Laminate, laminated film and molding

[Name of invention]

Laminate, Laminate Film and Molded Products (LAMINATE, LAMINATED FILM AND MOLDING)

[Brief Description of Drawings]

1 is a graph schematically showing the relationship between the X-ray diffraction peak of the inorganic layer acid compound and the "unit thickness a" of the compound.

2 is a graph schematically showing the relationship between the X-ray diffraction peak of the resin composition containing the inorganic layered compound and the "interplanar spacing d" of the composition.

3 schematically illustrates the relationship between the X-ray arc peak of the resin composition and the "planar spacing d" of the resin composition in the case where the peak corresponding to the "planar spacing d" overlaps with the halo (or background) and is difficult to detect. is a graph represented by 2θ in this figure_dThe area of the part except for the baseline on the lower angle side is made into the peak corresponding to "plane spacing d".

4 is a laminated film configuration of the present invention in which a resin film 3, a layer 2 of a gas barrier material disposed on the resin film 3, and an inorganic layer compound disposed on the layer 2 of the gas barrier material are used as the layer 1 of the present invention. is a schematic cross-sectional view showing one aspect of

Fig. 5 is a schematic cross-sectional view showing another aspect of the structure of the laminated film of the present invention obtained by arranging the application substrate 4 again on the inorganic layer compound-containing layer 1 of the aspect of Fig. 4 .

Fig. 6 is a schematic cross-sectional view showing another aspect of the laminated film configuration of the present invention by arranging the base material 4 for lamination again on the surface side of the resin film 3 in the aspect of Fig. 4 above.

7 is another aspect of the laminated film configuration of the present invention by arranging substrates 4 to 4a for lamination, respectively, on both the face side of the inorganic layer compound-containing layer 1 and the face side of the resin film 3 of the aspect of FIG. 4, respectively. is a schematic cross-sectional view showing

Fig. 8 is a schematic view showing one embodiment of the structure of the laminated film of the present invention, comprising a layer 2a of a material having a mib formation and a layer 1 of an inorganic layered compound containing material (resin composition) disposed on the layer 2a of the gas barrier material. be sectioned

Fig. 9 is a schematic cross-sectional view showing another embodiment of the laminated film configuration of the present invention by arranging the base material 13 for lamination again on the inorganic layer compound-containing layer 1 of the aspect of Fig. 8 above.

Fig. 10 is a schematic cross-sectional view showing another aspect of the laminated film configuration of the present invention by arranging the base material 13 for lamination again on the side of the layer 2a of the gas barrier material of the aspect of Fig. 8.

11 is another view of the laminated film configuration of the present invention obtained by arranging laminated substrates 13 to 13a again on both the face side of the inorganic layer compound-containing layer 1 of FIG. 8 and the face side of the gas barrier material layer 2a, respectively. It is a schematic cross-sectional view showing the sun.

Fig. 12 (Table 1) is a table showing data of the structure and oxygen permeability of the laminated films obtained in Examples.

Fig. 13 (Table 2) is a table showing data of the structure and oxygen permeability of the laminated film obtained in another example.

Fig. 14 (Table 3) is a table showing the data of the structure and oxygen permeability of the laminated film obtained in another example.

15 is a graph showing the X-ray diffraction peak of the polyvinyl alcohol PVA-117H/Knippy F composition used in Examples.

16 is a graph showing the X-ray diffraction peak of Kniphia F (non-morillonite) used in Examples.

FIG. 17 is a graph showing the X-ray diffraction peak (the pattern in FIG. 2) of the composition rule of the interplanar spacing d=19.62 angstroms.

18 is a graph showing the X-ray diffraction peak (the pattern of FIGS. 2 and 3 is present) of the composition having interplanar d=39.34 angstroms.

19 is a graph showing the X-ray diffraction peak (pattern of FIG. 3) of the composition having a plane spacing of d44.13 angstroms.

FIG. 20 is a graph showing the X-ray diffraction peak (the pattern of FIG. 3) of the composition having an interplanar spacing of d44.13 angstroms.

Fig. 21 is a schematic diagram for explaining the bending method used in the "bending test method", which will be described later.

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