Improvements in or relating to the epitaxial deposition of crystalline layers
28 claims: 16 independent, 12 dependent
- 1P a t entkrav 1. Förfarande för epitaktisk utfällning av ett halvledarmaterial skikt på som substrat tjänande, upphettade halvledarskivor från en reaktionsgas, som genomströmmar ett halvledarskivorna innehållande reaktionsrum och därvid når fram till halvledarskivornas yta, kännetecknat av att halvledarskivorna (l) anordnas på bottnen av ett den undre delen av reaktionsrummet (2) utgörande bägarformigt reaktionskärl (3) och upphettas underifrån, att färsk reaktionsgas tillföres halvledarskivorna uppifrån med ett reynoldstal om högst 50, företrädesvis högst 40, medelst ett i reaktionsrummet inskjutande gastillförselrör (5), vars mynning ligger på ett avstånd från det halvledarskivorna (l) innehållande planet, som är högst 1,5 gånger reaktionskärlets (2) hydrauliska diameter (D) vid den nivå där halvledarskivorna är belägna, samt att den förbrukade reaktionsgasen bringas att åter strömma ut ur reaktionsrummet i riktning uppåt.
- 2Förfarande -enligt krav 1, kännetecknat av ati reaktionskärlet (2) är uppdelat i en undre, bägarformad, för upptagning av halvledarskivorna (1) avsedd, transportabel’del (3) och en med denna undre del sammankopplingsbar övre del (4), samt att de i den undre delen av reaktionskärlet anordnade halvledarskivorna först underkastas en förberedande behandling, varefter den undre delen av, reaktionskärlet förbindes med den övre delen av reaktionskärlet, 'så att reaktionsruranet slutes gentemot omgivningen, och den epitaktiska utfällningsprocessen därefter genomföres.
- 3Förfarande enligt något av kraven 1-2, kännetecknat av att halvledarskivorna före den epitaktiska utfällningsprocessen i reaktionsrummet och i uppvärmt tillstånd utsätres för . en HCl-haltig, från föroreningar fri, företrädesvis med vätgas blandad gas, i synnerhet om ytan av det underlag på vilket halvledarskivorna ligger under den epitaktiska utfällningsprocessen består av det halvledarmaterial som skall utfällas.
- 4Förfarande enligt något av kraven 1-
- 55, kännetecknat av att en såsom underlag för halvledarskivorna anordnad bärare uppvärmes på ett sådant sätt, att de smällen av bärarens yta, på vilka halvledarskivorna vilar, blir varmare än övriga delar av bärarens yta. 33486,5 - 16 5. Förfarande enligt något av kraven 1-4, kännetecknat av att den epitaktiska utfällningsprocessen avbrytec, genom att tillförseln av reaktionsgasen avbrytes, att omedelbart därefter temperaturen hes halvledarskivorna sänkes oeh slutligen en inert gas, företrädesvis vätgas, inledes i reaktionsrummet, företrädesvis med en högre strömningshastighet än den för reaktionsgasen. tidigare använda strömningshastigheten.
- 6Förfarande· enligt något av kraven 1-5, känneteckn a t av att tillväxthastigheten för det utfällda skiktets tjocklek avpassas till högst 3 um per minut.
- 7Anordning för epitaktisk ut fällning ur gasfasen av ett halvledarmaterialskikt på'som substrat tjänande halvledarskivor medelst ett förfarande enligt något av kraven 1-6, känneteckn a d av att den innefattar ett vertikalt, företrädesvis cylindriskt reaktionskärl (2) försett med ett uppifrån inskjutande tillförselrör· (5) för färsk reaktionsgas samt med anordningar (7,8) för uppvärmning av i reaktionskärlet vid dess botten placerade haivledarskivor (1), varvid såväl reaktionskärlet som gastillförselröret är så dimensionerade att reynolds tal i reaktionskärlet och i gastillförselröret ej blir större än. 50, företrädesvis ej större än 40, för alla strömningshastigheter hos reaktionsgasen, som är förenliga med en enkristallin utfällning på halvledarskivorna, i synnerhet med en tillväxthastighet för det utfällda skiktets tjocklek om högst 3 per minut, oeh gastillförselrörets mynning ligger på ett avstånd från det halvledarskivorna innehållande planet som ej överstiger 1,5 gånger reaktionskärlets hydrauliska diameter (L) vid den nivå där halvledarskivorna är belägna.
- 8Anordning enligt krav 7, kännetecknad av att reaktionskärlet (2) vid sin övre ände är försett med,ett gasutlopp (6) koncentriskt anordnat relativt gastillförselröret (5).
- 9Anordning enligt krav 7 oeh 8, kännetecknad av att reaktionskärlet (2) består av en med gastillförselröret (5) och gasutloppet (6) fö'rsedd övre del (4) och en för upptagning av. halvledarskivorna (1) avsedd undre, väsentligen bägarformad del (3), vilka båda separata delar är gastätt sammankopplingsbara med varandra.
- 10Anordning enligt krav 9, kännetecknad av att anliggningsytoma på de båda sammankopplingsbara delarna (3,4) av reaktionskärlet (2) är inslipade till varandra. - 17 334865
- 11Anordning enligt något av kraven 7-10, känneteckn a d av att åtminstone de.delar av densamma som kommer i kontakt med den i reaktionskärlet inströmmande reaktionsgasen består av kvarts och/eller BeO och/eller SiO.
- 12Anordning enligt krav 11 med kvarts som konstruktionsmaterial för reaktionsapparaturen, kännetecknad av att alla de i kontakt med reaktionsgasen kommande delar som uppvärmas vid utfällningsprocessen, i synnerhet en av kvarts bestående bärare för halvledarskivorna ;består av en kvartskvalitet som är i största möjliga mån absorptionsfri inom våglängdsområdet 2,6 -· 2,8 μκι. . '
- 131 3. Anordning enligt något av kraven 7-12, kännetecknad av att uppvärmningsanordningen innefattar en parallellt med · halvledarskivorna (1) och under dessa anordnad värmeutjämningsplatta (8), vilken står i termisk kontakt med halvledarskivorna, samt eft under värmeutjämningsplattan anordnat, av en elektrisk ström genomflutet värmeelement (7), som står i termisk kontakt med värmeutjämningsplattan, varvid uppvärmningsanordningen i sin helhet är placerad inuti eller utanför reaktionskärlet (2).
- 14Anordning enligt krav 13, kännetecknad av att värmeelementet (7) utgöres av en i ett plan, exempelvis spiralformigt eller meanderformigt, lindad ledare.
- 15Anordning enligt krav 13 eller 14, kännetecknad av att värmeutjämningsplattan bildar bärare för halvledarskivorna.
- 16Anordning enligt något av kraven 7-12, kännetecknad av att uppvärmningsanordningen innefattar en elektriskt ledande, inuti reaktionskärlet anordnad, i termisk kontakt med halvledarskivorna stående del, företrädesvis utformad som en värmeutjämningsplatta, och en utanför reaktionskärlet anordnad del, som avger elektromagnetisk strålning till den inre delen eller står i värmeledande förbindning med denna genom reaktionskärlets vägg.
- 17Anordning enligt något av kraven 13-16, kännetecknad av att värmeelementet (7) är utformat med en reducerad ledararea vid sin ytterkant för kompensation av temperaturfallet vid denna kant.
- 18Anordning enligt något av kraven 13-17, kännetecknad av att värmeelementet (7) är anordnat i ett slutet utrymme.
- 19Anordning enligt krav 18, kännetecknad av att reaktionskärlets underdel (3) är utformad som ett lock för det värmeelementet (7) innehållande utrymmet. - 18
- 20Anordning enligt krav 19, kännetecknad av att reaktionskärlets underdel (3) och ett värmeelementet (7) innehållande, med gastäta väggar försett kärl (9) är gastätt sammankopplingsbara och losskopplingsbara från varandra.
- 21Anordning enligt krav 18 eller 20, kännetecknad av att det värmeelementet (7) innehållande utrymmet är fyllt sed inert gas.
- 22Anordning enligt krav 20 och 21, kännetecknad av att den inerta gasen i det värmeelementet innehållande utrymmet har ett sådant tryck, att det kompenserar de på reaktionskärlets (2) botten verkande, nedåtriktade krafterna.
- 23Anordning enligt något av kraven 13-22, känneteck n a d av att den innefattar en mantel (9), vilken omgiver den halvledareskivorna innehållande undre delen (3) av reaktionskärlet upp till fogstället mellan denna del och den övre delen (4) av reaktionskärlet.
- 24Anordning enligt krav 23, kännetecknad av att manteln är försedd med en kylningsanordning.
- 25‘ Anordning enligt kraven 19, 23 och 24, kännetecknad av att väggen av det värmeelementet innehållande utrymmet är utformad som en kylmantel.
- 26Anordning enligt något av kraven 7-25, känneteck n a d av att bäraren för halvledarskivorna är så utformad, a it utfällningsytorna på halvledarskivorna blir väsentligt varmare än de ytpartier av bäraren, som ej är täckta av halvledarskivorna, åtminstone i den utsträckning som dessa ytpartier av bäraren komne i kontakt med reaktionsgasen.
- 27Anordning enligt krav 26, kännetecknad av att bäraren för halvledarskivorna, exempelvis reaktionskärlets botten, är tunnare på de ställen, där halvledarskivorna skall vila, än i övrigt.
- 28Anordning enligt krav 9 ooh 10, kännetecknad av att reaktionskärlets undre del (3) är utformad att kunna gastätt sammankopplas även med andra apparater, i synnerhet med överdelen hos en eller flera andra utfällningsapparater. 1 ANFÖRDA PUBLIKATIONER:Tyskland 1 112 044 (12 c:2) I
Independent claims28
64 paragraphs in 3 sections, as filed
SWEDEN
<img file="SE334865B_D0001.tif" />
PATENTS AND REGISTRATION OFFICE
PUBLISHING WRITING No. 334 865 mtciB 01 j 17/28 κι. 12 g 17/28
Patent Application. No. 1 6700/65 Received on 22x111965 Validity Day on 22 XII 1965 Ans. generally available on 1 VII 1968
Ans. published and published in 10 V 1971 Priority requested from 25 XII 1964 (Federal Republic of Germany DT S 94 785)
SIEMENS AG, BERLIN AND ACHEN, FEDERAL REPUBLIC OF GERMANY DT
Inventor E Sussmann
Ombuds 0 Hermansson
Method and apparatus for epitactic precipitation of a semiconductor material layer on substrate serving as heated semiconductor wafers from a reaction gas
In the production of semiconductor elements, the so-called epitactic method is often used. This consists in heating a disc-shaped semiconductor crystal, preferably a single crystal, to a high temperature, however below the melting point of the semiconductor, and at the same time passing a reaction gas which, at the temperature of the disc, precipitates the semiconductor on the disc, preferably in a single crystalline state. The heating of the semiconductor crystal is preferably carried out by electrical means, for example by the wafer
During the precipitation process, contact, either directly or via an insulating intermediate layer, is a carrier and heater, which is made of heat-resistant conductive material, consisting of an electric heating current. However, an indirect heating of the disc by absorption of electromagnetic radiation is also possible.
As reaction gas, only the compounds of the semiconductor which are volatile and in which the semiconductor or dopant is not bound to any other are used to make the precipitated semiconductor sufficiently pure.
O elements other than an element belonging to the halogen group and / or
- 2 hydrogen. Preferably, the reaction gas is diluted with hydrogen and sometimes even with an inert gas.
In the manufacture of semiconductor elements by the epitactic method, it is necessary to produce epitactic layers of uniform layer thickness and crystal quality. Furthermore, it is desirable if the tangential doping gradient decreases identically in the precipitated layers. If multiple discs are subjected to precipitation processes in the same apparatus, then these requirements apply to all discs simultaneously.
The object of the present invention is to provide a solution to this troublesome problem.
The invention thus relates to a method for epitactic precipitation of a crystalline (poly or monocrystalline) layer, in particular of semiconductor material, on substrate heated semiconductor crystals, in particular semiconductor discs, from the gas phase with a reaction gas flowing through a semiconductor cavity. , which will be provided with an epitactic layer. The process according to the invention is characterized in that the reaction gas is brought into the reaction room with a Reynolds number of at most 50, preferably at most 40. According to a further development of the invention, the gas supply is preferably carried out in the vertical direction from above by at least one insertion, preferably vertically cylindrical tube, in such a position that the reaction gas leaves this tube with a Reynolds number of no more than 50 and in that case it encounters with its precipitation. provide a horizontal plane
<img file="SE334865B_D0002.tif" />
the substrate sheets, after the gas has flowed through a vertical distance, amounting to a maximum of 1.5 times the diameter of the reaction chamber at. the level at which the semiconductor wafers are arranged, and that the spent reaction gas is removed upward from the reaction room.
Preferably, it is desired that the vertically downward flow of the reaction gas is completely stopped at level with the substrate discs or slightly below them, or in other words that the substrate discs during the precipitation course are placed on the flat, reaction space at the bottom of the reaction or at the final sealing bottom. the bottom positioned, the bottom fully or partially covering the insert, preferably of semiconducting or conductive material. This insert is designed so that it does not prevent a uniform heat supply to the individual substrate sheets. The insert either has a constant thickness and nature over its entire surface or is so designed at the places where the substrate sheets are located and at its outer edge that a greater amount of heat is generated at these places than at other places of the insert.
As is well known, the Reynoldian number is a flow dynamic quantity for viscous media and is used, for example, as a criterion of the state in which laminar or turbulent flow occurs. If v means the kinematic viscosity measured in stokes, w means the flow rate and the hydrodynamic diameter of the mediated flow vessel, then the Reynolds number becomes
- 4 Re = w. ^ / V
The condition that the Reynolds number should not be greater than 50 must be fulfilled both inside the gas supply pipe and outside the same in the reaction room.
In the following, the method according to the invention will be described in more detail with reference to the accompanying drawing, which shows an apparatus suitable for carrying out the method according to the invention. The disks, preferably of silicon or germanium, which are to be provided with an epitactic layer, are designated 1 and are located on the flat bottom of a substantially circular cylindrical reaction vessel 2. This vessel consists of a lower cup-like part 3 and an upper part 4, which is provided with an inlet pipe 5 for the fresh reaction gas and an outlet 6 for the spent reaction gas. The inlet and outlet of the reaction gas are preferably arranged concentrically relative to each other, preferably all parts of reaction 2 and of the gas transport lines, at least to the extent that they constitute a limitation of the reaction space, are as pure as quartz glass and / or BeO and / or SiC. If this is not possible for technical reasons (for example, in the interior of the reaction vessel provided with conductive material), the apparatus part in question is provided with a very clean surface layer of one of the mentioned substances or of the substance to be precipitated ooh / or of the semiconductor material. the substrate wafers. The substrate on which the substrate sheets rest (in the embodiment shown in the bottom of the reaction chamber) preferably consists of a commercially available
- In common quartz quality, which is as far as possible free from absorption lines within the 2.6-2.8 / h spectral range. Such quarter grades or BeO or SiC are suitably used on all the stalls at which a temperature of more than 50 ° C occurs during operation. Humidity must be avoided in the reaction room in a suitable manner. The dimensions of the equipment and the operating conditions that are important for the Reignold century will be adapted so that the conditions according to the invention are fulfilled. This applies not only to the cylindrical case of the actual diameter d of the gas supply line 5 and D of the reaction chamber corresponding to the hydrodynamic diameter, but also to the flow velocity w of the reaction gas in the tube 5 and the reaction space as well as the vertical distance A between the outlet gas outlet 5 and the substrate sheets 1. The above-mentioned expression for the Reynolds number and the gas flow rate measuring devices available in the trade make it possible to carry out the process according to the invention with great certainty.
The above-described design of the reaction vessel in the form of two composite parts 3 and 4 makes it possible to subject the semiconductor discs already placed in the position necessary for the precipitation 1 to other devices and then subject them to the epitactic process, then the upper part 4 of the reaction vessel. 2 and the apparatus heated in the manner to be described hereinafter, without any further manipulations, in /
in particular, touch of the substrate sheets is required. The shown construction of the reaction vessel also makes it possible to keep the substrate disks 1 dust-free after the pre-treatment thereof, since the interior of the cup-shaped lower part 3, when the lower part 3 is detached from the upper part 4 of the reaction vessel, is preferably kept under pressure in an inert gas, e.g. nitrogen, after which the bottom part is again sealed from the environment with the help of an auxiliary plug. If this auxiliary cover, for example consisting of a plate of clay resin, as well as the edges of the cup-shaped bottom part 3 and of the upper part 4 which are to be brought into contact with each other, are cut into one another in this way one can. fully sealing is obtained ..
In the corresponding manner , it may be provided for other treatment apparatus which should be coupled to the bottom of the reaction vessel, unless it is preferable to introduce the cup-shaped base together with its contents wholly within the required treatment space or the like from the environment. only then remove the auxiliary lid.
The other important detail of the suitable apparatus for carrying out the method according to the invention relates to the design of the heating device. This may be arranged completely outside the reaction vessel so that the disks 1 are heated to the required reaction temperature through the bottom of the cup-shaped base member 3 by heat conduction and / or heat radiation. However, it can also be arranged partially inside the reaction chamber in the form of a carrier of conductive material which is in direct or indirect contact with the substrate plates and is in the induction field from an induction source arranged outside the reaction vessel. Finally, the heater may be completely disposed within the reaction chamber in the form of a galvanically heated carrier for the substrate sheets.
• In the first die and in the last case, the heater can advantageously be designed in the manner shown in the drawing.
The actual flow-through heater 7 consists of a current-flow conductor, for example, of graphite or molybdenum, which is wound in a plane during operation of the device. For example, the winding may be spiral or meander shaped. It is convenient that the conductor area of the heating element 7 decreases towards the edge of the heating element, so that a temperature decrease at the edge of the heating element is counteracted. Between the substrate disks 1 and the heating element 7 is provided a leveling plate 8 of radiation absorbing material, for example of graphite or pyrography, which preferably extends parallel to the heating element 7 and the arrangement of substrate disks 1.
In case the heater is outside the reaction vessel, it and the base member 3 of the reaction vessel are arranged in the manner shown in the drawing in a bowl-shaped jacket 9. If the heater is arranged inside the reaction vessel, the leveling plate 8 is suitably designed to separate the heater. 7 from the reaction room. In order for the precipitated material to be as clean as possible, the leveling plate is 8
- 3 in this case suitably provided with a surface layer the semiconductor material to be precipitated. Optionally, this leveling plate itself can act as a carrier for the substrate sheets 1. The power supply conductors - to the element 7 are thereby gas tight and possibly insulated through the wall of the lower part 3. If the heater is only partially inside the reaction vessel, the part of the heater arranged in the reaction vessel is suitably formed as the equalizing plate 8 if it is outside the reaction vessel. The outer part of the heater is either an induction coil or a radiant heater.
Particular attention must be paid to the direct substrate of the substrate sheets. This support must in any case be designed such that the surface of the substrate sheets 1 to be provided with an epitactic layer becomes considerably hotter than the surface portions of the carrier which are not to be covered with the substrate sheets, at least if the latter surface parts come into contact with the reaction gas. In particular, the substrate sheets 1 should be warmer than all other apparatus parts and walls, which limit the reaction space. For example, if the carrier for the substrate sheets, for example, the bottom of the reaction vessel, is heated by radiation, it is desirable, for example, that the carrier be formed thinner in the places where the substrate sheets should be located.
One of the essential steps of the method according to the invention consists in treating the carrier with the semiconductor to be prepared coated and the semiconductor discs 1 arranged in the heated state and prior to the epitactic precipitation process for a few minutes.
- 9 «anode gas containing free H01 or which develops this upon contact with the heated semiconductor material which does not precipitate semiconductor material. For this purpose, a treatment gas consisting of pure is preferably used
HCl and hydrogen. This measure contributes significantly to the purity of the precipitated semiconductor layers „For the same reason, it is also advisable that the precipitation rate be adjusted to be • at most 3 / h. per minute.
In particular, as the walls of the reaction vessel, the carrier for the substrate disks 1 and the other apparatus parts located in the reaction room are heated considerably during the precipitation process, the following measures should be taken in the order of completion of the precipitation reaction:
) Rapid shutdown of the reaction gas,
2) quick disconnection of the heater;
3) the quickest possible replacement of the reaction gas in the reaction room with pure hydrogen or other inert gas. In this case, it is desirable that the flow rate be significantly increased compared to the flow rate of the reaction gas, preferably at more than 1.5 times.
These measures should be taken as soon as possible. In this way, it is avoided that veils are formed on the surface of the eptactically precipitated semiconductor layers.
In the event that the carrier for the semiconductor substrate disks does not simultaneously constitute heaters, the heater is suitably arranged in a specially closed embodiment in the process of the invention.
- 10 ounces. This also applies in the case where the heater is outside the reaction vessel 2. This closed space is preferably filled with inert gas, in order to prevent oxidation of the heater 7 preferably made of graphite or similar material. The leveling plate 8 can thereby serve as an upper closure of the space surrounding the heater. It is even more advantageous if not the leveling plate 8 but instead the bottom part 3 of the actual reaction vessel 2 forms the upper closure of the heater 7 containing the space, as shown in principle in the accompanying drawing. In this embodiment, it conveniently assumes cooling and at the top of it. the joint between the two parts 3 and 4 of the reaction vessel extending the jacket 9 functions as a restriction wall for the heater containing the space. While it is appropriate in itself that the cup-shaped bottom part 3 of the reaction vessel 2 can be removed from the jacket 9 if necessary, it should also be ensured in this case that a gas-tight closure of this space, possibly with the use of seals , assured. In this case, it is desirable - virtually all of the bottom of a quartz sub-part 3 of the reaction vessel to act as a carrier for the substrate disks 1 - that the pressure of the inert gas in the heater containing the space is chosen so that it balances the gas pressure in the reaction pump and that of the bottom part. 3 bottom acting gravity. In this way, a bending of the bottom and thus of the substrate carrier 1 can be prevented, which would otherwise prevent a uniform precipitation on the substrate disk body.
- 11 In the following school, the essential measures of the process according to the invention are listed:
a) The semiconductor bodies to be provided with an epitactic layer and preferably consisting of silicon or germanium are placed in a horizontal plane on the bottom or in the vicinity of the bottom of an upright, bowl-shaped vessel, preferably consisting of quartz, DeO or SiC.
b) The reaction gas is introduced into the reaction chamber by at least one top view projecting into the reaction chamber.
Outflow of the gas from the reaction room also occurs upward.
c) The gas flow through the reaction vessel takes place with a Reynolds number of no more than 50.
d) The distance between the orifice of the gas inlet pipe and the plane in which the semiconductor bodies to be provided with a layer must be less than 1.5 times the hydraulic diameter of the reaction vessel.
e) The semiconductor bodies to be fitted with one. epitactic layer is heated by heat conduction from the carrier and / or by heat radiation through the carrier on which the semiconductor bodies rest. The carrier is preferably heated by radiation from a current flowing outside the reaction room, wound warmer or directly by an electric current flowing through the carrier or by induction. Generally, the heating of the semiconductor bodies (1) is effected by applying an electric and / or electromagnetic field to a heater which is in direct or indirect contact with the semiconductor bodies, or on the semiconductor bodies themselves.
- 12 f) The preferably wound circular heater of temperature-resistant material (for example graphite, io, Ta) has a smaller conductor cross-section in order to raise the temperature at the outer edge of the heater. Between the carrier and the heater there is a temperature equalization plate (island) of radiation-absorbing material (for example graphite), which provides a uniform heating of the carrier and possibly
You can act as a carrier yourself. '<sup>r</sup>id. radiation heating of the carrier, the heating system is arranged in a cooled metal bowl (sheath 9) flowing through a protective gas into which the bowl-shaped bottom part (3) as well as the reaction vessel (2) protrudes. This measure avoids, among other things<sub>t</sub> also unnecessary heating of the surroundings.
g) The carrier for the semiconductor bodies (1) to be provided with a layer is either the bottom of the ovoid reaction vessel (2), preferably covered with a layer of a semiconductor material to be precipitated, or of an inlay plate of very pure graphite; SiC, graphite with a coating of SiC, BeO or semiconductor material, which is arranged in the vicinity of the bottom of the reaction vessel, preferably directly on this bottom,
h) The carrier and / or heater system is designed so that its temperature is at least 0 ° C higher at the places on which the semiconductor bodies to be provided with a layer lie than those places not covered by the semiconductor bodies Betta can, for example, many cases are achieved by designing the places in question with a thinner wall.
(13) If the beaker-shaped reaction vessel (2) consists of quartz (very pure), at least in the reaction bottom (3) a quartz quality which has no or only insignificant absorption lines within the wavelength range between 2.6 and 2 is used. 8 / U.
j) The reaction room is so designed that the part (3) of the reaction room in which the semiconductor discs (1)
In the provided layer layers are rested, can be removed together with these semiconductor wafers from the heating device (9) in gas and dust tight closed condition. The semiconductor bodies 1 to be provided with layers are introduced into said part 3 of the reaction chamber, preferably outside the metal beaker 9 in a dust-free, inert atmosphere. In addition, when applying series of layers of various doped semiconductor materials and other, in particular insulating or metallic layers, it is possible to interconnect the base 3 containing the semiconductor bodies 1 to be provided with the layers with different, for the precipitation of the various substances, especially suitable tops 4, without handling the semiconductor bodies 1 h * hay.
k) If the reaction vessel consists of quartz, then the pressure of the inert gas in the heating chamber 9 is selected so high that the upward force exerted by this pressure on the quartz bottom of the beaker 9 balances the quartz bottom acting downward forces.
l) In order to prevent a back-etch effect, it is desirable that the semiconductors 6 coated with the semiconductor material (usually weakly doped) coated
- 14 slices 1 before precipitation are treated with a clean, dry HClOOh H<sub>?</sub>-containing gas at elevated temperature (for example, when precipitating Si on bodies of Si at 1100 ° C).
m) The growth rate is adjusted with a mole ratio corresponding to the described flow conditions at a value of no more than 3 / U per minute.
n) The precipitation is interrupted by interrupting the supply of the precipitated semiconductor material containing the gas and lowering the temperature of the substrate wafers, whereby hydrogen or other inert gas is passed through reaction rooms at a flow rate at least 1.5 times greater than the flow rate of the previously used fraction gas.
The combination of the measures described above gives particularly favorable results. Ln -most part of the measures are, however, also beneficial in itself. In particular, the flow and heat engineering measures described above can be used independently of one another. Thus, the rule regarding the Reynoldian number is advantageously applied independently of other details of the reaction apparatus, in order to avoid noticeable edge thickening of the non-epitactic layers and other disturbances.
As precipitated material, the semiconductor materials germanium and silicon are primarily concerned. However, the above-described method according to the invention can be applied in practically all the details and without major modifications even for epitactic deposition of other semiconductor materials and also for materials which are not semiconductors.
- 15 334865
Contents3
3 sheets
Sheet 1 Sheet 2 Sheet 3
10 members in 8 offices
Members10
| Document | Office | Kind | |
|---|---|---|---|
| NL6515706A | Netherlands (Kingdom of the) | A | |
| FR1461829A | France | A | |
| DE1262244B | Germany | B | |
| CH451886A | Switzerland | A | |
| AT263082B | Austria | B | |
| GB1124328A | United Kingdom | A | |
| AT269948B | Austria | B | |
| US3486933A | United States of America | A | |
| AT278096B | Austria | B | |
| SE334865BThis record | Sweden | B |
Numbers
- Application
- 1670065
Classification
- CPC, 3
- C30B25/02
- C30B25/14
- H10P95/00
- IPC, 3
- C30B25 02
- C30B25 14
- H10P95 00
