Formation of a slot in a silicon substrate
Summary by NHIP
Slot formation in silicon substrate
The method forms a slot through a silicon substrate using sequential laser patterning, dry etching, and wet etching. Distinctive steps include laser patterning a trench leaving 60 to 75 microns of silicon, followed by dry etching to approximately reach the second side before a wet etch completes the slot.
Claim Score by NHIP
Abstract
A slot is formed that reaches through a first side of a silicon substrate to a second side of the silicon substrate. A trench is laser patterned. The trench has a mouth at the first side of the silicon substrate. The trench does not reach the second side of the silicon substrate. The trench is dry etched until a depth of at least a portion of the trench is extended approximately to the second side of the silicon substrate (12). A wet etch is performed to complete formation of the slot. The wet etch etches silicon from all surfaces of the trench.

Term
Projected expiry 22 May 2029.
- Priority and filed
- Granted
- Today
- Projected expiry
12 claims: 2 independent, 10 dependent
- 1Broadest claimClaim Score 63, broad(NHIP)A method for forming a slot that reaches through a first side of a silicon substrate to a second side of the silicon substrate, the method comprising:placing wet etch masking material over the first side of the silicon substrate;removing the wet etch masking material to expose a trench area;placing dry etch masking material over the exposed trench area and the wet etch masking material;laser patterning a trench, the trench not reaching to the second side of the silicon substrate;dry etching the trench until a depth of the trench is extended approximately to the second side of the silicon substrate;and, performing a wet etch to complete formation of the slot, the wet etch removing the dry etch masking material and etching silicon from all surfaces of the trench.
- 7A method for forming a slot that reaches through a first side of a silicon substrate to thin films located on a second side of the silicon substrate, the method comprising:placing wet etch masking material over the first side of the silicon substrate;removing the wet etch masking material to expose a trench area;placing dry etch masking material over the exposed trench area and the wet etch masking material;laser patterning a trench, the trench having a mouth at the first side of the silicon substrate and the trench not reaching the thin films;dry etching the trench until a depth of at least a portion of the trench is extended approximately to the second side of the silicon substrate;and, performing a wet etch to complete formation of the slot, the wet etch etching silicon from all surfaces of the trench.
Independent claims2
14 paragraphs in 3 sections, as filed
BACKGROUND
p-0002Micro electro mechanical devices can be used to implement devices such as ink jet print cartridges and other fluid ejecting devices. In some such fluid ejecting devices, fluid can be fed through slots formed in substrates. These slots can be formed using substrate removal techniques.
BRIEF DESCRIPTION OF THE DRAWINGS
p-0003<figref idrefs="DRAWINGS">FIG. 1</figref> is a flowchart that describes a process for forming slots in a silicon substrate in accordance with an embodiment of the present invention
p-0004<figref idrefs="DRAWINGS">FIG. 2</figref>, <figref idrefs="DRAWINGS">FIG. 3</figref>, <figref idrefs="DRAWINGS">FIG. 4</figref>, <figref idrefs="DRAWINGS">FIG. 5</figref>, <figref idrefs="DRAWINGS">FIG. 6</figref> and <figref idrefs="DRAWINGS">FIG. 7</figref> illustrate the process for forming slots in a silicon substrate set out in <figref idrefs="DRAWINGS">FIG. 1</figref> in accordance with an embodiment of the present invention.
DESCRIPTION OF THE EMBODIMENT
p-0005<figref idrefs="DRAWINGS">FIG. 1</figref> is a flowchart that describes a process for forming slots in a substrate. For example, the silicon substrate is initially part of a silicon wafer. In a block <b>101</b> a wet etch mask layer is formed on a silicon substrate. This is illustrated in <figref idrefs="DRAWINGS">FIG. 2</figref>.
p-0006<figref idrefs="DRAWINGS">FIG. 2</figref> shows a cross section of a silicon substrate <b>12</b>. Previously formed on a front side of silicon substrate <b>12</b> are front-side thin films <b>11</b>. For example front-side thin films <b>11</b> can be used to implement electrical components such as resistors and can also include electrical traces. Front-side thin films <b>1</b> can also be used to implement a wall or surface of multiple fluid feed passageways. Front-side thin films <b>11</b> can also include a field or thermal oxide layer. Front-side thin films <b>11</b> can be continuous or discontinuous. For more information on thin films, see for example, U.S. Pat. No. 6,930,055 B1 issued on Aug. 16, 2005 to Bhowmik et al for SUBSTRATES HAVING FEATURES FORMED THEREIN AND METHODS OF FORMING.
p-0007As set out in block <b>101</b> of <figref idrefs="DRAWINGS">FIG. 1</figref>, a wet etch mask <b>13</b> is also formed on silicon substrate <b>12</b>. For example, wet etch mask <b>13</b> is formed of silicon nitride or silicon dioxide or some other material capable of masking silicon substrate <b>12</b> during a wet etch process.
p-0008For example, silicon substrate <b>12</b> is 675 microns thick. For example, front-side thin films <b>11</b> are 5 microns thick. For example, wet etch mask <b>13</b> is 20 nanometers to 1 micron thick. These thicknesses are meant to be illustrative, and as will be understood by persons of ordinary skill in the art can vary significantly dependent upon the application.
p-0009In block <b>102</b> of <figref idrefs="DRAWINGS">FIG. 1</figref>, the wet etch mask is patterned. This is illustrated by <figref idrefs="DRAWINGS">FIG. 3</figref>. In <figref idrefs="DRAWINGS">FIG. 3</figref>, wet etch mask <b>13</b> is removed over a slot area <b>21</b>. Slot area <b>21</b> defines the width and length of the final slot to be constructed. For example, slot area <b>21</b> is approximately 200 microns wide and approximately 11 to 19 millimeters long. As will be understood by persons of ordinary skill in the art these dimensions are illustrative and dependent upon the application for which the slot is to be utilized.
p-0010In a block <b>103</b> of <figref idrefs="DRAWINGS">FIG. 1</figref>, a dry etch mask is formed. This is illustrated in <figref idrefs="DRAWINGS">FIG. 4</figref> by a dry etch mask <b>14</b> having been deposited over wet etch mask <b>13</b> and slot area <b>21</b> (shown in <figref idrefs="DRAWINGS">FIG. 3</figref>). For example, dry etch mask <b>14</b> is composed of Aluminum, Titanium Aluminum, Aluminum oxide or some other material capable of masking silicon substrate <b>12</b> during a dry etch process and which can also be removed during a wet etch process. The thickness of dry etch mask <b>14</b> varies dependent on the material used to form dry etch mask <b>14</b>. For example, when dry etch mask <b>14</b> is formed of aluminum or titanium aluminum, a typical thickness of dry etch mask <b>14</b> is approximately 1 micron. For example, when dry etch mask <b>14</b> is formed of aluminum oxide, a typical thickness of dry etch mask <b>14</b> is approximately 300 nanometers.
p-0011In a block <b>104</b> of <figref idrefs="DRAWINGS">FIG. 1</figref>, laser patterning is used to pattern the dry etch mask and form a trench within the silicon substrate. This is illustrated by <figref idrefs="DRAWINGS">FIG. 5</figref>. In <figref idrefs="DRAWINGS">FIG. 5</figref>, a laser has been used to laser pattern dry etch mask layer <b>14</b> and form a trench <b>15</b> within silicon substrate <b>12</b>. The width of trench <b>15</b> of substrate <b>12</b> is narrower than the final width of the slot to be formed in silicon substrate <b>12</b>. A portion <b>16</b> of silicon substrate <b>12</b> separates a bottom of trench <b>15</b> from thin films <b>11</b> by, for example, approximately 60 to 75 microns. Shelves <b>17</b> are located, for example, approximately 400 microns below dry etch mask layer <b>14</b>. Shelves <b>17</b> are present only dependent upon the process used to perform the laser patterning. In alternative embodiments of the present invention, no shelving may occur. Shelves can occur unintentionally as a result of insufficient debris removal along the edge walls or intentionally by cutting a wide trench with the laser immediately followed with cutting a narrow trench with the same laser. For example, trench <b>15</b> can be formed using a single slow laser pass or using a sequence of multiple laser passes of various widths and lengths and positions providing a variety of bottom features including shelves.
p-0012In a block <b>105</b> shown in <figref idrefs="DRAWINGS">FIG. 1</figref>, a dry etch process is used to deepen the trench. This is illustrated in <figref idrefs="DRAWINGS">FIG. 6</figref>. In <figref idrefs="DRAWINGS">FIG. 6</figref>, a dry etch process has been used to remove portion <b>16</b> of silicon substrate, shown in <figref idrefs="DRAWINGS">FIG. 5</figref>. For example, the dry etch process used is a reactive ion etching process that etches within trench <b>15</b> to extend trench <b>15</b> so that at least a portion of thin films <b>11</b> is reached at the front side of silicon substrate <b>12</b>.
p-0013In a block <b>106</b> shown in <figref idrefs="DRAWINGS">FIG. 1</figref>, a wet etch is used to clean the remaining silicon from the slot. This is illustrated in <figref idrefs="DRAWINGS">FIG. 7</figref> where a wet etch is used to complete the transformation of trench <b>15</b> (shown in <figref idrefs="DRAWINGS">FIG. 6</figref>) into a slot <b>18</b>. The wet etch also removed dry etch mask <b>14</b> as well as smoothed out shelves <b>17</b> shown in <figref idrefs="DRAWINGS">FIG. 6</figref>.
p-0014The use of the combination of laser patterning, dry etch and wet etch processes, as set out above, allows the fabrication of narrow (less than 200 micron) slots that enable die shrinkage, increases the separation ratio between slots and thus decreases the die cost of dies formed of the silicon substrate. This allows slot widths to approach the width of ink feed holes formed through thin films <b>12</b>. This is performance advantage over processes that just use just a combination of laser patterning and a wet etch to form slots. The use of the combination of laser patterning, dry etch and wet etch processes, as set out above, also results in significantly less usage of fluorocarbon gasses when compared to processes that use just dry etch and wet etch to form slots.
p-0015The foregoing discussion discloses and describes merely exemplary methods and embodiments of the present invention. As will be understood by those familiar with the art, the invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. Accordingly, the disclosure of the present invention is intended to be illustrative, but not limiting, of the scope of the invention, which is set forth in the following claims.
Contents3
5 sheets
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2 priority claims, no other members on record
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| 89431607 | United States of America | A | |
| US20070894316 | – | – | – |
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Numbers
- Publication
- 07855151
- Publication, DOCDB
- 7855151
- Publication, EPODOC
- US7855151
- Application
- 11894316
- Application, DOCDB
- 89431607
- Application, EPODOC
- US20070894316
Titles
- English
- Formation of a slot in a silicon substrate
Patent term adjustment
- A delay
- +518 daysthe office missed an examination deadline
- B delay
- +122 dayspendency past three years
- Net adjustment
- 640 days
Classification
- CPC, 7
- B81C1/00087
- B41J2/16
- B41J2/1628
- B41J2/1629
- B41J2/1634
- B81B2201/052
- H01L21/76898
- IPC, 1
- H01L21 461
- USPC, 7
- 438734000
- 257E21249
- 438700000
- 438702000
- 438703000
- 438704000
- 438712000