Nova Patents
KR20040000004A

Apparatus of inspection for back light unit

Abstract

The present invention relates to a backlight unit inspection apparatus, wherein when a luminance enhancing film is formed on a backlight unit to be inspected, in order to prevent a defect of the backlight unit from being detected due to the increased luminance, the polarization axis is By forming a polarizing means that is the same as or different from the luminance improving film by 90 degrees in the improvement film, the light passing through the luminance enhancing film and the defect is selectively transmitted to easily detect the part where the defect exists. It has the effect of being able to

Term

Term ended

Projected expiry passed 19 June 2022, 4.3 years ago.

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Citations
DocumentRelationOfficeCited during
WO2009064054A1Cited byWorld Intellectual Property Organization (WIPO)Search report
US7959321B2Cited byUnited States of AmericaApplicant
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US9287241B2Cited byUnited States of AmericaApplicant
WO2012030109A2Cited byWorld Intellectual Property Organization (WIPO)International search
US8088302B2Cited byUnited States of AmericaApplicant
WO2012030109A3Cited byWorld Intellectual Property Organization (WIPO)International search
WO2009064054A1Cited byWorld Intellectual Property Organization (WIPO)International search
US8017961B2Cited byUnited States of AmericaApplicant
US8132952B2Cited byUnited States of AmericaApplicant
KR200452394Y1Cited byRepublic of KoreaSearch report
KR101008903B1Cited byRepublic of KoreaSearch report
KR100722223B1Cited byRepublic of KoreaSearch report
KR100690332B1Cited byRepublic of KoreaSearch report