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Sister Ra'a wallpaper

The present invention relates to composite photovoltaic structures and non-destructive inspection systems and methods, in particular to systems and methodologies for creating composite photovoltaic structures and systems and inspection methods for the detection of structural disturbances for the purpose of structural safety monitoring.

<p dir="rtl">5 Availability of non-destructive inspection methods for structural materials, eg, non-metallic pipes for use in pipelines, is limited. In all, the methods available so far are either destructive of matter or experimental and unreliable. Even when current empirical methods are taken into account for a non-destructive examination, there are no existing methods capable of reliably predicting the formation of defects, and they are generally used to detect Only flaws exist.</p>

<p dir="rtl">10 More specifically, current building materials and corresponding systems and methods of material inspection are not appropriate to detect the presence of stresses on or in materials such as tensile stress or compressive stress with sufficient accuracy and control that they can be predicted before they occur.</p>

Currently available techniques for sensing material defects are generally based on barge grooves of one-dimensional fibres. These fibers provide one-dimensional information: that is, they only detect stress that occurs along

<p dir="rtl">15th The fibers and major stresses only correspond to already damaged materials with significant cracks and tears in the structural material.</p>

There is a need for systems and methods for detecting disturbances in structural materials that use an optical material, such as an optical network or a photonic crystal, as a sensitive element for diffraction generation. In addition, there is a need for systems and methods for detecting disturbances in structural materials that quantitatively quantify changes in the form of optical materials from

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Through a change in wavelength, or a change in diffraction angles quantified by a change in intensity. Furthermore, there is a need for systems and methods for detecting disturbances with sensitivity that can be synthesized by testing the wavelength and corresponding periodic properties of the photostructural material. In addition, there is a need for systems and methods for detecting disturbances that have a multidimensional level of sensitivity.

<p dir="rtl">5 In connection with these and other considerations, the invention presented in this application has been submitted.</p>

General description of the invention

In accordance with a photograph of the present invention, a composite photovoltaic structure is provided, comprising one or more layers of a non-metallic structural material, a grooving aligned with at least one layer of the structural material, and a fluorescent carrier placed within the composite structure. Slits include a set of 10 traits that have been described to occur periodically in at least one dimension.

In another form, the grooves may comprise a separate layer of one or more grooving material placed over the entire surface of at least one layer of the structural material, or the surface of at least one layer of the structural material, or a combination of these structures. The grooving in this embodiment or others may extend over a top surface, a bottom surface, or both surfaces of at least one layer of 15 structural material. In other forms as well, the slit layer can be separated into two layers of the structural material,

The collective features of streaks can be set to occur periodically in at least two dimensions.

In other aspects, a fluorocarrier alone or in combination with the above may include a fluorocarrier that is excited by rays of a first wavelength that emit rays of a second wavelength when excited, and where one or more layers of the structural material and grooves 20 It is transparent to rays of first and second wavelengths. In certain embodiments, the carrier may be included

Fluorescence in a composite structure as a separate layer of a material comprising a fluorine carrier, as an analogue material or a nanomaterial which has been embedded in an area within at least one layer or one or more layers of a structural material, or a combination of the foregoing.

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In other images as well, a non-destructive examination of a periodic-slit diffraction optical structure is provided which includes a lamp configured to emit a cone of rays toward or on a part of a sample, rays of constant intensity over a range of wavelengths. A camera sensor is configured to take a diffracted ray image, where the diffracted rays are rays emitted by a lamp as diffracted by the part

<p dir="rtl">5 From the sample, where the image provides one or more wavelengths of the rays captured at each corresponding point on the captured image. A readable media is included with a jab comprising one or more program modules containing an parser module, where each module contains executable code. A processor is coupled to the lamp, camera sensor, and storage medium, whereby the processor is initialized by executing code in one or more program modules to analyze a ray image.</p>

<p dir="rtl">10 Captured In order to determine the displacement of any disturbances within a part of the sample, relative to any point on the captured image, by converting the wavelength at the point to a first periodic value of a corresponding point within the part of the sample as a function of the position of the lamp and camera sensor relative to the sample and the diffraction angles of the point Correspondence within a portion of the sample, and calculating the amount of shape change for the corresponding point. Depending on the first periodic value and the reference periodic property. A visual display is in contact via</p>

<p dir="rtl">15th A signal with the processor, where the processor is configured to output an image of the sample that represents the calculated amount of shape change for each corresponding point within the portion of the sample using the display.</p>

The examination method according to other images may also include a laser emitter prepared to emit a beam of rays of a specific wavelength at a specific location on the sample and a detector designed to capture at least one deflected ray and to measure the intensity of at least one captured ray and a corresponding position on the detector, where

<p dir="rtl">20 At least one diffracted ray is the result of a sample diffracting the emitted ray. In this test method, the processor is also configured to implement one or more program modules to receive the measured intensity and the corresponding position of at least one captured beam to determine the displacement of any disturbances at the specified location on the sample by: for at least one captured beam, and calculate a second periodic value for the specific location on the sample according to the diffraction angles</p>

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Calculated and a specific slitting characteristic of the sample, and calculating the amount of shape change for a specific location based on the difference between the second periodic value and a reference periodic characteristic with respect to the particular location.

These features, pictures, characteristics, and others can be understood from the accompanying description of certain models of the invention, the forms of drawings and the accompanying protection elements.

<p dir="rtl">5 Brief explanation of the drawings</p>

Figure (1) a high-level diagram showing a representative composite structure with a fluorescent layer and a two-dimensional lattice with a one-dimensional periodic property according to an embodiment of the invention;

Figure (2) a high-level diagram showing a representative composite structure with a fluorescent layer and a two-dimensional lattice with a one-dimensional periodic property according to an embodiment of the invention;

<p dir="rtl">10 Figure (3) A high-level diagram showing a representative composite structure with a fluorescent layer and a two-dimensional lattice with a two-dimensional periodic property according to an embodiment of the invention;</p>

Figure (4) a high-level diagram illustrating a representative composite structure with two fluorescent layers and a two-dimensional lattice with two-dimensional periodic property according to an embodiment of the invention;

Figure 5A is a high-level diagram illustrating a representative composite structure with parallel stripes constructed from a material

<p dir="rtl">15th Fluorescent and two-dimensional lattice with one-dimensional periodic property according to an embodiment of the invention;</p>

Figure 5b shows an upper projection of a representative diffraction pattern made by the model shown in Fig.

(5a);

Figure (6a) is a high-level diagram illustrating a representative compound structure with two orthogonal groups of ribbons constructed from a fluorescent material and a two-dimensional lattice with a two-dimensional periodic property according to a model

<p dir="rtl">20 for sister take care;</p>

Figure (6b) is an upper projection of a representative diffraction pattern made by the model shown in Figure (6a);

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Figure (7) is a high-level diagram illustrating a composite structure in the form of a representative tube with parallel and perpendicular stripes constructed of a fluorescent material and a two-dimensional network with a two-dimensional periodic property according to a model of the invention;

Figure (8a) is a high-level diagram illustrating a representative composite structure comprising rods defining a crystal

<p dir="rtl">5 Three-dimensional optical network according to a model of the invention;</p>

Figure (8b) a high-level diagram illustrating a representative composite structure comprising rods defining a three-dimensional photonic crystal as a lattice according to an embodiment of the invention;

Figure (9) is a high-level diagram illustrating a representative composite structure that includes beads that define a three-dimensional photonic crystal as a lattice according to a model of the invention;

<p dir="rtl">10 Figure (10) is a high-level diagram illustrating a representative composite structure that includes gaps defining a three-dimensional network and one or more fluorophores according to an embodiment of the invention;</p>

Figure (11a) a high-level diagram showing a representative profile of a monochromatic light source using a stretchable grid as the diffraction element;

Figure (11b) is a high-level diagram illustrating a representative profile of the monochromatic light source shown 15 in Figure (11a) using a stretchable diffraction grating under stretching conditions as a wavelength selection mechanism;

Figure (12a) is a high-level diagram illustrating the upper projection of a representative examination method according to a model

for sister take care;

Figure (12b) is a high-level diagram showing a frontal view of the representative examination method shown in Figure (12a), according to a model of the invention;

<p dir="rtl">20 Figure (12C) a box diagram showing a representative body of a physical component and software components of a computer for the test method shown in Figure (12A) according to a model of the invention;</p>

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Figure (13a) is a flow chart showing a special program for calculating the shape change of a photovoltaic structure according to a model of the invention;

Figure (13b) is a flow chart showing a special program for calculating the shape change of an optical structure according to a model of the invention;

<p dir="rtl">5 Figure (14a) is a high-level diagram showing a frontal view of a representative examination method according to a model of the invention;</p>

Figure (14b) is a high-level diagram illustrating a back view of the representative examination method shown in Figure (14a) according to a model of the invention;

Figure (15A) is a high-level diagram illustrating the upper projection of a representative examination method according to a model

<p dir="rtl">10 for sister take care;</p>

Figure (15b) is a high-level diagram showing a frontal view of the representative examination method shown in Figure (15a) according to a model of the invention;

Figure (16a) is a screenshot of a representative wavelength map as captured by a representative test device according to a model of the invention;

<p dir="rtl">15th Figure (16b) is a screenshot of a representative wavelength map as captured by a representative test device according to a model of the invention;</p>

Figure (17) is a high-level diagram illustrating a lateral view of a representative test device that includes ray sources with adjustable positions across at least two degrees of movement, according to a model of the invention;

Figure (18) a high-level diagram illustrating a lower profile of a well-resourced representative examination method

<p dir="rtl">20 X-rays can be located according to a model of the invention.</p>

Detailed description:

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By way of overview and introduction, systems and methodologies are disclosed in this application for detecting deformation of a material mainly for the purpose of structural safety monitoring. According to a first image, a composite material/structure that can be used to construct engineering structures has been revealed. The composite material includes a base material (for example, a structural material such as a non-metallic plate or tube), an optical diffraction grating, and a carrier

<p dir="rtl">5 for one or more fluorescence. In some applications the composite structure does not include a fluorescent material.</p>

In some applications the grooved can be a surface of the substrate or a separate layer of a material (for example a thin layer of aluminum). Composite structure materials are positioned so that a change in the shape of one or more materials of the composite structure, for example, disturbance causative, for example

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For example, without limitation, by tensile stresses, compressive stresses, bending, temperature changes, changes in chemical composition, and defects of other material, locally changing the periodic properties of the grating, or the refractive index of one or both materials, for example, by Change the size of the attributes and/or the relative distance between the slotted attributes. This produces a measurable change in the diffraction pattern caused by a complex structure that is proportional to the magnitude of the disturbance, and using a screening method, it can be quantified as a wavelength displacement of specific angles of diffraction according to the expected diffraction properties of the grating as defined by the grating equation.

The fluoro-carrier(s) may be introduced into the base material as dopants, nanomaterials, or provided as a material layer separate from the base material. In addition or alternatively, one or more layers of a fluorocarrier may be embedded in the grating material or an surrounding layer of the material.

According to another picture, the means and methods of a non-destructive examination were also disclosed in this application

<p dir="rtl">20 for representative vehicle structures. The examination facility is configured to detect disturbances in the composite structure based on the diffraction of test rays and radiation generated by fluorescent materials within the composite structure. More specifically, the examination device has been configured to emit examination rays on or into the composite structure and catch the diffracted rays as input and measure the change in the diffraction pattern from an expected pattern. It is recognizable that changes in the behavior of one or more parametric waves of rays can occur and can be trapped</p>

<p dir="rtl">25 and measure it. It includes changes in the diffraction, reflection, and refraction behavior of rays and one or more of these may be measured</p>

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Previous behaviours, and combinations of them, eg scan rays can deflect, refract, reflect diffracted, refract and deflect, etc. Accordingly, it can be realized that the common phenomenon is ray diffraction.

The assay device provides an output, a quantitative determination of the ARB effect on the composite structure. Precisely the way

<p dir="rtl">5 Check Convert wavelength and/or angular information into a displacement measurement. A screening method consists of one or two components that together use two similar principles to achieve that transformation. One component converts wavelength information into displacement, while the other component converts anisotropic information into displacement, each component can operate independently of the other. The composite structure considered could for example have diffraction grooves such as that shown in Figure 1 and described herein.</p>

<p dir="rtl">10 composite structure</p>

As mentioned before, according to one or more of the disclosed embodiments, a composite structure comprises a base material (such as a structural material such as a metal or non-metallic plate or tube), photonic diffraction streaks, or a photocrystal, and may also include one or more of fluorescent carriers (eg, ...). In some applications the slit can be a surface of the substrate or a separate layer of material (eg, a thin film of aluminum, other reflective metallic material, etc.) (.

The slit should not be a material in itself, but can be determined by any spacer that has periodic characteristics between materials with different refractive indexes, one of which can also be air, or any other gas, or liquid. More generally, the neutral role played by diffraction grating represented in

<p dir="rtl">20 Figures 1-7 can be performed by a photonic crystal. That photonic crystal can be defined as a periodic adjustment of the refractive index within a given region of a space that is capable of generating an optical band structure similar to the way a crystalline solid or semiconductor material generates an electronic energy level structure , or an electronic band structure (by conduction and valence bands). As an extension, any crystalline material can also be considered as a photonic crystal with a periodic size of the order of Å that is capable of generating a structure</p>

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Two optical bands in the X-ray region of the spectrum, which can be measured by X-ray diffraction. In most cases the position of the optical bands, or the entire optical band structure, can be calculated for reference using a combination of Barge's diffraction law and Snell's diffraction law. In many human-scale applications and human concerns, the scale of the periodic structure for defect detection can be synthesized around the scope of

<p dir="rtl">5 Submicron to Micron, which will generate a UV visible response to NIR in the electromagnetic spectrum. However, it is also possible that there are applications beyond this range in both smaller and larger scales. System dimensions can range from 1D to ND. Practical journals are one-, two-, and three-dimensional. In a single dimension, a photonic crystal can be represented as a Fiberbarge slit, a Fiberbarge slit of a photocrystal, or anything that has two rotations in one direction. In a two-dimensionality, the photonic crystal can be a diffraction slit, a monolayer of periodically distributed particles on a surface, a periodic distribution of holes arranged in two dimensions, as shown in Figures 1-7, or in this case also a slit Fiberbarge of a photonic crystal In three dimensions the photonic crystal can be an opal, or any periodic distribution of features that generate a modulation of the refractive index.</p>

One or more fluorescent carriers are inserted into the photostructure Any 15 active material can be of an emission wavelength capable of interacting with the photo-band structure generated by

The periodic photostructure is ultimately determined by the periodicity size, which in turn is determined by the degree of sensitivity required. The emission characteristic of the fluorescent carrier can be very narrow or broad depending on the mechanism of interaction with the photostructure. For example, if the displacement is measured as an intensity associated with a change in diffraction angles, the narrow emission characteristic of the fluorescent material 20 will produce a more abrupt intensity change as a result of the displacement in the material. However, it is above a certain value

For displacement, it will lose intensity because it will be deflected away from the photodetector, so the system will not be

Sensitive to even larger displacements. If the emission characteristic of the fluorescent carrier is wide, the change in intensity will not be sudden, but can be measured over a larger displacement range. In an even more sensitive scenario, the fluorocarrier can present multiple emission peaks, such that the change in intensity is sharp25 for small displacements, while remaining sensitive to even larger displacements, since another emission peak will

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collide with the scout. The same result can be obtained by introducing other fluorocarriers into the same structure. For these reasons, fluorescent materials can be organic molecules with broad and intense emission bands, transition metal ions, rare earth element ions with sharp emission peaks, quantum dots, or semiconductor nanocrystals with specific emission bands.

<p dir="rtl">5 By quantum confinement it can thus be synthesized in both energy to a certain extent in width.</p>

The size of the periodic features of the slit can be compared to the size of the stress to be discovered, in one of the models. Moreover, in that embodiment, the material constituting the grooves can have sufficient elasticity to respond to turbulence within it or its surroundings.

This composite body can be configured to operate in both reflection mode and emitting mode. The materials defining the composite structure 10, in one application, are such that inspection rays are allowed to pass through them.

In this or other application the slit may be formed from one material attached to or placed in close proximity to another material, or it may be manufactured as an interface between two materials with different refractive indexes.

In one representative configuration, the fluorescent carrier has such a narrow emission range that its detection when excited is improved. In addition, the fluorescent carrier can be placed on the side

<p dir="rtl">15th Corresponding to the basic material for the examination method. Accordingly, the base material, the grooves, and the fluorescent carrier are selected to allow the transmission of the scans and the rays emitted by the fluorescent carrier. This configuration of the representative composite structure can enhance sensitivity and simplify the detection of disturbances in the material. The reason is that the indicated wavelength shift for quasi-monochromatic rays will result in the presence or absence of rays due to a small perturbation. That change will be</p>

<p dir="rtl">20 It is easier to detect because: it provides a higher sensitivity contrast; It can be detected for a small change in intensity instead of a wavelength shift, thus simplifying the detection system and reducing its cost, and it eliminates the need for a broadband excitation source, and the excitation source and detection system can be placed on the same side with respect to the gratings, and can be included in a single device, without loss Achromatic clarity or contrast sensitivity.</p>

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These and other representative bodies in which one or more layers of a base material, a fluorophore carrier and a grooved surface are layered are described more specifically later in this application. These structures include 2D and 3D formats of one or more fluorophores within the complex structure, eg, as parallel bars, orthogonal grids, and 3D grids.

<p dir="rtl">5 According to another picture, the complex structure can include one or more photonic crystals, and quantum dots</p>

To define the streak layer, and in some applications the fluorescent layer as well.

According to one or more of the disclosed embodiments, a representative profile of the composite structure may include regular two-dimensional streaks with periodic property along one direction and one or more fluorophores may be embedded in a material layer parallel to the surface of the streaks. A complex structure (100) has been represented in figure (1)

<p dir="rtl">10 Commission.</p>

From the model shown in Figure (1) it is possible to realize few of the advantages of the invention. In this case, grooves (120) are formed between material (110) and material (130). Article (110, 130) provides different refractive indexes. It is also possible to The material (110) can be air, while the material (130) can be in principle air, but it is more common to be a solid material. The surface of the grooves can be (120)

<p dir="rtl">15th A simple interface between two materials or made of a thin layer of another material eg aluminium. For the purpose of the method, Article (140) is not necessary, but it is specified in the case of a manufacturing procedure that includes the manufacture of grooves as a free-standing piece made of Material (130). Article (150) contains one or more fluoro-carriers. The same material can be such as Article (140), which in turn, as mentioned before, can be the same Article as Article (130).</p>

<p dir="rtl">20 One or more fluorescent carriers in a material (150) as an dopant, or a nanometric material, or the material (150) can be fluorescent by itself. Material (170) can be a protective layer for the fluorescent layer, or it may be absent. The optical properties of materials (110, 130, 140, 150, 170), in some applications they have some transparency at the wavelength of excitation of one or more fluorescent carriers as well as at the wavelength of their emission.</p>

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During operation, when excitation rays represented by λex (eg rays emitted by a screening medium) arrive at the surface of the gratings (120), a diffraction pattern is generated in both the reflection and emission modes. As will be understood by those skilled in the art, it The streaks respond to a white light source by analyzing it at different wavelengths, while the streaks respond to a laser beam by analyzing it at different wavelengths.

<p dir="rtl">5 Neutralize it into separate rays emitted by the streaks at different angles depending on the diffraction orders. As shown in Figure (1), the scanned beam is a λex beam emitted from a laser source to a screening medium (not shown). In the representative model shown in Figure (1), only the reflection mode is taken into account and the “in” values ​​in the figure represent Arrange the diffractions for corresponding diffracted rays As shown, diffraction rays (eg, 0, 1, 2, m) reach the fluorescent layer at</p>

<p dir="rtl">10 Different are defined by the streak structure. At these locations the fluorescent layer will emit rays that produce a one- or two-dimensional image of that pattern that can be imaged/captured by a specially adapted examination medium, as mentioned below. Any disturbance in the material such as defects, tensile or compressive stresses, bending, and torsion will affect the diffraction pattern as well as the image formed by the fluorescent layer. The spots (160a-160e) shown in Figure (1) are regions of the fluorescent layer through which they pass.</p>

<p dir="rtl">15th Birth rays absorb or emit rays as a result of being excited by stray rays.</p>

As a result of perturbation in the complex structure created in this way, and by specifying the largest perturbation that affects the periodic characteristic of the surface of the grooves (20), the determinants that can change in the diffraction pattern are the distance between each spot, the size and shape of each spot, and with it the intensity distribution. , the reflection analysis to detect these disturbances may include monitoring the intensity or rays at a specific point, within one of 20 or more of: the emitting spot, at a certain distance, or relative to the excitation ray.

Install the searchlight and install it on the same medium containing the source of excitation. Changes in intensity measured at that specific point, indicate not only the presence of a disturbance but also its extent, and type. For example, tensile stress can push spots (160a-160e) away from each other and thus produce a decrease in ray intensity on the left side of spot 6a (to the far right

<p dir="rtl">25 Figure 1), or an increase on the right side of that spot. A similar response can be caused by a bending force</p>

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Generate negative or convex curvature in the grooves. The counter-response can occur if the stress is compressive or if the flexure causes a positive curvature of the grooves. In the case of the lesion, the spot will move to the sides and the intensity will change according to the same principle.

Figure (2) shows another representative body of the structure installed according to one or more models of the invention. Specifically,

<p dir="rtl">5 As shown in Figure (2), the fluorescent layer (250) is placed under the groove surface (220). Material (210) can be the basic support for the entire composite structure, and material (250) is a layer of material comprising a material In some applications it may be a substance containing one or more fluorescent carriers and may be a fluorescent substance by itself. In addition or in lieu of that, 210 may not necessarily be included, as</p>

<p dir="rtl">10 Material (250) can perform the function of a base material and one or more fluorescent carriers may be included within Material (250). The layer of material (230) provides a separation between the fluorescent layer and the slit. However, this material is also not strictly necessary, in practical applications it can be A layer of material (230) provides a useful separation and another carrier layer. Finally, the groove surface (220) is on top, and in some applications, it can be made from a separate material (230) and can be formed from it.</p>

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Figure (3) shows another representative body of a composite structure (300) according to one or more models of the invention. As shown in Figure (3), the fluorescent layer (350) is placed under the groove (380). Article (310) can be The primary bearing for the entire composite structure and the layer of material (330) can be the structural material. As shown, the layer of material (350) is the layer incorporating the fluorescent material. Furthermore, as shown in Figure (3), the groove used (380) is two-dimensional, like a periodic distribution of holes within a slab of another material. As a result, this will generate a 2D diffraction pattern, which will allow a more directed method to detect anisotropy in the slit or in the material with which the slit comes into contact. The perforations shown in the figure (eg perforation 385), can be actual perforations or regions made of a material with a different refractive index than the residual material specified for the grooving. In one or more applications, the optical properties of this perforated top layer or regions include . : a substance that is transparent to excitation rays, unless directed

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rays so that they pass through a gap in them; a substance that has a different refractive index in relation to the rest of the layer; A substance that is at least partially transparent to the wavelength of the emitted rays.

In Figures (1, 2, 3) the different ranks of diffractions are shown, 1 = m....n, and “n” are limited to two for ease of illustration in the figures, but the useful diffraction order can reach higher orders

<p dir="rtl">5 Depending on the structure of the grooving, the distance between the fluorescent layer and the slit, the distance between the grooving and the observer (for example, a test device), and in general on the structure of the device and the detection system. While the slit shown in Figure (1) presents a one-dimensional periodic characteristic and defines the slit in Figure (3) a characteristic 2D periodicity, then a slit with any type of periodic property can be used for the two representative composite structures, depending on the required diffraction properties, the advantage of a slit having a two-dimensional periodic property is that it will</p>

<p dir="rtl">10 Generates a diffraction pattern with information about the two-dimensional anisotropy of the strain. For example, in the case of a tensile stress along a given direction, only the distance between the diffraction spots will be increased along that particular direction.</p>

In another representative embodiment of the invention, as shown in Figure (4), a composite structure (400) may include two fluorescent layers. The construction of the composite structure (400) shown in Figure (4) is similar.

<p dir="rtl">15th The representative form shown in Figure (2) is that it has a fluorescent layer below the surface of the groove but also includes a second fluorescent layer (490) above the groove. More specifically, two lower layers (410) can act as a carrier for the fluorescent layer (450), and with some differences, it It is not necessary for a layer of material (450) containing one or more fluorophores to be configured to be a construction material layer comprising one or more fluorophores in which layer (430) is a separating layer between</p>

20 The fluorescent layer (450) and the slit layer (480). The layer (480) is the slit, which, as shown, can be a separate material layer. However, in some applications the separation layer (430) and the slit layer (480), can be combined, Except that the holes shown in the slit layer (480) may include a material with a different refractive index. Layer (440) is a separation layer between the slit and the second fluorescent layer and can be either a structural material layer, or in some applications. Air.

<p dir="rtl">25 Finally, layer (490) is an additional upper fluorescent material layer.</p>

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The purpose of this added fluorescent layer (490) is to simplify the visualization of the diffraction pattern as well as detect disturbances in the system of the composite structure. During operation, λex rays can shine through the composite structure (400) on a spot (460) on the fluorescent layer (450). The spot emits Excited fluorescent light (460) light in all directions and partially passes through the (430) layer and passes through the 5th (480) slit. At this point, due to the diffraction slit, the rays are diffracted and progressed through the (440) layer towards

Layer (490) as separate rays shown as m - 0 = 2 due to the fluorescent layer

With the additional rays (490), these rays can be seen as fluorescent spots (465) indicated by the upper fluorescent layer (490). The purpose of this upper fluorescent layer (490) is to facilitate the vision of these rays.

<p dir="rtl">10 The excitation rays are tested so that their wavelength is not completely absorbed by the layers of the material comprising the composite structure (400) through which the rays pass, except for the fluorescent layer (450). It is preferable that a minimum absorption or not occur in non-fluorescent layers to ensure The fluorescent layer (450) receives excitation rays. The fluorescent material (450) is also chosen so that its wavelength also passes through the emission layer (450) (first emission rays) without</p>

<p dir="rtl">15th Distortion through the layer (430), which prefers to be partially transparent for this wavelength of rays. The layer (480) can be made of two materials with different refractive indexes, or simply empty cylindrical holes. It is preferable that both materials are transparent to the excitation rays, while for For emission rays it can either be transparent or at least the material forming the cylindrical holes in the shape needs to be partially transparent.</p>

<p dir="rtl">20 In the case where the slit (480) is not a two-dimensional photonic crystal, as shown in Figure (4), but instead is a slit surface such as the slit (120) shown in Figure (1), the need is that each of Articles (430) and (440) are partially transparent to the first emission rays. By this structure, the (480) layer need not be a separate layer and can be a slit surface separating (e.g. specifying an interface between) layer (430) Layer . ( 440 ).</p>

<p dir="rtl">25 (440), however, must be transparent to the same rays emitted by a layer (450). Layer</p>

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<p dir="rtl">(480) can also have a three-dimensional optical structure, and in this case similar considerations apply to the notch shown in Figure (4) related to the transparency of the two constituent materials. The fluorescent layer (490) can be tested to absorb emission rays from (450) They are excited by emission rays, and thus emit second emission rays of a wavelength other than the first emission rays.</p>

<p dir="rtl">5 Alternatively, the top layer (490), rather than being a fluorescent layer, could simply be</p>

A screen on which you see the image.

In some representative formats, a composite structure may be constructed such that the groove is over one or more fluorocarriers and is positioned within the material so that it does not extend through the entire surface area of ​​the material under the groove. A representative body of a complex structure (500) has been shown in Figure (5a), according to the model

<p dir="rtl">10 One or more sister to take care of.</p>

As shown in Figure 5A, the fluorescent portion of the material is a pattern of parallel strips (530) embedded within the structural material (510) and below the groove surface (520), which defines the upper surface of the material layer (510). The examination light in this case should be a laser, but it could be a lamp that emits light that includes an excitation wavelength that is selected depending on the carrier material.

<p dir="rtl">15th One or more fluorescents are used (for example, depending on their specific excitation wavelength). In this way, the strips of the fluorescent material within the 530 will appear to light up when excited. Figure 5b shows an upper projection of the diffraction pattern being formed. By a group of parallel fluorescent rods periodically embedded under the incision.As shown, the rays from each of the excited fluorescent rods are shown as corresponding bars (511).</p>

<p dir="rtl">20 However, the spaces between the fluorescent stripes (eg, 512 strips) will also present emission steps due to the diffraction of the fluorescent stripes from the slit. By observing these stripes and the pattern formed, any shape change can be detected, such as a change of shape of the material will cause movement, A change in the shape, or displacement of this step from the expected pattern.For these reasons, from the point of view of detection, it is only possible to observe one spot and detect the change in the intensity of emission coming from that specific spot.</p>

<p dir="rtl">25 Detection of a shape change as a stop of a signal or as a start of a signal.</p>

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In addition to the previous example in which the fluorescent materials were placed inside the structural material according to a pattern that has a periodic property in one direction, fluorescent patterns can be used to produce a composite structure depending on the anisotropy of the required information. Figure (6a) shows a representative body of a composite structure (600) formed from a structural material (600) that has a top groove surface (620) and a fluorescent material (630) embedded in it.

<p dir="rtl">5 As shown, the fluorescent material is placed as two sets of parallel lines (each of which has width and thickness) that are perpendicular to each other and the slit surface is a two-dimensional slit with a two-dimensional periodic property. Figure 6b shows an upper projection of the composite structure and illustrates the diffraction pattern. Which is formed by the two sets of parallel fluorescent lines that are directed perpendicular to each other. Specifically, the lines (611) correspond to the rays emitted by the lines</p>

<p dir="rtl">10 The directed fluorescence across the length of the structure (600) and the lines (612) formed in the space between the strips are emission lines due to the diffraction of the fluorescent lines from the slit (620). A similar pattern of ray lines (614) is also emitted by fluorescent stripes in the longitudinal direction. During use, parallel lines of a fluorescent material can be useful for detecting perpendicular strokes, as striking in the same direction will have little effect on them.</p>

<p dir="rtl">15th It is made of two sets of parallel lines perpendicular to each other.</p>

Accordingly, a material constructed in this way can be monitored and its own structure used to detect the amount of disturbance, stress or deformation to which the material has been subjected. Specifically, the representative structure makes it possible to quantify the extent of the shape change. For example, if the material includes only a slit, then any

<p dir="rtl">20 A change in shape will produce a wavelength change. On the other hand, in the presence of one or more fluorescent carriers in addition to the slit, the change of shape will change the separation between the diffraction lines or the angularity between stray radiations from the slit.</p>

A practical application of one or more of the models disclosed in Figure (7) is illustrated. As shown in Figure (7), a periodically created surface (720), or grooving, is identified on the surface of a material

25 Structural (710), which is shaped to define an engineering structure such as a pipe (700). Figure (7) shows

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Also, the structural material (710) includes one or more fluorescent rods (730) embedded in it. Unlike the representative models mentioned before, in this particular case, the surface (720) is curved rather than flat. However, the principles in this model They remain generally the same as those mentioned for the previous representative embodiments.During use, disturbances will result in the material

<p dir="rtl">5 (710) modification of the diffraction pattern generated by slitting (720) on emission from fluorescent bars</p>

)730(.

It should be noted that the components of the representative body shown in Figure (7) are represented by a relative scale so that the complex structure shown (700) does not have to be to scale or precisely for practical applications. Specifically, the notch (720) is represented by a grid of lines,

<p dir="rtl">10 These streaks of lines are intended to provide streaks similar to those described for Figures 1-6b, or any two-dimensional streaks, with periodically marked recesses, spacers, or perforations. In addition, the relative distance between the streaks in those streaks is not Represented by a practical distance between slit features relative to the size of an object such as a pipe used, for example, in a pipeline.As mentioned before, sizing features can be specified in the slit, or in a two-dimensional photonic crystal format.</p>

<p dir="rtl">15th In light of the size of the pressure, I want to detect it through an examination. Similarly, as shown in Figure (7), the fluorescent material (730) is shown as rods, but it can be realized that the shape or arrangement of the fluorescent material within the composite structure does not necessarily have to be rod-shaped and the shape, size, and direction can be configured The specific shape of the system geometry and the type of null information detected by a scan.In the specific case of parallel fluorescent bars, as shown in Fig.</p>

<p dir="rtl">20 (7), the diffraction pattern generated by examining a section of the tube in a direction about its central axis</p>

It will be similar to that shown in Figure (56).

As mentioned before, the periodic property, or dimensionality of the determination, of the groove can be greater than (2). In the previous representations, only two-dimensional streaks were shown: either two-dimensional streaks with a one-dimensional periodic property, such as those in Figures (1) , 2, 5a - 5b, 6a - 6b); or grooves

<p dir="rtl">25 Two-dimensional with a two-dimensional periodic property, such as those in Figures (3, 4, 7). There are shapes</p>

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Additional representations of composite structures constructed to include 3D streaks, with a 3D periodic property, are also known as 3D photonic crystals and are described later in this application.

Figures (8a - 8b) show a representative composite structure (800) built according to one or more of the disclosed models to include a three-dimensional slit bar-shaped photonic crystal, or a diffraction element.

<p dir="rtl">5 The photonic crystal represented in Figures (8a - 8b) consists of rods of (814), having a square cross-section, distributed so as to form a three-dimensional periodic network. It can be seen that extended rods having alternating three-dimensional shapes can also be implemented. The structural material (810) holds a grid with different refractive indexes. However, in some applications, the material may be absent if the grooves carry themselves, and if the grooves are combined with a structural material close to it so that they discover</p>

<p dir="rtl">10 Click on the material close to it.</p>

The representative streaks can function by themselves without the addition of a fluorescent carrier, as they will respond to scanned rays producing regions of permissible bands and forbidden gaps according to a combination of Snell's law of refraction and Barge's law of diffraction, as explained in photonic crystal theory and as will be recognized by those skilled in the field. By observing the power and asymmetric distribution of these band structures, it can be determined

<p dir="rtl">15th Quantitative perturbation of the material, as these perturbations will change the periodic property of the grooves as well as the conditions of diffraction and refraction. However, like the previously mentioned models with 2D grids, one or more fluorocarriers are added within the structure so as to facilitate easier detection of changes in the diffraction pattern caused by 3D streaks on the fluoro-emitting material or materials. This fluoro-bearing material or materials may be added within the volume (850) of .</p>

<p dir="rtl">20 Three-dimensional streaks, as shown in Figure (8a), or on the opposite side relative to the observer.</p>

If the fluorescent material or carriers are added within the photonic crystal lattice, their distribution can preferably be random, and be at least 10 nm levels of the photonic crystal lattice observed. Figure (8b) shows a section of the representative structure (800) of the model shown in Figure (8a) with the possible locations of the fluorescent elements shown as black circles (860). Upper side

<p dir="rtl">25 (865) of the structure shown in Figure (8b) is that which is facing the observer. It can be realized that the scale of</p>

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The drawing in the figure is not accurate, and the relative sizes of the fluorescent materials and groove elements are chosen for clarity only. In practical applications, the size of the separate fluorescent carriers can be in the order of an order of magnitude smaller than the grating levels. Also, the number of fluorescent elements is not necessarily a true case, since the fluorescent substance or materials can also be

5 Evenly distributed throughout a portion of the structure (800) below or inside the grooves, occupying a volume roughly defined by the shaded area (870) in Figure (8b).

10

As shown in Figure (8b), the volume (870) that can be occupied by a fluorophore material or materials can also extend under the photostructure, on the opposite side of the observed. As a result, the effect of the streaks on the emission rays of one or more fluorophores It is the formation of diffraction lines represented as dotted arrows in Figures 8a, 8b, for example (815). These diffraction lines are similar to those observed in X-ray diffraction of crystalline materials. In fact, from a physical point of view, the streaks (800) behave like a crystal. The difference is that one or more fluorophores are present, and that the size of these streaks and the properties of the material related to the wavelength of the assay can be determined according to the application. Accordingly, as a function of the structure and creation of representative grooves, and by observing a position, presence, or

15th In the absence of these diffraction lines, information about a disturbance affecting the substance can be measured.

It can be seen that the special geometry of the three-dimensional streaks does not necessarily have to be the one shown in Figures (8a - 8b). For example, but not limited to, the streaks can be formed by a three-dimensional periodic distribution of beads, as shown in Figure (9). , or for a material that includes a three-dimensional distribution of holes in it, as represented in Figure (10).

<p dir="rtl">20 The photonic crystal (900) shown in Figure (9) has similar functions as the representative photonic crystal (800) shown in Figures (8a, 8b), but the grooves were identified by a periodic distribution of beads (916) within a carrier (910). The carrier (910) can carry grooves and can have a different refractive index. In this representative embodiment, one or more fluorocarriers can be contained within the volume (950) of the periodic grooves placed inside the carrier (910).</p>

<p dir="rtl">25 The location and distribution of the fluoro-bearing material or materials also apply similar considerations as the model shown</p>

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in Figures 8a and 8b relative to the bodies shown in Figures 9, 10. One difference to this representative setup is that the beads (916) themselves can be configured as fluorescence carriers. For example, the beads can be luminous nanoparticles , quantum dots, or microparticles activated by a fluorophore as an dopant.

<p dir="rtl">5 The fluorescent carrier is a filler between the gaps formed by grooves of beads (6, 9). The examination and analysis can be done in the same way as mentioned in the model shown in Figures (8a-8b). Due to the representative streaks structure, the effect of streaks on emission rays For the fluoro-bearing material or materials, the formation of directional forbidden diffraction lines or gaps (or stop bands) represented as arrows of dashed lines in Figure (9), for example, (915).</p>

<p dir="rtl">10 Figure (10) shows another representative form of a photonic crystal (1000). As shown, the crystal (1000) includes a three-dimensional network that is formed by a periodic distribution of holes (1016) formed inside a carrier (1010). However, those holes, in Some applications do not necessarily have to be perforations, and can be areas of a material with a different refractive index than 1010. In this case, 1010 is necessary as a carrier.</p>

<p dir="rtl">15th In Figure (10) the volume/area within the material (1010) that includes fluorescent material or materials is distinguished by the dotted volume (1050). The proximity of the dotted volume to the surface of the material with respect to a number of optical network planes is distinguished by non-scale optical elements which are The functionality of this particular body is also similar to the models described in relation to Figures (8a - 8b) and Figure (9) and by observing the position of the diffraction lines (1015) information about</p>

<p dir="rtl">20 The strokes affecting the grooves, which in turn, are a function of the grooves affecting the materials.</p>

constituent.

25

The types of perturbations that can be detected as a function of optical crystals generated according to one or more of the disclosed models are not limited to changes in physical form and can also include temperature changes, changes in chemical composition, liquid absorption, or the introduction of functional groups in load-bearing structures. While these changes may not alter the intervals between the periodic features of the slit, they can

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To cause a change in the refractive index. In turn, that change will modify the diffraction pattern by adjusting the refractive angles, as well as the diffraction directions. In representative structures that do not include a fluorescent carrier, changes in that substance can cause a wavelength change to specific angles of observation. In representative bodies containing one or more fluorophores, changes of the material can cause a change in the angle between the diffraction directions as well as a change in the interval between the diffraction lines.

The distinction between a physical change and a change in temperature or chemical composition is straightforward because the physical change is generally concentrated on a small part of the object, while the rest is spread over larger areas. However, you may find cases where different types of disorders affect the same areas; In this case, it is possible to distinguish different types of

<p dir="rtl">10 Adjustment by comparative analysis of a reference material without incision to detect any change in</p>

The refractive index is associated with changes in chemical composition or temperature.

Once this symmetry is established between the shape change and an optical signal, the detection system can be used to quantify one in terms of the other. More specifically, and as explained before, a detection system can be used to detect and quantify a disturbance in the meaning of an optical signal. opposite,

<p dir="rtl">15th It can be used to detect and quantify a change in wavelength or diffraction angles as a change in the shape of a substance.</p>

Under the same operating principles disclosed in this application for the creation of composite materials and the detection of disturbances in materials, in some representative embodiments, a test device may be inversely calibrated to control and select a known range of wavelengths. With greater specificity, control can be made

<p dir="rtl">20 Testing a known range of wavelength as a function of pressure applied to a material, or any shape change to which the material is subjected. This application can provide a light-dispersing element required in a colorimetric device or spectrophotometer where the principle of operation is based on a linear stress either in compression or in expansion and does not require a duron. The uniform color apparatus of a slit is usually coupled with a slit: the slit divides rays into their different wavelengths at different angles. The notch placed at a certain distance from the grooving makes the length</p>

<p dir="rtl">25 Only one waveform is executed. In order to change the wavelength that passes through the slit, the slit is rotated so that</p>

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Different diffraction angles are directed toward the slit. By shining a photonic structure as mentioned here or grooving onto a polymer or a stretchable material, the wavelength selection can be performed by changing the interval of the periodic structure instead of the observed angles. Accordingly, in this configuration it is not necessary to rotate the groove to change the wavelength. A representative form of the photostructure is shown in Figures 11a and 11b

<p dir="rtl">5 Used in a standard device for color to provide this supplemental application of the technology. Figure (11a) shows an analog optical structure (1110) constructed according to the models disclosed in a stop where incident white light (1110) (or more generally rays containing multiple wavelengths) is reflected and neutralized by the structure</p>

The photonic (1100) which has a slit surface (1105) does not change shape in this example. In this way, different wavelengths (1120) are emitted at different angles, and only a limited part of them can pass through the slit.

<p dir="rtl">10 The uniform device of the color (1130). Figure (11b) represents the structure (1100) (shown as 1100b) in a situation in which the light element is stretched or grooved (1130b) (for example, from a stress applied to the structure), thereby increasing the feature separation The periodicity of the slit, as well as the change of the diffraction pattern (1120b). As a result, the wavelength emitted by the slit (1130b) will be different from that of the previous one (for example, the slack photostructure). In this way, the same length selection can be achieved.</p>

<p dir="rtl">15th A waveform transmitted by a color standardizer, but by a linear system dependent on the compression or stretching of the optical structure used in the color standardizer. So if, for example, the slitting material used in the color standardizer is a soft polymer such as PDMS, the wavelength selection can be performed by applying a pressure or a tensile force to it.</p>

Possible manufacturing methods used for the previously mentioned models can be many. can be done

<p dir="rtl">20 Deposition of different layer-forming materials shown in Figures (1 - 6) swirl coating, droplet casting, spraying, physical vapor deposition, physical vapor deposition, crystal growth in substrate direction by molecular beam, and the like. The composite structure structuring can also be achieved to obtain A two-dimensional photonic crystal by either one-dimensional or two-dimensional periodic property, and can also be achieved in many different ways depending on the application and the size of the periodic property required.</p>

<p dir="rtl">25 Lithographic printing using laser interference, to print a pattern on a photoresist layer and a hole in the shape of</p>

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successive on the substrate. Another possibility is to use a mask to also generate the desired pattern on the photoresist layer. Each of these two systems provides the ability to achieve a volume of sub-micrometer periodic property. For smaller scales, structuring can be done by lithography using an electron beam or lithography using a stencil. There is another common way to manufacture

<p dir="rtl">5 Slitting diffraction is by controlling the model using a ruler motor. For larger scale applications, molding methods, such as injection molding, hot printing, and the like, can be used.</p>

Moreover, when the optical material works only by reflection and no emission is required, the interface between two materials with different refractive indexes can be enhanced by deposition of a reflective layer, such as aluminium, copper, chrome, gold, and the like.

<p dir="rtl">10 A fluoro-carrier(s) can also be introduced into the composite structure in many different ways. For example, a fluorescent carrier that dissolves in a polymer can simply be mixed into the polymer before it is cured: either in an elastomer or in a curing agent. For example, a fluorescein-carrying fluorescein can be dissolved in a variety of epoxy polymers by dissolving it in the elastomeric portion prior to treatment, and subsequently treated at room temperature. Another example is</p>

<p dir="rtl">15th Use of metallic nanoparticles such as silver or gold as carriers of fluorescence. These can be fixed by appropriate ligands such as benzoate and then dispersed in a polydimethylsiloxane (PDMS) curing agent such as Sylgard 184 polymer kit of Dow</p>

.Corning

If more intense emission transitions are required, then elemental ions can be introduced

<p dir="rtl">20 Rare earth as dopant in a polymer, glass, or in a crystal lattice. If they need to be introduced into a polymer, they can be fixed in it as a complex such as a coordination compound, while if they need to be introduced into a glass or crystal, they can be added in ionic form during growth: for example, oxides of rare earth elements can be added to a mixture of oxides A component of the crystal before the start of a crystal growth method, such as flux growth. Other potential methods for the growth of Czochralski-like crystals include, hydrothermal growth,</p>

<p dir="rtl">25 and the like.</p>

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In the event that the fluorescent layer is not continuous as in Figures (1, 2, 3, 4), but presents a separate structure, then this structural deposition can be achieved by one of the aforementioned lithographic printing methods to manufacture the photostructure. For example, it After the substrate is etched, a photoresist or a fluorescent carrier may be added to the substrate before the photoresist is removed.

<p dir="rtl">5 The models represented in Figure (8a) can also be fabricated in a similar fashion by alternating vertically oriented features for drilling and filling on the substrate.</p>

If these composite structures are sized above the micrometer range, then if the system is designed to interact with long wavelength rays, such as microwaves or radio waves, the fabrication methods are generally simpler below the micrometric range and can be achieved by conventional molding or prototyping processes10 .

For the fabrication of a three-dimensional composite structure such as the one shown in Figure (9) there is also a variety of methods that can be used. For micrometric or nanometer scale there is a simple method of self-assembly. For example, silica beads, polystyrene, or poly Methyl methacrylate (PMMA) can be self-sustaining by a horizontal or vertical precipitation method from vaporization

<p dir="rtl">15th Slow to dispersed from the cherries. An alternative method is to form a photonic crystal by shear-dependent nanometric assembly of beads in polymer art.</p>

examination device

According to one or more of the disclosed models, various representative systems and methods for the non-destructive examination of structures for the detection and quantification of disturbances will be described later in this application.

<p dir="rtl">20 In some applications, the assay device can be used to analyze the response of an optical material to stresses such as tensile stress, compressive stress, bending, shape change, changes in temperature, chemical composition, and refractive index. Although the representative screening method can be used independently of the representative composite structures previously described in connection with Figures 1–10a, the systems and methods</p>

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Representative non-destructive testing is described herein later in connection with the composite structures mentioned before.

More specifically, the examination device is configured to emit examiner rays on the material being examined. As mentioned before, the aforementioned composite structures are made of photovoltaic material whose properties can be affected

<p dir="rtl">5 Rotating mediated by Apat Arbat in its surroundings. This change in periodic properties results in a change in the diffraction pattern or the uniform optical band structure by these periodic slits. It can be recognized that streaks can be one-dimensional, two-dimensional, or three-dimensional. The test facility is also configured to measure</p>

Characteristics of the resulting diffraction pattern and, accordingly, a measure of the change in the diffraction pattern relative to an expected pattern.

Furthermore, the examination medium is configured to use, as input, the change in the diffraction pattern and to provide,

<p dir="rtl">10 As an output, a quantitative determination of the stimulus affecting the material. Specifically, the inspection device is configured to convert the wavelength and angular information about the diffracted rays into a displacement measurement. A screening method consists of one or two components that together use two similar principles to achieve that transformation. One component converts wavelength information to offset, while the other component converts wavelength information to offset. The periodic structure being examined is, for example, a complex structure that includes a diffraction grating</p>

<p dir="rtl">15th Similar to that described in connection with Figure 2.</p>

20

According to a prominent image, the screening medium is configured to quantitatively quantify shape changes in optical materials through a wavelength change, or a quantitatively defined diffraction angle change from an intensity change. As a result, the screening method provides the ability to detect disturbances with a sensitivity that can be tuned by selecting the examining wavelength and corresponding periodic characteristic of the optical material. Furthermore, the screening method provides a multidimensional level of sensitivity.

The system comprising the optical material and the examination medium shall be tunable to the magnitude of the deformation or defect detected. For example, if the user is set to detect defects on the order of a few hundred nanometers, the distance between periodic features in the photostructure needs to be in the sub-micrometer range at least. If the separator is well above the micrometric range, the change of

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A shape in the range of 100 nm can not be noticed. Whereas, if the interval is in the order of ten nanometers, the sensitivity to defects will be of the same range and thus suitable for detecting defects of interest but not required, due to excessive sensitivity.

At the same time, the examination rays used in the examination method and the sensitivity of the method must be

<p dir="rtl">5 Be able to interact with material attributes. Therefore, for sensitivity in the limits of the nanometer range, the rays of the medium must include the visible range of the electromagnetic spectrum, and the sensor must be sensitive to the same range. For the detection of defects in larger ranges, for example millimeters, the interval of periodic features in the material may be in the millimeter or sub-millimeter range and thus be sufficient for the X-ray examination of the medium to include infrared wavelengths to</p>

<p dir="rtl">10 micro wave.</p>

The multiplicity of sensitivity dimensions is also determined by the configuration of the optical material and the examiner. For example, for models of optical materials with a two-dimensional periodic property such as those shown in Figures (4, 6, 7) the anisotropic shape change of the material is greater along one of the axes (for example in Figure 4 the perpendicular axis is on a plane page (from

<p dir="rtl">15th Along the other axis (in Fig. 4 the axis is on page level) will produce diffraction angles caused by the features along the first axis that are greater than those caused by the feature along the last axis. Therefore spots (465) on the top surface of Fig. 4 that are aligned Perpendicular to the page plane will be farther from each other than aligned ones along directions parallel to the page plane.</p>

<p dir="rtl">20 This two-dimensional sensitivity that can be observed with the naked eye from the model in Figure (4), can also be quantified by the inspecting device. For example, this change in the separation between diffraction lines can be observed in an image captured by a camera sensor in the medium (1260). , or as a directional intensity change measured by a 1214 CCD matrix.</p>

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By briefly switching to the representative complex structure shown in Figure (2), the slit (220) is responsible for the diffraction, while the layer (2509) is fluorescent. While one or more fluorophores may be included to enhance the detection of disturbances, it is not essential to the operation of the enumeration screening medium. In fact, a slit responds to a white light source, by decomposing it to all 5 different wavelengths, while it responds to a laser beam by neutralizing it into separate beams emitted by the slit

at different angles depending on the diffraction order, which is indicated in the figure as m. Accordingly, the inspection device can be configured to emit one or more electromagnetic radiation sources that include a diffuse beam source (eg a white light source) and a laser so that it can be used with a variety of different composite body configurations (eg regardless of whether the structure includes a fluorescent carrier).

<p dir="rtl">10 Once the material is exposed to a white light source, such as that from an LED, it will generate a diffraction pattern of different wavelengths or colors that is reflected and deflected at different angles. Each of these wave phases for specific angles of observation relates to the interval between the periodic features of the slit according to the slit equation:</p>

(1) nλ= d(sinβ- sinα)

in the case of a reflective slit or;

(2) nλ= d(sinβ+sinα) 15

In the case of an emission slit, if for example the stray rays come from a fluorescent layer placed on the side opposite the slit to the observer (as represented in Figure 2), or if the inspection rays simply hit the slit on the opposite side to the observer.

In equations (1) and (2), n is an integer denoting an integer of lengths

<p dir="rtl">20 waveform, and^λ is the wavelength, and^d is the interval between two adjacent periodic features, and^α is the angles of fall, and^β It is a reflection angle, which corresponds to the diffraction angle atachieve these two equations.</p>

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Under normal conditions, if the shape of the sample is not altered by a defect, the periodic property of the slit will be the same across the entire space, and thus will generate a smooth diffraction pattern, in which, at any position, the wavelength changes smoothly with the angles of the observer; Or that for a single observation point, the angles change smoothly across the counterspace, because the different positions still correspond to different values ​​of^α

<p dir="rtl">5 And the^β . In the case of a defect, on the other hand, the change in wavelength (or color) is nearby</p>

A view of the defect will present an irregularity, as the periodic characteristic of the grooving will be locally modified. Knowing the diffraction angles, which are related to the structure of the medium (described later) and by measuring the observed wavelength, using equations (1) and (2) the inspection method can calculate the distance^d between periodic features and compare them with the interval^d undisturbed, which has been predetermined for

<p dir="rtl">10 for sample. The angles of incidence are known depending on the relative positions of the light source and the observed spot on the material. Diffraction angles are known by considering the relative position of the observed spot on the material and the sensor in the medium, or the magnitude of the periodic property of the photostructure on the material. Alternatively, the same information can be derived from the distance between the ray source and the sensor slit, and the medium's distance from the optical material. All of these are settings that can be started, modified, or installed</p>

<p dir="rtl">15th For a specific medium and/or substance.</p>

Nevertheless, even if the structure of the medium (relative position of a ray source and detector) and the magnitude of the periodic characteristic of the photostructure are not taken into account or are unknown, observation of wavelength or variation of diffraction angles, with or without a medium, still allows the quantification of the disturbance The reason for this is that the information required is not necessarily the absolute top of the displacement, but rather its change

<p dir="rtl">20 relative. Therefore, if the displacement through the analyzed area of ​​a material, appears as a certain value and in a given area appears as a different value, the most relevant information is the difference between these two values, rather than the absolute values. For these reasons, in certain cases it may not be necessary to take all the aforementioned determinants into account, and only for the relative change to take place. Conversely, if knowledge of the exact value of the displacement is required, then all parameters of the configuration can be</p>

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considered, or the offset value can be calibrated by the size of the known periodic characteristic (even if the starting value of the periodic characteristic is not known, it can be measured by a microscopic method).

Furthermore, if none of the foregoing determinants are known or the initial change is also very large and unordered (eg on a surface that is not smooth from the start) then the determination can be confirmed

<p dir="rtl">5 Quantitatively by comparing a diffraction pattern or wavelength image (a color image or a photogram) with a reference image taken when the structure is positioned or at a significant point in time.</p>

If instead of scattered rays, the material is exposed to a laser beam, the laser beam will also be diffracted according to equations (1) and (2). The difference in this case is that the wavelength is constant and the diffraction conditions will only be satisfied at certain angles, resulting in Uniform distribution of radiation

<p dir="rtl">10 stranding. If the material is not turbulent, the angular difference between these diffracted rays will be the same throughout the material. However, if there is a change of shape of the material, as well as the periodic property of the slit, the diffraction angles between the radiations will change. By observing these angles across the material, regions of deformation can be distinguished by calculating^d From equations (1) and (2), given^λ , and measure the angle.</p>

In light of the foregoing considerations, a representative examination method (1200) was subsequently described in this application.

<p dir="rtl">15th In conjunction with Figures (12a - 12c).</p>

In the representative model shown in Figure (12A), the screening medium (1200) includes a laser source (1220) and a diffused beam source (1250) as a white LED source. Although the source (1250) is described as a diffused electromagnetic beam source, the The source can also be configured to emit rays of constant intensity over a certain range of wavelengths, and that range can be

<p dir="rtl">20 It can be broad or it can be limited to a narrow range of wavelengths, and it can be in the visible range, or in any other range of the electromagnetic spectrum. The lens (1280) is also shown to focus the rays emitted by the scattered ray source (1250) and diffracted by a sample being examined. The lens is configured to focus the diffracted rays to a camera sensor (1260), which collects them and then configures to present the captured image to the processor (1216) .</p>

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5

10

The examination device can be placed with different hardware components and computer programs that operate the examination device, and more specifically, operations related to the analysis of the information captured by the detector (214) are performed. 2100) and includes the processor (1216) and circuit board (1215). As shown in Figure (12C), the circuit board may also include memory (1230), a communications interface (1255), and a computer-readable storage medium (1235) that can be accessed by the processor (1216). The circuit board and/or the processor can also be coupled with a display method (1217), for visual output of information to the user, and a user interface (1225) to receive user input and audio output (1270) to provide audio feedback to the user as understood by those skilled in the field: For example, the device may emit an audio or visual signal from the display device or from a separate indication light when a defect or shape change above a certain threshold value is encountered. The threshold value can be set manually or automatically prior to the measurement through the user interface which can be a touch screen or a suitable keyboard. Although the various components are shown either independently of the circuit board (1215) or as part of it, it can be seen that the components can be placed in different configurations.

<p dir="rtl">15th The processor (1216) works to execute program instructions that can be loaded into memory. The processor can be multiple processors, a multi-core processor, or another type of processor, depending on the particular application.</p>

Memory (1230) and/or store (1235) is accessed by the processor (1216), in this way the processor can receive and execute instructions stored on memory and/or store. For example,

<p dir="rtl">20 The memory shall be random access memory (RAM), or any other suitable volatile or non-volatile computer-readable storage medium. In addition, the memory can be fixed or can be removed. The store can also take different forms, depending on the particular application. For example, a storage may contain one or more components or devices such as a hard disk drive, flash memory, re-recordable optical disc, re-recordable magnetic tape, or some</p>

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5

In combinations of the above, the storage can be static, removable, or remote such as cloud-based data storage systems.

10

One or more program modules are encoded and decoded in storage (1235) and/or in memory (1230). Program modules can include one or more programs or applications with computer program code or a set of instructions executed in a processor (1216). These computer program code or instructions for executing operations and executing images of systems and methods disclosed in this application may be written in any combination of one or more programming languages. The program code can be executed entirely on HMI105, as a stand-alone software package, or partly on the HMI and partly on a remote computer/means (eg Control Computer 110) or completely on those remote computers/means. In the latter scenario the remote computer systems can be connected By means of scanning through any type of network, including a local area network (LAN), a wide area network (WAN), or the connection can be made through an external computer (for example, through the Internet using an Internet service provider).

Within the program modules (1245) one or more analysis programs are included that can be executed

<p dir="rtl">15th by the processor (1216). During the execution of the program modules, the processor is configured to perform various operations related to the analysis of the rays captured by the detector (1214). To detect and quantify disturbances in the examined material as a function of the diffraction pattern, as will be described in more detail later It can also be said that the program code for program modules (1245) and one or more non-temporary computer-readable storage devices (such as memory 1230 and/or store 1235) constitutes</p>

<p dir="rtl">20 A computer program product that may be manufactured and/or distributed in accordance with the present invention, as is known to people of ordinary skill in the art.</p>

In addition, it should be noted that information and/or other data relevant to the operation of existing systems and methods may also be stored on the warehouse (1235). For example, database (1258) may include specific modes and parameters related to different materials and structures that can be

<p dir="rtl">25 Examined using a screening method such as predicted diffraction patterns, properties of materials having any periodic streaks</p>

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5

10

15

20

(such as direction, cycle, separation of features, optical limiters, emission wavelength, etc.), or properties of any fluorescent carrier present in the material (such as excitation wavelength, emission wavelength) and the like, as will be discussed in greater detail later. , the database can store other operational parameters that are specific to the test method and different modes of operation (such as a diffuse beam based test and a laser based test). It should be noted that although store (1258) is indicated as being locally configured for storage for the scanning device, in certain applications a database and/or data objects stored in it can be located remotely (eg on a remote computer or server connected to a network - not shown) and connected to the scanning device from It may also be recognized that board (1215) may also include or be paired with a power source (not shown) to power the test device.

A communication interface (1255) can also be connected during operation to a processor (1216) and it can be any interface that enables communication between the test device and devices, machines, and/or external elements such as a control computer or server connected to a network (not shown). Communication interface includes, but is not limited to, a modem, a network interface card (NIC), a network integrated interface, a wireless transmitter/receiver (such as Bluetooth, cellular phone, NFC), a satellite transmitter/receiver, an infrared port, a connection USB, and/or any of those other interfaces for connecting the scanning device to other computing devices and/or communication networks, such as private networks and the Internet. Such connections may include a wired connection or a wireless connection (eg, using IEEE 802.11), however it should be understood that the communication interface can in practice be an interface that enables communication to/from the inspection facility.

Returning to Figure (12a), in some applications the examination medium (1200) can be configured to use a diffuse ray source (1250) to perform a preliminary analysis of a sample to characterize an area of ​​the sample that presents a shape change. Furthermore, the examination device can also be configured to use a laser source (1220). To perform a more detailed analysis of the characteristic space and to obtain a quantitative measure of the shape change. However, it is possible to realize

<p dir="rtl">25 The examination device can only consist of one of these two radiation sources and provide reliable results</p>

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on her. For example, analysis of galactic wavelength using a diffuse ray source can also provide quantitative information regarding the extent of the disturbance, as mentioned before.

Specifically, the scattered ray source (1250) is configured to emit a cone of rays (1240) (identified by the dotted lines in Figure 12a). The light material will, in response to these rays, be generated

<p dir="rtl">5 (such as white light for example), a diffraction pattern by reflecting and neutralizing different wavelengths along different directions. This diffraction pattern will be focused through the lens (1280) to the diffraction sensor (1260), which collects it and presents the captured images to the processor (1216) For further analysis.</p>

In the case of local perturbation, the asymmetric variation of the wavelength will not change uniformly as in the absence of perturbation. . This sudden change in color can be detected by the processor (1216), which is

<p dir="rtl">10 Initialized by executing one or more program modules that include the analysis program. The processor can also be configured to generate a notification accordingly. For example, depending on the gradation of color change in the captured image, the processor can send a warning signal such as a sound through an audio or light emitter (1270). The processor can also be configured by executing an analysis program to analyze the sudden color difference marked by the system. , the processor can be configured to associate the size of a periodic property</p>

<p dir="rtl">15th at the measured specific wavelength (as mentioned before), and obtain the magnitude of the perturbation by comparing it to a reference volume such as the regular magnitude of the periodic property measured in unperturbed areas.</p>

Figure (13a) illustrates a representative special program (1300) for color difference analysis to determine the size of a periodic property of a specific measured wavelength. Continuous reference to the test method (1200) shown in Figures (12a - 12c). Specifically, at step (1305), the Processor (1216), which has been

<p dir="rtl">20 Initialized by executing one or more program modules (1245), included in the analysis software, the wavelength at each specified point on the captured image is converted into a magnitude of the periodic property of the optical material. As explained before, the conversion can be performed as a function of the device geometry and the corresponding specified diffraction angles as a spot of the specified wavelength analyzed Once the periodic characteristic size has been determined, at step (1310), the custom processor can calculate the amount of shape change,</p>

<p dir="rtl">25 By comparing it with the periodic property known under normal conditions. In addition or in place of it, it can</p>

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Compare the cyclic characteristic relative to a specific cyclic characteristic of the surrounding environment, for example, to distinguish any difference that exceeds a specified threshold value. Then, in step (1315), the custom processor can be output, using the shapeshift value that accompanies the results on a display (1217) to be associated with the processor. Furthermore, in step (1315), the complete image can be output, or

<p dir="rtl">5 A wavelength map by the processor configured using the display (1217). In addition, the information can be stored by the processor in storage (1235) and/or transmitted via the communications interface (1255) to a calculator or over a network to a central processing center server ( (not shown) for further analysis and/or storage. Figure (11) shows two side-by-side visual images of the wavelength map generated and output by the inspection device for a sample being examined. Specifically,</p>

<p dir="rtl">10 On the left side of the image, the map is depicted without stress applied to the sample, and on the right side of the image, a map of the sample is depicted while stress is applied to the sample.</p>

15

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An alternative method for detecting and analyzing disturbances of a sample material is based on the diffraction of a laser beam (1230). As shown in Figure (12a), the incoming beam (1290) is a diffracted beam resulting from the interaction of the emitted laser beam (1230) with the optical sample material. The detection of this ray (1290) by a searchlight (1214), and its position on the detector will indicate the diffraction angles, which are related to the size of the periodic property of the light material according to the previous equation (1), in the form of (12) there are two additional elements shown that include a mirror (1212) A lens or optical filter (1213) to adjust the intensity of the beam. Both of these elements are not required for the basic function of the screening device (1200), but they can be useful in that they can provide a more efficient measurement. Specifically, the presence of the mirror (1212) can extend the optical path and can direct the beam to the detector site, which can be specified with the aim of minimizing the size of the medium, for example.Moreover, the inspection tool (1200) can be configured to include more than one mirror for this purpose.

The function of the element (1212) can be one or more of the following, a filter to reduce the intensity of the laser so that the searchlight or concave lens is saturated to spread the beam. This format can be used to reduce the intensity of the beam

25 . (1290) and distribute it over a larger area for detection on the searchlight (1214). For example, to make

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Multiple instantaneous measurements from different sensor units identify the detector (1214). In some applications, the detector or searchlights (1214) can be a photodiode placed on the beam path when the material is under normal conditions, or it can be a CCD array with Different sensitive elements, so that any change in the diffraction angles will result in the beam hitting the searchlight in

<p dir="rtl">5 different positions. A photodiode or a CCD array can be configured to convert the intensity of the rays into the intensity of an electric current. Furthermore, this current can be converted into voltage, which can then be used for input to the processor. Accordingly, the processor can be configured to convert the input voltage into a measurement of morphology of the sample being examined.</p>

More specifically, Figure (13b) shows a special representative program (1350) that the processor runs to quantify

<p dir="rtl">10 to change the shape of the material. Specifically, at step (1355), the processor, which is configured by executing one or more program modules (1245), includes the analysis program, converts the received voltage to a beam position on the detector. For example, this transformation can be done as a function of the known location of the sensor elements that include the detector (1214). Then, as explained before, at step (1360), the configured processor can be transformed, depending on the geometry</p>

<p dir="rtl">15th The method has the computed position to the diffraction angles. Then, at step (1365), the processor converts the diffraction angle into a periodic property of the optical material. At step (1307), the processor compares this specific periodic property to the known periodic property in the case of no shape change, and at step (1375) it outputs and stores the specified value Quantitatively for any shape change.</p>

By turning briefly to Figures 16A-16B, which show representative images (e.g., 20-wavelength maps) of light captured by a representative examination method from a composite structure examination built according to

for the disclosed models. Also, Figures 16A and 16B are examples of how a representative structural material constructed according to the disclosed patterns neutralizes light, in the absence or presence of a force applied to it. As shown in Figures (16A - 16B), the neutral color/shade or wavelength At each specific point on the material it can change depending on the force applied to the material and change its shape

<p dir="rtl">25 Larger, Figure (16a) represents an image of a subject being examined in a situation where incident white light has been reflected</p>

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(or more generally for rays of multiple wavelengths, neutralized by the photostructure mentioned in this application as a slit, which, in this example, is not a strain limit. Figure (16b) represents the situation in which the same optical element is stretched or slit (for example from stress), the separation is increased and the diffraction pattern is changed.

<p dir="rtl">5 The visual map shown in Figures 16A-16B is an example of refracted ray information.</p>

Captured as input to the examination medium. After processing a wavelength and converting it to a displacement, the output of the scan device can also be represented as a color map in two dimensions if each color is specified as corresponding to a certain value of the displacement. However, it has been noted that information regarding the apparent color or shade of the two representative images is provided as an example and may be different. Therefore, the input and output can appear to be the same, while

<p dir="rtl">10 They contain different information.</p>

If the analysis is performed with a laser beam, rather than a diffuse beam, the pattern will not be uniform, but will consist of uniformly distributed spots like those visible in Figures 1, 4) (eg 160a, 160b, 160c, 160d, 160e, 465). The captured two-dimensional image, due to the scattered rays, provides real-time information about a larger area of ​​a sample, since the anti-area is larger.

<p dir="rtl">15th Conversely, the image of the diffraction pattern generated by the diffraction of the laser beam provides information regarding the counterspace by the laser beam. This latter body, can be more sensitive and can be useful when a small displacement is expected to occur regularly across a larger sample area. Alternatively, diffuse beams can be used as a preliminary analysis, and lasers as a more detailed analysis afterwards.</p>

Figure (12b) illustrates the examination method (1200) shown in Figure (12a) from my perspective

<p dir="rtl">20 in front, so that the windows (1218) can be seen, positioned so that the rays exit and enter into and out of the examination facility (1200). Specifically, the diffracted laser beam collection window is marked as (1218a), and the image collection window is marked as a wavelength map (1218b), The window through which the scattered rays exit from the medium has been identified as (1218 d), and the window through which the laser ray exits from the medium has been identified as (1218 d).</p>

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An alternative is a more compact format for the components of the scan tool (1200), which is illustrated in Figures (14A - 14B). Figure (14A) is a front perspective projection of this different type of scan tool (1200) in a more compact form and Figure (14B) is a rear perspective projection. For the special shape of the embedded elements in the form of a representative built-in inspection method and operating principles, this representative different style

<p dir="rtl">5 Mainly equivalent to the screening method (1200) shown in Figures (12a - 12b). Therefore, the corresponding components are numbered in a consistent manner. However, to reduce the space used, the two light sources are placed one on top of the other. In particular, the lamp (1250) is represented On top of the laser emitter (1220), however, it can be realized that the two sources (1250, 1220) can have a counter-format. One advantage of having the laser source below is that it is on the same plane as the laser detection system, thus</p>

<p dir="rtl">10 It is easier to group the beam and direct it to the searchlight if it is on the same plane. Nevertheless, it can be realized that additional components to direct the beam to the detection system can easily be included in the scanning device if the light source is not exactly at the same level as the detector. In addition, the representative configuration of the test device (1200) shown in Figures (14A - 14B) was also shown containing two batteries (1219) as a power source.</p>

<p dir="rtl">15th Although the representative models in Figures 12a-14b are illustrated in a high-level (eg simplified) form, according to one or more models, the screening medium can be configured to have a more basic form. As mentioned before, the screening medium can include a source Only one photodiode (eg 1220 or 1250) and the corresponding detection components do not necessarily require both types of sources at the same time, since each of the two systems can be used separately to provide quantitative information at the same time.</p>

<p dir="rtl">20 It relates to the Arbat officer. Furthermore, one or more optical elements can be removed as a mirror or lens without departing from the declared range of models.</p>

However, there are other potential models that are configured to implement different detection systems and methods, which can be useful for certain practical applications. In particular, one of the representative alternative options for collecting neutral laser beams and directing them to a detector that measures intensity simply is to collect more than one beam.

<p dir="rtl">25 One is neutralized and focused on the searchlight by a lens, or a system of lenses. High scheme explained</p>

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The level of a representative examination device (1500) has that shape in Figures (15A and 15B). Specifically, Figure (15A) is an upper projection and Figure (15B) is a frontal projection of the examination device (1500).

This particular aspect of the examination method is generally analogous to the one described in relation to Figures (12A-14B). However, there is an additional feature which is the presence of two lenses (1511, 1513) placed on a path

<p dir="rtl">5 The two incoming laser beams (1590, 1595). In this configuration, the two beams are combined by a lens (1511), which reduces their spacing or, if possible, also generates some level of convergence. The two beams are then reflected by a mirror (1512) through a lens Other (1513). A lens (1513) can be necessary or not, depending on the initial spacing of the two beams or by the power of the lens (1511). The purpose of an additional lens (1513), if not already achieved by the lens</p>

<p dir="rtl">10 . (1511), is the focus of the two beams on a sensitive part of the photodiode (1514), which is</p>

Converts the intensity of the rays into a current.

In the morphology of the photonic material, the beam spacing on the photodiode must be weakened. Specifically, if the spacing changes (1590, 1595) the focal point or the point of intersection of the two beams will occur either before or after the photodiode. This will cause a change in intensity in the current generated

<p dir="rtl">15th by a photodiode (1514). Accordingly, through a calibration, the processor (1516), which is coupled to the photodiode, can be configured to relate the magnitude of the shape change on the sample material to a specific intensity change measured at the photodiode. For the steps conducted by the processor (1516), which was configured by implementing an analysis program, to convert the intensity into the size of a shape change on:</p>

<p dir="rtl">20 Photodiode, well-defined divergence angles for the two beams at the lens position (1511). Using equation (1) and diffraction angles, the configured processor can then calculate the periodic property interval responsible for those calculated diffraction angles.</p>

Therefore, a change in the periodic property of the groove caused by a turbine will produce a change in intensity on the detector. The intensity of the electric current generated by the photodiode, which is proportional to

<p dir="rtl">25 The intensity of the rays can be converted into voltage and the voltage can be processed by the processor unit (1516) to generate</p>

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A value for the change of shape on a substance by comparing it to the strength collected under normal conditions. The calculations carried out by processing are as mentioned in the previous paragraph. This information can be sent from the processor to a display (1517), which shows quantitative information about the disturbance.

In Figures 15a and 15b there are two lenses and one mirror, which, as explained before, is not necessary.

<p dir="rtl">5 To operate the examination device (1500). However, there may also be more lenses and mirrors to achieve the same function and, in some cases, more effectively. For example, if the laser beam spacing is very high, lenses may be needed More so that the beam is focused on the searchlight (1415). For the same reason, more mirrors may be needed to increase the optical path of the two laser beams inside the device to achieve the desired convergence.</p>

<p dir="rtl">10 Limit In order to make the position of the various elements within the facility as appropriate as possible, the searchlight may be in an inaccessible subject or hidden behind another element. For this reason, more beam or beam mirrors may be required to reach the required searchlight or element.</p>

In addition, alternative formats for a representative screening medium can provide greater degrees of freedom and a higher level of dimension to measure perturbations. As photovoltaic materials, for example structures

<p dir="rtl">15th The analog composite mentioned before, can be configured to have variable dimensions (eg one-, two-, three-dimensional slits), then the inspection medium can also be configured to detect and present the higher dimension. For example, if an optical material consists of a two-dimensional grid, then The examination device can be configured to detect changes in diffraction angles not only on one plane, but on two planes.In this configuration, the diffracted laser beam (such as the 8290 beam in Figure 12 for example) can move.</p>

<p dir="rtl">20 example) to the sides with respect to the searchlight, and it can also move vertically as a function of perturbation. In this case the angular differences in the diffracted ray will be analyzed not only on the plane of the means, but also in a plane perpendicular to it. Therefore, the method will provide mirrors, and lenses and detectors equipped to receive, process, and analyze radiation that are aligned vertically on the plane of Figure (13a) and Figure (16a). Accordingly, the examination device can be configured to detect this two-dimensional motion of a beam</p>

<p dir="rtl">25 neutralizer laser. More specifically, in some applications, the detector (1214) can consist of a medium</p>

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Scan from a planar array of CCD arrays, eg, on top of each other, or in any other 2D sensor format. The scheme of the system will generally be analogous to this in Figure (12) (and also the screening method shown in Figure 14A or 15A, for example), with the only difference being that the sensitivity of the method will be enhanced by the difference in the particular design of the detector. As a result, the examination device will not only be able to detect and quantify the presence of a shape change, but will also be able to determine the anisotropic shape or directivity of that shape change, by measuring a displacement along two different directions according to the two-dimensional shape of the device and the photostructure annotated by

Before.

Furthermore, in order for the screening medium to use a 3D optical system such as a photonic crystal 10 described by correlation, for example, in Figures 8a - 10a, the screening medium can be configured to capture and analyze

Multiple diffraction lines at the same time through different windows and detection of different diffraction angles. The relative position of the windows relative to the examiner beam is determined as a function of the specific structure of the 3D streaks or the particular photonic crystal. For example, a 3D optical structure with an optical bandgap will generate a diffraction pattern with allowed bandgaps and forbidden bands along different directions.

<p dir="rtl">15th Defined by different streak levels. Therefore, it will be possible to observe the absence or lack of rays of a certain wavelength along a certain direction. For example, consider a 3D opal with a surface-centred cubic lattice (FCC), it will create an array of optical stopping bands or bandgaps, if the quality of the streaks is very high. Few of these stop bands or bandgaps will be more intense than others and can be grouped at angles not very different from each other.</p>

<p dir="rtl">20 Specifically, the stop ranges corresponding to grid planes having Miller coefficients, eg, 111, 220, 200 can be summed (as explained before) and monitored by the means. Therefore, if there is an increase in intensity corresponding to a given stop range along a specific direction, then This will indicate a change in the interval between the corresponding streak levels.Moreover, if the stop-band movement can be monitored by two-dimensional detectors such as two or more CCD arrays, this will also indicate whether</p>

<p dir="rtl">25 The displacement of the grooves was in compression or extension. According to this, it is possible to monitor the movement (as angularity or intensity)</p>

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for different stopbands or bandgaps separately, and this analysis will provide multidimensional information (as many dimensions as the number of analysed stopbands) about the anisotropy of the shape change occurring within the grooves along the different analyzed directions.

Although this method will only work without a fluorocarrier as explained before,

<p dir="rtl">5 Its presence will greatly simplify the measurement. In the presence of one or more fluorescent carriers, the incident rays can target their optical excitation, so that analysis can be performed on their emission. In that scenario, the emission of the fluorescent carrier would be homogeneously radiated in all directions independent of the direction of excitation. However, its intensity will decrease sharply in the presence of stop bands or bandgaps along directions defined by different streak constants or levels,</p>

<p dir="rtl">10 The wavelength or emission of one or more fluorescent carriers. Therefore, by adapting the device in this way so that it observes the absence of intensity along any or all of these directions, the presence of displacement can be determined by observing the change in intensity. In this way a multidimensional anisotropic analysis (many dimensions such as hydrolyzed stopping bands) will be provided for the shape change of the material and any change that determines a difference in the refractive index or emitting properties of one or more materials included in the system. These changes,</p>

<p dir="rtl">15th To name a few are temperature changes, chemical absorption, introduction of functional groups, presence of magnetic fields, exposure to other types of radiation.</p>

Two other practical applications of the disclosed models of the invention are represented in Figures (16, 17). The main difference between these representative examination devices and the examination methods mentioned before is their ability to move the light source. In Figure (16) the light source can be a source 20 Diffuse beam (1701) or laser beam (1704), or both at the same time.

The source is with a movable arm (1703) which can be slipped over another arm (1702). To adjust its distance from the body of the device, which is represented in this figure by a cylinder. The boom (1702) can rotate around the device and is held in place by a system My fence (1601) is about the means. The rays emitted by the source (1704) are indicated by the reference number (1705),

<p dir="rtl">25 These rays are deflected from the material and sent to the medium, following the path delineated by the dotted line</p>

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(1705). These rays will enter the facility through a window (1706) and are likely to be reflected by one or more mirrors (1707) to reach the searchlight (1708). Even in this case the presence of mirrors is not required, but it can facilitate the construction of the facility The most appropriate (1705) is a processor and (1710) is a touch screen or simple screen for displaying data and results. The advantage of having a 5 camera that moves relative to the sensor is that it makes it easy to collect rays from different directions

Thus, they observe different diffraction conditions (for 2D optical materials, or stop bands) different bandgaps (for 3D optical materials). Even in this case, if the light source is diffuse, the camera sensor placed close to the window ( 1706) will observe changes in the neutral wavelength at each point, whereas if the light source is a 10 laser beam, the absence or presence of rays, or the intensity of the rays will provide information regarding the displacement of the material.

In Figure (17) the principles used are similar, the main difference is that this model focuses on the user interface. The entire system can be configured and minified on a means similar to a tablet computer represented in this figure. The dashed line (1806) represents the touch screen on the device on the side corresponding to the current projection. The back side of the device in this figure is shown above the figure, including

<p dir="rtl">15th Light sources (1802, 1808) are on movable arms that can rotate in a circle around a spot. This spot does not necessarily have to be the center of the medium, but can be positioned where it is most convenient. Light sources can also slide along the movable arms (1801) It can be placed anywhere on a circular area (1805) and thus covers many diffraction angles. The movable arm can move around a circular holder (1803). In the case of a laser beam source (1802), one of the</p>

<p dir="rtl">20 The possible paths of the ray are drawn by a dashed line: it is reflected and neutralized by the optical material and redirected towards a window (1804) of the medium which may be the sensitive element of the searchlight itself, or a window through which the ray passes to the searchlight or onto one or more mirrors as shown in Previous embodiments If a diffuse light source is used, an image of the diffraction pattern will be analyzed by a camera sensor (1804). It has also been noted that element (1804) can be either a sensor</p>

<p dir="rtl">25 The camera, or a projector, or both, or a window through which the rays are carried, so that they can reach</p>

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to the appropriate sensitive element either directly or via a group of mirrors, or other optical elements.

At this point, it should be noted that although much of the foregoing description relates to systems and methods for providing composite structures, the systems and methods disclosed in this application may likewise be deployed and/or

<p dir="rtl">5 Its implementation in scenarios, situations, and situations that are far from the aforementioned scenarios.</p>

It should be realized that fewer or more operations can be performed than shown and described in the figures. These operations can also be performed in a different order from those mentioned. It should be understood that similar reference numbers in the drawings represent similar elements across the many forms, and that not all components and/or steps mentioned and illustrated by reference to the figures are required for all forms or formats.

10

15

20

Thus, the models and formats shown for current systems and methods provide a computer-implemented system and method, a computer system, and a computer program product for field devices that can be configured wirelessly. The box and flow charts in the figures illustrate the structure, functionality, and operation of potential applications for computer program systems, methods, and products according to different models and formats. In this regard, each box in a box or flowchart can represent a module, part, or piece of code, which contains one or more executable instructions to perform the specified Boolean functions. It should also be noted that, in some alternative implementations, the That the jobs mentioned in the box occur in a different order mentioned in the figures. For example, two consecutive illustrated boxes, in fact, can be executed mainly concurrently, or sometimes the boxes can be executed in reverse order, depending on the particular functionality. It will also be noted that each box diagram and/or flowchart, and a combination of funds in the box diagram and/or flowchart, can be implemented by systems based on a special-purpose physical component whose specific functions or actions are performed, or combinations of a physical component for a purpose Special and computer instructions.

The terms used in this application are intended to describe certain models only and are not restrictive

For sister take care. As used in this application, the individual pictures “the”, “an”, and “a” include pictures of

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plural as well, unless the context clearly indicates otherwise. It will also be understood that the terms "includes" and/or "includes" when used in this specification specify the existence of the attributes, integers, steps, operations, elements, and/or components mentioned, but does not exclude the existence or addition of one or more of the Attributes, integers, steps, operations, elements, other components, and/or groups

<p dir="rtl">5 Of which.</p>

Also, the wording and conventions used in this application are for descriptive purposes and should not be considered restrictive. The use of "include", "include", "with", "contain", "consists of" and their synonyms in this application means the existence of the following terms and their equivalents, in addition to additional terms.

The above technical subject matter is provided for clarification only and should not be considered to be restricted. Can

<p dir="rtl">10 Making various modifications and changes to the technical subject mentioned in this application without following the models and representative applications explained and mentioned, and without deviating from the content and the real scope of the current invention, which are mentioned in the following elements of protection.</p>

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