Nova Patents
US8551785B2

Dual angle radiation scanning of objects

Summary by NHIP

Dual-Angle Radiation Scanning

The method scans an object with radiation beams at two different angles to detect high atomic number materials. It concludes potential nuclear or shielding material presence only when both angles indicate high density regions at corresponding longitudinal locations.

Claim Score by NHIP

Read claim 15, the broadest

Abstract

In one example, a method of examining contents of an object is disclosed comprising scanning an object by first and second radiation beams at least first and second angles, detecting radiation at the first and second angles, and determining whether the object at least potentially comprises high atomic number material, which may be nuclear material or shielding material, based, at least in part, on the detected radiation. In one example, the detected radiation at both angles must be indicative of a region of high atomic number material by the presence of corresponding high density regions, in order for it to be concluded that high atomic number material that may be nuclear material may be present. The determination may be further based on the size of a high density region in one of the images. Systems are also disclosed.

US8551785B2, drawing sheet 1
Sheet 1 of 12

Term

Term ended

Expired 12 July 2026, 0.2 years ago.

  1. Priority
  2. Filed
  3. Granted
  4. Expired
  5. Today

31 claims: 4 independent, 27 dependent

  1. 1
    A method of examining contents of an object, comprising:scanning at least a portion of an object by a first radiation beam at a first angle;detecting radiation interacting with the object at the first angle;determining whether the object at least potentially contains high atomic number material having an atomic number greater than a predetermined atomic number based, at least in part, on the radiation detected at the first angle;scanning at least the portion of an object by a second radiation beam at a second angle different than the first angle;detecting radiation interacting with the object at the second angle;and determining whether the object at least potentially contains high atomic number material having an atomic number greater than a predetermined atomic number based, at least in part, on the radiation detected at the second angle;and determining that the object at least potentially contains high atomic number material if the determinations at the first and second angles both indicate the at least potential presence of high atomic number material at corresponding longitudinal locations of the object.
  2. 14
    A method of examining contents of an object, comprising:scanning at least a portion of an object by a first radiation beam at a first angle;detecting radiation interacting with the object at the first angle;determining whether the object at least potentially contains high atomic number material based, at least in part, on the detected radiation at the first angle;and scanning at least the portion of the object by a second radiation beam at a second angle different than the first angle, only if it is determined that the object at least potentially contains high atomic number material based, at least in part, on the radiation detected at the first angle;if scanning is conducted at the second angle, detecting radiation interacting with the object at the second angle;determining whether the object at least potentially contains high atomic number material having an atomic number greater than a predetermined atomic number based, at least in part, on the radiation detected at the second angle;and determining that the object at least potentially contains high atomic number material if the radiation detected at the first and second angles both indicate the at least potential presence of high atomic number material at corresponding longitudinal locations of the object.
  3. 15
    Broadest claimClaim Score 44, average(NHIP)A system for examining contents of an object, the system comprising:at least one radiation source to scan at least a portion of an object at first and second different angles: at least one detector positioned to detect radiation at the first and second angles;and at least one processor coupled to the detector, the at least one processor being configured to: determine whether the object at least potentially contains high atomic number material having an atomic number greater than a predetermined atomic number based, at least in part, on the radiation detected at the first angle;determine whether the object at least potentially contains high atomic number material having an atomic number greater than a predetermined atomic number based, at least in part, on the radiation detected at the second angle;and determine that the object at least potentially contains high atomic number material if the first and second determinations at the first and second angles both indicate the at least potential presence of high atomic number material at corresponding longitudinal locations of the object.
  4. 31
    The system of 15 , further comprising:a conveyor to move the object through the system;wherein the system is configured to: scan the at least a portion of the object at a plurality of first longitudinal locations at the first angle;and scan the at least a portion of the object at a plurality of second longitudinal locations at the second angle.