Method of fabricating contact plug

CROSS REFERENCE TO RELATED APPLICATIONS

P-0001[0001] This application claims the priority benefit of Taiwan application serial no. 91107694, filed on May 16, 2002.

BACKGROUND OF THE INVENTION

P-0002[0002] 1. Field of Invention

P-0003[0003] The present invention relates generally to semiconductors and more specifically to a method for fabricating contact plug.

P-0004[0004] 2. Description of Related Art

P-0005[0005] Integrated circuits are manufactured as assemblies of the various devices, such as transistors that make up a chip and many chips are included on a single wafer. In the process of manufacturing integrated circuits, after the individual devices, such as the transistors, have been fabricated in the silicon substrate, they must be connected together to perform the desired circuit functions. This connection process is generally called “metallization”, and is performed using a number of different photolithographic and deposition techniques.

P-0006[0006] The contact plugs are formed to make a solid electrical connection between the underlying device and the overlying interconnection conductive line The fabrication of contact typically involves forming an opening in a dielectric layer and the opening is filled or “plugged” with a metallic layer, such as aluminum or tungsten. However, aluminum or tungsten ions from the contact can migrate into a silicon substrate through a doped region, causing a short to the substrate. To minimize this shorting, some processing techniques deposit a barrier layer before depositing the aluminum or tungsten. One type of barrier material is TiN. While TiN has a good barrier ability, but it needs to be thick enough to effectively function as a barrier layer. Furthermore, as integrated circuit devices are defined more finely, diameter of the contact shrinks and becomes more critical. Thus, thick TiN barrier metal layer is less desirable in high integrated circuits. It has been found that nitride in TiN improves the barrier function, in other words, as the nitride content in TiN increases, the barrier effect also increases. One approach is to implant nitrogen into TiN in order to increase the barrier effect and reduce the thickness of the TiN barrier metal layer in order to meet high integrated structure requirement. One method for implanting the nitrogen into TiN is to perform a nitrogen plasma treatment in an atmosphere of hydrogen gas. Now it is possible to form thinner TiN barrier metal layers meeting the high integrated circuit requirement.

P-0007[0007] Another commonly used barrier metal layer is formed from metal organic CVD titanium nitride (MOCVD-TiN). Inherently, the MOCVD-TiN material contains impurities such as carbon and oxides, therefore the resistance of MOCVD-TiN material is high. In order to reduce the resistance, one method is to remove these impurities by treating the said barrier layer with a plasma gas containing an atmosphere of nitrogen. However, following the plasma gas treatment, the thickness of the MOCVD-TiN is substantially reduced, consequently, the treated MOCVD-TiN layer so formed has comparatively lower resistance but however the thickness is not adequate to function as a barrier layer effectively.

P-0008[0008] The effectiveness of the contact is limited by the contact resistance between the barrier metal layer and the doped regions in the substrate. This contact resistance is greater for positively doped regions than for negatively doped regions. Contact resistance is of particular concern in CMOS (complementary metal-oxide-silicon) technology, which includes barrier metal contacts with positively doped regions as well as with negatively doped region. One approach to reduce the contact resistance is to deposit a conformal refractory metal layer into the opening and then annealing the refractory metal layer by performing a thermal process in order to effect a reaction between the metal and the silicon atoms to form metal-silicide. Since metal-silicide has a low resistance, consequently the contact resistance can be reduced. However, one problem with the above conventional contact plug scheme is that the resulting barrier layer following the thermal process offers poor adhesion between the dielectric layer and the tungsten layer.

P-0009[0009] Applicants have found out that during the thermal process, the oxygen from the ambient reacts with the barrier metal layer to form an oxide film on the surface of the contact barrier metal layer. One problem with the oxide film so formed is, they have a zeta potential value approximately same as the tungsten layer which is commonly used for filling into the contact opening. Because of the similar zeta potential value of the barrier metal layer and the tungsten layer, they tend to repel from each other.

P-0010[0010] Therefore, the oxide film formed on the barrier metal layer prevents the tungsten layer from adhering onto the surface of the barrier metal layer. Consequently voids are formed within the tungsten layer leading to electromigration failure. Because the oxide film has a poor adhesion property due to zeta potential, adhesion between the dielectric layer and the tungsten layer in the contact is poor. As difference in thermal coefficient of expansion between conductive layer such as tungsten and the dielectric layer is large, therefore during the subsequent thermal process, the thermal stress due to thermal expansion is large. Consequently, the conventional barrier metal layer is not strong enough to resist the thermal expansion and are fractured. Consequently, because the barrier metal layer structure is damaged, it promotes the diffusion of ions or atoms from the conductive layer such as aluminum or tungsten atoms into the substrate, causing shorting of device. Because the lattice structure of the conductive layer has been damaged, it promotes voids formation due to electromigration causing total failure of device.

P-0011[0011] Therefore in the foregoing problems as described above, the present invention provides a solution to solve the above problems.

SUMMARY OF INVENTION

P-0012[0012] The present invention provides a method for fabricating contact plug so as to eliminate the electro-migration of conductive material in the contact.

P-0013[0013] The present invention provides an improved method for forming contact plug to reduce the contact resistance. Therefore the RC delay time can be reduced, thus the operating speed of the device can be substantially increased.

P-0014[0014] The present invention provides a method of contact barrier metal layer to improve the adhesion ability between the dielectric layer and the conductive layer so that cracking or fracturing of barrier metal layer can be prevented. Thus increasing the reliability of the semiconductor device.

P-0015[0015] The present invention provides a method of contact barrier metal layer to improve the gap-fill ability of the conductive material and to increase adhesion ability between the dielectric layer and the conductive layer so that generation of voids can be prevented. Thus device failure due to electromigration can be effectively prevented thereby increasing the reliability of the semiconductor device.

P-0016[0016] The present invention provides a method for forming a contact metal barrier layer so that the adhesion ability between the dielectric layer and the conductive layer in a contact can be increased. Thus eliminating the defects due to electromigration, thereby increasing the reliability of the semiconductor device.

P-0017[0017] According to one of the preferred embodiment, the present invention provides an improved method for fabricating contact plug. A semiconductor substrate having a conductive region is provided, a dielectric layer is formed over the entire substrate, the dielectric layer is etched to form a contact opening, wherein the conductive region is exposed within the contact opening. A pre-clean process is carried out to remove the residues which would otherwise increase the contact resistance. The contact opening is coated with a first refractory metal layer. Next, a second refractory metal nitride layer is deposited over the first refractory metal layer, then a first plasma treatment is carried out to transform the second refractory barrier metal layer into a nitrided barrier layer. The first plasma treatment preferably comprises a plasma gas including nitrogen and hydrogen gas. A thermal-process is carried out in order to effect a reaction between the silicon atoms of the conductive region and the first refractory metal layer to form a metal-silicide in order to reduce the contact resistance. Then a third refractory metal nitride layer is deposited on the first metal nitride barrier layer and similarly treated with a plasma gas including nitrogen and hydrogen gas to remove the impurities from the third refractory metal nitride layer and to transform the third refractory metal nitride layer into a second nitrided barrier layer and then a conductive layer is deposited filling the contact opening.

P-0018[0018] It is to be understood with the approach of the present invention that by performing a thermal process is to effect a reaction between the silicon in the conductive region and the first refractory metal layer is to form a metal-silicide layer. Because the metal-silicide has a low resistance, therefore the contact resistance can be substantially reduced. Thus the operating speed of the device can be substantially increased.

P-0019[0019] Further, it is to be understood with the approach of the present invention that by performing a thermal process and then forming a second metal nitride barrier layer is to eliminate the formation of oxide film on the surface of the second metal nitride barrier layer so that the repulsion between the second metal nitride barrier layer and the conductive layer can be effectively eliminated in order to facilitate good gap fill of the conductive layer and to promote adhesion between the dielectric layer and the conductive layer. Because the zeta potential values of the second metal nitride barrier layer and the conductive layer are largely different, there will be no repulsion between them, consequently no voids are generated, thus the electromigration failure can be effectively prevented. Because the adhesion between the dielectric layer and the conductive layer is increased, cracking of the first refractory metal layer, the first and second metal nitride barrier layers can also be effectively prevented. Because the first refractory metal layer, the first and the second metal nitride barrier layers are not cracked or fractured, therefore the first and second metal nitride barrier layers can effectively prevent the diffusion of metal ions or atoms into the dielectric layer, thus shorting of devices can be prevented. Since the lattice structure of the conductive layer in the contact is not damaged and the adjacent first refractory metal layer, the first and the second metal nitride barrier layers are undamaged, generation of voids due to electromigration can be prevented, thus defects due to electromigration can be eliminated. Therefore the reliability of the device can be substantially increased.

P-0020[0020] The above and additional advantages of the present invention will become apparent to those skilled in the art from the following detailed description when taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF DRAWINGS

P-0021[0021]FIGS. 1 through 9 are schematic, cross sectional views showing the progression of manufacturing steps in the present invention provides an improved method for forming contact plug to reduce the contact resistance. Therefore the RC delay time can be reduced, thus the operating speed of the device can be substantially increased. fabricating contact plug in accordance to the first preferred embodiment of the present invention.

P-0022[0022]FIGS. 10 through 14 are schematic, cross sectional views showing the progression of manufacturing steps in fabricating contact plug in accordance to the second preferred embodiment of the present invention.

DETAILED DESCRIPTION

P-0023[0023] Reference will be made in detail to the present preferred embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts. FIGS. 1 through 9 are schematic, cross sectional views showing the progression of manufacturing steps in fabricating contact plug in accordance to the first preferred embodiment of the present invention.

P-0024[0024]FIGS. 1 through 9 are schematic, cross sectional views showing the progression of manufacturing steps in fabricating contact plug in accordance to the first preferred embodiment of the present invention.

P-0025[0025] Referring to FIG. 1, a substrate <b>100</b> having a conductive region <b>102</b> formed thereon, is provided. The conductive region <b>102</b> is comprised of, for example, a doped region in a silicon substrate, a silicon-based conductive line, a silicon-based gate structure, and the like. A dielectric layer <b>104</b> composed of low dielectric constant material, for example spin-on-polymers (SOP) materials, is formed over the substrate <b>100</b>. A CMP process is performed to remove excess dielectric layer <b>104</b> to planarize the dielectric layer <b>104</b> to obtain a planar topography top surface as shown in FIG. 1.

P-0026[0026] Referring to FIG. 2, a photoresist layer is deposited over the dielectric layer <b>104</b>. A photoresist layer is shaped or patterned to form a contact opening etch mask <b>106</b> as shown in FIG. 2. Next, a contact opening <b>108</b> is formed by etching the dielectric layer <b>104</b> where exposed by the mask <b>106</b> until the conductive region <b>102</b> is exposed within the opening <b>108</b>. The etch process used is preferably highly anisotropic and may, for example be performed by reactive ion etching (RIE) by using a suitable plasma gas.

P-0027[0027] Referring to FIG. 3, the mask <b>106</b> is then removed, or stripped, the removal process is preferably a dry etch process using an oxygen plasma or a wet etching process using a suitable solvent. A pre-clean step is carried out to clean the resides from the surface of the dielectric layer <b>104</b>, and more importantly, to clean the residues from the surface of the sidewall and the bottom of the contact opening which would otherwise increase the contact resistance. The pre-clean step comprises a wet etch or a dry etch process, wherein the pre-clean step use buffer oxidant agents. In the dry etch process, preferably a plasma gas formed from argon gas is used. A thin conformal layer of a first refractory metal layer <b>110</b> is formed over the dielectric layer <b>104</b> and the contact opening <b>108</b>. The first refractory metal layer <b>110</b>, for example, is made of titanium (Ti), or tantalum (Ta). Next, a first refractory metal nitride layer <b>112</b> is formed over the first refractory metal layer <b>110</b>. The first refractory metal nitride layer <b>112</b> is deposited preferably by performing a MOCVD method, using a precursor such as tetrakis-dimethylamido-titanium (TDMAT) or tetrakis-diethylamido-titanium (TDEAT), at a process temperature of about 400-450° C. and a preferable thickness of about 120-160 angstroms. The material of the first refractory metal nitride layer is preferably made of titanium nitride (TiN) or tantalum nitride (TaN).

P-0028[0028] Referring to FIG. 4, a first plasma treatment <b>125</b> is carried out in order to remove impurities such as carbon, oxides which are inherently present in the first refractory metal nitride layer <b>112</b>, consequently the first refractory metal nitride layer <b>112</b> is transformed into a thinner first metal nitride barrier layer <b>114</b>, reduced to a thickness of about 40-60 angstroms. The first plasma treatment <b>125</b> comprises preferably a plasma gas containing nitrogen and hydrogen. The first metal nitride barrier layer <b>114</b> has comparatively lower resistance.

P-0029[0029] Referring to FIG. 5, a thermal-process <b>126</b> is carried out to trigger a reaction between the portion of the first refractory metal layer <b>110</b> on the conductive region <b>102</b> and the silicon atoms of the conductive region <b>102</b> to form a metal silicide film <b>116</b>. Preferably, the thermal process comprises a rapid-thermal-process (RTP). The RTP is carried out preferably in an atmosphere of nitrogen, at a temperature of about 550-700° C., for a duration of 3-180 seconds. Since the metal silicide film <b>116</b> is refractory metal having low resistivity, the contact resistance is decreased.

P-0030[0030] Referring to FIG. 6, a second refractory metal nitride layer <b>118</b>, is formed on the first metal nitride barrier layer <b>114</b>. The material of the second refractory metal nitride layer <b>118</b> is substantially made of same material as the first refractory metal nitride layer <b>112</b>. The second refractory metal nitride layer <b>118</b> is preferably deposited by using a conventional deposition technique such as MOCVD, and a preferable thickness of about 120-160 angstroms.

P-0031[0031] Referring to FIG. 7, similarly a second plasma treatment <b>127</b> is carried out to remove impurities and to transform the second refractory metal nitride layer <b>118</b> into a thinner second metal nitride barrier layer <b>120</b>, reduced to a thickness of about 40-60 angstroms. The second plasma treatment <b>127</b> reaction conditions comprises preferably a plasma gas containing nitrogen and hydrogen. The second metal nitride barrier layer <b>120</b> has a comparatively lower resistance.

P-0032[0032] Referring to FIG. 8, a conductive metal layer <b>122</b>, for example tungsten is deposited over the dielectric layer <b>104</b> filling the contact opening <b>108</b> by performing a conventional metal deposition technique, such as CVD, or electro-chemical deposition (ECD) method. As the zeta potential values of the second metal nitride barrier layer <b>120</b> and the conductive layer <b>122</b> are largely different, so they do not repel from each other resulting in a good gap-fill. Therefore adhesion between the dielectric layer <b>104</b> and the conductive layer <b>122</b> is increased, consequently cracking of the barrier layer can be effectively prevented.

P-0033[0033] Referring to FIG. 9, a chemical-mechanical polishing process is performed to remove portions of the conductive layer <b>122</b>, the second metal nitride barrier layer <b>120</b>, and the first metal nitride barrier layer <b>114</b>, and the first refractory metal layer <b>110</b> until the dielectric layer <b>104</b> is exposed. A contact plug <b>150</b> is formed.

P-0034[0034] With the approach of the present invention, by performing a RT process and then forming a second metal nitride barrier layer <b>120</b> is to eliminate the formation of oxide film on the surface of the second metal nitride barrier layer <b>120</b> in order to promote good adhesion between the dielectric layer <b>104</b> and the conductive layer <b>122</b>. Because formation of oxide film on the second metal nitride barrier layer <b>120</b> is prevented, the difference of zeta potential values of the second metal nitride barrier layer <b>120</b> and the conductive layer <b>122</b> can be maintained large, therefore repulsion between the second metal nitride barrier layer <b>120</b> and the conductive layer <b>122</b> can be eliminated, consequently this condition promotes good gap-fill. As a result, generation of voids can also be prevented, consequently, device failure due to electromigration can be effectively eliminated. Because of the large difference of zeta potential values between the second metal nitride barrier layer <b>120</b> and the conductive layer <b>122</b>, adhesion between the dielectric layer <b>104</b> and the conductive layer <b>122</b> is increased, thus cracking of the first refractory metal layer <b>110</b>, the first and the second metal nitride barrier layers <b>114</b> and <b>120</b> is effectively prevented. Because the first refractory metal layer <b>110</b>, the first and second metal nitride barrier layers <b>114</b> and <b>120</b> are not cracked or fractured, the first and second metal nitride barrier layers <b>114</b> and <b>120</b> can effectively prevent the diffusion of metal ions or atoms into the dielectric layer <b>104</b>, thus shorting of devices can be prevented. Since the lattice structure of the conductive layer <b>122</b> in the contact is not damaged and the adjacent first refractory metal layer <b>110</b>, the first and second metal nitride barrier layers <b>114</b> and <b>120</b> are undamaged, generation of voids due to electromigration can be prevented, thus device failures due to electromigration can be eliminated. Therefore the reliability of the device can be substantially increased.

P-0035[0035] With the approach of the present invention, by performing a RTP process is to effect a reaction between the silicon atoms of the conductive region <b>102</b> and the first refractory metal layer <b>110</b> to form a metal-silicide layer <b>116</b>. Because the metal-silicide film <b>116</b> is a refractory metal having low resistivity, the contact resistance can be substantially decreased, therefore the RC delay time can be substantially decreased. Thus the operating speed of the device can be substantially increased.

P-0036[0036] Further, because a second metal nitride barrier layer <b>120</b> is formed over the first metal nitride barrier layer <b>114</b>, therefore the thickness of the barrier metal layer can be increased to adequately function as a barrier metal layer.

P-0037[0037]FIGS. 10 through 14 are schematic, cross sectional views showing the progression of manufacturing steps in fabricating contact plug in accordance to the second embodiment of the present invention.

P-0038[0038] Referring to FIG. 10, a substrate <b>200</b> having a conductive region <b>202</b> formed thereon, is provided. The conductive region <b>202</b> is comprised of, for example, a doped region in a silicon substrate, a silicon-based conductive line, a silicon-based gate structure, and the like. A dielectric layer <b>204</b> composed of low dielectric constant material, for example spin-on-polymers (SOP) materials, is formed over the substrate <b>200</b>. A photlithographic and etching process is carried out to form a contact opening <b>208</b> in the dielectric layer <b>204</b> until the conductive region <b>202</b> is exposed within the opening <b>208</b>. A pre-clean step is carried out to clean the resides from the surface of the dielectric layer <b>204</b>, and more importantly, to clean the residues from the surface of the sidewall and the bottom of the contact opening which would otherwise increase the contact resistance. The pre-clean step comprises a wet etch or a dry etch process, wherein the pre-clean step use buffer oxidant agents. In the dry etch process, preferably a plasma gas formed from argon gas is used. A thin conformal layer of a first refractory metal layer <b>210</b> is formed over the dielectric layer <b>204</b> and the contact opening <b>208</b>. The first refractory metal layer <b>210</b>, for example is made of titanium (Ti), or tantalum (Ta). Next, a multi-layered metal nitride barrier layer <b>214</b> over the first refractory metal layer <b>210</b>. The multi-layered metal nitride barrier layer <b>214</b> is formed, for example, by depositing a first refractory metal nitride layer comprised of TiN or TaN material of thickness of about 120-160 angstroms by performing a MOCVD process, and then treating the first refractory metal nitride layer with a plasma gas to transform the first refractory metal nitride layer into a metal nitride barrier layer. The said plasma treatment preferably comprises of a plasma gas containing an atmosphere of nitrogen and hydrogen. The deposition of the first refractory metal nitride layer and plasma treatments cycles follows, for example 1-3 cycles, until a desired thickness of a multi-layered metal nitride barrier layer <b>214</b> is formed. Next, a thermal-process <b>226</b> is carried out to trigger a reaction between the portion of the first refractory metal nitride layer <b>210</b> on the conductive region <b>202</b> and the silicon atoms of the conductive region <b>202</b> to form a metal silicide film <b>216</b>. The thermal process is preferably a rapid-thermal-process (RTP). The RTP is preferably carried out in an atmosphere of nitrogen, at a temperature of about 550-700° C., for a duration of about 3-180 seconds. Since the metal silicide film <b>216</b> is refractory metal having low resistivity, the contact resistance is decreased.

P-0039[0039] Referring to FIG. 11, a second refractory metal nitride layer <b>218</b>, for example TiN or TaN, is formed on the multi-layered metal nitride barrier layer <b>214</b>. The second refractory metal nitride layer <b>218</b> is preferably deposited by using a conventional deposition technique such as MOCVD, and a preferable thickness of about 120-160 angstroms.

P-0040[0040] Referring to FIG. 12, similarly a plasma treatment <b>227</b> on the second refractory metal nitride layer <b>218</b> is carried out to transform the second refractory metal nitride layer <b>218</b> into a thinner metal nitride barrier layer <b>220</b>, reduced to a thickness of about 40-60 angstroms. The plasma treatment process preferably comprises a plasma gas containing nitrogen and hydrogen gas.

P-0041[0041] Referring to FIG. 13, a conductive metal layer <b>222</b>, for example tungsten is deposited over the dielectric layer <b>204</b> filling the contact opening <b>208</b> by performing a conventional metal deposition technique, such as CVD, or electro-chemical deposition (ECD) method. As the zeta potential values of the metal nitride barrier layer <b>220</b> and the conductive layer <b>222</b> are largely different, so they do not repel from each other resulting in a good gap-fill. Therefore adhesion between the dielectric layer <b>204</b> and the conductive layer <b>222</b> is increased, consequently cracking of the barrier layer can be effectively prevented.

P-0042[0042] Referring to FIG. 14, a chemical-mechanical polishing process is performed to remove portions of the conductive layer <b>222</b>, the metal nitride barrier layer <b>220</b>, and the multi-layered metal nitride barrier layer <b>214</b>, and the first refractory metal layer <b>210</b> until the dielectric layer <b>204</b> is exposed. A contact plug <b>250</b> is formed.

P-0043[0043] With the approach of the present invention, by performing a RT process <b>226</b> and then forming a metal nitride barrier layer <b>220</b> is to eliminate the formation of oxide film on the surface of the metal nitride barrier layer <b>220</b> in order to promote good adhesion between the dielectric layer <b>204</b> and the conductive layer <b>222</b>. Because formation of oxide film on the metal nitride barrier layer <b>220</b> is prevented, the difference of zeta potential values of the second metal nitride barrier layer <b>220</b> and the conductive layer <b>222</b> can be maintained large, therefore repulsion between the metal nitride barrier layer <b>220</b> and the conductive layer <b>222</b> can be eliminated, consequently this condition promotes good gap-fill ability. As a result, generation of voids can also be prevented, consequently, device failure due to electromigration can be effectively eliminated. Because of the large difference of zeta potential values between the metal nitride barrier layer <b>220</b> and the conductive layer <b>222</b>, adhesion between the dielectric layer <b>204</b> and the conductive layer <b>222</b> is increased, thus cracking of the first refractory metal layer <b>210</b>, the multi-layered metal nitride barrier layer <b>214</b> and the metal nitride barrier layer <b>220</b> is effectively prevented. Because the first refractory metal layer <b>210</b>, the first and the metal nitride barrier layers <b>214</b> and <b>220</b> are not cracked or fractured, the metal nitride barrier layers <b>214</b> and <b>220</b> can effectively prevent the diffusion of metal ions or atoms into the dielectric layer <b>204</b>, thus shorting of devices can be prevented. Since the lattice structure of the conductive layer <b>222</b> in the contact is not damaged and the adjacent first refractory metal layer <b>210</b>, the metal nitride barrier layers <b>214</b> and <b>220</b> are undamaged, generation of voids due to electromigration can be prevented, thus device failures due to electromigration can be eliminated. Therefore the reliability of the device can be substantially increased.

P-0044[0044] With the approach of the present invention, by performing a RTP process <b>226</b> is to effect a reaction between the silicon of the conductive region <b>202</b> and the first refractory metal layer <b>210</b> to form a metal-silicide layer <b>216</b>. Because the metal-silicide film <b>216</b> is a refractory metal having low resistivity, the contact resistance can be substantially decreased, therefore the RC delay time can be substantially decreased. Thus the operating speed of the device can be substantially increased.

P-0045[0045] Further, because a second metal nitride barrier layer <b>218</b> is formed over the first metal nitride barrier layer <b>214</b>, therefore the thickness of the barrier metal layer can be increased to adequately function as a barrier metal layer.

P-0046[0046] Further, although the embodiments of the present invention are directed to a method for fabricating a contact barrier metal, it also will be recognized by those skilled in the art that other techniques of forming interconnect, such as the single/dual damascene technique, or other traditional techniques of forming vias or plugs which involve filling an opening with conductive materials such as copper, tungsten or aluminum may be used to practice the present invention.

P-0047[0047] While the invention has been described in conjunction with a specific best mode, it is to be understood that many alternatives, modifications, and variations will be apparent to those skilled in the art in light of the a foregoing description. Accordingly, it is intended to embrace all such alternatives, modifications, and variations which fall within the spirit and scope of the included claims. All matters set forth herein or shown in the accompanying drawings are to be interpreted in an illustrative and non-limiting sense.

P-0048[0048] It is to be understood that the foregoing general description and the following detailed description are exemplary, and are intended to provide further explanation of the invention as claimed.