Nova Patents
IL291003B2

Dual-column-parallel ccd sensor and inspection systems using a sensor

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

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39 members in 8 offices

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DocumentOfficeKind
US2017295334A1United States of AmericaA1
WO2017176915A1World Intellectual Property Organization (WIPO)A1
TW201803337ATaiwan Province of ChinaA
IL261663D0IsraelD0
KR20180123576ARepublic of KoreaA
CN109076179AChinaA
EP3440832A1European Patent Office (EPO)A1
JP2019514286AJapanA
US10313622B2United States of AmericaB2
US2019253652A1United States of AmericaA1
US2019313044A1United States of AmericaA1
EP3440832A4European Patent Office (EPO)A4
CN109076179BChinaB
CN111564462AChinaA
US10764527B2United States of AmericaB2
US10778925B2United States of AmericaB2
TWI725161BTaiwan Province of ChinaB
IL261663AIsraelA
IL261663BIsraelB
IL282111D0IsraelD0
CN111564462BChinaB
TW202127865ATaiwan Province of ChinaA
JP6912495B2JapanB2
KR102304668B1Republic of KoreaB1
KR20210118228ARepublic of KoreaA
JP2021170795AJapanA
KR20220020429ARepublic of KoreaA
IL282111AIsraelA
IL282111BIsraelB
IL291003AIsraelA
IL291003D0IsraelD0
TWI770875BTaiwan Province of ChinaB
KR102497977B1Republic of KoreaB1
JP7269997B2JapanB2
KR102539905B1Republic of KoreaB1
IL291003B1IsraelB1
IL291003B2This recordIsraelB2
EP3440832B1European Patent Office (EPO)B1
EP4534987A1European Patent Office (EPO)A1