Narrow Band Omnidirectional Reflectors And Their Use As Structural Colors
11 claims: 3 independent, 8 dependent
- 1A paint containing an omnidirectional structural color reflector in the form of flakes and a binder mixed with the omnidirectional structural color reflector.The omnidirectional structural color reflector has a refractive index n of 2 to 4.HA first layer made of a first material with a refractive index of 1-3 nLA multi-layer stack with alternating second layers made of a second material withThe first layerOuter surfaceandHas the first predetermined thicknessAndThe second layer is an outer surface that extends over the outer surface of the first layer.andHas a second predetermined thicknessAnd The first layer spreads over the second layer,In the second layerIn direct contact, the first layer and the second layer have a refractive index contrast of 0.2 to 1.0 n.H-nLHave、 The first predetermined thickness, the second predetermined thickness, and the refractive index contrast of 0.2 to 1.0.Because of the multi-layer stack, Reflection band less than 200 nanometers when viewed from 0 to 80 degreesHave、The omnidirectional structural color reflector exhibits a structural color that remains constant when viewed from an angle of 0 to 45 degrees, and / or the dispersion of the central wavelength of the omnidirectional structural color reflector is 0 degrees. It is 40 nm or less in the incident angle range of ~ 90 degrees, The multi-layer stack has more than 3 layers,paint。 フレークの形態にある全方向性構造色反射体と当該全方向性構造色反射体と混合されたバインダーとを含む塗料であって、前記全方向性構造色反射体は、2~4の屈折率nHを有する第一の材料でできた第一の層および1~3の屈折率nLを有する第二の材料でできた第二の層を交互に有するマルチレイヤースタックであり、前記第一の層は、外表面および第一の所定の厚さを有し、前記第二の層は、前記第一の層の外表面にわたって広がる外表面および第二の所定の厚さを有し、 前記第一の層は、前記第二の層にわたって広がり、前記第二の層に直接に接触し、 前記第一の層および前記第二の層は、0.2~1.0の屈折率コントラストnH-nLを有し、 前記第一の所定の厚さ、前記第二の所定の厚さ、および0.2~1.0の前記屈折率コントラストにより、前記マルチレイヤースタックは、0度から80度の角度から眺めたときに200ナノメートル未満の反射帯域を有し、前記全方向性構造色反射体は0度~45度の角度から眺めたときに一定のままである構造色を示し、及び/又は前記全方向性構造色反射体の中心波長の分散は0度~90度の入射角範囲で40nm以下であり、 前記マルチレイヤースタックが3より多い層を有する、塗料。
- 10Claim that the flakes have an average thickness in the range of 0.5-5 micrometers.Any one of 1 to 9Described inpaint。 前記フレークが0.5~5マイクロメートルの範囲の平均厚さを有する、請求項1~9のいずれか一項に記載の塗料。
- 11Claim that the flakes have an average diameter in the range of 5-50 micrometers.Any one of 1 to 10Described inpaint。 前記フレークが5~50マイクロメートルの範囲の平均直径を有する、請求項1~10のいずれか一項に記載の塗料。
Independent claims3
66 paragraphs, as filed
The present invention generally relates to reflectors and methods of making reflectors. More specifically, the present invention relates to omnidirectional reflectors and methods of making omnidirectional reflectors.
Pigments appear as a particular color because it selectively reflects and absorbs certain wavelengths of light. When white light, a light that is approximately equal to a mixture of wavelengths in the entire visible spectrum, encounters a pigment, some wavelengths are absorbed by the pigment's substituents and chemical bonds, and others are reflected. This type of color development mechanism is based on light absorption, and the molecular structure generally reflects a wide range of wavelengths with moderate reflectance (50-60%). In contrast, nature provides wonderful colors and metal-type reflections in insects, butterflies, birds and fish. Such naturally occurring colors are not pigment-based and are either nanoscale multi-layered structures with alternating high and low indexing materials, or regular arrangements of nanosized particles. It is based on the interference of light reflected from. These types of nanostructured assemblies are capable of reflecting up to 100% of the incident light.
<p num="0003"> This type of nanostructure assembly, such as a multi-layer structure, has not been utilized to provide a narrow reflection band of electromagnetic radiation. Therefore, there is a demand for a multi-layer structure in which the reflectance when the multi-layer structure is viewed from various angles is constant and a narrow reflection band is provided. As described below, the present invention provides a multilayer structure that can be used to create omnidirectional narrow band reflectors and / or omnidirectional structural colors in the visible photoelectric magnetic range. A method for creating this multi-layer structure is also explained. These and other advantages of the present invention will become apparent from the drawings and discussions presented herein.</p>
<p num="0004"> A multi-layer structure is disclosed, wherein the outer surface and the first layer made of the first material having a refractive index of 2-4 are made of a second material having a refractive index of 1-3. Spreads over the outer surface of the layer. This multi-layer stack has a reflection band of less than 200 nanometers when viewed from 0 ° to 80 ° angles, and is used to reflect a narrow range of electromagnetic radiation in the ultraviolet, visible and infrared spectral ranges. Can be done. In some examples, the reflection band of the multi-layer structure is less than 100 nanometers. Also, the multi-layer structure can have an amount defined as a range-to-midrange percentage of less than 2%.</p><p num="0005"> In one embodiment of the invention, the multilayer structure may be in the form of flakes. The flakes have an average thickness range of 0.5 to 5 micrometers and an average diameter of 5 to 50 micrometers. In some examples, multiple flakes can be mixed with the binder to form a coating material that can be used to coat the structure. The coating material exhibits a structural color that remains constant when viewed from various angles. The plurality of flakes of the present invention can also be applied to a structure using other methods.</p>
The present invention includes a multi-layer omnidirectional reflector that maintains a particular reflection band of ultraviolet, visible or infrared magnetic radiation from an arbitrary angle of incidence. The present invention itself has practicality as an omnidirectional reflector for electromagnetic radiation in a narrow wavelength range. The present invention also includes a method for making the omnidirectional reflector.
The omnidirectional reflector of the present invention is a multi-layer body having a first layer with a first refractive index and a second layer with a second refractive index. In some examples, the difference between the indices of refraction of the two layers may range from 0.2 to 1.0, and this multi-layer structure is 200 nanometers when viewed from an angle of 0 ° to 80 °. Has less than a reflection band. In other examples, the difference between the indices of refraction of the two layers may range from 0.2 to 0.6, and this multi-layer structure is less than 100 nanometers when viewed from an angle of 0 ° to 65 °. Has a reflection band of.
Now, referring to FIG. 1, high refractive index (n)<sub>H</sub>) And thickness (d<sub>H</sub>First material 100 with) and low index of refraction (n)<sub>L</sub>) And thickness (d<sub>L</sub>A multi-layer structure with alternating layers of the second material 200 with) is shown. The first material 100 includes an outer surface 110, which can spread over the outer surface 210 of the second material 200. In some examples, the multi-layer structure 10 has a total number of layers greater than 3. In another example, the multi-layer structure 10 has a total number of layers greater than 7.
An electromagnetic wave consisting of vertical electrical (E) and magnetic (M) vector components has an incident angle θ.<sub>0</sub>Is shown to be incident on the multi-layer structure. This electromagnetic wave can be divided into two independent electromagnetic modes, TE (horizontal electric) mode and TM (horizontal magnetic) mode. The index of refraction of media other than the multi-layer structure 10 is n at the first end 12.<sub>0</sub>Is. For example, when the medium is air, n<sub>0</sub>Is 1. The index of refraction of the optional substrate at the second end 14 is n<sub>Base material</sub>Is. This optional substrate may be any material compatible with the multi-layer structure 10 and can be useful in the manufacture, storage, transport and / or handling of this structure. If an optional substrate is present, the substrate may or may not be removed after manufacture of the multilayer structure 10.
When electromagnetic radiation hits the surface of a material, the waves of that radiation can be reflected from or propagated through the material. In addition, the electromagnetic radiation is at an angle θ at the first end 12 of the multi-layer structure 10.<sub>0</sub>When hit by, the reflection angles created by the electromagnetic waves on the surfaces of the high-refractive index layer and the low-refractive index layer are θ, respectively.<sub>H</sub>And θ<sub>L</sub>Is.
Using Snell's Law:<maths num="1"><img id="000002" he="21" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>Refractive index n<sub>H</sub>And n<sub>L</sub>If is known, the angle θ<sub>H</sub>And θ<sub>L</sub>Is required.
For omnidirectional reflectance, the maximum refraction angle (θ) in the first layer is a necessary but not sufficient condition for the TE and TM modes of electromagnetic radiation.<sub>H, MAX</sub>) Is the blue star angle (θ) of the interface between the first layer and the second layer<sub>B</sub>) Must be smaller. If this condition is not met, the TM mode of the electromagnetic wave will not be reflected by the second and subsequent interfaces and will therefore travel through this structure.
Using this consideration,<maths num="2"><img id="000003" he="29" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>and
<maths num="3"><img id="000004" he="24" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
This requires the following:<maths num="4"><img id="000005" he="30" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
In addition to this requirement expressed by Equation 4, an electromagnetic wave of wavelength λ has an angle θ.<sub>0</sub>Toward the multi-layer structure, and each bilayer of the multi-layer structure has a refractive index of n.<sub>H</sub>And n<sub>L</sub>With thickness d<sub>H</sub>And d<sub>L</sub>If you have a translation matrix (F)<sub>T</sub>) Is expressed as follows.
<maths num="5"><img id="000006" he="30" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
This can also be expressed as:<maths num="6"><img id="000007" he="29" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
here:<maths num="7"><img id="000008" he="24" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
<maths num="8"><img id="000009" he="26" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
<maths num="9"><img id="000010" he="31" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>and
<maths num="10"><img id="000011" he="31" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>Is.
Also,<maths num="11"><img id="000012" he="24" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
here,<maths num="12"><img id="000013" he="29" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
and<maths num="13"><img id="000014" he="30" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
Clarify about TE and TM<sub>T</sub>When you solve:<maths num="14"><img id="000015" he="25" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>and
<maths num="15"><img id="000016" he="30" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
The viewing angle-dependent band structure can be obtained from the boundary conditions for the ends of the total internal reflection zone, also known as the band ends. For the purposes of the present invention, the band edge is defined as the equation of the line separating the total reflection zone and the transmission zone for a given band structure.
The boundary conditions that determine the edge frequency of the high reflectance band are given by:<maths num="16"><img id="000017" he="20" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
Therefore, from Equation 3:<maths num="17"><img id="000018" he="27" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
Or in a different way:<maths num="18"><img id="000019" he="29" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
Combining equations 15 and 7 gives the following bandwidth-end equation:<maths num="19"><img id="000020" he="22" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths> here,<maths num="20"><img id="000021" he="17" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>and:<maths num="21"><img id="000022" he="19" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>The + symbol in the above band-end equation is the long wavelength (λ).<sub>long</sub>) Represents the band edge, and the-symbol represents a short wavelength (λ)<sub>short short</sub>) Represents the band edge.
Reorganizing equations 20 and 21: About TE mode<maths num="22"><img id="000023" he="25" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>and:
About TM mode<maths num="23"><img id="000024" he="26" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>Is.
An approximate solution for the band edge can be defined by the following expression:
<maths num="24"><img id="000025" he="25" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>This approximation is valid given the quarter-wave design (described in more detail below) and the optical thickness of the alternating layers selected to be equal to each other. Also, if the optical thickness of the alternating layers is relatively small, the cosine approaches 1. In this way, equations 23 and 24 result in an approximate band-end equation:
About TE mode:<maths num="25"><img id="000026" he="27" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
And about TM mode:<maths num="26"><img id="000027" he="27" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
L as a function of incident angle<sub>+</sub>And p<sub>TM</sub>The value of can be obtained from equations 7, 8, 14, 15, 20 and 21 thereby λ in TE and TM modes as a function of the angle of incidence.<sub>long</sub>And λ<sub>short short</sub>Can be calculated.
Looking at Figure 2, in a multi-layer system with a first material with a high index of 4.6 and a thickness of 800 nanometers and a second layer material with a refractive index of 1.6 and a thickness of 1600 nanometers. The TE and TM band edges as a function of the angle of incidence are shown. The omnidirectional band is defined in the wavelength range, where electromagnetic radiation coming from any angle is completely reflected, as indicated by the highlighted box. In the case of the example shown in Figure 2, the omnidirectional band is in the infrared region, and is approximately between wavelengths of 9.34 micrometers to 15 micrometers.
Mathematically, the omnidirectional band shown in Figure 2 can be described as:<maths num="27"><img id="000028" he="21" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
The exact solution for the band ends of Equations 23 and 24 can be expressed as: About TE mode:<maths num="28"><img id="000029" he="33" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>And about TM mode<maths num="29"><img id="000030" he="31" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>Is. Using numerical evaluation, a comparison of the exact and approximate solutions for the multi-layer system described above is shown in Figure 3. In this way, FIG. 3 explains that the approximation method obtained by the band-end equation is appropriate and appropriate.
Center wavelength of omnidirectional reflector (λ<sub>c</sub>) Is obtained from the following relationship:
<maths num="30"><img id="000031" he="24" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>This center wavelength can be an important parameter because its value suggests an approximate range of reflected electromagnetic wave length and / or color spectrum. For example, for normal incidence, the multi-layer system described above results in a center wavelength of 12.5 micrometers, which is consistent with the plots shown in Figures 2 and 3. Another important parameter that can provide implications for the width of the reflection band is defined as the range of wavelengths within the omnidirectional reflection band to the midrange ratio of wavelengths within the omnidirectional reflection band. ..
This "range to midrange ratio" (η) is mathematically expressed as: About TE mode<maths num="31"><img id="000032" he="31" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
And about TM mode<maths num="32"><img id="000033" he="29" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>Is. The range to midrange ratio can be expressed as a percentage, and it is understood that the terms "range to midrange ratio" and "range to midrange ratio percentage" are used synonymously for the purposes of the present invention. Further, the value of "range to midrange ratio" presented with the "%" symbol is understood to be the value of the percentage of "range to midrange ratio". The range-to-midrange ratio for TM and TE modes can be calculated numerically from Equations 31 and 32 and plotted as a function of high and low index of refraction, as illustrated in Figures 4A and 4B. it can. Furthermore, once the range-to-midrange ratio is determined, the corresponding reflectance can be plotted as a function of wavelength.
Examples of reflectance as a function of range-to-midrange ratio are illustrated in Figures 5A and 5B. Figure 5A shows the two curves for the TM mode range to midrange ratio-equal to 0.2% η<sub>TM</sub>And η equal to 30%<sub>TM</sub>About-shows. FIG. 5B shows the corresponding reflectance for the range-to-midrange ratios labeled "A" and "B" in FIG. 5A, with angles of incidence in the range 0 ° to 45 °. The reflection band illustrated in Figure 5B is approximately 300 nanometers, with a range-to-midrange ratio of 30% and an incident angle in the range of 0 ° to 45 °. In contrast, for a range-to-midrange ratio of 0.2% and the same angle of incidence, the reflection band is approximately 100 nanometers.
With respect to the center wavelength of the omnidirectional reflector, Equation 30 shows that the center wavelength, and thus the variance of the center wavelength, is a function of the angle of incidence. In some examples, the omnidirectional reflectors of the present invention have a small variance of the central wavelength as a function of the angle of incidence. The narrower the range of dispersion of the central wavelength, the purer the observed color, because the narrower band wavelengths are reflected from the reflector, for example to the human eye.
Methods of controlling the dispersion of the center wavelength may include a range-to-midrange ratio comparison for TM and TE modes as a function of high and low reflectance. Figure 6 illustrates the 0.2% range-to-midrange ratio for TM and TE modes as a function of high and low reflectance. As illustrated in FIG. 6, a relatively large variance between the high indexes for TM and TE modes is shown by Case I, an intermediate variance is shown by Case II, and a relatively small variance is shown by Case III. Shown. Therefore, different values for high and low reflectance can be selected for a given range to midrange ratio.
Looking at Figure 7A, the reflectance as a function of wavelength for Case I is illustrated, where the high index is equal to 2.61, the low index is equal to 1.2, and the angle of incidence is 0 ° to 45 °. Is the range of. As illustrated by this figure, when comparing the incident of normal electromagnetic radiation to the multi-layer structure and the incident of electromagnetic radiation of 45 ° to the multi-layer structure, the center wavelength shifts significantly. In contrast, relatively small differences between high and low reflectance, and equal angles of incidence result in a small dispersion of central wavelengths, as shown in Figure 7C. Therefore, a relatively small difference between the reflectances of the first material 100 and the second material 200 is desirable in order to narrow the range of wavelengths reflected by the multi-layer structure. Figure 7D quantifies the variance of the center wavelength with changes in the angle of incidence for cases I, II and III, and shows that the variance drops from about 140 nm for case I to about 40 nm for case III. Illustrated.
In another embodiment of the invention, a quarter wave technique can be used to measure the index of refraction and thickness of the material of the alternating layers for an omnidirectional reflector. Using this method, the optical thicknesses of the high-refractive-index material and the low-refractive-index material are set to be equal to each other and equal to a quarter of the desired reflection wavelength. Therefore, once the index of refraction of the multi-layer structure is selected, the thickness of the individual layers is set based on the following equation:
<maths num="33"><img id="000034" he="23" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>Where θ<sub>0</sub>Λ when = 0<sub>0</sub>= λ<sub>c</sub>Is.
Looking at FIG. 8, a graph representation of the approximate solution for the band edge of the quarter wave omnidirectional reflector is shown according to the parameters of Case II described above. This figure also shows an exact solution, which gives similar results. As illustrated in this figure, the narrow omnidirectional band at 490 nanometers coincides with the reflection band shown in Figure 7B. It is understood that the dispersion of the central wave must be minimal in order to obtain a narrow omnidirectional band. Therefore, from Equation 30, the variance of the central wave can be expressed as:
<maths num="34"><img id="000035" he="37" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>
here:<maths num="35"><img id="000036" he="29" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>And Fc, the center wavelength dispersion coefficient can be expressed as:
<maths num="36"><img id="000037" he="33" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></maths>The center wavelength dispersion coefficient is shown in FIG. 9A as a function of high index and low index. Therefore, from Equation 36 and FIG. 9A, the dispersion of the center wavelength can be reduced by appropriately selecting a material having a high refractive index and a low refractive index. The fact that the multi-layer structure, which shows a large difference between the high index and the low index even if the center wavelength dispersion coefficient is relatively low, has a wide reflection band is also illustrated in FIG. 9A with a "wide band" arrow. Will be done. Similarly, if the alternating layers have a first material with a high index of refraction close to the low index of the second material, the higher sideband of the reflected electromagnetic radiation is with the "high sideband" arrow. Occurs as illustrated. This higher sideband can be reduced by using a variety of methods, including a Lugate filter for illustration purposes.
FIG. 9B presents target regions for range-to-midrange ratio, high index and low index. If the difference between the range-to-midrange ratios in TE and TM modes is relatively large, a wide or large reflection band of the multi-layer structure occurs. In contrast, if the difference between the range-to-midrange ratios is relatively small, a relatively narrow reflection band is shown with a target region of values as seen in this diagram. Also, Figures 9C and 9D illustrate that a narrow bandwidth omnidirectional reflector is obtained in the visible region when a small index contrast (0.39) is selected between high and low index materials. ..
Thus, in some examples, the omnidirectional reflector has alternating layers of material, where one material has a low index of refraction of 1-3 and the other material has a high index of 2-3. Has a refractive index. Also, the difference between low-refractive-index and high-refractive-index materials is defined here as refractive index contrast, ranging from 0.2 to 1.0, and range-to-midrange percentages from greater than 0 to 10%. Change. In another example, the material used for the alternating layers of the omnidirectional reflector has a first material with a low index of refraction in the range of 2-3, a high index of refraction in the range of 2.47 to 3.38. Contains a second material. In yet another example, the difference between high and low index materials may be 0.35 to 0.5 and / or even if the range-to-midrange percentage is greater than 0 and 5%. Good. In some examples, the range-to-midrange percentage may also range from greater than 0 to 2%. Suitable materials for the manufacture of the omnidirectional reflectors of the present invention are selected to meet the criteria described above.
Table 1 shows possible, but not limited, high-refractive-index and low-refractive-index materials, respectively, for omnidirectional reflectors with a narrow reflection band. Therefore, by selecting the appropriate material, from various angles, the difference in refractive index is 0.2 to 1.0, and the range-to-midrange ratio percentage is from a positive value greater than 0 to 10%. It provides an omnidirectional reflector that allows structural colors that remain constant when viewed. In some examples, the structural color provided by the omnidirectional reflectors of the present invention remains constant when viewed from an angle of 0 ° -80 °. In another example, the structural color remains constant when viewed from an angle of 0 ° to 65 °. In yet another example, the structural color remains constant when viewed from an angle of 0 ° to 45 °.
Further, Table 1 is for explanatory purposes only and does not limit the scope of the present invention. Any two layers with a refractive index difference of 0.2 to 1.0 and a range-to-midrange percentage from a positive value greater than 0 to 10% are within the scope of the present invention. Also, more than two different materials can be used in the multi-layer stack, and / or one of the alternating layers was made of a defective layer, i.e. a material intentionally defective there to obtain the desired index of refraction. It is also within the scope of the present invention that it may be a layer.
It is understood that the omnidirectional reflectors of the present invention may be in the form of particles, discs, flakes and the like. In addition, particles, discs and / or flakes may be mixed with suitable organic and / or inorganic binders to form the coating. Therefore, the binder and the omnidirectional reflector of the present invention can be used to provide paints and coatings that do not change color when viewed from various angles. Also, the particles, discs, and / or flakes of the present invention can be applied to surfaces using other methods such as charging, e-coating, powder coating, spray deposition and the like, which results. It provides the surface with a color that does not change in appearance when viewed from various angles.<tables num="1"><img id="000038" he="181" wi="159" file="JP5774807B2_D0001.tif" img-format="tif" img-content="drawing" /></tables>
The flakes of the present invention may have an average thickness of 0.5 to 5 micrometers and an average diameter of 5 to 50 micrometers. For the purposes of the present invention, the term average thickness is defined as the average value obtained from measurements of at least three different thicknesses, and the term average diameter is defined as the average value obtained from measurements of at least three different diameters. It is understood that the flakes may have an optional substrate attached thereto, or may be independent flakes. The substrate may be made from any material known to those of skill in the art, including metals, alloys, plastics, ceramics, glass and combinations thereof for description, and is removed after the flakes are manufactured. It may or may not be.
It is understood that the narrow band omnidirectional reflectors of the present invention can be designed, manufactured and used to reflect ultraviolet (UV) light. Therefore, the narrow band omnidirectional reflectors of the present invention can be used to produce UV reflective coatings, and the narrow band omnidirectional reflectors of UV reflection made herein are (1) present. Available paints, stains and the like: (2) coatings of the invention containing narrow band omnidirectional reflectors that provide visible color: and / or (3) added to suitable clear binders, Manufacture a clear coating with UV protection. It is also understood that the narrow band omnidirectional reflectors of the present invention can be used in telecommunications and optoelectronic devices.
The methods for producing omnidirectional reflectors of the present invention include solgel process, alternating layer electron gun evaporation, alternating layer vacuum evaporation, thermal evaporation, CVD process, electrochemical deposition and etching process, high vacuum vapor deposition and oxidation. Includes processes, alternating layer sputtering, molecular-beam-evaporative processes, thermomechanical processes, chemical processes, polyelectrolyte multi-layer deposition by "layer-by-layer" processes and / or combinations thereof.
In this way, narrow bandwidth omnidirectional reflectors and methods of their manufacture are presented. The drawings, discussions and descriptions described above are descriptions of certain embodiments of the invention, but are not intended to be limiting in their practice. Numerical improvements and modifications of the present invention will be readily apparent to those skilled in the art given the teachings presented herein. The scope of claims includes all of the equivalents that define the scope of the invention.
<figref num="1">The schematic diagram of the multi-layer structure of this invention.</figref><figref num="2">Graphical display of the band edge as a function of the angle of incidence.</figref><figref num="3">A graph display comparing the exact and approximate solutions for the band edge as a function of the angle of incidence.</figref><figref num="4A">Graph display of range-to-midrange ratio for TM mode of electromagnetic radiation.</figref><figref num="4B">Graph display of range-to-midrange ratio for TE mode of electromagnetic radiation.</figref><figref num="5A">Graph display of range to midrange ratio equal to 30% and 0.2%.</figref><figref num="5B">Graph representation of the corresponding reflection spectra for the 30% and 0.2% range to midrange ratios shown in Figure 5A.</figref><figref num="6">Graph display showing a 0.2% range-to-midrange ratio comparison for TM and TE modes of electromagnetic radiation.</figref><figref num="7A">Graph representation of reflectance as a function of wavelength for Case I shown in Figure 6.</figref><figref num="7B">Graph representation of reflectance as a function of wavelength for Case II shown in Figure 6.</figref><figref num="7C">Graph representation of reflectance as a function of wavelength for Case III shown in Figure 6.</figref><figref num="7D">Graph representation of the variance of the center wavelength in Cases I, II and III.</figref><figref num="8">Graph display comparing approximate and exact solutions for the band edges of a multi-layer structure designed by quarter wavelength technology.</figref><figref num="9A">Graph representation of the center wavelength dispersion coefficient as a function of high index and low index.</figref><figref num="9B">A graph representation of the range-to-midrange ratio for TE and TM modes, where desired regions of high and low index of refraction are highlighted.</figref><figref num="9C">A graph display of the narrow band omnidirectional reflectance of the case with low index contrast between high index material and low index material.</figref><figref num="9D">Graph representation of the band structure of a narrow band omnidirectional reflection design with low index contrast between high index and low index materials.</figref>
<u style="single">Some embodiments of the invention relating to the present invention are described below.</u><u style="single">[Aspect 1]</u><u style="single"> First layer made of outer surface and first material with a refractive index of 2-4; and</u><u style="single"> It has an outer surface that extends over the outer surface of the first layer, and a second layer made of a second material having a refractive index of 1-3;</u><u style="single"> A multi-layer stack with a reflection band of less than 200 nanometers when viewed from an angle of 0 to 80 degrees.</u><u style="single">[Aspect 2]</u><u style="single"> The multi-layer stack according to aspect 1 above, wherein the reflection band is less than 200 nanometers when viewed from an angle of 0 to 65 degrees.</u><u style="single">[Aspect 3]</u><u style="single"> The multi-layer stack according to aspect 1 above, wherein the reflection band is less than 100 nanometers when viewed from an angle of 0 to 65 degrees.</u><u style="single">[Aspect 4]</u><u style="single"> The multi-layer stack according to aspect 1, wherein the first layer has a refractive index of 2.4 to 3.4, and the second layer has a refractive index of 2 to 3.</u><u style="single">[Aspect 5]</u><u style="single"> The multi-layer stack according to the first aspect, wherein the difference between the refractive index of the first layer and the refractive index of the second layer is 0.2 to 1.</u><u style="single">[Aspect 6]</u><u style="single"> The multi-layer stack according to the first aspect, wherein the difference between the refractive index of the first layer and the refractive index of the second layer is 0.35 to 0.5.</u><u style="single">[Aspect 7]</u><u style="single"> The multi-layer stack according to aspect 1 above, having a range-to-midrange percentage of values greater than zero to 10%.</u><u style="single">[Aspect 8]</u><u style="single"> The multi-layer stack according to aspect 1 above, having a range-to-midrange percentage of 5% from a value greater than zero.</u><u style="single">[Aspect 9]</u><u style="single"> The multi-layer stack according to aspect 1 above, having a range-to-midrange percentage from a value greater than zero to 2%.</u><u style="single">[Aspect 10]</u><u style="single"> The multi-layer stack according to aspect 1 above, which has more than 3 layers in total.</u><u style="single">[Aspect 11]</u><u style="single"> The multi-layer stack according to aspect 1 above, which has more than 7 layers in total.</u><u style="single">[Aspect 12]</u><u style="single"> The multi-layer stack according to aspect 1 above, which is in the form of flakes.</u><u style="single">[Aspect 13]</u><u style="single"> The multi-layer stack according to aspect 12 above, wherein the flakes have an average thickness in the range of 0.5 to 5 micrometers.</u><u style="single">[Aspect 14]</u><u style="single"> The multi-layer stack according to aspect 12 above, wherein the flakes have an average diameter in the range of 5 to 50 micrometers.</u><u style="single">[Aspect 15]</u><u style="single"> The multi-layer stack according to aspect 12 above, wherein the flakes are mixed with a binder to form a paint.</u><u style="single">[Aspect 16]</u><u style="single"> The multi-layer stack according to aspect 12 above, wherein the flakes are mixed with a binder to form a UV protective coating.</u><u style="single">[Aspect 17]</u><u style="single"> First layer made of outer surface and first material with a refractive index of 2-4; and</u><u style="single"> An omnidirectional reflector having an outer surface that extends over the outer surface of the first layer and forms a multi-layer stack, and a second layer made of a second material having a refractive index of 1-3. hand,</u><u style="single"> The difference between the refractive index of the first layer and the refractive index of the second layer is 0.2 to 1;</u><u style="single"> The multi-layer stack has a range-to-midrange percentage from a positive percentage greater than zero to 10%;</u><u style="single"> The multi-layer stack is an omnidirectional reflector that also has a reflection band of less than 200 nanometers when viewed from an angle of 0 to 80 degrees.</u><u style="single">[Aspect 18]</u><u style="single"> The multi-layer stack according to aspect 17 above, wherein the reflection band is less than 100 nanometers when viewed from an angle of 0 to 65 degrees.</u><u style="single">[Aspect 19]</u><u style="single"> The multi-layer stack according to aspect 17, wherein the first layer has a refractive index of 2.4 to 3.4, and the second layer has a refractive index of 2 to 3.</u><u style="single">[Aspect 20]</u><u style="single"> First layer made of outer surface and first material with a refractive index of 2.4-3.4;</u><u style="single"> A narrow bandwidth omnidirectional reflector with a second layer made of a second material with a refractive index of 2-3;</u><u style="single"> The outer surface of the first layer spreads over the second layer and forms a multi-layer stack.</u><u style="single"> The multi-layer stack has a range-to-midrange percentage from a positive percentage greater than zero to 5%;</u><u style="single"> The multi-layer stack is also a narrow bandwidth omnidirectional reflector with a reflection band of less than 100 nanometers when viewed from an angle of 0 to 65 degrees.</u>
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Titles2
- Japanese
- 狭い帯域の全方向性反射体および構造色としてのそれらの使用
- English
- Narrow band omnidirectional reflectors and their use as structural colors
Classification
- CPC, 2
- G02B5/0833
- G02B5/26
- IPC, 2
- G02B5 28
- G02B5 08
