Signal acquisition system having reduced probe loading of a device under test

CROSS REFERENCE TO RELATED APPLICATION

0001This Divisional patent application clams priority from Continuation-in-Part application Ser. No. 12/846,745, filed Jul. 29, 2010 which claims priority from U.S. patent application Ser. No. 12/571,236, filed Sep. 30, 2009.

BACKGROUND OF THE INVENTION

0002The present invention relates generally to acquiring a signal from a device under test and more particularly to a signal acquisition system having reduced loading of the device under test using a signal acquisition probe with reduced capacitance.

0003Traditional passive voltage probes <b>10</b> generally consist of a resistive-capacitive parallel network <b>12</b> at the probe tip <b>14</b>, shown as R_Tand C_Tin <figref idref="DRAWINGS">FIG. 1</figref>, coupled via a resistive center conductor signal cable <b>16</b> to compensation circuitry <b>18</b> in a compensation box. The compensation circuitry <b>18</b> has resistive elements R_C1and R_C2and capacitive element C_C. R_C1is in series with the cable <b>16</b> and R_C2is in series with variable capacitor C_C. The compensation circuitry <b>18</b> is coupled to input circuitry <b>20</b> of a measurement test instrument <b>22</b>, such as an oscilloscope, spectrum analyzer, logic analyzer and the like. Generally, the input circuitry <b>20</b> of an oscilloscope includes an input resistive-capacitive network <b>24</b>, shown as R_TSand C_TS, that is associated with switching input attenuation circuitry (not shown) that provides an input impedance for the oscilloscope of 1 MΩ in parallel with 10 to 20 picofarad (pf) of capacitance. The output of the switching input attenuation circuitry is coupled to the input of a preamplifier <b>26</b>. The oscilloscope is calibrated to provide a nominally flat frequency response transfer function from the input of the oscilloscope to the output of the preamplifier.

0004The compensation circuitry <b>18</b> provides resistive and capacitive termination of the cable <b>16</b> to minimize reflections and provides a transfer function having a nominally flat frequency response to the measurement test instrument <b>22</b>. The variable compensation capacitor C_Cis user adjustable to match the capacitive and resistive divider ratios of the probe over variations in the input capacitance of individual oscilloscope channels. Resistive element R_C1provides resistive cable <b>16</b> termination matching into the oscilloscope input at high frequencies (where cable Z₀≈155Ω). R_C2in series with variable capacitor C_Cimproves the cable termination into the capacitive load in the oscilloscope.

0005The tip resistance R_T, cable termination resistor R_C1and the input resistance R_TSform a voltage divider attenuation network for DC to low frequency input signals. To accommodate a wide frequency range of input signals, the resistive voltage divider attenuation network is compensated using a shunt tip capacitor C_Tacross the tip resistive element R_Tand a shunt termination capacitor C_Cand the input capacitor C_TSacross termination resistive element R_TS. To obtain a properly compensated voltage divider, the time constant of the probe tip resistive-capacitive parallel network <b>12</b> must equal the time constant of the termination resistive-capacitive parallel network <b>24</b> including C_cableand C_C.

0006Properly terminating the resistive cable <b>16</b> in its characteristic impedance requires adding a relatively large shunt capacitance C_Cto the compensation network <b>18</b>. This is in addition to the bulk cable capacitance C_CABLE. For example, the tip resistance R_Tand capacitance C_Tfor a P2222 10× Passive Probe, manufactured and sold by Tektronix, Inc., Beaverton, Oreg., is selected to give a 10× divide into the oscilloscope's input impedance of 1 MΩ. The minimum tip capacitance C_T, neglecting any other parasitic capacitance, is one ninth of the sum of the cable bulk capacitance C_CABLE, C_Cand C_Ts. The tip capacitance of C_Tis on the order of 8 pF to 12 pf for the above stated parameters. The input capacitance (which is C_Tin series with the sum of C_CABLE, C_Cand C_TS) is driven by the circuit being monitored and therefore represents a measure of how much the probe loads the circuit.

0007<figref idref="DRAWINGS">FIG. 2</figref> illustrates another passive voltage probe and oscilloscope configuration where the preamplifier <b>28</b> is configured as a current amplifier. This configuration has the same limitations as the probe and oscilloscope configuration of <figref idref="DRAWINGS">FIG. 1</figref>. The probe has compensation circuitry in the probe compensation box and the oscilloscope has the traditional 1 MΩ resistance in parallel with 10 to 20 pf of capacitance at the oscilloscope input. A major drawback to existing passive voltage probe and oscilloscope configurations is that a substantial portion of the mid-band and high-band frequency signal current at the output of the resistive center conductor signal cable is shunted to ground by the termination capacitor C_C. In addition, since the resistive center conductor signal cable is terminated prior to the oscilloscope input, the parasitic capacitance of the input circuitry of the oscilloscope acts as a non-terminated transmission line which shunts additional current to ground.

0008The probe tip capacitance and the resistive center conductor signal cable affect the overall bandwidth of a traditional passive probe. Further, the probe tip input presents low input impedance to a device under test at high frequencies due to the low capacitive reactance in parallel with the high input resistance. Reducing the probe tip capacitance to increase the capacitive reactance requires adjustment of the other component values of the voltage divider network to maintain a compensated network. Previously, this has been accomplished by increasing the resistance in the probe tip. However, this increases the divider ratio of the network with a resulting increase in the attenuation of signal applied to the probe. The decreased signal input to the oscilloscope may be compensated for by increasing the gain of the oscilloscope input circuits which results in an increase in the noise on the signal reducing the overall signal-to-noise ratio of the instrument.

0009A special type of passive probe exists that provides a relatively high impedance and attenuation into a 50 ohm input oscilloscope. The Z₀probe has a relatively low input resistance, 5 kilo ohms or less, coupled to a 50 ohm lossless coaxial cable. The capacitance at the probe tip is generally less than 1 pf produced by the parasitic capacitance of the probe head. In a specific embodiment, the probe tip resistance is 450 ohm coupled via the 50 ohm lossless coaxial cable to the 50 ohm input of the oscilloscope, which produces a 10× passive voltage divider network. The voltage input to this probe is limited as compared to the traditional passive probe due to the size of the input resistor. Also, the low input resistance can cause excessive loading to DC signals.

0010U.S. Pat. No. 6,483,284, shown in <figref idref="DRAWINGS">FIG. 3</figref>, teaches a wideband probe using pole-zero cancellation. A parallel probe tip network of resistor R_tipand capacitor C_tipin series with resistor R_taband capacitor C_tabdetects a signal from a device under test and couples the signal to a compensation network via a near lossless coaxial cable <b>40</b>. The capacitor C_tabrepresents the capacitance in the tip circuit, such as a trace on a circuit board, a coaxial cable or the like. A cable termination resistor R_eis connected in series between the cable <b>40</b> and an inverting input terminal of an operational amplifier <b>42</b>. The non-inverting input is coupled to a common ground. Connected between the input terminal and the output terminal of the operational amplifier <b>42</b> is a parallel combination of a resistor R_fband a capacitor C_fbwith resistor R_pkin series with C_fb. The parallel tip resistor R_hpand capacitor C_hpcreate a zero and the combination of resistor R_taband capacitor C_tabcreate a pole. A pole is created by resistor R_fband capacitor C_fbin the compensation network and a zero is created by resistor R_pkand capacitor C_fb. The zero and pole created in the probe tip network are cancelled by the pole and zero in the compensation network. The output of the compensation network is coupled to an end user device, such as an oscilloscope or the like. The teaching states that the time constants of the two RC networks must be equal so that the zeros and poles balance out and the probe has a constant gain. Further, the operational amplifier <b>42</b> is part of the wideband probe circuitry and not part of the end user device.

SUMMARY OF THE INVENTION

0011Accordingly, the present invention is a signal acquisition system having a signal acquisition probe and a signal processing instrument. The signal acquisition probe has probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to an input node of the signal processing instrument. The input node is further coupled to a compensation system disposed in the signal processing instrument via input circuitry. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

0012The input amplifier may be a current amplifier with the feedback loop circuitry having a first series coupled resistive element and capacitive element, a second series coupled resistive element and capacitive element, and a third resistive element with the first and second series coupled resistive elements and capacitive elements and the third resistive element in parallel with each other. A plurality of registers may be used for setting resistive values and capacitive values of respective resistive and capacitive elements in the feedback loop circuitry. The first series coupled capacitive and resistive elements in parallel with the second series coupled capacitive and resistive elements form a split pair of poles and zeros. The resistive element of the shunt pole-zero pair may be an electronically controlled variable resistor.

0013The input circuitry of the signal processing instrument is preferably attenuation circuitry that provides at least one of resistive and capacitive termination of the resistive center conductor signal cable. The input node is coupled to a signal path that has the other end coupled to a resistive element disposed adjacent to the input of the input amplifier forming a terminated transmission line. A switching circuit is disposed in the signal processing instrument for selectively coupling the input node to the compensation system via the attenuation circuitry and the shunt pole-zero pair to the attenuation circuitry and for selectively coupling a resistive-capacitive network between the input node and the attenuation circuitry and decoupling the shunt pole-zero pair from the attenuation circuitry.

0014The probe tip circuitry has at least a first resistive element in parallel with a capacitive element. The probe tip circuitry may also have a plurality of first resistive elements in parallel with a plurality of capacitive elements to form a high voltage signal acquisition probe. The capacitive element or elements have an effective capacitance in the range of 2 to 5 picofarads.

0015A calibration process for the signal acquisition system includes the steps of acquiring digital values of a broad frequency content signal as a calibration waveform using the signal acquisition probe and the signal processing instrument and determining a measured error value between a broad frequency content signal reference calibration waveform stored in the signal processing instrument and the calibration waveform at a common location on the waveforms. A measured error factor is determined having at least one of a register value and an adjustable resistive element value as a function of the measured error value at the common location. The register value and/or the adjustable resistive element value of the measured error factor is applied to at least one of an appropriate feedback loop register in a plurality of registers in feedback loop circuitry of an input amplifier and an adjustable resistive element in the shunt pole-zero pair. The measured error value and the measured error factor for each common location of the calibration waveform and the calibration reference waveform are then determined. Alternately, a plurality of first measured error values are determined between the broad frequency content signal reference calibration waveform stored in the signal processing instrument and the calibration waveform at common locations on the waveforms set by at least one of time locations and frequency locations, and a measured error factor is determined as a function of the plurality of first measured error values and the common locations on the waveforms. After the measured error value and the measured error factor has been determined for the last common location on the calibration waveform and the calibration reference waveform, a new set of digital values of the broad frequency content signal are acquired as the calibration waveform. The new calibration waveform is compared with calibration specifications to verify the calibration. If the calibration is within the calibration specifications, the register values in the plurality of registers in feedback loop circuitry of the input amplifier and the adjustable resistive element value are stored and the successful result of the calibration process is displayed.

0016If the calibration waveform is not within the calibration specifications, then a determination is made on whether the calibration process has exceeded an iteration time limit value. If the calibration process has not exceeded an iteration time limit value, then the common location on the waveforms is set to the initial location. The measured error value or values and the measured error factor for each common location or locations of the calibration waveform and the calibration reference waveform is then determined and at least one of the resister value and the adjustable resistive element value of the measured error factor is applied to at least one of an appropriate feed back loop register in a plurality of registers in feedback loop circuitry of the input amplifier and the adjustable resistive element of the shunt pole-zero pair. After the measured error value and the measured error factor has been determined for the last common location on the calibration waveform and the calibration reference waveform, a new set of digital values of a broad frequency content signal are acquired as the calibration waveform. The new calibration waveform is compared with calibration specifications to verify the calibration. If the new calibration waveform is still not within the calibration specifications and the calibration process has timed out, then the initial values in the plurality of registers in the feedback loop circuitry of the input amplifier and the initial adjustable resistive element value of the shunt pole-zero pair prior to the calibration process are stored, and the unsuccessful result of the calibration process is displayed.

0017The acquiring of the digital values of the broad frequency content signal as the calibration waveform includes the additional steps of attaching the signal acquisition probe to the signal processing instrument. The signal processing instrument detects the presence or absence of a probe memory in the signal acquisition probe, and loads stored contents of probe memory into the signal processing instrument if the probe memory is present. The signal processing instrument detects the presence of probe calibration constants stored in the probe memory, and applies the probe calibration constants to appropriate register values in the plurality of registers in the in feedback loop circuitry of the input amplifier and the appropriate adjustable resistive element value of the shunt pole-zero pair. If the signal acquisition probe does not have a probe memory, then nominal register values are applied to the plurality of registers in the in feedback loop circuitry of the input amplifier and the nominal adjustable resistive element value is applied to adjustable resistive element of the shunt pole-zero pair.

0018The objects, advantages and novel features of the present invention are apparent from the following detailed description when read in conjunction with appended claims and attached drawings.

BRIEF DESCRIPTION OF THE DRAWING FIGURES

0019<figref idref="DRAWINGS">FIG. 1</figref> is a representative schematic diagram of a prior art passive probe.

0020<figref idref="DRAWINGS">FIG. 2</figref> is representative schematic diagram of another prior art probe circuit.

0021<figref idref="DRAWINGS">FIG. 3</figref> is representative schematic diagram of a further prior art probe circuit.

0022<figref idref="DRAWINGS">FIG. 4</figref> is a block diagram of a signal acquisition system according to the present invention.

0023<figref idref="DRAWINGS">FIG. 5</figref> is a representative block diagram of a signal processing instrument in a signal acquisition system according to the present invention.

0024<figref idref="DRAWINGS">FIG. 6</figref> is a representative schematic diagram of a signal acquisition system according to the present invention.

0025<figref idref="DRAWINGS">FIG. 7</figref> shows representative frequency responses of a signal acquisition system with and without crossover compensation.

0026<figref idref="DRAWINGS">FIGS. 8A and 8B</figref> show a calibration process flow chart for calibrating the signal acquisition system of the present invention.

0027<figref idref="DRAWINGS">FIG. 9</figref> is a representative schematic of the attenuator circuitry in a signal acquisition system of the present invention.

0028<figref idref="DRAWINGS">FIG. 10</figref> is a schematic representation of a high voltage signal acquisition probe in the signal acquisition system of the present invention.

DESCRIPTION OF THE INVENTION

0029Referring to <figref idref="DRAWINGS">FIG. 4</figref>, there is shown a high level block diagram of a signal acquisition system <b>50</b> having reduced probe loading of a device under test according to the present invention. The signal acquisition system <b>50</b> has a signal acquisition probe <b>52</b> that includes a resistive center conductor signal cable <b>54</b>. The signal cable is coupled to an input node <b>56</b> of a signal processing instrument <b>58</b>. The input node <b>56</b> is also coupled to acquisition circuitry <b>60</b> in the signal processing instrument <b>58</b>. The acquisition circuitry <b>60</b> generates digital values of an input signal from the signal acquisition probe <b>52</b>. The digital values of the input signal are coupled to a controller <b>62</b> for further processing. The controller <b>62</b> may couple the digital values to processing circuitry <b>64</b> for formatting the digital values and displaying the formatted digital values on a display device <b>66</b>.

0030In traditional probe-oscilloscope systems, each stage of the signal path is compensated for a flat frequency and phase response. The oscilloscope is calibrated to provide a nominally flat frequency response. The signal acquisition probe is attached to the oscilloscope and the probe is calibrated using termination and compensation circuitry in the probe to produce a nominally flat frequency response relative to the oscilloscope input. The resulting probe-oscilloscope system has time constant matching of the signal acquisition probe and the oscilloscope input to produce a flat frequency response over the probe oscilloscope system bandwidth. In the present invention, the high frequency input impedance of the signal acquisition probe <b>52</b> at a device under test is increased by reducing the input capacitance of the signal acquisition probe <b>52</b>. The resulting structure of the present invention mismatches the time constants of the probe tip circuitry of the signal acquisition probe <b>52</b> and the circuitry across the input node <b>56</b> of the signal processing instrument <b>58</b>. A compensation system <b>68</b> in the acquisition circuitry <b>60</b> provides pole-zero pairs that flatten the frequency response of the signal acquisition system <b>50</b> resulting from the mismatched time constants.

0031The signal processing instrument <b>58</b> of the present invention, such as an oscilloscope, logic analyzer, digitizer and the like, will be described below with respect to a digital oscilloscope. <figref idref="DRAWINGS">FIG. 5</figref> depicts a high level block diagram of a digital oscilloscope <b>100</b> used as part of the signal acquisition system <b>50</b> of the subject invention. Generally, oscilloscopes <b>100</b> include multiple signal channels with each signal channel having an input on which are connected various types of signal acquisition probes <b>105</b>, <b>110</b>, such as passive and active voltage probes, current probes, and the like, for acquiring electrical signals from a device under test (DUT). The oscilloscope <b>100</b> signal channel inputs are coupled to respective signal channel acquisition circuitry <b>115</b>, <b>120</b>. The respective acquisition circuitry <b>115</b>, <b>120</b> sample their respective input signals in accordance with a sample clock provided by an internal sample clock generator <b>122</b>.

0032The acquisition circuitry <b>115</b>, <b>120</b> each include a preamplifier, analog-to-digital conversion circuitry, triggering circuitry, decimator circuitry, supporting acquisition memory, and the like. The acquisition circuitry <b>115</b>, <b>120</b> operate to digitize, at a sample rate, one or more of the signals under test to produce one or more respective sample streams suitable for use by controller <b>125</b> or processing circuitry <b>130</b>. The acquisition circuitry <b>115</b>, <b>120</b>, in response to commands received from the controller <b>125</b>, changes preamplifier feedback values; trigger conditions, decimator functions, and other acquisition related parameters. The acquisition circuitry <b>115</b>, <b>120</b> communicates its respective resulting sample stream to the controller <b>125</b>.

0033A trigger circuit <b>124</b> is shown separate from the acquisition circuitry <b>115</b>, <b>120</b> but one skilled in the art will realize that it could be internal to the acquisition circuitry <b>115</b>, <b>120</b>. The trigger circuit <b>124</b> receives trigger parameters, such as trigger threshold level, hold off, post trigger acquisition, and the like, from the controller <b>125</b> in response to user input. The trigger circuit <b>124</b> conditions the acquisition circuitry <b>115</b>, <b>120</b> for capturing digital samples of the signal under test from the DUT.

0034The controller <b>125</b> operates to process the one or more acquired sample streams provided by the acquisition circuitry <b>115</b>, <b>120</b> to generate respective sample stream data associated with one or more sample streams. That is, given desired time per division and volts per division display parameters, controller <b>125</b> operates to modify or rasterize the raw data associated with an acquired sample stream to produce corresponding waveform data having the desired time per division and volts per division parameters. The controller <b>125</b> may also normalize waveform data having non-desired time per division, volts per division, and current per division parameters to produce waveform data having the desired parameters. The controller <b>125</b> provides the waveform data to processing circuitry <b>130</b> for subsequent presentation on display device <b>135</b>.

0035The controller <b>125</b> of <figref idref="DRAWINGS">FIG. 5</figref> preferably comprises a processor <b>140</b>, such as a PowerPC™ Processor, manufactured and sold by Motorola, Inc., Schaumburg, Ill., support circuits <b>145</b> and memory <b>155</b>. Processor <b>140</b> cooperates with conventional support circuitry <b>145</b>, such as power supplies, clock circuits, cache memory, buffer/expanders, and the like, as well as circuits that assist in executing software routines stored in memory <b>155</b>. As such, it is contemplated that some of the process steps discussed herein as software processes may be implemented within hardware, for example, as circuitry that cooperates with processor <b>140</b> to perform various steps. Controller <b>125</b> also interfaces with input/output (I/O) circuitry <b>150</b>. For example, I/O circuitry <b>150</b> may comprise a keypad, pointing device, touch screen, or other means adapted to provide user input and output to the controller <b>125</b>. The controller <b>125</b>, in response to such user input, adapts the operations of acquisition circuitry <b>115</b>, <b>120</b> to perform various data acquisitions, triggering, processing, and display communications, among other functions. In addition, the user input may be used to trigger automatic calibration functions or adapt other operating parameters of display device <b>135</b>, logical analysis, or other data acquisition devices.

0036Memory <b>155</b> may include volatile memory, such as SRAM, DRAM, among other volatile memories. Memory <b>155</b> may also include non-volatile memory devices, such as a disk drive or a tape medium, among others, or programmable memory, such as an EPROM, among others. A signal source <b>157</b> generates a broad frequency content signal for probe compensation. In the preferred embodiment of the present invention, the broad frequency content signal is a fast edge square wave. Alternately, the signal source <b>157</b> may be a leveled variable frequency sine-wave generator.

0037Although Controller <b>125</b> of <figref idref="DRAWINGS">FIG. 5</figref> is depicted as a general purpose computer that is programmed to perform various control functions in accordance with the present invention, the invention may be implemented in hardware such as, for example, an application specific integrated circuit (ASIC). As such, it is intended that processor <b>125</b>, as described herein, be broadly interpreted as being equivalently performed by hardware, software, or by a combination thereof.

0038<figref idref="DRAWINGS">FIG. 6</figref> is a representative schematic diagram of a signal acquisition system <b>200</b> according to the present invention. Like elements from <figref idref="DRAWINGS">FIG. 5</figref> are labeled the same in <figref idref="DRAWINGS">FIG. 6</figref>. The signal acquisition probe <b>105</b> has a probing head <b>206</b> containing probe tip circuitry <b>208</b>, a resistive center conductor signal cable <b>202</b>, and a resistor element <b>216</b>. The probe tip circuitry <b>208</b> has a resistive element <b>210</b> coupled in parallel with a capacitive element <b>212</b> that is in series with a resistive element <b>214</b>. The capacitive element <b>212</b> has a capacitance in the range of 2-5 picofarads (pf) to provide a low input capacitance to a device under test. The probe tip circuitry <b>208</b> is coupled to one end of the resistive center conductor signal cable <b>202</b>. The other end of the resistive center conductor signal cable <b>202</b> is coupled to a BNC input node <b>204</b> of one of the signal acquisition circuitry <b>115</b>, <b>120</b> in the digital oscilloscope <b>100</b> via the resistive element <b>216</b>. The resistive center conductor signal cable is preferably a coaxial cable having a resistive center conductor with a resistance of 39 Ω/ft. The resistive center conductor signal cable <b>202</b> has a capacitance to ground, which is shown by capacitor <b>213</b>. The BNC input node <b>204</b> is coupled to a switching circuit <b>220</b> which in turn provides coupling of the signal acquisition probe <b>105</b> to input circuitry <b>224</b>. The resistive element <b>216</b> in combination with resistive element <b>230</b> in the input circuitry <b>224</b>, representatively shown as attenuation circuitry consisting of resistive element <b>226</b> in parallel with capacitive element <b>228</b>, terminate the resistive center conductor signal cable <b>202</b> in its characteristic resistive impedance. In the preferred embodiment of the invention, the termination capacitance of the resistive center conductor signal cable <b>202</b> is approximately 40 pf and the termination resistance is approximately 150Ω. In addition, a 1.2 meter resistive center conductor signal cable <b>202</b> has, by coincidence, a capacitance to ground of approximately 40 pf. The capacitance to ground of the resistive center conductor signal cable <b>202</b> can be easily changed by changing the length of the cable. The resistive element <b>216</b> has a resistive value of 100Ω and resistive element <b>230</b> has a resistive value of 50Ω. The resistive element <b>230</b> is physically located as close as possible to the input of input amplifier <b>234</b>, functioning as a current amplifier, to reduce the non-terminated parasitic capacitance of the signal trace between the BNC input node <b>204</b> and the input amplifier <b>234</b>. The BNC and signal trace here are assumed to be designed to a characteristic impedance of 50Ω so as to be properly terminated by resistive element <b>230</b>. The input circuitry <b>224</b> also terminates the resistive center conductor signal cable <b>202</b> in its characteristic capacitive impedance.

0039The switching circuit <b>220</b> has a switching element <b>222</b> having double pole contacts. The switching element <b>222</b> has a first set of contacts that selectively couple the probe tip circuitry <b>208</b> to compensation system <b>232</b> via the input circuitry <b>224</b> or couple a resistor-capacitor attenuator network <b>240</b> between the probe tip circuitry <b>208</b> and the input circuitry <b>224</b>. A second set of contacts selectively couples a ground connected shunt pole-zero pair of the compensation system <b>232</b>, consisting of resistive element <b>236</b> and capacitive element <b>238</b>, to the input circuitry <b>224</b> or uncouples the series connected resistive element <b>236</b> and capacitive element <b>238</b> from the input circuitry <b>224</b>. The resistive-capacitive attenuator network <b>240</b> provides backward compatibility for legacy signal acquisition probes requiring a 1 MΩ oscilloscope input impedance. The switching element <b>222</b> is preferably a relay switch receiving switching commands from controller <b>125</b>.

0040The signal acquisition probe <b>105</b> preferably has a memory <b>256</b> containing information about the probe, such as probe type, serial number, and the like, and may also contain probe calibration data. The probe memory <b>256</b> is preferably a one wire EEPROM, manufactured and sold by Maxim Integrated Products, Inc., Sunnyvale, Calif. under Part No. DS2431. The probe memory <b>256</b> is coupled to the controller <b>125</b> via a one line communications/power line <b>258</b>. Alternately, the probe memory <b>256</b> may communicate with the controller <b>125</b> via multi line communications bus, such as an I²C bus, a Firewire bus and the like.

0041Moving the resistive and capacitive terminations of the resistive center conductor signal cable <b>202</b> into the signal processing instrument <b>100</b> substantially reduces the amount of mid-band and high-band frequency signal current being shunted to ground at the output of the resistive center conductor signal cable <b>202</b>. In the prior art resistive center conductor signal cable passive voltage probes, a substantial portion, on the order of two-thirds of the mid-band and high-band signal current at the output of the probe cable, is shunted to ground by the termination capacitor in the probe compensation box depending on the termination capacitance of the cable and the parasitic capacitance of the oscilloscope input. Also, the resistive center conductor signal cable of the prior art is terminated in the compensation box of the probe which results in the parasitic capacitance in the input of the oscilloscope acting as a non-terminated stub, further shunting additional current to ground. In the present invention, the resistive and capacitive terminations in the input circuitry <b>224</b> are in series with the resistive center conductor signal cable <b>202</b> and the input of the input amplifier <b>234</b>, resulting in substantially greater current flow into the input of the amplifier. The probe tip capacitance can be reduced to values in the range of 2-5 pf which reduces the mid-band and high-band frequency signal current at the output of the resistive center conductor signal cable <b>202</b>. This decrease in signal current is offset by an overall increase in signal current provided to the input current amplifier resulting in a signal-to noise ratio equivalent to existing passive voltage probes. Additionally, the resistive element <b>230</b> terminating the signal path from the BNC input node <b>204</b> to the input amplifier <b>234</b> in conjunction with parasitic inductance and capacitance of the signal path essentially transforms the signal path into a terminated transmission line which further diminishes the amount of signal current shunted to ground. The results of moving the resistive and capacitive cable termination into the oscilloscope <b>100</b> and terminating the signal path in the instrument are that greater than fifty percent of the mid-band and high-band frequency signal current at the output of the resistive center conductor signal cable <b>202</b> is coupled to the input amplifier <b>234</b> and an increase in the bandwidth of the signal acquisition system due to the elimination of the non-terminated stub between the BNC input node <b>204</b> and the input amplifier <b>234</b>.

0042The termination resistance and capacitance of the resistive center conductor signal cable <b>202</b> are fixed values for a given cable type where as the capacitance to ground of the resistive center conductor signal cable <b>202</b> varies with the length of the cable. In the preferred embodiment of the invention, the termination capacitance of the resistive center conductor signal cable <b>202</b> is approximately 40 pf and the termination resistance is approximately 150Ω. In addition, a 1.2 meter resistive center conductor signal cable <b>202</b> has, by coincidence, a capacitance to ground of approximately 40 pf. The capacitance to ground of the resistive center conductor signal cable <b>202</b> can be easily changed by changing the length of the cable. The resistive element <b>210</b> in the probe tip circuitry <b>208</b> has a value of 9.75 MΩ and the capacitive element <b>212</b> has a value of 3.4 pf. The capacitive value is lower than existing resistive center conductor passive voltage probes which generally have a capacitance in the range of 8 to 14 pf. Reducing the input capacitance at the probe tip reduces the capacitive loading of the device under test resulting in a wider probe bandwidth. The time constant for the probe tip circuitry <b>208</b> using the above values is 33.15 μsec. The time constant across the BNC input node <b>204</b> should match the time constant of the probe tip circuitry <b>208</b>. Limitations are placed on the capacitive element <b>228</b> in the input circuitry <b>224</b> in that its capacitance should match the termination capacitance of the resistive center conductor signal cable <b>202</b>. Therefore, the capacitance of capacitive element <b>228</b> is 40 pf. The capacitance to ground of the resistive center conductor signal cable <b>202</b>, which is 40 pf, needs to added to the termination capacitance. The resulting capacitance at the BNC input node <b>204</b> is 80 pf. The probe tip circuitry <b>208</b> time constant is divided by the 80 pf value of the summed capacitive value of the termination capacitance and the capacitance to ground of the resistive center conductor signal cable <b>202</b> should result in a value of 414.4 kΩ for the resistive element <b>226</b> of the input circuit <b>224</b>. However, the need for backward compatibility with legacy probes and a requirement to directly drive the oscilloscope input requires the oscilloscope input capacitance be in the range of 10-20 pf. The parasitic capacitance at the input of the oscilloscope is approximately 2 pf. The optimal value of the effective capacitance of the capacitive elements <b>228</b> and <b>244</b> is preferably between 10 and 12 pf. The value of capacitive element <b>228</b> is set at 40 pf to match the capacitance of the resistive center conductor signal cable <b>202</b>. The value of capacitive element <b>244</b> needs to be approximately 13.3 pf to produce an effective capacitance of about 10 pf. The ratio of the capacitive element <b>228</b> to capacitive element <b>244</b> is 3:1 requiring a 1:3 ratio for the resistive element <b>226</b> and resistive element <b>242</b>. The values of the resistive elements <b>226</b> and <b>242</b> need to add-up to 1 MΩ for backward compatibility resulting in the resistive element <b>226</b> having a value of 250 kΩ and the resistive element <b>242</b> having a value of 750 kΩ. The resulting time constants for the input circuitry <b>224</b> and the resistive-capacitive attenuator network <b>240</b> are 10 μsec. With the time constant of the input circuitry <b>224</b> set at 10 μsec, the time constant across the BNC input node <b>204</b> is nominally 20 μsec (80 pf times 250 kΩ) and the time constant of the probe tip circuitry <b>208</b> is 33.15 μsec. The compensation circuitry <b>224</b> has split pole-zero pairs that compensate for the mismatched time constants across the BNC input node of the oscilloscope <b>100</b>.

0043The compensation system <b>232</b> further includes an input amplifier <b>234</b> that has its inverting input coupled to the attenuation circuitry <b>224</b> and the non-inverting input coupled to ground. The input amplifier <b>234</b> of the compensation system <b>232</b> has feedback loop circuitry <b>244</b> that preferably includes an adjustable resistive element <b>246</b> in parallel with series connected adjustable resistive element <b>248</b> and adjustable capacitive element <b>250</b>, which are in turn in parallel with series connected adjustable resistive element <b>252</b> and adjustable capacitive element <b>254</b>. The values of the adjustable resistors and capacitors are controlled by changing register values of a plurality of registers in the feedback loop circuitry <b>244</b>. The feedback loop of resistive element <b>246</b> sets the DC and low frequency gain. Series feedback loops consisting of resistive element <b>248</b> and capacitive element <b>250</b> and resistive element <b>252</b> and capacitive element <b>254</b> are adjusted to form a split pair of poles and zeros. The total capacitance of the capacitive elements <b>250</b> and <b>254</b> set the midband gain and the parallel conductance of the resistive elements <b>248</b> and <b>252</b> set the high frequency gain. The time constant formed by pole-zero pair elements <b>248</b> and <b>250</b> can be adjusted independently of the time constant formed by pole-zero pair elements <b>252</b> and <b>254</b>. The time constants are adjusted to provide flatness correction for that portion of the residual error caused by the mismatch of mid and high frequency gains in other portions of the circuit. The resistive element <b>236</b> and capacitive element <b>238</b> of the shunt pole-zero pair are chosen to set the gain in a narrow band between the low and middle band frequencies and are adjusted to provide flatness correction for that portion of the residual error caused by the mismatch of low and mid frequency gains in other portions of the circuit. Alternately, the resistive element <b>236</b> may be adjustable by using a Rejustor™, manufactured and sold by Microbridge Technology Corp., Montreal, Canada. The controller <b>125</b> communicates with the feedback loop circuitry <b>244</b> via a four line Serial Peripheral Interface bus <b>260</b> for loading register values for the adjustable resistive and capacitive elements. The controller <b>125</b> would further provide adjustment signals to the resistive element <b>236</b> when using a Rejustor™.

0044<figref idref="DRAWINGS">FIG. 6</figref> shows representative frequency responses <b>260</b>, <b>262</b> of the signal acquisition system <b>200</b> with and without feedback crossover compensation. The capacitance of the capacitive element <b>212</b> in the probe tip circuitry <b>208</b> of the signal acquisition system <b>200</b> is reduced which increases the high frequency input impedance. The reduced capacitance in the probe tip circuitry <b>208</b> results in a time constant that is mismatched across the input node <b>204</b> with the time constant of the capacitance to ground capacitor <b>213</b> of the resistive center conductor signal cable <b>212</b> in combination with the input circuitry <b>226</b>. This breaks the traditional probe-oscilloscope structure where each stage of the signal path is compensated for flat frequency and phase response. The mismatched time constants produce a peak <b>264</b> near 8 KHz. A valley <b>266</b> near 60 MHz in the frequency response <b>262</b> is related to the round-trip reflections in the resistive center conductor signal cable <b>202</b> resulting from the termination elements, resistive elements <b>216</b>, <b>226</b> and <b>230</b> and capacitive element <b>228</b>, being only approximations for the complex impedance of the resistive center conductor signal cable <b>202</b>. The feedback loop circuitry <b>244</b> and the series connected resistive and capacitive elements <b>236</b> and <b>238</b> of the shunt pole-zero pair provide crossover compensation to the peak <b>264</b> and valley <b>266</b>. The 8 KHz peak <b>264</b> is corrected by the shunt pole-zero pair of resistive and capacitive elements <b>236</b>, <b>238</b> connected to the input circuitry <b>224</b>. Generally, the values of resistive and capacitive element <b>234</b>, <b>236</b> are fixed values providing a pole-zero pair. Alternately, the resistive element <b>236</b> may be adjustable by using a Rejustor. The controller <b>125</b> provides adjustment signals to the resistive element <b>236</b> when using a Rejustor. The valley <b>266</b> near 60 MHz is caused by the capacitance of the capacitive element <b>212</b> being lower than the capacitance of the same capacitor in the traditional probe, and is corrected by changing register values for capacitive elements <b>250</b> and <b>254</b> with resistive elements <b>248</b> and <b>252</b> forming a split pair of poles and zeros. The total capacitance of capacitive elements <b>250</b> plus <b>254</b> sets the midband gain (10 KHz to 10 MHZ), and the parallel conductance of resistive elements <b>248</b> and <b>252</b> sets the gain above 200 MHZ.

0045The resistive element <b>236</b> and the capacitive element <b>238</b> produce a pole-zero pair in the signal acquisition system <b>200</b> that flattens the peak <b>264</b> near 8 KHz in the frequency response. The transfer function for the low frequency band (DC to midband AC) is shown by Equation 1 below:

0046<maths id="MATH-US-00001" num="00001"><math overflow="scroll"><mtable><mtr><mtd><mrow><mrow><mi>H</mi><mo>⁡</mo><mrow><mo>(</mo><mrow><mi>j</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>w</mi></mrow><mo>)</mo></mrow></mrow><mo>=</mo><mrow><mo>-</mo><mrow><mo>(</mo><mfrac><mrow><msub><mi>R</mi><mn>246</mn></msub><mo>·</mo><mrow><mo>(</mo><mrow><msub><mi>C</mi><mi>z</mi></msub><mo>·</mo><msub><mi>A</mi><mi>z</mi></msub><mo>·</mo><msub><mi>T</mi><mi>z</mi></msub></mrow><mo>)</mo></mrow></mrow><mrow><msub><mi>TAC</mi><mi>P</mi></msub><mo>·</mo><msub><mi>A</mi><mi>P</mi></msub></mrow></mfrac><mo>)</mo></mrow></mrow></mrow></mtd><mtd><mrow><mi>EQ</mi><mo>.</mo><mstyle><mspace width="0.8em" height="0.8ex" /></mstyle><mo>⁢</mo><mn>1</mn></mrow></mtd></mtr></mtable></math></maths><img file="US8810258B2_D0001.tif" /><br /> where <ul id="ul0001" list-style="none"><li id="ul0001-0001" num="0000"><ul id="ul0002" list-style="none"><li id="ul0002-0001" num="0047">C_zrepresents the Correction Zero pole: <ul id="ul0003" list-style="none"><li id="ul0003-0001" num="0048">(C₂₃₈·R₂₃₆·jw+1)</li></ul></li><li id="ul0002-0002" num="0049">A_zrepresents the Attenuator Zero: <ul id="ul0004" list-style="none"><li id="ul0004-0001" num="0050">(C₂₂₈·R₂₂₆·jω+1)</li></ul></li><li id="ul0002-0003" num="0051">T_zrepresents the Tip Zero: <ul id="ul0005" list-style="none"><li id="ul0005-0001" num="0052">(C₂₁₂·R₂₁₀·jw+1)</li></ul></li><li id="ul0002-0004" num="0053">A_prepresents the Amplifier Poles: <ul id="ul0006" list-style="none"><li id="ul0006-0001" num="0054">((C₂₅₀+C₂₅₄)·R₂₄₆·jω+1)</li></ul></li><li id="ul0002-0005" num="0055">TAC_prepresent the Tip/Attenuator/Correction Pole:</li></ul></li></ul>

0056<maths id="MATH-US-00002" num="00002"><math overflow="scroll"><mrow><mrow><mrow><mo>(</mo><mrow><mrow><msub><mi>C</mi><mn>213</mn></msub><mo>·</mo><msub><mi>C</mi><mn>238</mn></msub><mo>·</mo><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>236</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow><mo>+</mo><mrow><msub><mi>C</mi><mn>212</mn></msub><mo>·</mo><msub><mi>C</mi><mn>238</mn></msub><mo>·</mo><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>236</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow><mo>+</mo><mrow><mrow><msub><mi>C</mi><mn>238</mn></msub><mo>·</mo><msub><mi>C</mi><mn>228</mn></msub></mrow><mo>⁢</mo><mrow><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>236</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow></mrow></mrow><mo>)</mo></mrow><mo>·</mo><msup><mrow><mo>(</mo><mi>jω</mi><mo>)</mo></mrow><mn>2</mn></msup></mrow><mo>+</mo><mrow><mrow><mo>(</mo><mrow><mrow><msub><mi>C</mi><mn>213</mn></msub><mo>·</mo><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow><mo>+</mo><mrow><msub><mi>C</mi><mn>212</mn></msub><mo>·</mo><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow><mo>+</mo><mrow><msub><mi>C</mi><mn>238</mn></msub><mo>·</mo><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>236</mn></msub></mrow><mo>+</mo><mrow><msub><mi>C</mi><mn>238</mn></msub><mo>·</mo><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow><mo>+</mo><mrow><msub><mi>C</mi><mn>228</mn></msub><mo>·</mo><msub><mi>R</mi><mn>210</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow><mo>+</mo><mrow><msub><mi>C</mi><mn>238</mn></msub><mo>·</mo><msub><mi>R</mi><mn>236</mn></msub><mo>·</mo><msub><mi>R</mi><mn>226</mn></msub></mrow></mrow><mo>)</mo></mrow><mo>·</mo><mrow><mo>(</mo><mrow><mi>j</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>w</mi></mrow><mo>)</mo></mrow></mrow><mo>+</mo><msub><mi>R</mi><mn>210</mn></msub><mo>+</mo><msub><mi>R</mi><mn>226</mn></msub></mrow></math></maths><img file="US8810258B2_D0002.tif" /><br /> The shunt pole-zero pair of adjustable resistive element <b>236</b> and capacitive element <b>238</b> can improve the response over a small band using the Rejustor resistive element <b>236</b> but not completely flatten it.

0057The transfer function for the midband AC to high frequency AC is shown by Equation 2 below:

0058<maths id="MATH-US-00003" num="00003"><math overflow="scroll"><mtable><mtr><mtd><mrow><mrow><mi>H</mi><mo>⁡</mo><mrow><mo>(</mo><mrow><mi>j</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>w</mi></mrow><mo>)</mo></mrow></mrow><mo>=</mo><mrow><mo>-</mo><mrow><mo>(</mo><mfrac><mi>A</mi><mrow><mi>B</mi><mo>+</mo><mi>C</mi></mrow></mfrac><mo>)</mo></mrow></mrow></mrow></mtd><mtd><mrow><mi>EQ</mi><mo>.</mo><mstyle><mspace width="0.8em" height="0.8ex" /></mstyle><mo>⁢</mo><mn>2</mn></mrow></mtd></mtr></mtable></math></maths><img file="US8810258B2_D0003.tif" /><ul id="ul0007" list-style="none"><li id="ul0007-0001" num="0000"><ul id="ul0008" list-style="none"><li id="ul0008-0001" num="0059">where A equals:</li></ul></li></ul>

0060<maths id="MATH-US-00004" num="00004"><math overflow="scroll"><mfrac><mn>1</mn><mrow><mo>(</mo><mrow><mfrac><mn>1</mn><mrow><mo>(</mo><mrow><msub><mi>R</mi><mn>248</mn></msub><mo>+</mo><mfrac><mn>1</mn><mrow><msub><mi>C</mi><mn>250</mn></msub><mo>⁢</mo><mi>w</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>j</mi></mrow></mfrac></mrow><mo>)</mo></mrow></mfrac><mo>+</mo><mfrac><mn>1</mn><mrow><mo>(</mo><mrow><msub><mi>R</mi><mn>252</mn></msub><mo>+</mo><mfrac><mn>1</mn><mrow><msub><mi>C</mi><mn>254</mn></msub><mo>⁢</mo><mi>w</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>j</mi></mrow></mfrac></mrow><mo>)</mo></mrow></mfrac></mrow><mo>)</mo></mrow></mfrac></math></maths><img file="US8810258B2_D0004.tif" /><ul id="ul0009" list-style="none"><li id="ul0009-0001" num="0000"><ul id="ul0010" list-style="none"><li id="ul0010-0001" num="0061">B equals:</li></ul></li></ul>

0062<maths id="MATH-US-00005" num="00005"><math overflow="scroll"><mrow><mrow><mo>(</mo><mrow><msub><mi>R</mi><mn>216</mn></msub><mo>+</mo><msub><mi>R</mi><mn>230</mn></msub><mo>+</mo><mfrac><mn>1</mn><mrow><msub><mi>C</mi><mn>228</mn></msub><mo>⁢</mo><mi>w</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>j</mi></mrow></mfrac></mrow><mo>)</mo></mrow><mo>·</mo><mrow><mo>[</mo><mrow><mrow><mi>cos</mi><mo>⁡</mo><mrow><mo>(</mo><mrow><mi>β</mi><mo>·</mo><mi>l</mi></mrow><mo>)</mo></mrow></mrow><mo>+</mo><mrow><msub><mi>Y</mi><mn>0</mn></msub><mo>·</mo><mi>j</mi><mo>·</mo><mrow><mi>sin</mi><mo>⁡</mo><mrow><mo>(</mo><mrow><mi>β</mi><mo>·</mo><mi>l</mi></mrow><mo>)</mo></mrow></mrow><mo>·</mo><mrow><mo>(</mo><mrow><msub><mi>R</mi><mn>214</mn></msub><mo>+</mo><mfrac><mn>1</mn><mrow><msub><mi>C</mi><mn>212</mn></msub><mo>⁢</mo><mi>w</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>j</mi></mrow></mfrac></mrow><mo>)</mo></mrow></mrow></mrow><mo>]</mo></mrow></mrow></math></maths><img file="US8810258B2_D0005.tif" /><ul id="ul0011" list-style="none"><li id="ul0011-0001" num="0000"><ul id="ul0012" list-style="none"><li id="ul0012-0001" num="0063">C equals:</li></ul></li></ul>

0064<maths id="MATH-US-00006" num="00006"><math overflow="scroll"><mrow><mrow><mrow><mi>cos</mi><mo>⁡</mo><mrow><mo>(</mo><mrow><mi>β</mi><mo>·</mo><mi>l</mi></mrow><mo>)</mo></mrow></mrow><mo>·</mo><mrow><mo>(</mo><mrow><msub><mi>R</mi><mn>214</mn></msub><mo>+</mo><mfrac><mn>1</mn><mrow><msub><mi>C</mi><mn>212</mn></msub><mo>⁢</mo><mi>w</mi><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mi>j</mi></mrow></mfrac></mrow><mo>)</mo></mrow></mrow><mo>+</mo><mrow><msub><mi>Z</mi><mn>0</mn></msub><mo>·</mo><mi>j</mi><mo>·</mo><mrow><mi>sin</mi><mo>⁡</mo><mrow><mo>(</mo><mrow><mi>β</mi><mo>·</mo><mi>l</mi></mrow><mo>)</mo></mrow></mrow></mrow></mrow></math></maths><maths id="MATH-US-00006-2" num="00006.2"><math overflow="scroll"><mrow><mi>and</mi><mo>⁢</mo><mstyle><mtext>:</mtext></mstyle></mrow></math></maths><maths id="MATH-US-00006-3" num="00006.3"><math overflow="scroll"><mrow><mrow><mi>β</mi><mo>=</mo><mrow><mi>ω</mi><mo>·</mo><msqrt><mi>LC</mi></msqrt></mrow></mrow><mo>;</mo></mrow></math></maths><maths id="MATH-US-00006-4" num="00006.4"><math overflow="scroll"><mrow><mrow><msub><mi>Z</mi><mn>0</mn></msub><mo>=</mo><msqrt><mfrac><mrow><mi>R</mi><mo>+</mo><mrow><mi>j</mi><mo>·</mo><mi>w</mi><mo>·</mo><mi>L</mi></mrow></mrow><mrow><mi>G</mi><mo>+</mo><mrow><mi>j</mi><mo>·</mo><mi>w</mi><mo>·</mo><mi>C</mi></mrow></mrow></mfrac></msqrt></mrow><mo>;</mo></mrow></math></maths><maths id="MATH-US-00006-5" num="00006.5"><math overflow="scroll"><mrow><mrow><mrow><msub><mi>Y</mi><mn>0</mn></msub><mo>=</mo><mfrac><mn>1</mn><msub><mi>Z</mi><mn>0</mn></msub></mfrac></mrow><mo>;</mo></mrow><mo>⁢</mo><mstyle><mtext></mtext></mstyle><mo>⁢</mo><mi>l</mi><mo>=</mo><mrow><mi>electrical</mi><mo>⁢</mo><mstyle><mspace width="0.8em" height="0.8ex" /></mstyle><mo>⁢</mo><mi>length</mi><mo>⁢</mo><mstyle><mspace width="0.8em" height="0.8ex" /></mstyle><mo>⁢</mo><mi>of</mi><mo>⁢</mo><mstyle><mspace width="0.8em" height="0.8ex" /></mstyle><mo>⁢</mo><mi>the</mi><mo>⁢</mo><mstyle><mspace width="0.8em" height="0.8ex" /></mstyle><mo>⁢</mo><mi>cable</mi></mrow></mrow></math></maths>

0065The analysis to determine the transfer function through the cable at midband AC to high frequency AC uses a 2-port microwave theory, specifically the ABCD, or transmission matrix. The use of the transmission matrix allows the use of measured data for the cable, since S-parameters can be easily transformed into T-parameters. The transfer function is built up by solving for the port voltages. The 2-port method easily solves the transfer function of the probe tip, cable and attenuator. The active circuit in the signal acquisition system <b>200</b> is solved by summing the current at the summing node and assuming an ideal operational amplifier for the input amplifier <b>234</b>.

0066The transfer function of Equation 2 indicates that the time delay of the cable causes a pole split between the probe time constant and the attenuator time constant. Traditionally, this pole split is compensated for by choosing values for the probe circuitry time constant that set the poles atop of one another. This has been accomplished using network circuitry in the compensation box at the other end of the probe cable. However, this is at odds with the signal acquisition system <b>200</b> concept where the load capacitance in the probe tip circuitry <b>208</b> is reduced by lowering the probe tip capacitance and the probe compensation circuitry resides in the signal acquisition system.

0067The poles may be lined up with each other by increasing the tip resistance but this causes the overall frequency response of the probe-signal processing instrument system to suffer. Other traditional solutions to resolving the midband frequency response flatness requires adjusting cable parameters or removing capacitance in the attenuator to adjust the attenuator time constant. Removing too much capacitance in the attenuator causes the noise gain of the system to suffer and the input amplifier <b>234</b> is required to have a higher gain bandwidth. The present invention adds a pole-zero pair in the transfer function to compensate for the split poles by splitting the pole-zero pair in the feedback loop circuitry <b>244</b> into two pole-zero pairs (capacitive elements <b>250</b>, <b>254</b> and resistive elements <b>248</b> and <b>252</b>).

0068The above analysis of the transfer functions for the low frequency band (DC to midband AC) and the midband AC to high frequency AC assumes that there are no parasitic capacitances or inductances and the input amplifier <b>234</b> is an ideal amplifier with infinite gain-bandwidth. The resistive elements <b>214</b>, <b>230</b>, <b>248</b> and <b>252</b> in the Equation 2 for the midband AC to high frequency AC are damping resistors in series with the respective capacitive elements <b>212</b>, <b>228</b>, <b>250</b> and <b>254</b>. It is assumed at these frequencies (midband AC to high frequency AC) that the conductance of the capacitive elements <b>212</b>, <b>228</b>, <b>250</b> and <b>254</b> are much higher than the large DC resistive elements <b>210</b>, <b>226</b> and <b>246</b>, resulting in the midband range being a function of capacitance ratio of <b>212</b>, <b>228</b>, <b>250</b> and <b>254</b>.

0069It should be understood that there will be poles due to parasitics and high frequency losses due to skin effects on the cable, as well as zeros from inductive peaking in the ground lead and the various interconnects in the system <b>200</b>. The input amplifier <b>234</b> will have a finite bandwidth and non-zero phase delay. These additional effects will need to be considered in a final design and will affect the chosen component values for the system <b>200</b>.

0070Active compensation of the signal acquisition system <b>200</b> of the present invention is achieved by electronically varying register values of the resistive and capacitive elements in the feedback loop circuitry <b>244</b> of the input amplifier <b>234</b> and, if used, the adjustable resistive element <b>236</b> in the shunt pole-zero pair. The probe memory <b>256</b> may be loaded with typical values associated with a signal acquisition probe, such as input resistance, attenuation factor, dynamic range, bandwidth host resistance, and the like. The probe memory <b>256</b> may also be loaded with calibration constants associated with that particular probe at the time of factory calibration. The calibration constants are register values that are combined with existing register value in the feedback loop circuitry <b>244</b> of the input amplifier <b>232</b> and the adjustable resistive elements <b>236</b>.

0071The broad frequency content signal from the signal source <b>157</b> is provided internally to at least one of the signal channels of the oscilloscope <b>100</b> during factory calibration. The broad frequency content signal is characterized and stored in oscilloscope memory <b>155</b> as a CAL REFERENCE WAVEFORM. The characterized waveform may be digitized magnitude values of the broad frequency content signal at selected time locations. Alternately, the characterized waveform may be stored as a time domain mathematical expression associated with amplitude, offset, rise time, overshoot aberrations and the like that would generate a digital waveform of the CAL REFERENCE WAVEFORM. A further alternative is characterizing the CAL REFERENCE WAVEFORM in the frequency domain by performing a Fast Fourier Transform (FFT) on the acquired digital time domain data of the broad frequency content signal.

0072The oscilloscope memory <b>155</b> is loaded with a series of time specific measured error factor tables. Each table defines a time location from a reference time location on the CAL REFERENCE WAVEFORM. Each table has a measured error field having measured error value records, and a corresponding measured error factor field consisting of a register field having register value records for the feedback circuitry <b>244</b> and an adjustable resistive element field having resistive element value records for the shunt pole-zero pair, if used. Alternately, the oscilloscope memory <b>155</b> may be loaded with a series of frequency specific measured error factor tables where the digital data of the broad frequency content signal has been converted to the frequency domain using an FFT. Each table defines a frequency location on the CAL REFERENCE WAVEFORM. Each table has a measured error field and a measured error factor field with each record of the measured error field having a corresponding record in the measured error factor field. Additionally, multiple specific times error factor tables may be stored in the oscilloscope memory <b>155</b>. These tables contain multiple time locations from the reference time. The tables have combinations of time locations and associated measured error fields, and a measured error factor field.

0073<figref idref="DRAWINGS">FIGS. 8A and 8B</figref> show a calibration process flow chart for calibrating the signal acquisition system <b>200</b> of the present invention. Prior to the calibration of the signal acquisition probe <b>105</b>, DC signal path compensation is performed on the signal channel without the signal acquisition probe <b>105</b> attached. The signal acquisition probe <b>105</b> is attached to one of the signal channels of the oscilloscope <b>100</b> at step <b>300</b>. The oscilloscope <b>100</b> detects the presence of a signal acquisition probe memory <b>256</b> at step <b>302</b> and reads the contents of the probe memory <b>256</b> at step <b>304</b>. If the oscilloscope <b>100</b> does not detect the presence of a signal acquisition probe memory <b>256</b>, then the attached probe is identified as a legacy probe at step <b>306</b>. If the probe memory <b>256</b> has probe calibration constants as depicted at step <b>308</b>, then the probe calibration constants are combined with the registers values of the feedback loop circuitry <b>244</b> of the input amplifier <b>232</b> and the resistive element value <b>236</b> at step <b>310</b>.

0074A user connects the other end of the signal acquisition probe <b>105</b> to the broad frequency content signal source <b>157</b> and initiates the probe calibration on the signal channel at step <b>312</b> using the display device <b>135</b> and instrument controls that may include I/O circuitry, such as a keyboard, mouse or the like. The oscilloscope <b>100</b> acquires digital values of the broad frequency content signal as a CAL WAVEFORM at step <b>314</b>. Alternately, the acquired digital values of the broad frequency content signal may be converted to the frequency domain using an FFT. The error value between the acquired CAL WAVEFORM and the CAL REFERENCE WAVEFORM is measured at a selected time or frequency location as represented in step <b>316</b>. The measured error factor tables are accessed in step <b>318</b> with the selected time or frequency table corresponding to the selected time or frequency of the measured error value being used. The register value and the resistive element <b>236</b> value, if used, of the measured error factor are respectively applied to the register of the appropriate feedback loop register and the adjustable resistive element <b>236</b> at step <b>320</b>. The register value of the measured error factor is preferably a value that is multiplied with the current register value of the feedback loop circuitry <b>240</b> to generate a new register value. At step <b>322</b>, a determination is made if the measured error value is at the last time or frequency location of the CAL REFERENCE WAVEFORM. If the calibration process is not at the last time or frequency location of the CAL REFERENCE WAVEFORM, then the process returns to step <b>316</b> and the measured error value between the CAL WAVEFORM and the CAL REFERENCE WAVEFORM at the next selected time or frequency location is determined.

0075If the calibration process has determined the last measured error value between the CAL WAVEFORM and the CAL REFERENCE WAVEFORM, then a new acquisition of digital values of the broad frequency content signal is performed and the digital values are stored as the CAL WAVEFORM as shown in step <b>324</b>. The just acquired CAL WAVEFORM is compared to calibration specifications to determine if the new CAL WAVEFORM is within the calibration specifications at step <b>326</b>. The calibration specifications include verifying that the CAL WAVEFORM low frequency compensation measurements are within spec, the peak-to-peak short term aberrations are less than set percentage within a set time span as compared to the CAL REFERENCE WAVEFORM, the peak-to-peak long term aberrations are less than a set percentage within a different set time span as compared to the CAL REFERENCE WAVEFORM, and the rise time is within a set time as compared to the CAL REFERENCE WAVEFORM. If the new CAL WAVEFORM meets the calibration specifications, the register values of the feedback loop circuitry <b>244</b> of the input amplifier <b>234</b> and the adjustable resistive value <b>236</b> are saved for the specific probe and signal channel calibration as shown at step <b>328</b>. The user is informed that the calibration process has passed by a display output on the display device <b>135</b> at step <b>330</b> and the calibration process ends.

0076If the new CAL WAVEFORM does not meet the calibration specification, then the current elapsed time of the calibration process is compared to a iteration time limit value at step <b>332</b>. If the current elapsed time of the calibration process does not exceed the iteration time limit value, then the time or frequency location of the new CAL REFERENCE WAVEFORM is reset to the start location at step <b>334</b> and the process returns to step <b>316</b> where measured error values between the CAL REFERENCE WAVEFORM and the new CAL WAVEFORM are determined, the measured error factors are determined and the measured error factors are applied to the register values of the plurality of registers in the feedback loop circuitry <b>244</b> of the input amplifier <b>232</b> and the adjustable resistive element <b>236</b>, if used. If the elapsed time of the calibration process exceeds the iteration time limit value, then the initial register values of the feedback loop circuitry <b>244</b> and the adjustable resistive element <b>236</b> are set as the register values as shown in step <b>336</b>. The initial register values may be the initial nominal values applied to the registers in the feedback loop circuitry <b>244</b> and to the adjustable resistive element <b>236</b> without any probe calibration or the previously calibrated register values if the probe and signal channel combination had been previous calibrated. The user is informed of the non-calibration status of the probe-channel combination by a display output on the display device <b>135</b> at step <b>338</b> and the calibration process ends.

0077Referring to <figref idref="DRAWINGS">FIG. 9</figref>, there is shown a representative schematic diagram of the attenuation circuitry <b>224</b> as implemented in the signal acquisition system <b>200</b> of the present invention. The attenuator circuitry <b>224</b> is preferably a multi-stage attenuation ladder <b>400</b> with each attenuation stage having an input current node, <b>402</b>A, <b>402</b>B, <b>402</b>C, <b>402</b>D, <b>402</b>E. In the preferred embodiment, the multi-stage attenuation ladder <b>400</b> has five stages <b>404</b>A, <b>404</b>B, <b>404</b>C, <b>404</b>D, <b>404</b>E. The five attenuation stages are by example only and various numbers of stages may be implemented in the multi-stage attenuation ladder <b>400</b> without departing from the scope of the claimed invention. The input current to the multi-stage attenuation ladder <b>400</b> is received from the signal acquisition probe <b>105</b> via the BNC input <b>204</b>. The input current is sequentially divided at each input current node, <b>402</b>A, <b>402</b>B, <b>402</b>C, <b>402</b>D, <b>402</b>E, of each attenuation stage, <b>404</b>A, <b>404</b>B, <b>404</b>C, <b>404</b>D, <b>404</b>E. A first portion of the current at each node is coupled through attenuation switches <b>406</b>A, <b>406</b>B, <b>406</b>C, <b>406</b>D, <b>406</b>E to the input amplifier <b>234</b> or to ground and a remaining portion of the current coupled to the next attenuation stage. For example, the input current entering the current input node <b>402</b>A is divided so that three-fourths of the current is coupled through the first attenuation stage to the input amplifier <b>234</b> or to ground and one-fourth of the current is coupled to the input current node <b>402</b>B of the next attenuation stage <b>404</b>B. The one-fourth current entering the current input node <b>402</b>B of the second attenuation stage <b>404</b>B is divided so that three-sixteenths of the total input current to the multi-stage attenuation ladder <b>400</b> is coupled through the second stage <b>404</b>B to the input of input amplifier <b>234</b> or to ground and one-sixteenth is coupled to the input current node <b>402</b>C of the next attenuation stage <b>404</b>C. The one-sixteenth current entering the current input node <b>402</b>C of the third attenuation stage <b>404</b>C is divided so that three-sixty-fourths of the total input current to the multi-stage attenuation ladder <b>400</b> is coupled through the third stage <b>404</b>C to the input of input amplifier <b>234</b> or to ground and one-sixty-fourth is coupled to the input current node <b>402</b>D of the next attenuation stage <b>404</b>D. The one sixty-fourth current entering the input current node <b>402</b>D is divided so that one-half of the current is coupled through the fourth stage <b>404</b>D to the input of input amplifier <b>234</b> or to ground and one-half is coupled through the fifth stage <b>404</b>E to the input of the input amplifier <b>234</b> or to ground.

0078Vertical gain settings input by a user are interpreted by the controller <b>125</b> for activating and deactivating the attenuation switches <b>406</b>A, <b>406</b>B, <b>406</b>C, <b>406</b>D, <b>306</b>E. The current through each of the attenuator stages <b>404</b>A, <b>404</b>B, <b>404</b>C, <b>404</b>D, <b>404</b>E may be individually coupled to the input of the input amplifier <b>234</b> or the current through multiple stages maybe combined and applied to the input of the input amplifier <b>234</b>. The input current is not coupled to the input amplifier <b>234</b> when implementing “ground” coupling. The attenuation circuitry <b>224</b> scales the current to the dynamic range of the input amplifier <b>234</b>.

0079The input impedance of the attenuator circuitry <b>224</b> for the signal acquisition system <b>200</b> is lower than expected by existing passive voltage probes. The shunt impedance of the compensation circuitry <b>18</b> in the input box of the prior art probe as illustrated in <figref idref="DRAWINGS">FIG. 1</figref> is now a series impedance in the signal acquisition system <b>200</b>. The addition of the selectable resistive-capacitive network <b>240</b> in series with the signal acquisition probe <b>105</b> and the attenuation circuitry <b>224</b> and the simultaneous disconnection of the shunt pole-zero pair of resistive element <b>236</b> and capacitive element <b>238</b> lowers the input capacitance of the oscilloscope to allow legacy passive voltage probes to be used with the signal acquisition system <b>200</b>.

0080Referring to <figref idref="DRAWINGS">FIG. 10</figref>, there is shown a schematic representation of the signal acquisition probe <b>105</b> implementing a high voltage probe <b>500</b> for the signal acquisition system <b>200</b>. The high voltage probe <b>500</b> has a probing head <b>202</b> containing probe tip circuitry <b>502</b>. The probe tip circuitry <b>502</b> has a plurality of series connected resistive elements <b>504</b>, <b>506</b>, <b>508</b> coupled in parallel with series connected resistive elements <b>510</b> and <b>512</b> and capacitive elements <b>514</b>, <b>516</b> and <b>518</b>. The probe tip circuitry is coupled to one end of resistive center conductor cable <b>202</b> with the other end of the resistive center conductor cable coupled via coaxial cable termination circuitry <b>520</b> to shunt attenuation circuitry <b>522</b> and the BNC input <b>204</b> of one of the signal acquisition circuitry <b>115</b>. The cable termination circuitry <b>520</b> has resistive element <b>524</b> coupled in parallel with resistive element <b>526</b> and capacitive element <b>528</b> which are in series with resistive element <b>530</b>. The shunt attenuation circuitry <b>522</b> has a resistive element <b>532</b> in parallel with a capacitive element <b>534</b>. The shunt attenuation circuitry <b>522</b> functions as a portion of a voltage divider network with the probe tip circuitry <b>502</b>. In a preferred embodiment, the total series resistance of the probe tip circuitry <b>502</b> is approximately 40 MΩ and the shunt resistive element <b>532</b> is 1 MΩ which results in a divide by ratio of 40:1 and a total attenuation factor from the probe tip circuitry <b>502</b> to the output of the input amplifier <b>234</b> times the selected attenuation factor of the attenuation circuitry <b>224</b>. The voltage divider network of the probe tip circuitry <b>502</b> and the shunt attenuation circuitry <b>522</b> reduces the high voltage potential at the output of the resistive center conductor cable <b>202</b> to provide a safety factor for a user. The resistive center conductor signal cable <b>202</b> has dielectric and skin effect losses which may be compensated for by the resistive element <b>526</b> and the capacitive element <b>528</b> in parallel with the resistive element <b>524</b>.

0081It will be obvious to those having skill in the art that many changes may be made to the details of the above-described embodiments of this invention without departing from the underlying principles thereof. For example, the input amplifier <b>234</b> is not limited to an inverting amplifier and a non-inverting amplifier may be used without departing from the scope of the claimed invention. Further, the compensation system <b>232</b> may be implemented with multi-stage amplifiers where one or more amplifiers provide gain and one or more amplifiers provide the feedback crossover compensation. Additionally, any compensation not performed in using the input amplifier <b>234</b> may be shifted several stages later in the signal path, such as after the single-ended-to-differential conversion or the variable gain stages. It should also be noted that steps in calibration process for the signal acquisition system <b>200</b> need not be performed in the exact order as described and claimed, and variation in the order of the steps may be implemented without departing from the claims of the invention. Likewise, an iteration count rather than an elapsed time limit may be used to abort a non-converging calibration attempt. The present invention preferably uses registers for varying the resistive and capacitive values of the resistive and capacitive elements in the feedback loop circuitry of the compensation system. However, it is contemplated that by precise laser trimming of the resistive and capacitive components in the signal acquisition system that the use of registers in the feedback loop circuitry may not be needed. The scope of the present invention should, therefore, be determined only by the following claims.