Charge transfer element
Abstract
PURPOSE:To enlarge the maximum charge transfer quantity of a charge transfer element by a method wherein a well of electric potential distribution in the condition existing no free electron is made as deep. CONSTITUTION:A p type impurity diffusion region 10 of the samely conductive type with a semiconductor substrate is formed on the whole surface of an n type impurity diffusion region 2 of the inversely conductive type to the substrate. Impurity concentration and thickness of the layer of the impurity diffusion region 10 is so instituted as when the impurity diffusion region 2 is in the minimum potential condition being completely depleted, namely in the minimum voltage in order to have no existence of free electron in the n type region 2, the impurity diffusion region 10 is to be depleted completely at the same time.

Term
Term ended
Projected expiry passed 17 June 2000, 26.3 years ago.
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- Published
- Projected expiry
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2 sheets
Sheet 1 Sheet 2
Every citation, both ways
| Document | Relation | Office | Cited during |
|---|---|---|---|
| WO2006070598A1 | Cited by | World Intellectual Property Organization (WIPO) | International search |
| US7948048B2 | Cited by | United States of America | Applicant |
| JPS58137252A | Cited by | Japan | Search report |
Numbers
- Application
- 8263080
Titles
- English
- CHARGE TRANSFER ELEMENT
Classification
- CPC, 1
- H10D44/45
- IPC, 4
- H01L29 762
- H01L21 339
- H01L27 148
- H01L29 768