USH879H
Method and device for inspecting circumferentially conducting materials
Abstract
This record has no abstract on file.
Term
Term ended
Projected expiry passed 30 June 2009, 17.2 years ago.
- Priority and filed
- Published
- Projected expiry
- Today
Every citation, both ways
| Document | Relation | Office | Cited during |
|---|---|---|---|
| US5619423A | Cited by | United States of America | Search report |
| US5589772A | Cited by | United States of America | Search report |
| WO03091722A2 | Cited by | World Intellectual Property Organization (WIPO) | International search |
| EP1209463A3 | Cited by | European Patent Office (EPO) | Search report |
| EP1209463A2 | Cited by | European Patent Office (EPO) | Search report |
| US2011294402A1 | Cited by | United States of America | Pre-grant |
| WO03091722A3 | Cited by | World Intellectual Property Organization (WIPO) | International search |
| US2124579A | Cites | United States of America | Search report |
| US2150922A | Cites | United States of America | Search report |
| US3449664A | Cites | United States of America | Search report |
| US3694740A | Cites | United States of America | Search report |
| US4006407A | Cites | United States of America | Search report |
| US4041379A | Cites | United States of America | Search report |
| US4107605A | Cites | United States of America | Search report |
| US4337431A | Cites | United States of America | Search report |
| US4413231A | Cites | United States of America | Search report |
| US4467281A | Cites | United States of America | Search report |
| US4495587A | Cites | United States of America | Search report |
| US4496904A | Cites | United States of America | Search report |
| US4507608A | Cites | United States of America | Search report |
| US4667149A | Cites | United States of America | Search report |
| US4719422A | Cites | United States of America | Search report |
| US4739261A | Cites | United States of America | Search report |
| US4745809A | Cites | United States of America | Search report |
| US4747310A | Cites | United States of America | Search report |
| US4761610A | Cites | United States of America | Search report |
| US4763071A | Cites | United States of America | Search report |
| US4821204A | Cites | United States of America | Search report |
| US4823082A | Cites | United States of America | Search report |
| WO8601896A1 | Cites | World Intellectual Property Organization (WIPO) | Search report |
| WO8602456A1 | Cites | World Intellectual Property Organization (WIPO) | Search report |
2 priority claims, no other members on record
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| 37421289 | United States of America | A | |
| US19890374212 | – | – | – |
2 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Information on status: patent grantGrantedSTCF | STCF | |
| AssignmentAS | AS |
Numbers
- Publication, DOCDB
- H879
- Publication, EPODOC
- USH879H
- Application
- 374212
- Application, DOCDB
- 37421289
- Application, EPODOC
- US19890374212
Titles
- English
- Method and device for inspecting circumferentially conducting materials
Classification
- CPC, 1
- G01N27/9033
- IPC, 1
- G01N27 90