO2012002136A1

Manufacturing method of power storage device

Abstract

It is an object to improve performance of a power storage device, such as cycle characteristics. A power storage device includes a current collector and a crystalline semiconductor layer including a whisker, which is formed on and in close contact with the current collector. Separation of the crystalline semiconductor layer is suppressed by an increase of adhesion, whereby cycle characteristics in which a specific capacity of a tenth cycle number with respect to a first cycle number is greater than or equal to 90 %is realized. In addition, cycle characteristics in which a specific capacity of a hundredth cycle number with respect to a first cycle number is greater than or equal to 70 % is realized.

WO2012002136A1, drawing sheet 1
Sheet 1 of 10

Term

No projected expiry on record.

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20 claims: 7 independent, 13 dependent

  1. 1
    CLAIMS 1. A power storage device comprising:a current collector;and a crystalline semiconductor layer including a whisker which is formed over the current collector, wherein a specific capacity of a tenth cycle number with respect to a first cycle number is greater than or equal to 90 %.
  2. 5
    A power storage device comprising:a current collector;and a crystalline semiconductor layer including a whisker which is formed on and in contact with the current collector, wherein a specific capacity of a tenth cycle number with respect to a first cycle number is greater than or equal to 90 %.
  3. 9
    A power storage device comprising:a first electrode comprising: a current collector;and a crystalline semiconductor layer including a whisker which is formed on and in contact with the current collector;an electrolyte;and a second electrode which is provided to face the first electrode with the electrolyte interposed therebetween, wherein a specific capacity of a tenth cycle number with respect to a first cycle number is greater than or equal to 90 %.
  4. 13
    A method for manufacturing a power storage device comprising the steps of:performing a surface treatment on a current collector;and forming a crystalline semiconductor layer including a whisker over the current collector.
  5. 15
    A method for manufacturing a power storage device comprising the steps of:processing a current collector with a material selected from the group consisting of a hydrofluoric acid, a hydrochloric acid, a sulfuric acid, a mixed acid thereof, NF 3 plasma, SiF 4 plasma, and C1F 3 plasma;and forming a crystalline semiconductor layer including a whisker over the current collector.
  6. 17
    A method for manufacturing a power storage device comprising the steps of:processing a current collector with a material selected from the group consisting of a hydrofluoric acid, a hydrochloric acid, a sulfuric acid, a mixed acid thereof, NF 3 plasma, SiF 4 plasma, and C1F 3 plasma;and forming a crystalline semiconductor layer including a whisker over the current collector by a low-pressure chemical vapor deposition method.
  7. 19
    A method for manufacturing a power storage device comprising the steps of:processing a current collector with a material selected from the group consisting of a hydrofluoric acid, a hydrochloric acid, a sulfuric acid, a mixed acid thereof, NF 3 plasma, SiF 4 plasma, and C1F 3 plasma;and forming a crystalline semiconductor layer including a whisker over the current collector with a source gas containing silicon by a low-pressure chemical vapor deposition method.