Microelectromechanical apparatus and methods for surface acoustic wave switching
Abstract
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Expired 11 July 2023, 3.2 years ago.
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29 claims: 4 independent, 25 dependent
- 1離間された 入力表面弾性波(SAW)トランスデューサと出力SAWトランスデューサと を有する1つの圧電基板と、 前記入力 SAWトランスデューサと前記 出力SAWトランスデューサ と の間に配置された1つの微小電子機械システム(MEMS)スイッチと を備える装置であって、 前記MEMSスイッチは、前 記入力SAWトランスデューサによって生成された S AWを 変化させるべく前記圧電基板と機械的に接触するように 変形可能な、1つの変形可 能部 材を有する装置。
- 2前記変形可 能部 材 は 、前記SAWを 偏向 させ る 、請求項1に記載の装置。
- 3前記変形可 能部 材 は 、前記SAWを 偏向 させ るための 1つの格子層をさらに備える、請求項2に記載の装置。
- 4前記圧電基板の上 または その上部に形成され、かつ 、偏向 された 前記 SAWを吸収するように配置された1つの吸収体をさらに備える、請求項2に記載の装置。
- 5前記変形可 能部 材 は 、前記SAWを吸収する ための 1つの吸収体層を含む、請求項1に記載の装置。
- 6前記装置 は 、前記変形可 能部 材 を電磁的に動かす ように配置された1つの作動電極をさらに備える、請求項1に記載の装置。
- 7前記作動電極 は 、前記変形可 能部 材の下にあって、前記入力SAWトランスデューサと 前記 出力SAWトランスデューサ と を 結ぶ 軸に沿って、前記 圧電 基板 の 表面上に配置される、請求項6に記載の装置。
- 8前記作動電極 は 、前記変形可 能部 材の下 にある 前記 圧電 基板 の 表面上に配置され、前記入力SAWトランスデューサと 前記 出力SAWトランスデューサとによって画定される1つのSAWパスの少なくとも部分的に外部にある、2つ以上の作動電極部材を含む、請求項6に記載の装置。
- 9前記入力SAWトランスデューサに電気的に 接続 された1つの第1の電気信号源をさらに備える、請求項1に記載の装置。
- 10前記MEMSスイッチに電気的に 接続 された1つの第2の電気信号源をさらに備える、請求項9に記載の装置。
- 11前記出力SAWトランスデューサに電気的に 接続 された1つの電子装置をさらに含む、請求項10に記載の装置。
- 121つの圧電基板の1つの表面 上 に存在する、入力 表面弾性波(SAW)トランスデューサ および 出力SAW トランスデューサと、 前記入力 SAWトランスデューサと前記 出力SAWトランスデューサとの間 において 前記 圧電 基板に固定された微小電子機械システム(MEMS)スイッチと を備える装置であって、 前記MEMSスイッチは、 前記 圧電 基板の表面に接触する べく 変形可能な1つの変形可 能部 材と、 前記 圧電 基板の前記表面に形成され、前記変形可 能部 材を電磁的に 動かす ように配置された作動 電極 と を有する装置。
- 13前記入力SAWトランスデューサに電気的に 接続 された1つの第1の電気信号源と、 前記MEMSスイッチに電気的に 接続 された1つの第2の電気信号源とを更に備える、請求項12に記載の装置。
- 14前記作動電極 は 、前記入力SAWトランスデューサと 前記 出力SAWトランスデューサ と によって画定される1つのSAWパス内に存在する、請求項12に記載の装置。
- 15前記作動電極 は 、前記入力 SAWトランスデューサと前記 出力SAWトランスデューサ と によって画定される1つのSAWパスの外部に存在する2つ以上の作動電極部材を含む、請求項12に記載の装置。
- 161つの基板 の表 面に沿って進行する 第 1の表面 弾性波 (SAW)を生成する段階と、 1つの微小電子機械システム(MEMS)スイッチ の変形可能部材 を前記基板 の 表面に接触させることによって、前記第1のSAWを選択的に 変化させる 段階と を備え る方 法。
- 17前記変形 可能 部材の一部として形成された1つの格子を前記基板 の 表面 と 接触させることによっ て前 記第1のSAWを 偏向 させて、 第 2のSAWを形成する段階を備える、請求項16に記載の方法。
- 18前記第2のSAWを吸収する段階を備える、請求項17に記載の方法。
- 19前記変形 可能 部材の一部として形成された1つの吸収体層で前記第1のSAWを吸収する段階を備える、請求項16に記載の方法。
- 20前記基板 の表面上 にあって、前記変形可 能部 材の下にあって、 入力SAWトランスデューサと 出力SAWトランスデューサ と によって画定された1つのSAWパス内に存在する1つの作動電極に対して作動電気信号を 与える ことによって、前記変形可 能部 材を電磁的に 動かして 前記MEMSスイッチを作動させる段階を更に備える、請求項16に記載の方法。
- 21入力SAWトランスデューサと 出力SAWトランスデューサ と によって画定された1つのSAWパスの少なくとも 部分的に 外部に存在する2つ以上の部材を有する1つの作動電極に対して作動電気信号を 与える ことによって、前記変形可 能部 材を電磁的に 動かす ことによって、前記MEMSスイッチを作動させる段階を更に備える、請求項16に記載の方法。
- 22前記第1のSAWを生成する段階 は 、 入 力電気信号 を入 力SAWトランスデューサに 与える 段階を備える、請求項16に記載の方法。
- 23前記変形可 能部 材が前記基板と接触していないとき、 出 力SAWトランスデューサで前記第1のSAWを検出する段階を備える、請求項16に記載の方法。
- 24出 力電気信号を前記出力SAWトランスデューサで形成する段階と、 前記出力電気信号を処理する段階と を備える、請求項23に記載の方法。
- 251つの基板 の 表面 上において入 力表面音波(SAW)を生成する段階と、 前記基板上にある1つの微小電子機械システム(MEMS)スイッチの1つの変形可 能部 材を電磁的に 動かす ことによって、前記変形可 能部 材を 前記基板の表面と接触させて前記入力SAWを変化させる 段階と を備える、切り替え方法。
- 26前記SAWを 変化させる 段階 は 、前記入力SAWを吸収する段階および 偏向させる 段階のうちの1つを備える、請求項25に記載の切り替え方法。
- 27前記入力SAWを生成する段階 は 、 電 気信号を1つのSAWトランスデューサに 与える 段階を備える、請求項25に記載の切り替え方法。
- 28電 気信号を1つの作動電極に提供して、前記変形可 能部 材を電磁的に 動かして変形させることによって 、前記変形可 能部 材を前記基板 の 表面 と 接触させる段階を備える、請求項25に記載の切り替え方法。
- 29偏向 された S AWを吸収する段階を備える、請求項25に記載の切り替え方法。
Independent claims29
31 paragraphs, as filed
The field of the present invention relates to a plurality of microelectromechanical systems (MEMS) in more detail.<u style="single">Surface acoustic wave</u>It relates to multiple MEMS devices and methods for switching.
A plurality of filters and a plurality of switches are often used in combination in a plurality of electronic devices. For example, in a plurality of mobile phones, a plurality of radio frequency (RF) signals are detected by one antenna, converted into a plurality of electric signals, and then processed. To process multiple signals, one filter on the receiving side of the device requires one switch to switch the RF antenna. In addition, a plurality of switches are required to change between a plurality of frequency channels. In most multiple electronic devices, the switch takes the form of multiple transistors. In electronic technology, it is known that a plurality of electric signals are adversely affected by "insertion loss" due to switching or passing through a filter circuit.
<p> A plurality of SAW devices are used in a plurality of electronic applications as a plurality of resonators and a plurality of filters. In one SAW filter, one electric signal is input to one input SAW transducer formed on one piezoelectric substrate. The input electrical signal typically has multiple frequencies in one relatively wide range. However, the input SAW transducer produces a single SAW that has only multiple frequencies in a relatively narrow range. The SAW then travels over the substrate and is detected by a single output SAW transducer. The output SAW transducer only responds to multiple SAW frequencies in one narrow range and further enhances signal filtering. The detected SAW is then converted into one output electrical signal, which signal has one frequency range narrower than the input electrical signal.</p><p> Multiple MEMS switches are also used in multiple selective electronic applications. An example of one MEMS switch is one capacitor shunt switch, which includes one tip electrode in the form of one thin film and one bottom electrode in the form of one communication path. When one direct current (DC) working voltage is applied to both ends of the front electrode (thin film) and the bottom electrode (communication path) during operation, the thin film becomes<u style="single">Bent</u>Physical contact with the dielectric layer of the communication path. As a result, the circuit is short-circuited and grounded, and the transmission of a plurality of signals passing through the communication path is cut off.</p><p> Currently, multiple MEMS and SAW devices are used in a variety of electronic devices as multiple resonators, multiple filters, and multiple switches. Moreover, common efforts for switching and filtering with multiple SAW and / or MEMS devices are switching and switching in the electrical domain.<u style="single">Elastic wave</u>Involved in filtering in the domain. This effort tends to be inefficient due to the associated insertion loss. Unfortunately, another effort is<u style="single">Elastic wave</u>Currently does not exist due to the lack of multiple efficient switches based on.</p>
In the detailed description of the plurality of embodiments of the present invention below, the accompanying drawings forming a portion thereof will be referred to, and the plurality of specific embodiments in which the embodiments of the present invention will be implemented are described. Shown for. These plurality of embodiments are described in sufficient detail for those skilled in the art to be able to use the other plurality of embodiments, and the plurality of modifications can be made without departing from the scope thereof. Should be understood. The following detailed description should therefore not be taken up in a limited sense and the scope of the embodiments of the present invention is defined only by the accompanying claims.
FIG. 1 is a schematic plan view of a general embodiment of one MEMS switching device 100. The apparatus 100 includes one input SAW transducer 112 and one output SAW transducer 114, each formed on or above one top surface 117 of one piezoelectric substrate 118. The input SAW transducer 112 includes first and second pairs 120 and 122 of electrode fingers 124 and 126 arranged in a comb shape. Similarly, the output SAW transducer 114 includes first and second pairs 128 and 130 of comb-shaped electrode fingers 132 and 134.
In one embodiment, the electrode finger pairs 120 and 122 consist of a single metal thin film formed using photoengraving and thin film treatment and may include either etching or lift-off techniques. In one embodiment of the input SAW transducer 112, the width W1 of each electrode finger 124 and 126 and the spacing S1 between a plurality of adjacent electrode fingers are at a micron or less than micron level. Similarly, in one embodiment of the output SAW transducer 114, the width W2 of each electrode finger 132 and 134 and the spacing S2 between a plurality of adjacent electrode fingers are at a micron or less than micron level.
Input and output SAW transducers 112 and 114 define one SAW path 137 through which one signal travels. The SAW path 137 is defined as a region of substrate surface 117 between the input and output SAW transducers. The width of the SAW path 137 is substantially the same as the width of the multiple SAW transducers, and the SAW path is essentially defined by the size and spacing of the multiple SAW transducers, covering the area between the multiple SAW transducers. Including.
One electrical signal (eg, voltage) source 140 is via wires 141 and 142 for pairs 120 and 122 of the electrode fingers of the input SAW transducer 112.<u style="single">Connection</u>And play a role in driving the input SAW transducer. In one embodiment,<u style="single">Electrical</u>The signal source 140 is an electronic element or device, such as an RF antenna or an amplifier. In addition, one electronic element or device 144 electrically to the set 128 and 130 of the electrode fingers of the output SAW transducer 114 via wires 145 and 146.<u style="single">Connection</u>are doing. In one embodiment, the electronic element and device 144 are an amplifier (eg, a low noise amplifier), an electronic filter, or an analog signal processing chip. Instead, electronics 144 include some or all of these (or similar) elements.
The apparatus 100 further includes one MEMS switch 150 formed on a piezoelectric substrate 118 between the input SAW transducer 112 and the output SAW transducer 114. The MEMS switch 150 includes a plurality of anchors 160 connected to the substrate 118 at an upper surface 117. Multiple anchors 160 are one that is designed to mechanically contact the top surface 117 within the SAW path 137.<u style="single">Deformable member</u>Support 166. In one embodiment,<u style="single">Deformable member</u>166 is a beam. In other embodiments,<u style="single">Deformable member</u>166 is a thin film. The MEMS switch 150 includes one working electrode 170 formed on the substrate surface 117.
The working electrode 170<u style="single">Deformable member</u>It is arranged to perform electromagnetic communication with 166. In particular, the working electrode 170<u style="single">Deformable member</u>166<u style="single">Electromagnetically move with sufficient force</u>Designed and arranged so that when one electrical signal (eg, one voltage signal) is applied to the working electrode<u style="single">Deformable member</u>And make contact with the top surface 117 of the substrate. The working electrode 170 can be made up of one or more electrode elements. For example, in the embodiment shown in FIG. 1, the working electrode 170 is on the upper surface 117 and<u style="single">Deformable member</u>Created by two-sided working electrode elements 170A and 170B located under 166 and multiple adjacent anchors 160. In one embodiment, the electrode elements 170A and 170B are located completely outside the SAW path 137. In another embodiment, the plurality of electrode elements forming the electrode 170 are located at least in part outside the SAW path 137.
In another embodiment shown in FIG. 2, the working electrode 170 of the MEMS switch 150 is located on the substrate top surface 117 and in the SAW path 137.<u style="single">Deformable member</u>Includes a single electrode member 170A located beneath 166. The working electrode member 170A is conductive and, in some embodiments, comprises a durable metal such as chromium or an insulator such as a doped diamond. To minimize the loss of SAW energy as it passes through the working electrode, the working electrode 170A must be relatively thin and uniform compared to the wavelength of the input SAW210.
Via one wire 188 for MEMS switch 150 and working electrode 170<u style="single">Connection</u>It is the working electrical signal (eg, voltage) source 190 that periodically activates (ie, activates or "turns on") the MEMS switch.<u style="single">Deformable member</u>To selectively make mechanical contact or separation with a portion of the substrate top surface 117 within the SAW path 137.<u style="single">Deformable member</u>Transform 166.
Continuing with reference to FIG. 1, device 100 operates as follows. The electrical signal source 140 applies one input electrical signal 200 between pairs 120 and 122 of electrode fingers 124 and 126. This causes periodic deformation of the piezoelectric substrate 118, thereby producing one input SAW 210 traveling across the substrate surface 117 and in the SAW path 137. The size and phase of the input SAW210 are determined by the electrode finger width W1, the electrode finger spacing S1, the comb-shaped electrode fingers 124 and 126, and the frequency content of the applied input electrical signal 200. The input SAW propagates across the top surface 117 of the substrate 118 to the MEMS switch 150.
When the MEMS switch 150 is in the first state<u style="single">Deformable member</u>166 is not in contact with the substrate surface 117. As a result, SAW210 becomes<u style="single">Deformable member</u>It can propagate unimpeded under and through the MEMS switch. The input SAW 210 continues to propagate along the substrate surface 117 until it reaches the output SAW transducer 114 and is converted into one output electrical signal 220. The output electrical signal 220 is then further processed by electronic device 144.
When the MEMS switch 150 is switched to the second state via one electrical signal 226 from the electrical signal source 190, the working electrode 170<u style="single">Deformable member</u>166<u style="single">Electromagnetically</u>attract. This will<u style="single">Deformable member</u>Deforms and comes into contact with the substrate upper surface 117. In one embodiment of device 100<u style="single">Deformable member</u>166 has almost or virtually all input SAW210<u style="single">Biased</u>, Thereby one<u style="single">deflection</u>Form SAW230. this<u style="single">deflection</u>Prevents almost or substantially all of the input SAW 210 from reaching the output SAW transducer 114.
Further, in one embodiment,<u style="single">Biased</u>SAW230 is present on or above the substrate top surface 117 and<u style="single">Biased</u>SAW<u style="single">Arranged to block</u>It is optionally absorbed by one absorbing member 240. Multiple material examples of absorbent member 240 include silicon and silicon-based materials such as RTV-3145 available from Dow Corning.
In other examples of embodiments described in more detail below.<u style="single">Deformable member</u>166 includes one absorber layer that absorbs most or substantially all of the input SAW 210, thereby preventing the input SAW 210 from reaching the output SAW transducer 114.
<u style="single">By selective operation of the MEMS switch 150, the deformable member 166 interacts with the input SAW 210, altering the input SAW 210 so that the device 100 can act as an elastic wave switch.</u>Here, some specific examples of the general embodiments of the apparatus 100 will be described in detail below.
MEMS Switch with Grid: FIG. 3A is a schematic plan view of an embodiment of a general embodiment of the MEMS switching device 100 of FIG. FIG. 3B shows the device 100 of FIG. 3A.<u style="single">Deformable member</u>It is a cross-sectional view of 166.<u style="single">Deformable member</u>166 includes one structural layer 254 with one lower surface 256 in this embodiment. Formed on the lower surface 256 is one grid layer 260 having a plurality of grid lines 262 having a grid spacing SG. Both the structural layer 254 and the lattice layer 260 can be formed by many materials. In a plurality of embodiments, the structural layer 254 contains one metal such as nickel, gold, titanium, or aluminum, and the lattice layer 260 is one metal, one metal-coated dielectric, nitride, carbide. , Or contains one oxide such as silicon dioxide.
In one embodiment, the grid layer 260 is oriented at one angle θ with respect to the axis A1. This causes the input SAW210 to be along one (virtual) axis A2 across axis A1.<u style="single">deflection</u>Will result in In one embodiment, the absorber 240 is located along axis A2,<u style="single">Biased</u>Crosses and absorbs SAW230. In one embodiment, the azimuth angle θ is the input SAW filter 210.<u style="single">deflection</u>Are at right angles, i.e. axis A1 and axis A2 are at right angles.
The specific grid angle θ required to achieve one specific strain direction is<u style="single">Input SAW</u>And deflection<u style="single">SAW</u>Based on speeds of 210 and 230. VI incident SAW210 speed, VD<u style="single">deflection</u>Consider it as the speed of SAW230. Due to the anisotropy of the piezoelectric quartz substrate 118, the velocity VD may differ from the VI. The pitch P of the lattice layer 260 is determined by P = VISinθ / f, where f is the frequency of the incident SAW210. Right angle<u style="single">deflection</u>The condition is given by tanθ = VI / VD. Further, in the examples, the number of grid lines and the grid spacing SG are chosen to best reflect the incident SAW210.
FIG. 3C is a close-up view of the MEMS switch of FIG. 3A, which includes four anchors 160 to which multiple suspension members 272 are mounted and<u style="single">Deformable member</u>It is connected to 166. In addition, the working electrode 170 of the MEMS switch is on the substrate surface 117 and is deformable adjacent to the four corners of the member.<u style="single">Possible</u>Includes four working electrode members 170A, 170B, 170C, and 170D under member 166. Due to this arrangement<u style="single">Deformable member</u>The flexibility of the 166 can be increased and also provides space for accommodating multiple working electrodes.
In the operation of the MEMS switching device 100 in FIG. 3A, in the first state,<u style="single">Deformable member</u>166 is not in contact with the top surface 117 of the substrate. This allows the input SAW 210 to propagate directly to the output SAW transducer 114. However, when the MEMS switch 150 is switched to the second state via the electrical signal 226 from the working electrical signal source 190, the working electrode members 170A, 170B, 170C, and 170D<u style="single">Deformable member</u>116<u style="single">Electromagnetically</u>、<u style="single">Deformable member</u>Is deformed so that it comes into contact with the upper surface 117 of the substrate. This will<u style="single">Deformable member</u>Lattice layer has almost or virtually all input SAW210<u style="single">Block and deflect</u>be able to.
In one embodiment,<u style="single">deflection</u>SAW230 is optionally absorbed by the absorber layer 240. this<u style="single">deflection</u>And absorption provides the selective separation of the output SAW transducer 114 from the input SAW transducer 112, which is necessary to perform the switching operation.
MEMS switch with absorber layer: FIG. 4A is a schematic plan view of another embodiment of the MEMS switching device 100, which is a general example of FIG. Figure 4B shows<u style="single">Deformable member</u>It is a close sectional view of 166.
In the device 100 of FIG. 4A,<u style="single">Deformable member</u>166 is membranous and includes one structural layer 304 with one lower surface 306 and one absorber layer 310 with one lower surface 312 formed on the lower surface of the structural layer. The absorber layer 310 consists of one substance capable of absorbing one SAW. Multiple embodiments of the absorber layer 310 include one polymer or one soft metal.
In certain embodiments, the material forming the absorber layer 310 is<u style="single">substrate</u>It may harm or contaminate 118. In such cases, one optional embodiment comprises one thin lining layer 316 across the lower surface 312 to protect the upper surface 117 from damage or contamination from the absorber layer 310. The thin lining layer 316 consists of one substance comparable to the substance forming the substrate 118, and in one embodiment, contains the same substance as the substance forming the substrate 118.
Further, in one embodiment, the substrate top surface 117 includes any thin protective layer (not shown) to protect one underlying electrode or the piezoelectric substrate itself.
In the operation of the MEMS switching device 100 in FIG. 4A, when the MEMS switch 150 is in the first state,<u style="single">Deformable member</u>166 is not in contact with the substrate surface 117. This allows the input SAW 210 to propagate directly to the output SAW transducer 114 via the MEMS switch 150. However, when the MEMS switch 150 is actuated from the working electrical signal source 190 via the electrical signal 226, the working electrodes 170A and 170B.<u style="single">Is a deformable member</u>166<u style="single">Electromagnetically</u>, Deform it and mechanically contact the top surface 117 of the substrate<u style="single">Let</u>.. This will<u style="single">Deformable member</u>166 is capable of blocking and absorbing almost or substantially all input SAW in the absorber layer 10. This absorption provides the selective separation of the output SAW transducer 114 from the input SAW transducer 112, which is required to perform the switching operation.
Although the present invention has been described in the context of a plurality of preferred embodiments, it is understood that the invention is not limited thereto. Conversely, it is intended to include all alternatives, modifications, and equivalents that would be contained within the spirit and scope of the embodiments of the present invention, as defined in the plurality of attachments. There is.
<figref num="1">It is a schematic plan view of one general Embodiment example of one MEMS switching apparatus which has a working electrode with two electrode members.</figref><figref num="2">FIG. 1 is a schematic plan view of another embodiment of one MEMS switching device similar to FIG.<u style="single">Deformable member</u>Includes a single electrode member located below.</figref><figref num="3A">FIG. 1 is a schematic plan view of an embodiment of the MEMS switching device of FIG. 1, wherein the MEMS switch is one with one grid layer.<u style="single">Deformable member</u>including.</figref><figref num="3B">Figure 3A MEMS switch<u style="single">Deformable member</u>It is a cross-sectional view of, and shows the structural layer and the lattice layer in more detail.</figref><figref num="3C">FIG. 3A is a close plan view of the MEMS switch shown in FIG. 3A, showing an example of an embodiment using four working electrodes.</figref><figref num="4A">FIG. 1 is a schematic plan view of an embodiment of the MEMS switching device of FIG. 1, wherein the MEMS switch is one with one absorber layer.<u style="single">Deformable member</u>including.</figref><figref num="4B">Figure 4A of the MEMS switch<u style="single">Deformable member</u>It is a cross-sectional view of, and shows the structural layer and the absorber layer in more detail.</figref>
Every citation, both ways
| Document | Relation | Office |
|---|---|---|
| JP58075313A | Cites | Japan |
| JP60180318A | Cites | Japan |
| WO01082478A1 | Cites | World Intellectual Property Organization (WIPO) |
| JP51028474B2 | Cites | Japan |
16 members in 8 offices
Priority claims9
| Document | Office | Kind | Date |
|---|---|---|---|
| 10198503 | United States of America | – | |
| 19850302 | United States of America | A | |
| 19850302 | United States of America | A | |
| 0322105 | United States of America | W | |
| 0322105 | United States of America | W | |
| 2002198503 | – | – | – |
| 2003022105 | – | – | – |
| US20020198503 | – | – | – |
| WO2003US22105 | – | – | – |
Members16
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| US2004012464A1 | United States of America | A1 | |
| WO2004008635A1 | World Intellectual Property Organization (WIPO) | A1 | |
| AU2003256550A1 | Australia | A1 | |
| TW200406985A | Taiwan Province of China | A | |
| US2005122001A1 | United States of America | A1 | |
| EP1552610A1 | European Patent Office (EPO) | A1 | |
| US6933808B2 | United States of America | B2 | |
| CN1669219A | China | A | |
| JP2005533442A | Japan | A | |
| EP1552610B1 | European Patent Office (EPO) | B1 | |
| DE60311125D1 | Germany | D1 | |
| US7218188B2 | United States of America | B2 | |
| DE60311125T2 | Germany | T2 | |
| JP4138745B2This record | Japan | B2 | |
| TWI317575B | Taiwan Province of China | B | |
| CN100568719C | China | C |
18 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Cancellation because of no payment of annual feesLAPS | LAPS | |
| Receipt of annual feesJAPANESE INTERMEDIATE CODE: R250R250 | R250 | |
| Receipt of annual feesJAPANESE INTERMEDIATE CODE: R250R250 | R250 | |
| Receipt of annual feesJAPANESE INTERMEDIATE CODE: R250R250 | R250 | |
| Receipt of annual feesJAPANESE INTERMEDIATE CODE: R250R250 | R250 | |
| Renewal fee payment (event date is renewal date of database)FPAY | FPAY | |
| Renewal fee payment (event date is renewal date of database)FPAY | FPAY | |
| Renewal fee payment (event date is renewal date of database)FPAY | FPAY | |
| Renewal fee payment (event date is renewal date of database)FPAY | FPAY | |
| Renewal fee payment (event date is renewal date of database)FPAY | FPAY | |
| Certificate of patent or registration of utility modelJAPANESE INTERMEDIATE CODE: R150R150 | R150 | |
| First payment of annual fees (during grant procedure)JAPANESE INTERMEDIATE CODE: A61A61 | A61 | |
| Written decision to grant a patent or to grant a registration (utility model)JAPANESE INTERMEDIATE CODE: A01A01 | A01 | |
| Written decision to grant a patent or to grant a registration (utility model)JAPANESE INTERMEDIATE CODE: A01A01 | A01 | |
| Decision of grant or rejection writtenTRDD | TRDD | |
| Written submission of copy of amendment under section 19 (pct)JAPANESE INTERMEDIATE CODE: A524A524 | A524 | |
| Notification of reasons for refusalJAPANESE INTERMEDIATE CODE: A131A131 | A131 | |
| Report on retrievalJAPANESE INTERMEDIATE CODE: A971007A977 | A977 |
Numbers
- Publication
- 4138745
- Publication, DOCDB
- 4138745
- Publication, EPODOC
- JP4138745B
- Application
- 2004521855
- Application, DOCDB
- 2004521855
- Application, EPODOC
- JP20040521855
Titles2
- Japanese
- 表面弾性波切り替え用微小電子機械装置および方法
- English
- Microelectromechanical devices and methods for surface acoustic wave switching
Classification
- CPC, 3
- H03H9/0542
- H03H9/02779
- H03H9/6403
- IPC, 4
- H03H9 25
- B81B3 00
- H03H9 02
- H03H9 05