Laser processing method and semiconductor chip
Abstract
A LASER PROCESSING METHOD IS PROVIDED, CAPABLE OF HIGHLY PRECISELY CUTTING IN PARTICULAR A LAMINATION SECTION WHEN CUTTING A SUBSTRATE ON WHICH THE LAMINATION SECTION INCLUDING PLURAL FUNCTIONAL DEVICES IS FORMED. IN A STATE IN WHICH A PROTECTIVE TAPE (22) IS ADHERED TO A SURFACE (16A) OF A LAMINATION SECTION (16), BY IRRADIATING A BACKSIDE (4B) OF A SUBSTRATE (4) AS A LASER BEAM INCIDENT SURFACE WITH LASER BEAMS (L), A MODIFIED REGION (7) IS FORMED INSIDE THE SUBSTRATE (4) ALONG A CUTTING SCHEDULED LINE AND A CRACK (24) EXTENDING FROM THE SURFACE SIDE END PORTION (7A) OF THE MODIFIED REGION (7) TO A SURFACE (4A) OF THE SUBSTRATE (4) IS GENERATED. THEN, IN A STATE IN WHICH THERE EXISTS THE CRACK (24) THUS GENERATED, IF AN EXPANDABLE TAPE IS ADHERED TO THE BACKSIDE (4B) OF THE SUBSTRATE (4) AND EXPANDED, IT IS POSSIBLE TO PRECISELY CUT NOT ONLY THE SUBSTRATE (4) BUT ALSO THE LAMINATION SECTION (16) ON THE CUTTING SCHEDULED LINE, THAT IS, INTERLAYER INSULATING FILMS (17A) AND (17B).
Term
No projected expiry on record.
- Priority
- Filed
- Published
- Today
Every citation, both ways
| Document | Relation | Office |
|---|---|---|
| US20040002199A1 | Cites | United States of America |
23 members in 8 offices
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| P2004329560 | Japan | – | |
| 2004329560 | Japan | A |
Members23
| Document | Office | Kind | |
|---|---|---|---|
| WO2006051866A1 | World Intellectual Property Organization (WIPO) | A1 | |
| JP2006140355A | Japan | A | |
| TW200624205A | Taiwan Province of China | A | |
| EP1811551A1 | European Patent Office (EPO) | A1 | |
| KR20070086026A | Republic of Korea | A | |
| CN101057317A | China | A | |
| CN100487868C | China | C | |
| EP1811551A4 | European Patent Office (EPO) | A4 | |
| US2009212396A1 | United States of America | A1 | |
| US2011001220A1 | United States of America | A1 | |
| US7902636B2 | United States of America | B2 | |
| US8143141B2 | United States of America | B2 | |
| JP4917257B2 | Japan | B2 | |
| TW201219137A | Taiwan Province of China | A | |
| MY147341AThis record | Malaysia | A | |
| TWI380867B | Taiwan Province of China | B | |
| KR20130016406A | Republic of Korea | A | |
| KR20130016407A | Republic of Korea | A | |
| KR101282432B1 | Republic of Korea | B1 | |
| KR101282459B1 | Republic of Korea | B1 | |
| KR101282509B1 | Republic of Korea | B1 | |
| EP1811551B1 | European Patent Office (EPO) | B1 | |
| TWI422451B | Taiwan Province of China | B |
Numbers
- Publication
- 147341
- Application
- 5316
Titles
- English
- LASER PROCESSING METHOD AND SEMICONDUCTOR CHIP
Classification
- CPC, 6
- B28D5/0011
- H10P54/00
- B23K26/40
- B23K26/53
- B23K2101/40
- B23K2103/50
- IPC, 7
- H01L29 30
- H01L21 46
- H10D62 00
- B23K26 364
- H10D62 50
- B23K26 38
- H10D99 00