Electrode configuration in a MEMS switch
Summary by NHIP
MEMS switch with segmented contacts
The MEMS switch includes a signal contact with input and output segments separated by an actuation electrode. A beam engages the signal contact, while inner and outer pads connect via a substrate surface to a connecting pad below that surface.
Claim Score by NHIP
Abstract
A microelectromechanical system (MEMS) switch that includes a signal contact, an actuation electrode and a beam that engages the signal contact when a voltage is applied to the actuation electrode. The signal contact includes a first portion and a second portion. The actuation electrode is positioned between the first and second portions of the signal contact.

Term
Term ended
Expired 18 August 2022, 4.1 years ago.
- Priority and filed
- Granted
- Expired
- Today
20 claims: 3 independent, 17 dependent
- 1Broadest claimClaim Score 87, broad(NHIP)A MEMS switch comprising:a signal contact including an input contact, an output contact and two segments that electrically connect the input contact to the output contact;an actuation electrode positioned between the two segments;and a beam that engages the signal contact when a voltage is applied to the actuation electrode.
- 12A MEMS switch comprising:a substrate including a surface;a signal contact on the surface the substrate, the signal contact including an input contact, an output contact and two segments that electrically connect the input contact to the output contact;an actuation electrode including an inner pad positioned under the beam between the two segments of the signal contact and at least one outer pad positioned under the beam outside the two segments of the signal contact;and a beam that engages the signal contact when a voltage is applied to the actuation electrode.
- 17A MEMS switch comprising:a substrate including a surface;a signal contact on the surface the substrate, the signal contact including an input contact, an output contact and two segments that electrically connect the input contact to the output contact;an actuation electrode including an inner pad positioned under the beam between the two segments of the signal contact and at least one outer pad positioned under the beam outside the two segments of the signal contact, the inner pad being electrically coupled to the at least one outer pad by a connecting pad positioned below the surface of the substrate;and p 1 a beam that engages the signal contact when a voltage is applied to the actuation electrode.
Independent claims3
52 paragraphs in 4 sections, as filed
TECHNICAL FIELD
Microelectromechanical systems (MEMS), and in particular to MEMS switches that have an improved electrode configuration.
BACKGROUND
A microelectromechanical system (MEMS) is a microdevice that integrates mechanical and electrical elements on a common substrate using microfabrication technology. The electrical elements are formed using known integrated circuit fabrication techniques, while the mechanical elements are fabricated using lithographic techniques that selectively micromachine portions of a substrate. Additional layers are often added to the substrate and then micromachined until the MEMS device is in a desired configuration. MEMS devices include actuators, sensors, switches, accelerometers, and modulators.
MEMS switches have intrinsic advantages over conventional solid-state counterparts such as field-effect transistor switches. The advantages include low insertion loss and excellent isolation. However, MEMS switches are generally much slower than solid-state switches. This speed limitation precludes applying MEMS switches in certain technologies, such as wireless communications, where sub-microsecond switching is required.
One type of MEMS switch includes a suspended connecting member, or beam, that is electrostatically deflected by energizing an actuation electrode. The deflected beam engages one or more electrical contacts to establish an electrical connection between isolated contacts. A beam anchored at one end while suspended over a contact at the other end is called a cantilevered beam. A beam anchored at opposite ends and suspended over one or more electrical contacts is called a bridge beam.
<figref idref="DRAWINGS">FIGS. 1-3</figref> illustrate a prior art MEMS switch <b>10</b> that includes a bridge beam <b>12</b>. Beam <b>12</b> is made up of structural portions <b>14</b> and a flexing portion <b>16</b>. MEMS switch <b>10</b> further includes a pair of actuation electrodes <b>18</b>A, <b>18</b>B and a pair of signal contacts <b>20</b>A, <b>20</b>B that are each mounted onto a base <b>22</b>.
Beam <b>12</b> is mounted to base <b>22</b> such that flexing portion <b>16</b> of beam <b>12</b> is suspended over actuation electrodes <b>18</b>A, <b>18</b>B and signal contacts <b>20</b>A, <b>20</b>B. Signal contacts <b>20</b>A, <b>20</b>B are not in electrical contact until a voltage is applied to the actuation electrodes <b>18</b>A, <b>18</b>B. As shown in <figref idref="DRAWINGS">FIG. 2</figref>, applying a voltage to actuation electrodes <b>18</b>A, <b>18</b>B causes the flexing portion <b>16</b> of beam <b>12</b> to move down until protuberances <b>21</b> on the flexing portion <b>16</b> engage signal contacts <b>20</b>A, <b>20</b>B to electrically connect signal contacts <b>20</b>A, <b>20</b>B. In other types of MEMS switches, signal contacts <b>20</b>A, <b>20</b>B are always electrically connected such that beam <b>12</b> acts as a shunt when beam <b>12</b> engages signal contacts <b>20</b>A, <b>20</b>B.
One drawback associated with MEMS switch <b>10</b> is that there is significant resistance between protuberances <b>21</b> on beam <b>12</b> and the pads that form signal contacts <b>20</b>A, <b>20</b>B. The considerable resistance between protuberances <b>21</b> and signal contacts <b>20</b>A, <b>20</b>B causes excessive insertion losses within MEM switch <b>10</b>.
<figref idref="DRAWINGS">FIGS. 4 and 5</figref> illustrate another prior art MEMS switch <b>30</b> that includes a bridge beam <b>32</b>. MEMS switch <b>30</b> is similar to MEMS switch <b>10</b> in <figref idref="DRAWINGS">FIG. 1</figref> in that MEMS switch <b>30</b> also includes a beam <b>32</b> that is made up of structural portions <b>34</b> and a flexing portion <b>36</b>. MEMS switch <b>30</b> similarly includes a pair of actuation electrodes <b>38</b>A, <b>38</b>B and a pair of signal contacts <b>40</b>A, <b>40</b>B that are each mounted onto a base <b>42</b>. Flexing portion <b>36</b> of beam <b>32</b> is suspended over actuation electrodes <b>38</b>A, <b>38</b>B and signal contacts <b>40</b>A, <b>40</b>B such that when a voltage is applied to actuation electrodes <b>38</b>A, <b>38</b>B, multiple protuberances <b>41</b> on flexing portion <b>36</b> move downward to engage signal contacts <b>40</b>A, <b>40</b>B.
MEMS switch <b>30</b> attempts to address the resistance problems associated with MEMS switch <b>10</b> by using more protuberances <b>41</b> on beam <b>32</b>. The drawback with adding additional protuberances is that only a few of the protuberances <b>41</b> actually establish good electrical contact with signal contacts <b>20</b>A, <b>20</b>B. The remaining protuberances are in poor electrical contact with signal contacts <b>20</b>A, <b>20</b>B or do not even engage signal contacts <b>20</b>A, <b>20</b>B. Therefore, MEMS switch <b>30</b> still has considerable insertion loss.
<figref idref="DRAWINGS">FIGS. 6 and 7</figref> illustrate a more recent prior art MEMS switch <b>50</b> that includes a bridge beam <b>52</b>. MEMS switch <b>50</b> is similar to MEMS switches <b>10</b>, <b>30</b> in <figref idref="DRAWINGS">FIGS. 1-4</figref> in that MEMS switch <b>50</b> also includes a beam <b>52</b> that is made up of structural portions <b>54</b> and a flexing portion <b>56</b>. MEMS switch <b>50</b> includes an actuation electrode <b>58</b> that is positioned below a surface <b>61</b> of base <b>66</b>. Actuation electrode <b>58</b> extends below a pair of signal contacts <b>60</b>A, <b>60</b>B that are each mounted onto base <b>66</b>. Signal contacts <b>60</b>A, <b>60</b>B include projections <b>62</b> that extend from respective bodies <b>63</b>. The flexing portion <b>56</b> of beam <b>52</b> is suspended over projections <b>62</b> such that when actuation electrode <b>58</b> applies a voltage, multiple protuberances <b>65</b> on flexing portion <b>56</b> move downward to engage projections <b>62</b>.
Placing actuation electrode <b>58</b> under projections <b>62</b> surrounds each protuberance <b>65</b> with pulling force when a voltage is applied to actuation electrodes <b>58</b>. The space between projections <b>62</b> on each signal contact <b>60</b>A, <b>60</b>B further enhances the surrounding effect of the force generated by actuation electrode <b>58</b>.
During operation of MEMS switch <b>50</b>, the pulling force surrounding each protuberance <b>65</b> facilitates contact between each protuberance <b>65</b> and signal contacts <b>60</b>A, <b>60</b>B. The improved contact between protuberances <b>65</b> and signal contacts <b>60</b>A, <b>60</b>B minimizes insertion loss within MEMS switch <b>50</b>.
One drawback associated with MEMS switch <b>50</b> is a greater distance between actuation electrode <b>58</b> and beam <b>52</b> as compared to other MEMS switches. The increased distance between actuation electrode <b>58</b> and beam <b>52</b> requires a much larger actuation voltage to be applied to actuation electrode <b>58</b> in order to manipulate beam <b>52</b>. Increased actuation voltage is undesirable because more equipment and/or power are required to operate MEMS switch <b>50</b>. The necessary additional equipment and power are especially problematic when MEMS switches are used in portable electronic devices powered by batteries.
BRIEF DESCRIPTION OF THE DRAWINGS
<figref idref="DRAWINGS">FIG. 1</figref> illustrates a prior art MEMS switch.
<figref idref="DRAWINGS">FIG. 2</figref> illustrates the prior art MEMS switch of <figref idref="DRAWINGS">FIG. 1</figref> during operation.
<figref idref="DRAWINGS">FIG. 3</figref> is a top view of the prior art MEMS switch shown <figref idref="DRAWINGS">FIG. 1</figref> with portions removed and portions shown in phantom.
<figref idref="DRAWINGS">FIG. 4</figref> illustrates another prior art MEMS switch.
<figref idref="DRAWINGS">FIG. 5</figref> is a top view of the prior art MEMS switch shown <figref idref="DRAWINGS">FIG. 4</figref> with portions removed and portions shown in phantom.
<figref idref="DRAWINGS">FIG. 6</figref> illustrates anther prior art MEMS switch.
FIG. <b>7</b>. is a top view of the prior art MEMS switch shown <figref idref="DRAWINGS">FIG. 6</figref> with portions removed and portions shown in phantom.
<figref idref="DRAWINGS">FIG. 8</figref> illustrates a MEMS switch.
<figref idref="DRAWINGS">FIG. 9</figref> is a top view of the MEMS switch shown <figref idref="DRAWINGS">FIG. 8</figref> with portions removed and portions shown in phantom.
<figref idref="DRAWINGS">FIG. 10</figref> illustrates another MEMS switch.
<figref idref="DRAWINGS">FIG. 11</figref> is a top view of the MEMS switch shown <figref idref="DRAWINGS">FIG. 10</figref> with portions removed and portions shown in phantom.
<figref idref="DRAWINGS">FIG. 12</figref> illustrates another MEMS switch.
<figref idref="DRAWINGS">FIG. 13</figref> is a top view of the MEMS switch shown <figref idref="DRAWINGS">FIG. 12</figref> with portions removed and portions shown in phantom.
<figref idref="DRAWINGS">FIG. 14</figref> is a block diagram of an electronic system incorporating at least one MEMS switch.
DETAILED DESCRIPTION
In the following detailed description reference is made to the accompanying drawings in which is shown by way of illustration specific embodiments. These embodiments are described in sufficient detail to enable those skilled in the art to practice the embodiments of invention. Other embodiments may be utilized and/or changes made to the illustrated embodiments.
<figref idref="DRAWINGS">FIGS. 8 and 9</figref> show a MEMS switch <b>70</b>. MEMS switch <b>70</b> includes a substrate <b>72</b> with an upper surface <b>74</b>. The substrate <b>72</b> may be part of a chip or any other electronic device. An actuation electrode <b>76</b> and a signal contact <b>78</b> are formed on the upper surface <b>74</b> of substrate <b>72</b>. The actuation electrode <b>76</b> and signal contact <b>78</b> are electrically connected with other electronic components via conducting traces in the substrate <b>72</b>, or through other conventional means.
Switch <b>70</b> further includes a bridge beam <b>80</b> having a flexible portion <b>82</b> supported at both ends by structural portions <b>84</b>. It should be noted that in alternative embodiments, beam <b>80</b> is suspended over substrate <b>72</b> in a cantilevered fashion. Beam <b>80</b> is suspended over actuation electrode <b>76</b> with a gap <b>77</b> between the actuation electrode <b>76</b> and beam <b>80</b>. Gap <b>77</b> is sized so that the actuation electrode <b>76</b> is in electrostatic communication with beam <b>80</b>.
Beam <b>80</b> is suspended over at least a portion of the signal contact <b>78</b> such that gap <b>77</b> is also between beam <b>80</b> and signal contact <b>78</b>. In one embodiment, gap <b>77</b> is anywhere from 0.5 to 2 microns.
MEMS switch <b>80</b> operates by applying a voltage to actuation electrode <b>76</b>. The voltage creates an attractive electrostatic force between actuation electrode <b>76</b> and beam <b>80</b> that deflects beam <b>80</b> toward the actuation electrode <b>76</b>. Beam <b>80</b> moves toward substrate <b>72</b> until protuberances <b>81</b> on beam <b>80</b> engage signal contact <b>78</b> to establish an electrical connection between beam <b>80</b> and signal contact <b>78</b>. In some embodiments, beam <b>80</b> engages signal contact <b>78</b> directly.
Actuation electrode <b>76</b> is positioned between at least two portions of signal contact <b>78</b> such that the attractive force generated by actuation electrode <b>76</b> encompasses more of the area surrounding each protuberance <b>81</b>. In some embodiments, actuation electrode <b>76</b> is positioned between a first portion and a second portion of signal contact <b>78</b>. Surrounding more of the area around each protuberance <b>81</b> with the attractive force that is generated by actuation electrode <b>76</b> facilitates engaging each protuberance <b>81</b> with signal contact <b>78</b> during operation of switch <b>70</b>. In addition, the gap <b>77</b> between actuation electrode <b>76</b> and beam <b>80</b> is relatively small such that a relatively low actuation voltage is required to operate switch <b>70</b>.
In the sample embodiment illustrated in <figref idref="DRAWINGS">FIGS. 8 and 9</figref>, signal contact <b>78</b> includes an input contact <b>85</b>A and an output contact <b>85</b>B. Each of the input and output contacts <b>85</b>A, <b>85</b>B includes a body <b>86</b> with projections <b>87</b> extending from the respective bodies <b>86</b>. Projections <b>87</b> are positioned under beam <b>80</b> in alignment with protuberances <b>81</b>.
Actuation electrode <b>76</b> includes outer pads <b>90</b> that are positioned under beam <b>80</b> on both sides of signal contact <b>78</b>. The outer pads <b>90</b> are connected by an inner pad <b>91</b> that extends between projections <b>87</b> on input and output contacts <b>85</b>A, <b>85</b>B.
Although input and output contacts <b>85</b>A, <b>85</b>B are shown with three projections <b>87</b> extending from each body <b>86</b> any number of projections may extend from the bodies <b>86</b>. In addition, in some embodiments projections may extend from only one body <b>86</b>.
<figref idref="DRAWINGS">FIGS. 10 and 11</figref> illustrate another MEMS switch <b>100</b>. MEMS switch <b>100</b> includes a beam <b>110</b> that is similar to beam <b>80</b> described above. A signal contact <b>102</b> is mounted onto an upper surface <b>103</b> of a substrate <b>104</b>. The signal contact includes an input contact <b>106</b> and an output contact <b>108</b>. The input and output contacts <b>106</b>, <b>108</b> are connected by segments <b>107</b> that are at least partly positioned below beam <b>110</b>.
Beam <b>110</b> is electrostatically deflected by an actuation electrode <b>112</b> so that protuberances <b>113</b> on beam <b>110</b> engage segments <b>107</b> on signal contact <b>102</b> to establish an electrical connection between beam <b>110</b> and signal contact <b>102</b>. When beam <b>110</b> is engaged with signal contact <b>102</b>, beam <b>110</b> serves as a shunt for any electric signal passing through signal contact <b>102</b>. Actuation electrode <b>112</b> includes inner pads <b>114</b>B that are each positioned between pairs of segments <b>107</b> on signal contact <b>102</b>, and outer pads <b>114</b>A that are positioned outside segments <b>107</b>. In other example embodiments, signal contact <b>102</b> includes two segments and actuation electrode <b>112</b> includes a single pad between the two segments.
Inner and outer pads <b>114</b>A, <b>114</b>B are electrically coupled together by a connecting pad <b>115</b> that is positioned below upper surface <b>103</b> of substrate <b>104</b>. Connecting pad <b>115</b> extends below inner and outer pads <b>114</b>A, <b>114</b>B and segments <b>107</b>. Vias <b>116</b> electrically couple connecting pad <b>115</b> to inner and outer pads <b>114</b>A, <b>114</b>B. Since connecting pad <b>115</b> is also positioned below beam <b>110</b>, connecting pad <b>115</b> supplements the actuating force applied by the inner and outer pads <b>114</b>A, <b>114</b>B during operation of MEMS switch <b>100</b>.
<figref idref="DRAWINGS">FIGS. 12 and 13</figref> illustrate another MEMS switch <b>130</b>. MEMS switch <b>130</b> includes a beam <b>140</b> that is similar to beams <b>80</b>, <b>110</b> described above. A signal contact <b>132</b> is mounted onto an upper surface <b>133</b> of substrate <b>134</b>. Signal contact <b>132</b> includes an input contact <b>136</b> and an output contact <b>138</b>. Input and output contacts <b>136</b>, <b>138</b> are connected by segments <b>137</b> that are at least partly positioned below beam <b>110</b>.
Beam <b>140</b> is electrostatically deflected by an actuation electrode <b>142</b> so that beam <b>140</b> directly engages signal contact <b>132</b> to establish an electrical connection between beam <b>140</b> and signal contact <b>132</b>. Actuation electrode <b>142</b> includes outer pads <b>144</b>A that are positioned outside segments <b>137</b> and inner pads <b>144</b>B that are each positioned between a unique pair of segments <b>137</b> on signal contact <b>132</b>.
Inner and outer pads <b>144</b>A, <b>144</b>B are electrically coupled together by a connecting pad <b>145</b> that is positioned below upper surface <b>133</b> of substrate <b>134</b>. Inner pads <b>144</b>B are only partially positioned between segments <b>137</b> because segments <b>137</b> are raised slightly above the level of pads <b>144</b>A, <b>144</b>B. Since segments <b>137</b> in signal contact <b>132</b> are slightly above pads <b>144</b>A, <b>144</b>B that make up actuation electrode <b>142</b>, there is no need for protuberances to placed on beam <b>140</b>.
Input and output contacts <b>136</b>, <b>138</b>, and inner and outer pads <b>144</b>A, <b>144</b>B may be covered by a dielectric layer <b>149</b>. Adding dielectric layer <b>149</b> is especially effective when MEMS switch <b>130</b> is acting as a high frequency capacitive shunt switch. In other example embodiments, dielectric layer <b>149</b> may cover only a portion of signal contact <b>132</b> and/or actuation electrode <b>142</b>.
In any embodiment, the height of any actuation electrode may be less than that of any signal contact so that the beam does not engage the actuation electrode when the beam is deflected. The actuation electrodes and signal contacts may be arranged perpendicular to the longitudinal axis of the beam, parallel to the longitudinal axis of the beam, or have any configuration that facilitates efficient switching. The beam may also have any shape as long as the shape is adequate for a particular application.
MEMS switches provide superior power efficiency, low insertion loss and excellent isolation. Any of the MEMS switches or alternatives described above are highly desirable because they are readily integrated onto a substrate that may be part of another device such as filters or CMOS chips. The tight integration of the MEMS switches reduces power loss, parasitics, size and costs.
<figref idref="DRAWINGS">FIG. 14</figref> is a block diagram of an electronic system <b>150</b> incorporating at least one MEMS switch <b>151</b>, such as MEMS switches <b>70</b>, <b>100</b>, <b>130</b> illustrated in <figref idref="DRAWINGS">FIGS. 7-13</figref>. Electronic system <b>150</b> may be a computer system that includes a system bus <b>152</b> to electrically couple the various components of electronic system <b>150</b>. System bus <b>152</b> may be a single bus or any combination of busses.
MEMS switch <b>151</b> may be part of an electronic assembly <b>153</b> that is coupled to system <b>152</b>. In one embodiment, electronic assembly <b>153</b> includes a processor <b>156</b> which can be of any type. As used herein, processor means any type of circuit such as, but not limited to, a microprocessor, a microcontroller, a graphics processor or a digital signal processor.
Other types of circuits that can be included in electronic assembly <b>153</b> are a custom circuit or an application-specific integrated circuit, such as communications circuit <b>157</b> for use in wireless devices such as cellular telephones, pagers, portable computers, two-way radios, and similar electronic systems.
The electronic system <b>150</b> may also include an external memory <b>160</b> that in turn may include one or more memory elements suitable to the particular application, such as a main memory <b>162</b> in the form of random access memory (RAM), one or more hard drives <b>164</b>, and/or one or more drives that handle removable media <b>166</b>, such as floppy diskettes, compact disks (CDs) and digital video disks (DVDs).
The electronic system <b>150</b> may also include a display device <b>168</b>, a speaker <b>169</b>, and a controller <b>170</b>, such as a keyboard, mouse, trackball, game controller, microphone, voice-recognition device, or any other device that inputs information into the electronic system <b>150</b>.
MEMS switch <b>151</b> can be implemented in a number of different forms, including an electronic package, an electronic system, a computer system, one or more methods of fabricating an electronic package, and one or more methods of fabricating an electronic assembly that includes the package.
<figref idref="DRAWINGS">FIGS. 7-13</figref> are representational and are not necessarily drawn to scale. Certain proportions thereof may be exaggerated, while others may be minimized.
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16 members in 9 offices
Priority claims2
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| EP1529300A1 | European Patent Office (EPO) | A1 | |
| JP2005536029A | Japan | A | |
| US6972650B2 | United States of America | B2 | |
| CN1842884A | China | A | |
| EP1529300B1 | European Patent Office (EPO) | B1 | |
| MY134267A | Malaysia | A | |
| DE60317680D1 | Germany | D1 | |
| JP4076536B2 | Japan | B2 | |
| TWI307676B | Taiwan Province of China | B | |
| CN1842884B | China | B |
45 transactions on the USPTO file
Allowed after 2 non-final rejections.
- Non-final rejections
- 2
- Final rejections
- 0
- RCEs
- 0
- Appeals
- 0
Over time
Point at a mark for the transactionTransactions
| Event | Code | |
|---|---|---|
| Expire PatentEXP. | EXP. | |
| Recordation of Patent Grant MailedPGM/ | PGM/ | |
| Patent Issue Date Used in PTA CalculationAllowedPTAC | PTAC | |
| Issue Notification MailedAllowedWPIR | WPIR | |
| Receipt into PubsR1021 | R1021 | |
| Dispatch to FDCD1935 | D1935 | |
| Application Is Considered Ready for IssuePILS | PILS | |
| Receipt into PubsR1021 | R1021 | |
| Mail Miscellaneous Communication to ApplicantMM327 | MM327 | |
| Issue Fee Payment VerifiedN084 | N084 | |
| Issue Fee Payment ReceivedIFEE | IFEE | |
| Miscellaneous Communication to Applicant - No Action CountM327 | M327 | |
| Receipt into PubsR1021 | R1021 | |
| Workflow - File Sent to ContractorSENT | SENT | |
| Mail Notice of AllowanceAllowedMN/=. | MN/=. | |
| Notice of Allowance Data Verification CompletedAllowedN/=. | N/=. | |
| Date Forwarded to ExaminerFWDX | FWDX | |
| Response after Non-Final ActionA... | A... | |
| Workflow incoming amendment IFWWAMD | WAMD | |
| Mail Non-Final RejectionNon-final rejectionMCTNF | MCTNF | |
| Non-Final RejectionNon-final rejectionCTNF | CTNF | |
| Date Forwarded to ExaminerFWDX | FWDX | |
| Reference capture on IDSRCAP | RCAP | |
| Response after Non-Final ActionA... | A... | |
| Information Disclosure Statement (IDS) Filed | – | |
| Information Disclosure Statement (IDS) Filed | – | |
| Workflow incoming amendment IFWWAMD | WAMD | |
| Mail Non-Final RejectionNon-final rejectionMCTNF | MCTNF | |
| Non-Final RejectionNon-final rejectionCTNF | CTNF | |
| Date Forwarded to ExaminerFWDX | FWDX | |
| Response to Election / Restriction FiledELC. | ELC. | |
| Mail Restriction RequirementMCTRS | MCTRS | |
| Restriction/Election RequirementCTRS | CTRS | |
| Correspondence Address ChangeC.ADB | C.ADB | |
| Case Docketed to Examiner in GAUDOCK | DOCK | |
| IFW TSS Processing by Tech Center CompleteTSSCOMP | TSSCOMP | |
| Case Docketed to Examiner in GAUDOCK | DOCK | |
| Application Dispatched from OIPEOIPE | OIPE | |
| Application Is Now CompleteCOMP | COMP | |
| Cleared by L&R (LARS) | – | |
| IFW Scan & PACR Auto Security Review | – | |
| IFW Scan & PACR Auto Security Review | – | |
| Information Disclosure Statement (IDS) Filed | – | |
| Information Disclosure Statement (IDS) Filed | – | |
| Initial Exam Team nnIEXX | IEXX |
11 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Lapsed due to failure to pay maintenance feeLapsedFP | FP | |
| Information on status: patent discontinuationPATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362STCH | STCH | |
| Information on status: patent discontinuationPATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362STCH | STCH | |
| Lapse for failure to pay maintenance feesLapsedLAPS | LAPS | |
| Maintenance fee reminder mailedREMI | REMI | |
| Fee paymentFPAY | FPAY | |
| Surcharge for late paymentSULP | SULP | |
| Maintenance fee reminder mailedREMI | REMI | |
| Fee paymentFPAY | FPAY | |
| Fee payment procedurePAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITYFEPP | FEPP | |
| AssignmentAS | AS |
Numbers
- Publication
- 06850133
- Publication, DOCDB
- 6850133
- Publication, EPODOC
- US6850133
- Application
- 10219013
- Application, DOCDB
- 21901302
- Application, EPODOC
- US20020219013
Titles
- English
- Electrode configuration in a MEMS switch
Patent term adjustment
- A delay
- +8 daysthe office missed an examination deadline
- Applicant delay
- −4 days
- Net adjustment
- 4 days
Classification
- CPC, 1
- H01H59/0009
- IPC, 2
- B81B3 00
- H01H59 00
- USPC, 2
- 335078000
- 200181000