IL301151B1

Alignment of a specimen for inspection and other processes

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

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15 members in 8 offices

This recordMember, by publication datePriority claim

Priority claims5

Priority claims
DocumentOfficeKindDate
63084024United States of America
202063084024United States of AmericaP
17157992United States of America
202117157992United States of AmericaA
2021049543United States of AmericaW

Members15

Family members, oldest first
DocumentOfficeKind
US2022101506A1United States of AmericaA1
WO2022066417A1World Intellectual Property Organization (WIPO)A1
TW202213609ATaiwan Province of ChinaA
IL301151AIsraelA
CN116097418AChinaA
KR20230079063ARepublic of KoreaA
EP4200898A1European Patent Office (EPO)A1
US11748871B2United States of AmericaB2
JP2023544275AJapanA
TWI847045BTaiwan Province of ChinaB
KR102684035B1Republic of KoreaB1
JP7580584B2JapanB2
EP4200898A4European Patent Office (EPO)A4
IL301151B1This recordIsraelB1
IL301151B2IsraelB2