US2885784A

Apparatus for pattern grading of wearing apparel

Abstract

This record has no abstract on file.

US2885784A, drawing sheet 1
Sheet 1 of 5

Term

Term ended

Expired 12 May 1976, 50.4 years ago.

  1. Priority and filed
  2. Granted
  3. Expired
  4. Today

6 claims: 6 independent, 0 dependent

  1. 1
    Having thus described my invention, I claim as new and desire to secure by Letters Patent:1. A pattern size grading apparatus comprising a frame base, a carrier mounted for selective positioning with respect to said base having a portion for releasably securing a master pattern piece to move therewith beyond said frame base, said master pattern piece having a series of designated points arranged at spaced distances around the periphery thereof in sufficient number to define the contour of the pattern when connected by substantially straight lines, and a series of predetermined carrier positioning indicia carried by a portion of the frame base, each of said indicia corresponding to one of said designated points on the master pattern piece whereby the carrier is aligned successively with each index to determine the position of the designated points defining the contour of the next size pattern.
  2. 2
    The pattern size grading apparatus defined in claim 1 in which the portion of said frame base carrying said indicia is of demountable construction for interchanging with other portions having indicia corresponding to other master pattern pieces.
  3. 3
    The pattern size grading apparatus defined in claim 1 m which said portion of the frame base carrying the indicia is a demountable control plate, said plate having openings serving as said indicia, and pin means carried by said carrier for engaging in each of said plate openings to effectuate said alignment thereof.
  4. 4
    The pattern size grading apparatus defined in claim 1 in which said portion of the frame base carrying the indicia is a demountable control plate, said plate having openings serving as said indicia, pin means carried by said carrier for engaging in each of said plate openings to effectuate said alignment thereof and additional control plates each having indicia corresponding to other master pattern pieces for forming a complete pattern
  5. 5
    The pattern size grading apparatus defined in Haim 2.885,784 1 in which said series of predetermined carrier positioning indicia are formed as spaced apart openings, and pin means carried by said carrier for engaging in each of said openings to effectuate said alignment thereof.
  6. 6
    The pattern size grading apparatus defined in claim 1 in which' said series of predetermined carrier positioning indicia are formed as spaced apart openings, pin means carried by said carrier for engaging in each of said openings to effectuate said alignment thereof, and a grooved track extending to interconnect said openings for guiding said pin riding therein from opening to opening when moving the carrier with respect to said base. References Cited in the file of this patent UNITED STATES PATENTS 1,635,300 Abrams et al.--------- July 12, 1927 2,569,265 Sudhoff___________— Sept. 25, 1951 2,589,105 Maiocchi-------------Mar. 11,1952 2,689,402 Breitbart —------- Sept. 21,1954 10 2,711,588 Ingram---------------June 28,1955