Nova Patents
IL262229B

System, method and computer program product for detecting defects in a fabricated target component using consistent modulation for the target and reference components

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

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11 members in 6 offices

This recordMember, by publication datePriority claim

Priority claims3

Priority claims
DocumentOfficeKindDate
201662331567United States of AmericaP
201615194436United States of AmericaA
2017031147United States of AmericaW

Members11

Family members, oldest first
DocumentOfficeKind
US2017323434A1United States of AmericaA1
WO2017192908A1World Intellectual Property Organization (WIPO)A1
TW201742004ATaiwan Province of ChinaA
US9940705B2United States of AmericaB2
IL262229AIsraelA
KR20180133534ARepublic of KoreaA
CN109075101AChinaA
CN109075101BChinaB
IL262229BThis recordIsraelB
KR102190835B1Republic of KoreaB1
TWI717508BTaiwan Province of ChinaB