Macro design techniques to accommodate chip level wiring and circuit placement across the macro

CROSS-REFERENCE TO RELATED APPLICATIONS

0001This application is a divisional of U.S. patent application Ser. No. 10/403,626, filed Mar. 31, 2003 now U.S. Pat. No. 6,883,155, entitled “Macro Design Techniques To Accommodate Chip Level Wiring and Circuit Placement Across the Macro”, which is a divisional of U.S. patent application Ser. No. 09/526,198, filed Mar. 15, 2000 now U.S. Pat. No. 6,543,040, entitled “Macro Design Techniques To Accommodate Chip Level Wiring and Circuit Placement Across the Macro”, the entirety of each of which is hereby incorporated herein by reference.

TECHNICAL FIELD

0002The present invention relates to integrated circuits. More particularly, the present invention relates to pre-designing hard macros, or other hierarchically designed entities, within integrated circuits to accommodate a combination of subsequent stage wiring and circuit insertion across the macros.

BACKGROUND OF THE INVENTION

0003It is well-known that with increasing circuit densities, timing requirements, and bus capacities in integrated circuit chips, wiring widths must be decreased. Decreased wiring widths, however, leads to increased resistances, impacting the slew rate and path delay of the wiring. Wiring must comply with a maximum slew rate and minimum delay based on the required timing. This wiring problem is aggravated when macro “blocks” occupy otherwise open space on the integrated circuit plan. These macros often interfere with subsequently-designed wiring paths which must comply with the slew rate and delay requirements.

0004To illustrate these problems, and with reference to <figref idref="DRAWINGS">FIG. 1</figref>, an IC <b>10</b> may include an embedded macro <b>12</b> having remnant silicon and/or wiring whitespace areas <b>24</b>₁. . . <b>24</b>₄. Assume that IC wiring is required from region <b>14</b> to region <b>16</b> of the IC. Running wiring across the macro may not be possible, since design tools usually see the macro as a fixed block, which cannot be modified when placing and routing the higher level IC wiring. Even assuming that whitespace is available and recognized by the design tools, running a standard width wire <b>18</b> across the macro may not suffice, since the distance over which this wire is run (i.e., the horizontal width of the macro <b>12</b>) may exceed that required for the maximum slew rate and delay.

0005Another option involves re-routing the wiring around the macro along the longer path <b>20</b>, and using repowering circuits <b>22</b>₁. . . <b>22</b>₅to maintain the required slew rate and path delays while compensating for the excess path length. This approach, however, involves the use of valuable silicon area and power to support the repowering circuits, and may not be sufficient to meet path delay requirements.

0006What is required, therefore, are techniques for maintaining the required wiring slew rates and path delays across an entire IC in the presence of large, fixed macro blocks.

SUMMARY OF THE INVENTION

0007The present invention addresses the above problems during the design of the macros themselves by preparing the macros for anticipated subsequent stage wiring. The wiring and/or silicon whitespace areas of the macro are designed to accommodate the wiring. In that regard, the present invention, in one aspect is related to a method, system and corresponding computer program products (program code and data structures) directed to designing an IC macro, across which subsequent stage wiring is expected to run. A macro destined for the IC is identified, within which whitespace is identified available to facilitate the subsequent stage wiring running across the macro. The whitespace within the macro is designed especially to accommodate the subsequent stage wiring running across the macro.

0008The design of the whitespace of the macro may include rearranging wiring whitespace within the macro into at least one routing track to accommodate the wiring. The routing track may extend from one side of the macro to another side thereof and, to provide for decreased resistances, a width of the routing track may be greater than the minimum wiring width of the IC.

0009During the design of the macro whitespace, silicon whitespace may also be rearranged into circuit areas, optionally corresponding to the rearranged wiring whitespace. The presence of these circuit areas is conveyed through the design process to subsequent stage design, during which active circuits can be “dropped in” to these areas to support the subsequent stage wiring.

0010The whitespace of the macro may also include shielding to shield the wiring from areas of the macro bounding the whitespace. In one particularly unique embodiment of the present invention, the shielding comprises macro power bussing and/or macro wiring arranged to simultaneously effect shielding.

0011Other options for designing the macro whitespace to accommodate the subsequent stage wiring include, for example, designing power bussing in the whitespace for support circuits for the subsequent stage wiring. At least one active circuit may be designed into the whitespace to repower a signal within the wiring. For active circuits, pin areas are also designed in the macro for connection to the active circuit and for connection to the wiring, such that chip level design tools can connect the subsequently placed wiring to these accessible pins. The active circuits may be, e.g., repowering buffers or inverters.

0012In accordance with the present invention, by specially designing the whitespace of the macro to accommodate this subsequent stage wiring, including optional shielding, power bussing and/or active circuits, wiring can be effectively routed across the macro without adverse effects on the slew rate or path delay.

BRIEF DESCRIPTION OF THE DRAWINGS

0013The subject matter which is regarded as the invention is particularly pointed out and distinctly claimed in the concluding portion of the specification. The invention, however, both as to organization and method of practice, together with further objects and advantages thereof, may best be understood by reference to the following detailed description of the preferred embodiment(s) and the accompanying drawings in which:

0014<figref idref="DRAWINGS">FIG. 1</figref> presents the problem to which the present invention is directed, i.e., an integrated circuit requiring wiring routed around a fixed macro block;

0015<figref idref="DRAWINGS">FIG. 2</figref> depicts whitespace of the macro rearranged into routing tracks which may include other pre-designed features such as shielding, power bussing and silicon whitespace optionally corresponding to any tracks, in accordance with the present invention;

0016<figref idref="DRAWINGS">FIG. 3</figref> depicts pre-placed, active circuits in the silicon whitespace of the macro with pins accessible to the IC wiring, in accordance with the present invention;

0017<figref idref="DRAWINGS">FIG. 4</figref> depicts tapered wiring widths across the macro, in accordance with present invention;

0018<figref idref="DRAWINGS">FIG. 5</figref><i>a </i>depicts an exemplary sequence of macro design steps in accordance with the present invention;

0019<figref idref="DRAWINGS">FIG. 5</figref><i>b </i>depicts an exemplary sequence of subsequent stage design steps assuming a completed macro design; and

0020<figref idref="DRAWINGS">FIG. 6</figref> depicts an exemplary data processing system and associated media upon which computer program product implementations of the present invention can be stored and executed.

BEST MODE FOR CARRYING OUT THE INVENTION

0021As discussed above, the present invention is directed to the design of macros destined for implementation within subsequent, hierarchically designed stages of an IC, to accommodate wiring of those subsequent stages run across the macro. <figref idref="DRAWINGS">FIGS. 2–4</figref> depict various embodiments of the macro having areas designed therein to accommodate this wiring.

0022With reference to <figref idref="DRAWINGS">FIG. 2</figref>, shown therein is IC <b>100</b> having macro <b>112</b> designed therein to accommodate wiring paths <b>118</b> and <b>120</b> in accordance with the present invention.

0023Those skilled in the art will recognize that known IC design systems support hierarchical design. For example, an IC design may repeatedly employ any one of a number of pre-designed “off-the-shelf” macros, to repeatedly perform the function for which they were previously designed. An IC design may also involve the sequential design of numerous custom macros having individual functions which, when combined in hierarchical design stages, cooperatively perform the desired IC function. The term “macro” is used broadly herein to connote any hierarchically-designed portion of an IC with circuits and wiring designed therein, having a defined function, and whose design has reached a substantially completed stage as defined within the relevant design system such that the macro is expected to perform its function without any further, significant changes thereto.

0024The present invention is directed to designing the macros to accommodate wiring not necessarily known yet, but which is expected to be run across the macro in subsequent, hierarchically designed stages of the IC. This is especially important for large macros which designers can safely assume will probably interfere with wiring in the subsequent stages, because of their size.

0025In accordance with the present invention, wiring tracks <b>134</b> and <b>144</b> and/or circuit areas <b>139</b> and <b>149</b> have been pre-designed into macro <b>112</b> to accommodate wiring <b>118</b> and <b>120</b> of subsequent hierarchical design stages, while maintaining the requisite slew rate and path delay of the wiring. (The term “across” is used broadly herein to connote any type of traversal of the macro by the wiring including over, under, through, etc. As discussed below, the “whitespace” within the macro designed to accommodate the wiring may have limitations such that straight paths are not possible. Therefore, the routing tracks may not take the straight paths depicted, but may follow circuitous routes “across” the macro.)

0026The wiring tracks <b>134</b> and <b>144</b>, and/or circuit areas <b>139</b> and <b>149</b>, have been designed into the macro by rearranging the remnant whitespace of the macro (e.g., the whitespace areas <b>24</b>₁. . . <b>24</b>₄of macro <b>12</b> of <figref idref="DRAWINGS">FIG. 1</figref>), in accordance with the principles of the present invention.

0027The rearranged whitespace can be wiring whitespace, silicon whitespace, a combination thereof, or any other type of excess space in the macro. Silicon whitespace connotes that which can support actual circuitry, while wiring whitespace connotes any open area on any wiring level in the macro.

0028Wiring tracks <b>134</b>, <b>144</b> are normally comprised of rearranged wiring whitespace, however, additional areas of silicon whitespace can be rearranged into circuit areas <b>139</b> and <b>149</b> corresponding to the rearranged wiring whitespace to support additional, wiring support circuitry (either designed in during macro design, or designed in during subsequent stage design).

0029Alternatively, silicon whitespace can be rearranged into areas <b>139</b> and <b>149</b> alone to support additional, wiring support circuitry (either designed in during macro design, or designed in during higher stage design), without a rearrangement of any wiring whitespace into tracks.

0030The wiring is usually sized at a minimum width as it runs across the IC, for example, section <b>119</b> of wiring <b>118</b>. In accordance with the present invention, routing track <b>134</b> (and the wiring section <b>118</b> through this track) are sized greater than the minimum IC wiring width, and preferably greater than about twice the minimum IC wiring width (e.g., twice the width), to support the proper slew rate and delay across the macro.

0031Additional features can be designed into the macro to support subsequent stage wiring across the macro, in accordance with the present invention. For example, power bussing <b>137</b> and <b>147</b> can be placed into the anticipated wiring areas for support circuitry used to support the wiring. In addition, the routing tracks can be bounded by shielding <b>136</b>, <b>138</b>, <b>146</b>, <b>148</b> between sensitive areas of the macro and the routing tracks to minimize interference between these regions. In one embodiment, this shielding can be implemented with rearranged macro wiring and/or rearranged macro power busing.

0032The need for specially designed areas to support wiring inside macros is especially useful for very large macros, when the semiconductor technology wire definition cannot support routing across these large macro cells due to a combination of resistance and capacitance of the wires. The process of determining the minimum macro width which requires these openings includes examining multiple wire widths, electromigration, and output slew rate limits for a number of different wire lengths and high power level buffers or inverter cells. The high power level buffers or inverter cells typically would be required to cross the large macro cells. Floorplanning can try to reduce the number of critical paths which must cross large macro cells but cannot completely eliminate them. A worst case data switching frequency can be estimated by taking the half expected maximum clock frequency supported by the technology and using this value in the electromigration calculation. These and other calculations can be used to determine the widths of macros likely to require redesigned whitespace for subsequent stage wiring.

0033In addition to, or in place of, the generally “passive” modifications made to the macro set forth in <figref idref="DRAWINGS">FIG. 2</figref>, the principles of the present invention extend to the placement of active circuits in the macro to support the anticipated, subsequent stage wiring in accordance with the present invention.

0034With reference to the IC <b>200</b> and macro <b>212</b> combination of <figref idref="DRAWINGS">FIG. 3</figref>, macro <b>212</b> has pre-designed therein active circuits, e.g., pair <b>238</b>₁and <b>238</b>₂, and pair <b>248</b>₁and <b>248</b>₂. These active circuits (e.g., repowering buffers and/or inverters) include specially placed input and output pins <b>236</b>₁, <b>236</b>₂; and <b>246</b>₁, <b>246</b>₂, respectively. The pins are accessible to design tools during place and route of the subsequent stage wiring. The embedded active circuits, which would be otherwise inaccessible to the subsequent stage wiring, can therefore now be accessed using these pins. (The term “pin” is broadly used herein to connote any conductive area of the circuit to which conductive connections can be made to subsequent stage wiring levels.)

0035These active support circuits can be placed in rearranged silicon whitespace areas <b>230</b>₁, <b>230</b>₂and <b>240</b>₁, <b>240</b>₂, respectively, during the design of the macro, which, as discussed above, can themselves be arranged to correspond to routing tracks <b>234</b> and <b>244</b>, respectively.

0036Alternatively, in a preferred embodiment, support circuits can be placed in the rearranged silicon whitespace areas during the design of the subsequent hierarchical stage. Here, rather than seeing the macro as a fixed block, the design system is alerted to the presence of the rearranged whitespace in the macro and its availability to support circuitry for wiring. Repowering circuits can be designed into this whitespace (e.g., well contacts, latches, buffers and/or inverters). In one embodiment, latches can be designed, possibly in series across the length of the wiring path, for multi-cycle propagation of a signal across the wiring path. Pre-placed powering can be used for these circuits (e.g., bussing <b>137</b>, <b>147</b> of <figref idref="DRAWINGS">FIG. 2</figref>), or additional power can be routed.

0037In another embodiment of the present invention, with reference to the IC <b>300</b> and macro <b>312</b> combination of <figref idref="DRAWINGS">FIG. 4</figref>, routing tracks <b>334</b> and <b>344</b> can be sized to hold tapered versions of wiring sections <b>318</b> and <b>320</b>, respectively. This subsequent stage wiring can be tapered from larger to smaller sections thereof, to improve the RC response of the wiring. As is known to those skilled in the art, the wiring is narrowed to about the IC minimum width if tapping into circuit areas <b>330</b> or <b>340</b> for repowering or latching, as discussed above. The tapering can either be continuous in nature, such as that depicted in <figref idref="DRAWINGS">FIG. 4</figref>, or can be discretely stepped.

0038The macro design steps of the present invention are depicted in flow diagram <b>1000</b> of <figref idref="DRAWINGS">FIG. 5</figref><i>a</i>. In Step <b>1010</b>, a macro is identified which is destined to be used during subsequent hierarchical design stages, followed by Step <b>1020</b> in which the design of the macro is initiated. In Step <b>1030</b>, whitespace is identified within the macro available to facilitate subsequent stage wiring requirements across the macro, which may be known to varying degrees during this macro design process. This whitespace is usually remnant white space spread throughout the macro, such as areas <b>24</b> of <figref idref="DRAWINGS">FIG. 1</figref>. This whitespace is then designed to facilitate subsequent stage wiring in Step <b>1040</b> including any one or any combination of the following options: <ul id="ul0001" list-style="none"><li id="ul0001-0001" num="0000"><ul id="ul0002" list-style="none"><li id="ul0002-0001" num="0039">Rearranging the wiring whitespace into routing tracks (Step <b>1050</b>);</li><li id="ul0002-0002" num="0040">Rearranging the silicon whitespace into circuit areas, optionally corresponding to the rearranged wiring whitespace (Step <b>1060</b>);</li><li id="ul0002-0003" num="0041">Shielding the whitespace with, e.g., macro power bussing and/or macro wiring rearranged into shielding areas (Step <b>1070</b>);</li><li id="ul0002-0004" num="0042">Supplying power to the whitespace with power bussing (Step <b>1080</b>); and</li><li id="ul0002-0005" num="0043">Inserting active circuits with accessible pins in the whitespace (Step <b>1090</b>).</li></ul></li></ul>

0044As stated above, any one of these design options can be invoked, or any combination thereof, in accordance with the principles of the present invention.

0045With reference to the subsequent stage design sequence <b>2000</b> of <figref idref="DRAWINGS">FIG. 5</figref><i>b</i>, design of this stage is initiated (Step <b>2010</b>), assuming the presence of the designed macro of <figref idref="DRAWINGS">FIG. 5</figref><i>a</i>. The designed whitespace in the macro is then used to facilitate subsequent stage wiring across the macro (Step <b>2020</b>). Optionally, in Step <b>2030</b>, active circuits are designed (“dropped”) into the silicon whitespace rearranged in accordance with any or all of Steps <b>1050</b>–<b>1090</b> of the macro design sequence of <figref idref="DRAWINGS">FIG. 5</figref><i>a. </i>

0046At this point, the design of the IC may be completed (Step <b>2040</b>), and the IC is implemented and produced with the macro embedded therein, having the subsequent stage wiring running across the macro (Step <b>2050</b>).

0047With reference to <figref idref="DRAWINGS">FIG. 6</figref>, the present invention can be implemented as a design tool/computer program product for execution on, for example, the computer workstation <b>3000</b>. In this implementation, the executable code and related macro/IC design data structures can be stored on any type of computer media <b>3010</b>.

0048By pre-designing macros in anticipation of subsequent stage wiring requirements, greater flexibility is provided during the design of the subsequent stage, and slew rate and path delay requirements (timing closure) is greatly facilitated.

0049While the invention has been particularly shown and described with reference to preferred embodiment(s) thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention.